Zhude Dai

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Double-faced ion source
- Patent number 8,217,365
- Issue date Jul 10, 2012
- Nuctech Company Limited
- Zhiqiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array-based ion storage system and method therefor
- Patent number 8,084,737
- Issue date Dec 27, 2011
- Nuctech Company Limited
- Yuanjing Li
- G01 - MEASURING TESTING
Information Patent Grant
Ion gate for dual ion mobility spectrometer and method thereof
- Patent number 8,013,297
- Issue date Sep 6, 2011
- Nuctech Company Limited
- Hua Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrode structure for drift tube in ion mobility spectrometer
- Patent number 7,851,747
- Issue date Dec 14, 2010
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Multi-array detector module structure for radiation imaging
- Patent number 7,512,212
- Issue date Mar 31, 2009
- Tsinghua University
- Yuanjing Li
- G01 - MEASURING TESTING
Information Patent Grant
Dual-array detector module
- Patent number 7,470,914
- Issue date Dec 30, 2008
- Nuctech Company Limited
- Yuanjing Li
- G01 - MEASURING TESTING
Information Patent Grant
Solid state detector module structure and radiation imaging system
- Patent number 7,429,738
- Issue date Sep 30, 2008
- Tsinghua University
- Yuanjing Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ION GATE FOR DUAL ION MOBILITY SPECTROMETER AND METHOD THEREOF
- Publication number 20100102219
- Publication date Apr 29, 2010
- Hua Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Array-based ion storage system and method therefor
- Publication number 20100065755
- Publication date Mar 18, 2010
- Yuanjing Li
- G01 - MEASURING TESTING
Information Patent Application
Electrode structure for drift tube in ion mobility spectrometer
- Publication number 20090309013
- Publication date Dec 17, 2009
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE-FACED ION SOURCE
- Publication number 20090283694
- Publication date Nov 19, 2009
- Zhiqiang CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-array detector module structure for radiation imaging
- Publication number 20070172027
- Publication date Jul 26, 2007
- Yuanjing Li
- G01 - MEASURING TESTING
Information Patent Application
Solid state detector module structure and radiation imaging system
- Publication number 20070096030
- Publication date May 3, 2007
- TSINGHUA UNIVERSITY
- Yuanjing Li
- G01 - MEASURING TESTING
Information Patent Application
Dual-array detector module
- Publication number 20060273259
- Publication date Dec 7, 2006
- Yuanjing Li
- G01 - MEASURING TESTING