TREA

AFM [Atomic Force Microscopy] or apparatus therefor

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Industry

  • CPC
  • G01Q60/24
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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/24AFM [Atomic Force Microscopy] or apparatus therefor
Industries