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AFM [Atomic Force Microscopy] or apparatus therefor
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G01Q60/24
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PHYSICS
G01
Measuring instruments
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SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES
G01Q60/00
Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof
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G01Q60/24
AFM [Atomic Force Microscopy] or apparatus therefor
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Patents Grants
last 30 patents
Information
Patent Grant
Truncated nonlinear interferometer-based sensor system
Patent number
12,181,773
Issue date
Dec 31, 2024
UT-Battelle, LLC
Raphael C. Pooser
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Thin film metrology
Patent number
12,158,332
Issue date
Dec 3, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Chih Hung Chen
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring optical constants of thin film of fluorine-con...
Patent number
12,105,018
Issue date
Oct 1, 2024
Shin-Etsu Chemical Co., Ltd.
Takashi Uchida
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting thickness of bonded rubber of carbon black in...
Patent number
11,976,193
Issue date
May 7, 2024
SICHUAN UNIVERSITY OF SCIENCE & ENGINEERING
Jian Chen
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for quantitatively evaluating surface roughness o...
Patent number
11,965,734
Issue date
Apr 23, 2024
NORTHEAST PETROLEUM UNIVERSITY
Shansi Tian
E21 - EARTH DRILLING MINING
Information
Patent Grant
Method of evaluating silicon wafer, method of evaluating silicon wa...
Patent number
11,948,819
Issue date
Apr 2, 2024
Sumco Corporation
Keiichiro Mori
B24 - GRINDING POLISHING
Information
Patent Grant
Crude sterol as an additive in asphalt binder
Patent number
11,912,874
Issue date
Feb 27, 2024
A.L.M. Holding Company
Gerald H. Reinke
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information
Patent Grant
Method and apparatus for nanoscale infrared absorption tomography
Patent number
11,860,087
Issue date
Jan 2, 2024
The Board of Trustees of the University of Illinois
Rohit Bhargava
G01 - MEASURING TESTING
Information
Patent Grant
Modified method to fit cell elastic modulus based on Sneddon model
Patent number
11,860,187
Issue date
Jan 2, 2024
Dalian University of Technology
Wei Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for calibrating nano measurement scale and standard material...
Patent number
11,852,581
Issue date
Dec 26, 2023
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
Kyung Joong Kim
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Sensor probe assembly
Patent number
11,841,330
Issue date
Dec 12, 2023
Physik-Instrumente (PI) GmbH & Co. KG
Scott Jordan
G01 - MEASURING TESTING
Information
Patent Grant
Systems, method and computer-accessible medium for providing balanc...
Patent number
11,835,545
Issue date
Dec 5, 2023
The Trustees of Columbia University In the City of New York
Alexander Swinton McLeod
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Sample, method for manufacturing sample, and method for measuring i...
Patent number
11,828,772
Issue date
Nov 28, 2023
Kioxia Corporation
Machiko Ito
G01 - MEASURING TESTING
Information
Patent Grant
Thin free-standing oxide membranes
Patent number
11,821,081
Issue date
Nov 21, 2023
The Regents of the University of California
Yi-Hsien Lu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
AFM imaging with metrology-preserving real time denoising
Patent number
11,796,565
Issue date
Oct 24, 2023
Bruker Nano, Inc.
Vladimir Fonoberov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Line edge roughness analysis using atomic force microscopy
Patent number
11,774,241
Issue date
Oct 3, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Wei-Shan Hu
G01 - MEASURING TESTING
Information
Patent Grant
Thin film metrology
Patent number
11,761,751
Issue date
Sep 19, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Chih Hung Chen
G01 - MEASURING TESTING
Information
Patent Grant
Wafer-scale programmable films for semiconductor planarization and...
Patent number
11,762,284
Issue date
Sep 19, 2023
Board of Regents, The University of Texas System
Sidlgata V. Sreenivasan
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for identifying the extent of aging in an asphalt
Patent number
11,760,882
Issue date
Sep 19, 2023
A.L.M. Holding Company
Gerald H. Reinke
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for identifying sample position in atomic forc...
Patent number
11,761,981
Issue date
Sep 19, 2023
Park Systems Corp.
JeongHun An
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting ferroelectric signal
Patent number
11,703,523
Issue date
Jul 18, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Wei-Shan Hu
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Nanomechanical profiling of breast cancer molecular subtypes
Patent number
11,686,720
Issue date
Jun 27, 2023
Universitat Basel
Marija Plodinec
G01 - MEASURING TESTING
Information
Patent Grant
Roll-to-roll programmable film imprint lithography
Patent number
11,669,009
Issue date
Jun 6, 2023
Board of Regents, The University of Texas System
Sidlgata V. Sreenivasan
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Three-dimensional surface metrology of wafers
Patent number
11,662,324
Issue date
May 30, 2023
Applied Materials Israel Ltd.
Ido Almog
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring dimension of semiconductor structure
Patent number
11,656,245
Issue date
May 23, 2023
Changxin Memory Technologies, Inc.
Zheng Li
G01 - MEASURING TESTING
Information
Patent Grant
Initiating and monitoring the evolution of single electrons within...
Patent number
11,635,450
Issue date
Apr 25, 2023
QUANTUM SILICON INC.
Robert Wolkow
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for simultaneously and microscopically measuring vapor cell...
Patent number
11,614,464
Issue date
Mar 28, 2023
North University of China
Zongmin Ma
G01 - MEASURING TESTING
Information
Patent Grant
Truncated non-linear interferometer-based sensor system
Patent number
11,561,453
Issue date
Jan 24, 2023
UT-Battelle, LLC
Raphael C. Pooser
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Atomic force microscope probes and methods of manufacturing probes
Patent number
11,499,990
Issue date
Nov 15, 2022
Nanosurf AG
Dominik Ziegler
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for semiconductor chip surface topography metro...
Patent number
11,448,499
Issue date
Sep 20, 2022
Yangtze Memory Technologies Co., Ltd.
Sicong Wang
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
ATOMIC FORCE MICROSCOPE (AFM) DEVICE AND METHOD OF OPERATING THE SAME
Publication number
20250004010
Publication date
Jan 2, 2025
Nearfield Instruments B.V.
Jakob VAN DE LAAR
G01 - MEASURING TESTING
Information
Patent Application
MASK CHARACTERIZATION METHODS AND APPARATUSES
Publication number
20240385111
Publication date
Nov 21, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chien-Cheng Chen
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...
Publication number
20240230712
Publication date
Jul 11, 2024
Samsung Electronics Co., Ltd.
Gyubaek Lee
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND MODEL FOR THREE-DIMENSIONAL CHARACTERIZATION OF MOLYBDEN...
Publication number
20240203019
Publication date
Jun 20, 2024
Jiangsu University
Quan WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...
Publication number
20240183805
Publication date
Jun 6, 2024
The Aerospace Corporation
Rafael J. ZALDIVAR
G01 - MEASURING TESTING
Information
Patent Application
Micro-Electromechanical System
Publication number
20240182293
Publication date
Jun 6, 2024
TECHNISCHE UNIVERSITAT WIEN
Daniel PLATZ
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
CRUDE STEROL AS AN ADDITIVE IN ASPHALT BINDER
Publication number
20240141170
Publication date
May 2, 2024
ALM Holding Co.
Gerald H. Reinke
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information
Patent Application
METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...
Publication number
20240133919
Publication date
Apr 25, 2024
Samsung Electronics Co., Ltd.
Gyubaek Lee
G01 - MEASURING TESTING
Information
Patent Application
LEVEL DIFFERENCE MEASURING APPARATUS AND METHOD OF CALCULATING LEVE...
Publication number
20240061014
Publication date
Feb 22, 2024
KIOXIA Corporation
Kiminori YOSHINO
G01 - MEASURING TESTING
Information
Patent Application
THIN FILM METROLOGY
Publication number
20230375330
Publication date
Nov 23, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Chih Hung CHEN
G01 - MEASURING TESTING
Information
Patent Application
NANOMECHANICAL PROFILING OF BREAST CANCER MOLECULAR SUBTYPES
Publication number
20230358724
Publication date
Nov 9, 2023
UNIVERSITAT BASEL
Marija PLODINEC
G01 - MEASURING TESTING
Information
Patent Application
RAZOR BLADES
Publication number
20230311353
Publication date
Oct 5, 2023
The Gillette Company LLC
Michael Joseph Baxter
B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information
Patent Application
SURFACE ANALYSIS METHOD, SURFACE ANALYSIS SYSTEM, AND SURFACE ANALY...
Publication number
20230273237
Publication date
Aug 31, 2023
Yuki ARAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE, METHOD FOR MANUFACTURING SAMPLE, AND METHOD FOR MEASURING I...
Publication number
20230236221
Publication date
Jul 27, 2023
KIOXIA Corporation
Machiko ITO
G01 - MEASURING TESTING
Information
Patent Application
DETECTION AND IMAGING OF AMYLOID AGGREGATES IN BLOOD
Publication number
20230184661
Publication date
Jun 15, 2023
EMPA EIDGENOSSISCHE MATERIALPRUFUNGS- UND FORSCHUNGSANSTALT
Peter NIRMALRAJ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM
Publication number
20230161220
Publication date
May 25, 2023
UT-Battelle, LLC
Raphael C. Pooser
B82 - NANO-TECHNOLOGY
Information
Patent Application
DOUBLE-STRANDED DNA MOLECULE FOR THE DETECTING AND CHARACTERIZING M...
Publication number
20230054300
Publication date
Feb 23, 2023
PARIS SCIENCES ET LETTRES - QUARTIER LATIN
Térence STRICK
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
MASK CHARACTERIZATION METHODS AND APPARATUSES
Publication number
20220357660
Publication date
Nov 10, 2022
Taiwan Semiconductor Manufacturing Company, Ltd.
Chien-Cheng Chen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
AFM Imaging with Metrology-Preserving Real Time Denoising
Publication number
20220326277
Publication date
Oct 13, 2022
Bruker Nano, Inc.
Vladimir Fonoberov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR NANOSCALE INFRARED ABSORPTION TOMOGRAPHY
Publication number
20220326148
Publication date
Oct 13, 2022
THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
Rohit Bhargava
G01 - MEASURING TESTING
Information
Patent Application
THIN FILM METROLOGY
Publication number
20220316861
Publication date
Oct 6, 2022
Taiwan Semiconductor Manufacturing Co., Ltd.
Chih Hung CHEN
G01 - MEASURING TESTING
Information
Patent Application
NITRIDE SEMICONDUCTOR, WAFER, SEMICONDUCTOR DEVICE, AND METHOD FOR...
Publication number
20220283199
Publication date
Sep 8, 2022
Kabushiki Kaisha Toshiba
Hajime NAGO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR MEASURING OPTICAL CONSTANTS OF THIN FILM OF FLUORINE-CON...
Publication number
20220276151
Publication date
Sep 1, 2022
Shin-Etsu Chemical Co., Ltd.
Takashi UCHIDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR MEASURING DIMENSION OF SEMICONDUCTOR STRUCTURE
Publication number
20220229087
Publication date
Jul 21, 2022
CHANGXIN MEMORY TECHNOLOGIES, INC
Zheng LI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR IDENTIFYING SAMPLE POSITION IN ATOMIC FORC...
Publication number
20220206039
Publication date
Jun 30, 2022
Park Systems Corp.
JeongHun AN
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD FOR IDENTIFYING THE EXTENT OF AGING IN AN ASPHALT
Publication number
20220195193
Publication date
Jun 23, 2022
ALM Holding Co.
Gerald H. Reinke
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information
Patent Application
SYSTEM FOR SIMULTANEOUSLY AND MICROSCOPICALLY MEASURING VAPOR CELL...
Publication number
20220196700
Publication date
Jun 23, 2022
NORTH UNIVERSITY OF CHINA
Zongmin MA
G01 - MEASURING TESTING
Information
Patent Application
DIFFRACTIVE OPTICAL ELEMENT FOR A TEST INTERFEROMETER
Publication number
20220170735
Publication date
Jun 2, 2022
Carl Zeiss SMT GMBH
Alexander Winkler
G01 - MEASURING TESTING
Information
Patent Application
A REMOTE CONTROL METHOD OF SAMPLE PREPARATION AND/OR SAMPLE ANALYSIS
Publication number
20220107332
Publication date
Apr 7, 2022
MSSCORPS CO., LTD.
CHI-LUN LIU
G05 - CONTROLLING REGULATING
Information
Patent Application
LINE EDGE ROUGHNESS ANALYSIS USING ATOMIC FORCE MICROSCOPY
Publication number
20220107179
Publication date
Apr 7, 2022
Taiwan Semiconductor Manufacturing Co., Ltd.
Wei-Shan HU
G01 - MEASURING TESTING