Accessing extra cells

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CPC
G11C29/24

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/24Accessing extra cells

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Non-volatile memory with layout adaptive problematic word line dete...
- Patent number 12,293,800
- Issue date May 6, 2025
- SanDisk Technologies, Inc.
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and erasing method
- Patent number 12,198,768
- Issue date Jan 14, 2025
- Winbond Electronics Corp.
- Masaru Yano
- G11 - INFORMATION STORAGE
Information Patent Grant
DRAM retention test method for dynamic error correction
- Patent number 12,190,974
- Issue date Jan 7, 2025
- RAMBUS INC.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory array having error checking and correction circuit
- Patent number 12,190,981
- Issue date Jan 7, 2025
- Winbond Electronics Corp.
- Yao-Ting Tsai
- G11 - INFORMATION STORAGE
Information Patent Grant
Error correction in a memory device having an error correction code...
- Patent number 12,142,333
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Mustafa N. Kaynak
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for testing redundant fuse latches in a memory...
- Patent number 12,100,467
- Issue date Sep 24, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Authenticity and yield by reading defective cells
- Patent number 12,027,224
- Issue date Jul 2, 2024
- International Business Machines Corporation
- Julien Frougier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, system and computer program product for memory repair
- Patent number 12,014,790
- Issue date Jun 18, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Katherine H. Chiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor apparatus
- Patent number 11,972,829
- Issue date Apr 30, 2024
- SK hynix Inc.
- Dong Keun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic error monitor and repair
- Patent number 11,935,610
- Issue date Mar 19, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hiroki Noguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for column repair
- Patent number 11,901,033
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Jooyong Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Safety and correctness data reading and programming in a non-volati...
- Patent number 11,715,539
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Safety and correctness data reading in non-volatile memory devices
- Patent number 11,710,532
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system including parities written to dummy memory cell groups
- Patent number 11,699,499
- Issue date Jul 11, 2023
- Kioxia Corporation
- Tsukasa Tokutomi
- G11 - INFORMATION STORAGE
Information Patent Grant
DRAM retention test method for dynamic error correction
- Patent number 11,646,090
- Issue date May 9, 2023
- RAMBUS INC.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory devices, memory systems, and methods of operat...
- Patent number 11,626,185
- Issue date Apr 11, 2023
- Samsung Electronics Co., Ltd.
- Kyung-Ryun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy in microelectronic devices, and related methods, devices...
- Patent number 11,615,845
- Issue date Mar 28, 2023
- Micron Technology, Inc.
- Toru Ishikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for column repair
- Patent number 11,574,700
- Issue date Feb 7, 2023
- Samsung Electronics Co., Ltd.
- Jooyong Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for determining data states of memory cells
- Patent number 11,568,940
- Issue date Jan 31, 2023
- Micron Technology, Inc.
- Tommaso Vali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus
- Patent number 11,551,780
- Issue date Jan 10, 2023
- SK hynix Inc.
- Dong Keun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Level dependent error correction code protection in multi-level non...
- Patent number 11,527,300
- Issue date Dec 13, 2022
- Western Digital Technologies, Inc.
- Nian Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory and operation method of memory
- Patent number 11,462,286
- Issue date Oct 4, 2022
- SK Hynix Inc.
- Munseon Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system
- Patent number 11,450,397
- Issue date Sep 20, 2022
- Kioxia Corporation
- Prashob Ramachandran Nair
- G11 - INFORMATION STORAGE
Information Patent Grant
Method, system and computer program product for memory repair
- Patent number 11,450,401
- Issue date Sep 20, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Katherine H. Chiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Safety and correctness data reading and programming in a non-volati...
- Patent number 11,443,818
- Issue date Sep 13, 2022
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Grant
Modifiable repair solutions for a memory array
- Patent number 11,430,539
- Issue date Aug 30, 2022
- Micron Technology, Inc.
- Troy A. Manning
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory controller and flash memory system
- Patent number 11,410,741
- Issue date Aug 9, 2022
- TDK Corporation
- Kenichi Takubo
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic error monitor and repair
- Patent number 11,380,415
- Issue date Jul 5, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hiroki Noguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage device and operating method thereof
- Patent number 11,380,416
- Issue date Jul 5, 2022
- SK Hynix Inc.
- Eun Jae Ock
- G11 - INFORMATION STORAGE
Information Patent Grant
Safety and correctness data reading in non-volatile memory devices
- Patent number 11,373,724
- Issue date Jun 28, 2022
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION
- Publication number 20250201328
- Publication date Jun 19, 2025
- Rambus Inc.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-VOLATILE MEMORY WITH LAYOUT ADAPTIVE PROBLEMATIC WORD LINE DETE...
- Publication number 20250006287
- Publication date Jan 2, 2025
- Western Digital Technologies, Inc.
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR FORCING MEMORY CELL FAILURES IN A MEMOR...
- Publication number 20240395349
- Publication date Nov 28, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR TESTING MEMORY DEVICES
- Publication number 20240331794
- Publication date Oct 3, 2024
- Micron Technology, Inc.
- TAKAMASA SUZUKI
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR
- Publication number 20240331795
- Publication date Oct 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Katherine H. CHIANG
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS OF TESTING REPAIR CIRCUITS OF MEMORY DEVICES
- Publication number 20240290414
- Publication date Aug 29, 2024
- Samsung Electronics Co., Ltd.
- Taewon Kim
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC ERROR MONITOR AND REPAIR
- Publication number 20240221858
- Publication date Jul 4, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hiroki Noguchi
- G11 - INFORMATION STORAGE
Information Patent Application
DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION
- Publication number 20230377668
- Publication date Nov 23, 2023
- Rambus Inc.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Error Correction in a Memory Device having an Error Correction Code...
- Publication number 20230317195
- Publication date Oct 5, 2023
- Micron Technology, Inc.
- Mustafa N. Kaynak
- G11 - INFORMATION STORAGE
Information Patent Application
AUTHENTICITY AND YIELD BY READING DEFECTIVE CELLS
- Publication number 20230298683
- Publication date Sep 21, 2023
- International Business Machines Corporation
- Julien Frougier
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR APPARATUS
- Publication number 20230022393
- Publication date Jan 26, 2023
- SK HYNIX INC.
- Dong Keun KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR APPARATUS
- Publication number 20230023098
- Publication date Jan 26, 2023
- SK HYNIX INC.
- Dong Keun KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SAFETY AND CORRECTNESS DATA READING AND PROGRAMMING IN A NON-VOLATI...
- Publication number 20230005555
- Publication date Jan 5, 2023
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR
- Publication number 20220366996
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Katherine H. CHIANG
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC ERROR MONITOR AND REPAIR
- Publication number 20220336037
- Publication date Oct 20, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hiroki Noguchi
- G11 - INFORMATION STORAGE
Information Patent Application
SAFETY AND CORRECTNESS DATA READING IN NON-VOLATILE MEMORY DEVICES
- Publication number 20220319626
- Publication date Oct 6, 2022
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICES, MEMORY SYSTEMS, AND METHODS OF OPERAT...
- Publication number 20220238178
- Publication date Jul 28, 2022
- Samsung Electronics Co., Ltd.
- Kyung-Ryun KIM
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE AND OPERATING METHOD THEREOF
- Publication number 20220115082
- Publication date Apr 14, 2022
- SK HYNIX INC.
- Eun Jae OCK
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR USING COLUMN REDUNDANCY FOR ERROR BIT DETEC...
- Publication number 20220084618
- Publication date Mar 17, 2022
- Micron Technology, Inc.
- Daniele Vimercati
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM
- Publication number 20220076773
- Publication date Mar 10, 2022
- KIOXIA Corporation
- Tsukasa TOKUTOMI
- G11 - INFORMATION STORAGE
Information Patent Application
Level Dependent Error Correction Code Protection in Multi-Level Non...
- Publication number 20220068423
- Publication date Mar 3, 2022
- Western Digital Technologies, Inc.
- Nian YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CONTROLLER WITH ADAPTIVE REFRESH RATE CONTROLLED BY ERROR BI...
- Publication number 20220051744
- Publication date Feb 17, 2022
- MEDIATEK INC.
- Hsiang-I Huang
- G11 - INFORMATION STORAGE
Information Patent Application
IMPROVED SAFETY AND CORRECTNESS DATA READING AND PROGRAMMING IN A N...
- Publication number 20210407608
- Publication date Dec 30, 2021
- Micron Technology, Inc.
- Antonino Mondello
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY AND OPERATION METHOD OF MEMORY
- Publication number 20210398600
- Publication date Dec 23, 2021
- SK HYNIX INC.
- Munseon JANG
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR
- Publication number 20210375385
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Katherine H. CHIANG
- G11 - INFORMATION STORAGE
Information Patent Application
IMPROVED SAFETY AND CORRECTNESS DATA READING IN NON-VOLATILE MEMORY...
- Publication number 20210335442
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION
- Publication number 20210335437
- Publication date Oct 28, 2021
- Rambus Inc.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY
- Publication number 20210313004
- Publication date Oct 7, 2021
- Fujitsu Limited
- Yoshitsugu Goto
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUITS AND METHODS FOR RELIABLE REPLACEMENT OF BAD COLUMNS IN A M...
- Publication number 20210295945
- Publication date Sep 23, 2021
- SANDISK TECHNOLOGIES LLC
- Siddarth Naga Murty Bassa
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CIRCUIT
- Publication number 20210280265
- Publication date Sep 9, 2021
- Sony Semiconductor Solutions Corporation
- HIROYUKI TEZUKA
- G11 - INFORMATION STORAGE

Accessing extra cells

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Non-volatile memory with layout adaptive problematic word line dete...

Semiconductor device and erasing method

DRAM retention test method for dynamic error correction

Memory array having error checking and correction circuit

Error correction in a memory device having an error correction code...

Systems and methods for testing redundant fuse latches in a memory...

Authenticity and yield by reading defective cells

Method, system and computer program product for memory repair

Semiconductor apparatus

Dynamic error monitor and repair

Memory device for column repair

Safety and correctness data reading and programming in a non-volati...

Safety and correctness data reading in non-volatile memory devices

Memory system including parities written to dummy memory cell groups

DRAM retention test method for dynamic error correction

Semiconductor memory devices, memory systems, and methods of operat...

Redundancy in microelectronic devices, and related methods, devices...

Memory device for column repair

Apparatus for determining data states of memory cells

Semiconductor apparatus

Level dependent error correction code protection in multi-level non...

Memory and operation method of memory

Memory system

Method, system and computer program product for memory repair

Safety and correctness data reading and programming in a non-volati...

Modifiable repair solutions for a memory array

Memory controller and flash memory system

Dynamic error monitor and repair

Storage device and operating method thereof

Safety and correctness data reading in non-volatile memory devices

Patents Applicationslast 30 patents

DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION

NON-VOLATILE MEMORY WITH LAYOUT ADAPTIVE PROBLEMATIC WORD LINE DETE...

APPARATUSES AND METHODS FOR FORCING MEMORY CELL FAILURES IN A MEMOR...

APPARATUSES AND METHODS FOR TESTING MEMORY DEVICES

METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR

METHODS OF TESTING REPAIR CIRCUITS OF MEMORY DEVICES

DYNAMIC ERROR MONITOR AND REPAIR

DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION

Error Correction in a Memory Device having an Error Correction Code...

AUTHENTICITY AND YIELD BY READING DEFECTIVE CELLS

SEMICONDUCTOR APPARATUS

SEMICONDUCTOR APPARATUS

SAFETY AND CORRECTNESS DATA READING AND PROGRAMMING IN A NON-VOLATI...

METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR

DYNAMIC ERROR MONITOR AND REPAIR

SAFETY AND CORRECTNESS DATA READING IN NON-VOLATILE MEMORY DEVICES

SEMICONDUCTOR MEMORY DEVICES, MEMORY SYSTEMS, AND METHODS OF OPERAT...

STORAGE DEVICE AND OPERATING METHOD THEREOF

SYSTEMS AND METHODS FOR USING COLUMN REDUNDANCY FOR ERROR BIT DETEC...

MEMORY SYSTEM

Level Dependent Error Correction Code Protection in Multi-Level Non...

MEMORY CONTROLLER WITH ADAPTIVE REFRESH RATE CONTROLLED BY ERROR BI...

IMPROVED SAFETY AND CORRECTNESS DATA READING AND PROGRAMMING IN A N...

MEMORY AND OPERATION METHOD OF MEMORY

METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR MEMORY REPAIR

IMPROVED SAFETY AND CORRECTNESS DATA READING IN NON-VOLATILE MEMORY...

DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION

MEMORY

CIRCUITS AND METHODS FOR RELIABLE REPLACEMENT OF BAD COLUMNS IN A M...

MEMORY CIRCUIT