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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

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Patents Grantslast 30 patents

Information Patent Grant
Method of and system for performing subsurface imaging using vibrat...
- Patent number 12,169,187
- Issue date Dec 17, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining dimensions of features of a subsurface topogr...
- Patent number 12,123,895
- Issue date Oct 22, 2024
- Nearfield Instruments B.V.
- Paul Zabbal
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne scanning probe microscopy method and system
- Patent number 11,940,416
- Issue date Mar 26, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever, ultrasound acoustic microscopy device comprising the ca...
- Patent number 11,927,564
- Issue date Mar 12, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Vibration component measurement device, Kelvin probe force microsco...
- Patent number 11,835,548
- Issue date Dec 5, 2023
- Osaka University
- Yasuhiro Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne scanning probe microscopy method and scanning probe micr...
- Patent number 11,635,448
- Issue date Apr 25, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Sri Ram Shankar Rajadurai
- G01 - MEASURING TESTING
Information Patent Grant
Method of and atomic force microscopy system for performing subsurf...
- Patent number 11,268,935
- Issue date Mar 8, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensitive atomic force microscope based infrared spectroscopy
- Patent number 11,226,285
- Issue date Jan 18, 2022
- Bruker Nano, Inc.
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Grant
Tuned oscillator atomic force microscopy methods and apparatus
- Patent number 11,162,977
- Issue date Nov 2, 2021
- Yale University
- Udo Schwarz
- G01 - MEASURING TESTING
Information Patent Grant
Method and device of using a scanning probe microscope
- Patent number 11,112,426
- Issue date Sep 7, 2021
- Ecole Polytechnique Federale de Lausanne (EPFL)
- Georg Ernest Fantner
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing atomic force microscopy with an ultrasound tra...
- Patent number 11,067,597
- Issue date Jul 20, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Martinus Cornelius Johannes Maria Van Riel
- G01 - MEASURING TESTING
Information Patent Grant
Sharpening method for probe tip of atomic force microscope (AFM)
- Patent number 11,016,120
- Issue date May 25, 2021
- YANSHAN UNIVERSITY
- Jianchao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 11,002,757
- Issue date May 11, 2021
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of determining an overlay error, method for manufacturing a...
- Patent number 10,935,568
- Issue date Mar 2, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for performing defect detection on or characte...
- Patent number 10,775,405
- Issue date Sep 15, 2020
- Nederlandse Organisatie voor toegepast-natuuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of tuning parameter settings for performing acoustic scannin...
- Patent number 10,746,702
- Issue date Aug 18, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing surface measurements on a surface of a sample,...
- Patent number 10,697,998
- Issue date Jun 30, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 10,663,483
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Device for the volumetric analysis of an organic or inorganic sample
- Patent number 10,598,692
- Issue date Mar 24, 2020
- Universite de Bourgogne
- Eric Bourillot
- G01 - MEASURING TESTING
Information Patent Grant
Thermal measurements using multiple frequency atomic force microscopy
- Patent number 10,556,793
- Issue date Feb 11, 2020
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Quantitative measurements using multiple frequency atomic force mic...
- Patent number 10,557,865
- Issue date Feb 11, 2020
- Oxford Instruments Asylum Research, Inc.
- Roger B Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Peakforce photothermal-based detection of IR nanoabsorption
- Patent number 10,520,426
- Issue date Dec 31, 2019
- Bruker Nano, Inc.
- Gregory O. Andreev
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,502,761
- Issue date Dec 10, 2019
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Automatic calibration and tuning of feedback systems
- Patent number 10,444,259
- Issue date Oct 15, 2019
- Technion Research & Development Foundation Limited
- Uri Sivan
- G01 - MEASURING TESTING
Information Patent Grant
AM/FM measurements using multiple frequency atomic force microscopy
- Patent number 10,444,258
- Issue date Oct 15, 2019
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Material property measurements using multiple frequency atomic forc...
- Patent number 10,215,773
- Issue date Feb 26, 2019
- Oxford Instruments AFM Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,197,596
- Issue date Feb 5, 2019
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dual-probe scanning probe microscope
- Patent number 10,197,595
- Issue date Feb 5, 2019
- Bruker Nano, Inc.
- Chanmin Su
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measuring method for atomic force microscope
- Patent number 10,191,081
- Issue date Jan 29, 2019
- Korea Research Institute of Standards and Science
- Byong Chon Park
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope and control method of the same
- Patent number 10,161,959
- Issue date Dec 25, 2018
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DECOUPLED OPTICAL FORCE NANOSCOPY
- Publication number 20240345129
- Publication date Oct 17, 2024
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Yang Zhao
- G01 - MEASURING TESTING
Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM FOR PERFORMING ACOUSTIC SCANNIN...
- Publication number 20240219421
- Publication date Jul 4, 2024
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Daniele PIRAS
- G01 - MEASURING TESTING
Information Patent Application
OPTOMECHANICAL TRANSDUCER
- Publication number 20240094240
- Publication date Mar 21, 2024
- Centre National de la Recherche Scientifique
- Cyprien LEMOUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPE AND HIGH-...
- Publication number 20240094241
- Publication date Mar 21, 2024
- TOHOKU UNIVERSITY
- Yoshiomi HIRANAGA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING DIMENSIONS OF FEATURES OF A SUBSURFACE TOPOGR...
- Publication number 20230143659
- Publication date May 11, 2023
- Nearfield Instruments B.V.
- Paul ZABBAL
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION COMPONENT MEASUREMENT DEVICE, KELVIN PROBE FORCE MICROSCO...
- Publication number 20230110754
- Publication date Apr 13, 2023
- OSAKA UNIVERSITY
- Yasuhiro SUGAWARA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE
- Publication number 20220357360
- Publication date Nov 10, 2022
- ACTOPROBE LLC
- ALEXANDER A. UKHANOV
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICR...
- Publication number 20220229088
- Publication date Jul 21, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Sri Ram Shankar RAJADURAI
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER, ULTRASOUND ACOUSTIC MICROSCOPY DEVICE COMPRISING THE CA...
- Publication number 20220091069
- Publication date Mar 24, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus VAN ES
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING PHYSICAL QUANTIT...
- Publication number 20210316986
- Publication date Oct 14, 2021
- Shimadzu Corporation
- Kenji YAMASAKI
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD OF PERFORMING ATOMIC FORCE MICROSCOPY
- Publication number 20200348334
- Publication date Nov 5, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Martinus Cornelius Johannes Maria VAN RIEL
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20200191826
- Publication date Jun 18, 2020
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD OF AND ATOMIC FORCE MICROSCOPY SYSTEM FOR PERFORMING SUBSURF...
- Publication number 20200057028
- Publication date Feb 20, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Daniele Piras
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING AN OVERLAY ERROR, METHOD FOR MANUFACTURING A...
- Publication number 20190310284
- Publication date Oct 10, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus van Es
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR THE VOLUMETRIC ANALYSIS OF AN ORGANIC OR INORGANIC SAMPLE
- Publication number 20190227098
- Publication date Jul 25, 2019
- UNIVERSITE DE BOURGOGNE
- Eric Bourillot
- G01 - MEASURING TESTING
Information Patent Application
Material Property Measurements Using Multiple Frequency Atomic Forc...
- Publication number 20190195910
- Publication date Jun 27, 2019
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TUNING PARAMETER SETTINGS FOR PERFORMING ACOUSTIC SCANNIN...
- Publication number 20190154636
- Publication date May 23, 2019
- Nederlandse Organisatie voor toegepast-natuurwetep -pelijk Onderzoe TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
TUNED OSCILLATOR ATOMIC FORCE MICROSCOPY METHODS AND APPARATUS
- Publication number 20190056428
- Publication date Feb 21, 2019
- Udo Schwarz
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20190018040
- Publication date Jan 17, 2019
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Surface Sensitive Atomic Force Microscope Based Infrared Spectroscopy
- Publication number 20190011358
- Publication date Jan 10, 2019
- Bruker Nano, Inc.
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING SURFACE MEASUREMENTS ON A SURFACE OF A SAMPLE,...
- Publication number 20180306837
- Publication date Oct 25, 2018
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY
- Publication number 20180292432
- Publication date Oct 11, 2018
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC CALIBRATION AND TUNING OF FEEDBACK SYSTEMS
- Publication number 20180217180
- Publication date Aug 2, 2018
- Technion Research & Development Foundation Limited
- Uri SIVAN
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20180136251
- Publication date May 17, 2018
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Device of Using a Scanning Probe Microscope
- Publication number 20180106830
- Publication date Apr 19, 2018
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
- Georg Ernest Fantner
- G01 - MEASURING TESTING
Information Patent Application
Peakforce Photothermal-Based Detection of IR Nanoabsorption
- Publication number 20180106715
- Publication date Apr 19, 2018
- Bruker Nano, Inc.
- Gregory O. Andreev
- B82 - NANO-TECHNOLOGY
Information Patent Application
Thermal Measurements Using Multiple Frequency Atomic Force Microscopy
- Publication number 20170313583
- Publication date Nov 2, 2017
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...
- Publication number 20170299628
- Publication date Oct 19, 2017
- Oxford Instruments AFM Inc
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
HEAD-INTEGRATED ATOMIC FORCE MICROSCOPE AND COMPOSITE MICROSCOPE IN...
- Publication number 20170138983
- Publication date May 18, 2017
- Korea Research Institute of Standards and Science
- Dal Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy
- Publication number 20170131322
- Publication date May 11, 2017
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of and system for performing subsurface imaging using vibrat...

Method of determining dimensions of features of a subsurface topogr...

Heterodyne scanning probe microscopy method and system

Cantilever, ultrasound acoustic microscopy device comprising the ca...

Vibration component measurement device, Kelvin probe force microsco...

Heterodyne scanning probe microscopy method and scanning probe micr...

Method of and atomic force microscopy system for performing subsurf...

Surface sensitive atomic force microscope based infrared spectroscopy

Tuned oscillator atomic force microscopy methods and apparatus

Method and device of using a scanning probe microscope

Method of performing atomic force microscopy with an ultrasound tra...

Sharpening method for probe tip of atomic force microscope (AFM)

Method and apparatus of operating a scanning probe microscope

Method of determining an overlay error, method for manufacturing a...

Method of and system for performing defect detection on or characte...

Method of tuning parameter settings for performing acoustic scannin...

Method of performing surface measurements on a surface of a sample,...

Method and apparatus of using peak force tapping mode to measure ph...

Device for the volumetric analysis of an organic or inorganic sample

Thermal measurements using multiple frequency atomic force microscopy

Quantitative measurements using multiple frequency atomic force mic...

Peakforce photothermal-based detection of IR nanoabsorption

Method and apparatus of operating a scanning probe microscope

Automatic calibration and tuning of feedback systems

AM/FM measurements using multiple frequency atomic force microscopy

Material property measurements using multiple frequency atomic forc...

Method and apparatus of operating a scanning probe microscope

Dual-probe scanning probe microscope

Measuring method for atomic force microscope

Atomic force microscope and control method of the same

Patents Applicationslast 30 patents

DECOUPLED OPTICAL FORCE NANOSCOPY

METHOD, SYSTEM AND COMPUTER PROGRAM FOR PERFORMING ACOUSTIC SCANNIN...

OPTOMECHANICAL TRANSDUCER

HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPE AND HIGH-...

METHOD OF DETERMINING DIMENSIONS OF FEATURES OF A SUBSURFACE TOPOGR...

VIBRATION COMPONENT MEASUREMENT DEVICE, KELVIN PROBE FORCE MICROSCO...

SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE

HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICR...

CANTILEVER, ULTRASOUND ACOUSTIC MICROSCOPY DEVICE COMPRISING THE CA...

SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING PHYSICAL QUANTIT...

METHOD OF PERFORMING ATOMIC FORCE MICROSCOPY

Method and Apparatus of Operating a Scanning Probe Microscope

METHOD OF AND ATOMIC FORCE MICROSCOPY SYSTEM FOR PERFORMING SUBSURF...

METHOD OF DETERMINING AN OVERLAY ERROR, METHOD FOR MANUFACTURING A...

DEVICE FOR THE VOLUMETRIC ANALYSIS OF AN ORGANIC OR INORGANIC SAMPLE

Material Property Measurements Using Multiple Frequency Atomic Forc...

METHOD OF TUNING PARAMETER SETTINGS FOR PERFORMING ACOUSTIC SCANNIN...

TUNED OSCILLATOR ATOMIC FORCE MICROSCOPY METHODS AND APPARATUS

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Surface Sensitive Atomic Force Microscope Based Infrared Spectroscopy

METHOD OF PERFORMING SURFACE MEASUREMENTS ON A SURFACE OF A SAMPLE,...

AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY

AUTOMATIC CALIBRATION AND TUNING OF FEEDBACK SYSTEMS

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Device of Using a Scanning Probe Microscope

Peakforce Photothermal-Based Detection of IR Nanoabsorption

Thermal Measurements Using Multiple Frequency Atomic Force Microscopy

QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...

HEAD-INTEGRATED ATOMIC FORCE MICROSCOPE AND COMPOSITE MICROSCOPE IN...

AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy