Zhiyong Zhang

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Universal semiconductor-based automatic highspeed serial signal tes...
- Patent number 11,336,554
- Issue date May 17, 2022
- Sino IC Technology Co., Ltd.
- Kun Yu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Halo test method for an optical chip in an integrated circuit
- Patent number 10,977,469
- Issue date Apr 13, 2021
- Sino IC Technology Co., Ltd.
- Hua Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus with physical separation feature
- Patent number 8,878,545
- Issue date Nov 4, 2014
- Sino IC Technology Co., Ltd.
- Jie Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ECHO PLANAR IMAGING METHOD CAPABLE OF REDUCING IMAGE DISTORTION
- Publication number 20250130300
- Publication date Apr 24, 2025
- SHANGHAI JIAO TONG UNIVERSITY
- Zhiyong ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ANALYSIS OF INTEGRATED CIRCUIT TESTING ANOMAL...
- Publication number 20230080214
- Publication date Mar 16, 2023
- SINO IC TECHNOLOGY CO., LTD.
- Kun YU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNIVERSAL SEMICONDUCTOR-BASED AUTOMATIC HIGH-SPEED SERIAL SIGNAL TE...
- Publication number 20200313998
- Publication date Oct 1, 2020
- Kun Yu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HALO TEST METHOD FOR AN OPTICAL CHIP IN AN INTEGRATED CIRCUIT
- Publication number 20200311375
- Publication date Oct 1, 2020
- Sino IC Technology Co.,Ltd.
- Hua WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZATION METHOD FOR INTEGRATED CIRCUIT WAFER TEST
- Publication number 20200309845
- Publication date Oct 1, 2020
- Hua Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF COMPRESSING TEST FILE
- Publication number 20140114935
- Publication date Apr 24, 2014
- SINO IC TECHNOLOGY CO., LTD.
- Hui Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS WITH PHYSICAL SEPARATION FEATURE
- Publication number 20140070816
- Publication date Mar 13, 2014
- SINO IC TECHNOLOGY CO., LTD.
- Jie Zhang
- G01 - MEASURING TESTING

Zhiyong Zhang

Person

Patents Grantslast 30 patents

Universal semiconductor-based automatic highspeed serial signal tes...

Halo test method for an optical chip in an integrated circuit

Test apparatus with physical separation feature

Patents Applicationslast 30 patents

ECHO PLANAR IMAGING METHOD CAPABLE OF REDUCING IMAGE DISTORTION

SYSTEM AND METHOD FOR ANALYSIS OF INTEGRATED CIRCUIT TESTING ANOMAL...

UNIVERSAL SEMICONDUCTOR-BASED AUTOMATIC HIGH-SPEED SERIAL SIGNAL TE...

HALO TEST METHOD FOR AN OPTICAL CHIP IN AN INTEGRATED CIRCUIT

OPTIMIZATION METHOD FOR INTEGRATED CIRCUIT WAFER TEST

METHOD OF COMPRESSING TEST FILE

TEST APPARATUS WITH PHYSICAL SEPARATION FEATURE