Zhiyong Zhang

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Halo test method for an optical chip in an integrated circuit
- Patent number 10,977,469
- Issue date Apr 13, 2021
- Sino IC Technology Co., Ltd.
- Hua Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus with physical separation feature
- Patent number 8,878,545
- Issue date Nov 4, 2014
- Sino IC Technology Co., Ltd.
- Jie Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
UNIVERSAL SEMICONDUCTOR-BASED AUTOMATIC HIGH-SPEED SERIAL SIGNAL TE...
- Publication number 20200313998
- Publication date Oct 1, 2020
- Kun Yu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HALO TEST METHOD FOR AN OPTICAL CHIP IN AN INTEGRATED CIRCUIT
- Publication number 20200311375
- Publication date Oct 1, 2020
- Sino IC Technology Co.,Ltd.
- Hua WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZATION METHOD FOR INTEGRATED CIRCUIT WAFER TEST
- Publication number 20200309845
- Publication date Oct 1, 2020
- Hua Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF COMPRESSING TEST FILE
- Publication number 20140114935
- Publication date Apr 24, 2014
- SINO IC TECHNOLOGY CO., LTD.
- Hui Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS WITH PHYSICAL SEPARATION FEATURE
- Publication number 20140070816
- Publication date Mar 13, 2014
- SINO IC TECHNOLOGY CO., LTD.
- Jie Zhang
- G01 - MEASURING TESTING