Zhongwei Chen

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 12,237,143
- Issue date Feb 25, 2025
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample pre-charging methods and apparatuses for charged particle be...
- Patent number 12,191,109
- Issue date Jan 7, 2025
- ASML Netherlands B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 12,087,541
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-emission type electron source and charged particle beam devic...
- Patent number 11,935,720
- Issue date Mar 19, 2024
- Dazhi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for charged particle flooding to enhance voltag...
- Patent number 11,929,232
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Frank Nan Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,887,807
- Issue date Jan 30, 2024
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS sample holder, packaged product thereof, and apparatus of char...
- Patent number 11,854,762
- Issue date Dec 26, 2023
- BORRIES PTE. LTD.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backscattered electron detector, apparatus of charged-particle beam...
- Patent number 11,854,763
- Issue date Dec 26, 2023
- BORRIES PTE. LTD.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-emission type electron source and charged particle beam devic...
- Patent number 11,848,169
- Issue date Dec 19, 2023
- Dazhi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens system for fast scanning large FOV
- Patent number 11,837,431
- Issue date Dec 5, 2023
- ASML Netherlands B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, and systems and methods for operat...
- Patent number 11,798,777
- Issue date Oct 24, 2023
- ASML Netherlands B.V.
- Martinus Gerardus Maria Johannes Maassen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-cell detector for charged particles
- Patent number 11,784,024
- Issue date Oct 10, 2023
- ASML Netherlands B.V.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for charged particle detection
- Patent number 11,715,619
- Issue date Aug 1, 2023
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,705,304
- Issue date Jul 18, 2023
- ASML Netherlands B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,688,580
- Issue date Jun 27, 2023
- ASML Netherlands B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample pre-charging methods and apparatuses for charged particle be...
- Patent number 11,676,792
- Issue date Jun 13, 2023
- ASML Netherlands, B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of charged-particle beam such as scanning electron micros...
- Patent number 11,664,189
- Issue date May 30, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- B08 - CLEANING
Information Patent Grant
Apparatus of electron beam comprising pinnacle limiting plate and m...
- Patent number 11,664,186
- Issue date May 30, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rapid and automatic virus imaging and analysis system as well as me...
- Patent number 11,593,938
- Issue date Feb 28, 2023
- BORRIRS PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,587,758
- Issue date Feb 21, 2023
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of charged-particle beam such as electron microscope comp...
- Patent number 11,569,059
- Issue date Jan 31, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- B08 - CLEANING
Information Patent Grant
Detection of buried features by backscattered particles
- Patent number 11,443,915
- Issue date Sep 13, 2022
- ASML Netherlands B.V.
- Joe Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,398,368
- Issue date Jul 26, 2022
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage driving system and apparatus or device such as apparatus of c...
- Patent number 11,355,312
- Issue date Jun 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for compensating dispersion of a beam separator...
- Patent number 11,328,894
- Issue date May 10, 2022
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital detector, apparatus of charged-particle beam such as electr...
- Patent number 11,328,898
- Issue date May 10, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of charged-particle beam such as electron microscope comp...
- Patent number 11,295,927
- Issue date Apr 5, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for charged particle detection
- Patent number 11,295,930
- Issue date Apr 5, 2022
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrode assembly, electronic apparatus/device using the same, and...
- Patent number 11,257,659
- Issue date Feb 22, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number 11,217,423
- Issue date Jan 4, 2022
- ASML Netherlands B.V.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20250112023
- Publication date Apr 3, 2025
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...
- Publication number 20240379325
- Publication date Nov 14, 2024
- ASML NETHERLANDS B.V.
- Frank Nan ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...
- Publication number 20240362778
- Publication date Oct 31, 2024
- BORRIES PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECTIVE LENS SYSTEM FOR FAST SCANNING LARGE FOV
- Publication number 20240145209
- Publication date May 2, 2024
- ASML NETHERLANDS B.V.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20240128044
- Publication date Apr 18, 2024
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20240014003
- Publication date Jan 11, 2024
- ASML NETHERLANDS B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...
- Publication number 20230360877
- Publication date Nov 9, 2023
- ASML NETHERLANDS B.V.
- Xuedong LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20230282441
- Publication date Sep 7, 2023
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...
- Publication number 20230170178
- Publication date Jun 1, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR CHARGED PARTICLE DETECTION
- Publication number 20220375716
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS SCANNING ELECTRON MICROS...
- Publication number 20220262596
- Publication date Aug 18, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- B08 - CLEANING
Information Patent Application
SYSTEMS AND METHODS FOR COMPENSATING DISPERSION OF A BEAM SEPARATOR...
- Publication number 20220262594
- Publication date Aug 18, 2022
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-CELL DETECTOR FOR CHARGED PARTICLES
- Publication number 20220246391
- Publication date Aug 4, 2022
- ASML NETHERLANDS B.V.
- Joe WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20220148851
- Publication date May 12, 2022
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE COMP...
- Publication number 20220115204
- Publication date Apr 14, 2022
- Zhongwei Chen
- B08 - CLEANING
Information Patent Application
NOVEL STAGE DRIVING SYSTEM AND APPARATUS OR DEVICE SUCH AS APPARATU...
- Publication number 20220108869
- Publication date Apr 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...
- Publication number 20220108443
- Publication date Apr 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE COMP...
- Publication number 20220108865
- Publication date Apr 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIGITAL DETECTOR, APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTR...
- Publication number 20220108867
- Publication date Apr 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20210391138
- Publication date Dec 16, 2021
- ASML NETHERLANDS B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20210384008
- Publication date Dec 9, 2021
- ASML NETHERLANDS B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20210233736
- Publication date Jul 29, 2021
- ASML Netherlands B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20210193433
- Publication date Jun 24, 2021
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON EMITTER AND METHOD OF FABRICATING SAME
- Publication number 20210142975
- Publication date May 13, 2021
- ASML NETHERLANDS B.V.
- Juying Dou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...
- Publication number 20210142979
- Publication date May 13, 2021
- ASML NETHERLANDS B.V.
- Frank Nan ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20200388464
- Publication date Dec 10, 2020
- ASML Netherlands B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND SYSTEMS AND METHODS FOR OPERAT...
- Publication number 20200286707
- Publication date Sep 10, 2020
- ASML NETHERLANDS B.V.
- Martinus Gerardus, Maria, Johannes MAASSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
- Publication number 20200286705
- Publication date Sep 10, 2020
- ASML NETHERLANDS B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...
- Publication number 20200266023
- Publication date Aug 20, 2020
- ASML NETHERLANDS B.V.
- Xuedong LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20200251305
- Publication date Aug 6, 2020
- ASML NETHERLANDS B.V.
- Zhongwei CHEN
- H01 - BASIC ELECTRIC ELEMENTS

Zhongwei Chen

Person

Patents Grantslast 30 patents

Apparatus of plural charged-particle beams

Sample pre-charging methods and apparatuses for charged particle be...

Apparatus of plural charged-particle beams

Field-emission type electron source and charged particle beam devic...

Systems and methods for charged particle flooding to enhance voltag...

Apparatus of plural charged-particle beams

MEMS sample holder, packaged product thereof, and apparatus of char...

Backscattered electron detector, apparatus of charged-particle beam...

Field-emission type electron source and charged particle beam devic...

Objective lens system for fast scanning large FOV

Charged particle beam apparatus, and systems and methods for operat...

Multi-cell detector for charged particles

Method and apparatus for charged particle detection

Apparatus of plural charged-particle beams

Apparatus of plural charged-particle beams

Sample pre-charging methods and apparatuses for charged particle be...

Apparatus of charged-particle beam such as scanning electron micros...

Apparatus of electron beam comprising pinnacle limiting plate and m...

Rapid and automatic virus imaging and analysis system as well as me...

Apparatus of plural charged-particle beams

Apparatus of charged-particle beam such as electron microscope comp...

Detection of buried features by backscattered particles

Apparatus of plural charged-particle beams

Stage driving system and apparatus or device such as apparatus of c...

Systems and methods for compensating dispersion of a beam separator...

Digital detector, apparatus of charged-particle beam such as electr...

Apparatus of charged-particle beam such as electron microscope comp...

Method and apparatus for charged particle detection

Electrode assembly, electronic apparatus/device using the same, and...

Apparatus of plural charged-particle beams

Patents Applicationslast 30 patents

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...

RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...

OBJECTIVE LENS SYSTEM FOR FAST SCANNING LARGE FOV

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...

METHOD AND APPARATUS FOR CHARGED PARTICLE DETECTION

APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS SCANNING ELECTRON MICROS...

SYSTEMS AND METHODS FOR COMPENSATING DISPERSION OF A BEAM SEPARATOR...

MULTI-CELL DETECTOR FOR CHARGED PARTICLES

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE COMP...

NOVEL STAGE DRIVING SYSTEM AND APPARATUS OR DEVICE SUCH AS APPARATU...

RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...

APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE COMP...

DIGITAL DETECTOR, APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTR...

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

ELECTRON EMITTER AND METHOD OF FABRICATING SAME

SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

CHARGED PARTICLE BEAM APPARATUS, AND SYSTEMS AND METHODS FOR OPERAT...

APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS

SAMPLE PRE-CHARGING METHODS AND APPARATUSES FOR CHARGED PARTICLE BE...

CHARGED PARTICLE BEAM APPARATUS