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G01N2021/8809

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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Patents Grantslast 30 patents

Information Patent Grant
Lighting optical system and substrate inspecting device
- Patent number 12,085,517
- Issue date Sep 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihiro Iwamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Automated system and method for clarity measurements and clarity gr...
- Patent number 11,915,407
- Issue date Feb 27, 2024
- Gemological Institute of America, Inc. (GIA)
- Marc Verboven
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Portable lighting device for workbench
- Patent number 11,859,798
- Issue date Jan 2, 2024
- Dennis Rotim
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Time domain multiplexed defect scanner
- Patent number 11,852,592
- Issue date Dec 26, 2023
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 11,774,374
- Issue date Oct 3, 2023
- NANOSYSTEM SOLUTIONS, INC.
- Takashi Sugata
- G01 - MEASURING TESTING
Information Patent Grant
Time domain multiplexed defect scanner
- Patent number 11,733,173
- Issue date Aug 22, 2023
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of detecting pipe defects
- Patent number 11,709,139
- Issue date Jul 25, 2023
- New Jersey Institute of Technology
- John F. Federici
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for recognising and analysing surface defects in...
- Patent number 11,674,907
- Issue date Jun 13, 2023
- Dhruv Kasavala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated system and method for clarity measurements and clarity gr...
- Patent number 11,562,473
- Issue date Jan 24, 2023
- Gemological Institute of America, Inc. (GIA)
- Marc Verboven
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device and casting system
- Patent number 11,158,041
- Issue date Oct 26, 2021
- Sintokogio, Ltd.
- Kazuhiro Ota
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Detection of contamination on steel parts using ultraviolet light
- Patent number 11,047,804
- Issue date Jun 29, 2021
- voestalpine Automotive Components Cartersville Inc.
- Wilhelm Weinmeister
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated system and method for clarity measurements and clarity gr...
- Patent number 10,891,724
- Issue date Jan 12, 2021
- Gemological Institute of America, Inc. (GIA)
- Marc Verboven
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 10,803,576
- Issue date Oct 13, 2020
- TOSHIBA MEMORY CORPORATION
- Kenji Wakisaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technologies for identifying defects
- Patent number 10,768,120
- Issue date Sep 8, 2020
- Sunspring America, Inc.
- Scott Steven Sheppard
- G01 - MEASURING TESTING
Information Patent Grant
Inspection condition determination device, inspection condition det...
- Patent number 10,614,566
- Issue date Apr 7, 2020
- FANUC CORPORATION
- Keisuke Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to characterize cut gemstones using optical coherence tomogr...
- Patent number 10,458,921
- Issue date Oct 29, 2019
- The Regents of the University of California
- Matthew Brenner
- G01 - MEASURING TESTING
Information Patent Grant
Vibration measurement device
- Patent number 10,317,190
- Issue date Jun 11, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting method and defect inspecting apparatus
- Patent number 10,254,235
- Issue date Apr 9, 2019
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Technologies for identifying defects
- Patent number 10,060,861
- Issue date Aug 28, 2018
- SUNSPRING AMERICA, INC.
- Scott Steven Sheppard
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system and method using an array of light sources
- Patent number 10,036,712
- Issue date Jul 31, 2018
- Philips Lighting Holding B.V.
- Shuguang Kuai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 10,018,572
- Issue date Jul 10, 2018
- KLA-Tencor Corporation
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface features by azimuthal angle
- Patent number 9,952,151
- Issue date Apr 24, 2018
- Seagate Technology LLC
- David M. Tung
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting method and defect inspecting apparatus
- Patent number 9,841,384
- Issue date Dec 12, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive nuisance filter
- Patent number 9,835,566
- Issue date Dec 5, 2017
- KLA-Tencor Corp.
- Ardis Liang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods eliminating false defect detections
- Patent number 9,689,805
- Issue date Jun 27, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Biow-Hiem Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,528,942
- Issue date Dec 27, 2016
- KLA-Tencor Corporation
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scattered light measurement system
- Patent number 9,518,930
- Issue date Dec 13, 2016
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface features by azimuthal angle
- Patent number 9,513,215
- Issue date Dec 6, 2016
- Seagate Technology LLC
- David M. Tung
- G01 - MEASURING TESTING
Information Patent Grant
Lighting device for inspection and lighting method for inspection
- Patent number 9,494,422
- Issue date Nov 15, 2016
- CCS Inc.
- Shigeki Masumura
- G01 - MEASURING TESTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,488,591
- Issue date Nov 8, 2016
- Uster Technologies AG
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER DEFECT INSPECTION SYSTEM
- Publication number 20250044241
- Publication date Feb 6, 2025
- SYNTEC RESOURCES CO., LTD.
- KANG-FENG FAN
- G01 - MEASURING TESTING
Information Patent Application
AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...
- Publication number 20240402092
- Publication date Dec 5, 2024
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- G02 - OPTICS
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM AND METHOD, COMPUTER DEVICE, AND COMPUTER READABLE...
- Publication number 20240319159
- Publication date Sep 26, 2024
- Reemoon Technology Co., Ltd.
- Er Zhu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CAR BODY INSPECTION DEVICE, CAR BODY INSPECTION SYSTEM, AND CAR BOD...
- Publication number 20240310293
- Publication date Sep 19, 2024
- Rie Hirayama
- G01 - MEASURING TESTING
Information Patent Application
OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC ARRAYS VIA OPTICA...
- Publication number 20240283402
- Publication date Aug 22, 2024
- NewSouth Innovations Pty Limited
- Oliver KUNZ
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
GLASS INSPECTION
- Publication number 20240085342
- Publication date Mar 14, 2024
- PILKINGTON GROUP LIMITED
- Simon CHERRY
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT
- Publication number 20240060904
- Publication date Feb 22, 2024
- SAMSUNG DISPLAY CO., LTD.
- Jeong Moon LEE
- G01 - MEASURING TESTING
Information Patent Application
TIME DOMAIN MULTIPLEXED DEFECT SCANNER
- Publication number 20230341332
- Publication date Oct 26, 2023
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Lighting Optical System and Substrate Inspecting Device
- Publication number 20230142646
- Publication date May 11, 2023
- Hitachi High-Tech Corporation
- Akihiro IWAMATSU
- G01 - MEASURING TESTING
Information Patent Application
DETECTING DEVICE
- Publication number 20220317052
- Publication date Oct 6, 2022
- InnoLux Corporation
- Takanobu NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DEFECT DETECTION
- Publication number 20220051395
- Publication date Feb 17, 2022
- Baker Hughes Oilfield Operations LLC
- Jeremy Vandam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods of Detecting Pipe Defects
- Publication number 20220026372
- Publication date Jan 27, 2022
- NEW JERSEY INSTITUTE OF TECHNOLOGY
- John F. Federici
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR RECOGNISING AND ANALYSING SURFACE DEFECTS IN...
- Publication number 20210325313
- Publication date Oct 21, 2021
- Dhruv Kasavala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Device
- Publication number 20210231586
- Publication date Jul 29, 2021
- NanoSystem Solutions, Inc.
- Takashi SUGATA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF CONTAMINATION ON STEEL PARTS USING ULTRAVIOLET LIGHT
- Publication number 20210140896
- Publication date May 13, 2021
- Voestalpine Automotive Components Cartersville Inc.
- Wilhelm WEINMEISTER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE AND CASTING SYSTEM
- Publication number 20200234419
- Publication date Jul 23, 2020
- SINTOKOGIO, LTD.
- Kazuhiro OTA
- B22 - CASTING POWDER METALLURGY
Information Patent Application
ILLUMINATION DEVICE, ILLUMINATION METHOD AND IMAGING APPARATUS
- Publication number 20200011809
- Publication date Jan 9, 2020
- SCREEN Holdings Co., Ltd.
- Shoichi Umakoshi
- G01 - MEASURING TESTING
Information Patent Application
TECHNOLOGIES FOR IDENTIFYING DEFECTS
- Publication number 20180313768
- Publication date Nov 1, 2018
- Sunspring America, Inc.
- Scott Steven Sheppard
- G01 - MEASURING TESTING
Information Patent Application
TECHNOLOGIES FOR IDENTIFYING DEFECTS
- Publication number 20180195976
- Publication date Jul 12, 2018
- Sunspring America, Inc.
- Scott Steven Sheppard
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS
- Publication number 20180067060
- Publication date Mar 8, 2018
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
SURFACE FEATURES BY AZIMUTHAL ANGLE
- Publication number 20170030831
- Publication date Feb 2, 2017
- SEAGATE TECHNOLOGY LLC
- David M. Tung
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION SYSTEM AND METHOD
- Publication number 20160266046
- Publication date Sep 15, 2016
- Koninklijke Philips N.V.
- SHUGUANG KUAI
- G01 - MEASURING TESTING
Information Patent Application
Adaptive Nuisance Filter
- Publication number 20160258879
- Publication date Sep 8, 2016
- KLA-Tencor Corporation
- Ardis Liang
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods Eliminating False Defect Detections
- Publication number 20150316489
- Publication date Nov 5, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Biow-Hiem Ong
- G01 - MEASURING TESTING
Information Patent Application
SURFACE FEATURES BY AZIMUTHAL ANGLE
- Publication number 20140354984
- Publication date Dec 4, 2014
- SEAGATE TECHNOLOGY LLC
- David M. Tung
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING DEVICE FOR INSPECTION AND LIGHTING METHOD FOR INSPECTION
- Publication number 20140355003
- Publication date Dec 4, 2014
- Shigeki Masumura
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspecting Method and Defect Inspecting Apparatus
- Publication number 20140125980
- Publication date May 8, 2014
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
System With Polarized Scattered Light
- Publication number 20130342833
- Publication date Dec 26, 2013
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Application
System With Multiple Scattered Light Collectors
- Publication number 20130335733
- Publication date Dec 19, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING

Adjustment for highlighting flaws

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Lighting optical system and substrate inspecting device

Automated system and method for clarity measurements and clarity gr...

Portable lighting device for workbench

Time domain multiplexed defect scanner

Inspection device

Time domain multiplexed defect scanner

Systems and methods of detecting pipe defects

Method and device for recognising and analysing surface defects in...

Automated system and method for clarity measurements and clarity gr...

Inspection device and casting system

Detection of contamination on steel parts using ultraviolet light

Automated system and method for clarity measurements and clarity gr...

Defect inspection apparatus and defect inspection method

Technologies for identifying defects

Inspection condition determination device, inspection condition det...

Method to characterize cut gemstones using optical coherence tomogr...

Vibration measurement device

Defect inspecting method and defect inspecting apparatus

Technologies for identifying defects

Defect inspection system and method using an array of light sources

Front quartersphere scattered light analysis

Surface features by azimuthal angle

Defect inspecting method and defect inspecting apparatus

Adaptive nuisance filter

Systems and methods eliminating false defect detections

Front quartersphere scattered light analysis

Scattered light measurement system

Surface features by azimuthal angle

Lighting device for inspection and lighting method for inspection

Front quartersphere scattered light analysis

Patents Applicationslast 30 patents

WAFER DEFECT INSPECTION SYSTEM

AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

DETECTION SYSTEM AND METHOD, COMPUTER DEVICE, AND COMPUTER READABLE...

CAR BODY INSPECTION DEVICE, CAR BODY INSPECTION SYSTEM, AND CAR BOD...

OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC ARRAYS VIA OPTICA...

GLASS INSPECTION

DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT

TIME DOMAIN MULTIPLEXED DEFECT SCANNER

Lighting Optical System and Substrate Inspecting Device

DETECTING DEVICE

AUTOMATED DEFECT DETECTION

Systems and Methods of Detecting Pipe Defects

METHOD AND DEVICE FOR RECOGNISING AND ANALYSING SURFACE DEFECTS IN...

Inspection Device

DETECTION OF CONTAMINATION ON STEEL PARTS USING ULTRAVIOLET LIGHT

INSPECTION DEVICE AND CASTING SYSTEM

ILLUMINATION DEVICE, ILLUMINATION METHOD AND IMAGING APPARATUS

TECHNOLOGIES FOR IDENTIFYING DEFECTS

TECHNOLOGIES FOR IDENTIFYING DEFECTS

DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS

SURFACE FEATURES BY AZIMUTHAL ANGLE

DEFECT INSPECTION SYSTEM AND METHOD

Adaptive Nuisance Filter

Systems and Methods Eliminating False Defect Detections

SURFACE FEATURES BY AZIMUTHAL ANGLE

LIGHTING DEVICE FOR INSPECTION AND LIGHTING METHOD FOR INSPECTION

Defect Inspecting Method and Defect Inspecting Apparatus

System With Polarized Scattered Light

System With Multiple Scattered Light Collectors