TREA

Accessing serial memories

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Industry

  • CPC
  • G11C29/22
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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/22Accessing serial memories
Industries

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    CHIP DETECTION METHOD AND DEVICE
    • Publication number 20220310186
    • Publication date Sep 29, 2022
    • CHANGXIN MEMORY TECHNOLOGIES, INC
    • Jianbo ZHOU
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    INTELLIGENT MEMORY DEVICE TEST RACK
    • Publication number 20220230700
    • Publication date Jul 21, 2022
    • Micron Technology, Inc.
    • Gary D. Hamor
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    INTELLIGENT MEMORY DEVICE TEST RACK
    • Publication number 20210193250
    • Publication date Jun 24, 2021
    • Micron Technology, Inc.
    • Gary D. Hamor
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MEMORY SYSTEM HAVING MEMORY RANKS AND RELATED TUNING METHOD
    • Publication number 20140078840
    • Publication date Mar 20, 2014
    • Samsung Electronics Co., Ltd.
    • EUNSUNG SEO
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    SRAM MACRO TEST FLOP
    • Publication number 20110072326
    • Publication date Mar 24, 2011
    • SUN MICROSYSTEMS, INC.
    • Ali Vahidsafa
    • G01 - MEASURING TESTING