Accessing serial memories

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CPC
G11C29/22

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/22Accessing serial memories

Industries

Patents Grantslast 30 patents

Information Patent Grant
Memory component for deployment in a dynamic stripe width memory sy...
- Patent number 11,862,236
- Issue date Jan 2, 2024
- RAMBUS INC.
- Frederick A. Ware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent memory device test rack
- Patent number 11,328,789
- Issue date May 10, 2022
- Micron Technology, Inc.
- Gary D. Hamor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory component for deployment in a dynamic stripe width memory sy...
- Patent number 11,264,085
- Issue date Mar 1, 2022
- RAMBUS INC.
- Frederick A. Ware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlling a dynamic-stripe-width memory module
- Patent number 10,734,064
- Issue date Aug 4, 2020
- RAMBUS INC.
- Frederick A. Ware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Gate driving circuit and method for detecting same, array substrate...
- Patent number 10,241,145
- Issue date Mar 26, 2019
- BOE Technology Group Co., Ltd.
- Miao Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Memory system having memory ranks and related tuning method
- Patent number 9,135,981
- Issue date Sep 15, 2015
- Samsung Electronics Co., Ltd.
- Eunsung Seo
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM macro test flop
- Patent number 8,181,073
- Issue date May 15, 2012
- Oracle America, Inc.
- Ali Vahidsafa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CHIP DETECTION METHOD AND DEVICE
- Publication number 20220310186
- Publication date Sep 29, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Jianbo ZHOU
- G11 - INFORMATION STORAGE
Information Patent Application
INTELLIGENT MEMORY DEVICE TEST RACK
- Publication number 20220230700
- Publication date Jul 21, 2022
- Micron Technology, Inc.
- Gary D. Hamor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTELLIGENT MEMORY DEVICE TEST RACK
- Publication number 20210193250
- Publication date Jun 24, 2021
- Micron Technology, Inc.
- Gary D. Hamor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEM HAVING MEMORY RANKS AND RELATED TUNING METHOD
- Publication number 20140078840
- Publication date Mar 20, 2014
- Samsung Electronics Co., Ltd.
- EUNSUNG SEO
- G11 - INFORMATION STORAGE
Information Patent Application
SRAM MACRO TEST FLOP
- Publication number 20110072326
- Publication date Mar 24, 2011
- SUN MICROSYSTEMS, INC.
- Ali Vahidsafa
- G01 - MEASURING TESTING