AFM [Atomic Force Microscopy] or apparatus therefor

Industry

CPC
G01Q60/24

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/24AFM [Atomic Force Microscopy] or apparatus therefor

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for detecting thickness of bonded rubber of carbon black in...
- Patent number 11,976,193
- Issue date May 7, 2024
- SICHUAN UNIVERSITY OF SCIENCE & ENGINEERING
- Jian Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for quantitatively evaluating surface roughness o...
- Patent number 11,965,734
- Issue date Apr 23, 2024
- NORTHEAST PETROLEUM UNIVERSITY
- Shansi Tian
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method of evaluating silicon wafer, method of evaluating silicon wa...
- Patent number 11,948,819
- Issue date Apr 2, 2024
- Sumco Corporation
- Keiichiro Mori
- B24 - GRINDING POLISHING
Information Patent Grant
Crude sterol as an additive in asphalt binder
- Patent number 11,912,874
- Issue date Feb 27, 2024
- A.L.M. Holding Company
- Gerald H. Reinke
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Method and apparatus for nanoscale infrared absorption tomography
- Patent number 11,860,087
- Issue date Jan 2, 2024
- The Board of Trustees of the University of Illinois
- Rohit Bhargava
- G01 - MEASURING TESTING
Information Patent Grant
Modified method to fit cell elastic modulus based on Sneddon model
- Patent number 11,860,187
- Issue date Jan 2, 2024
- Dalian University of Technology
- Wei Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for calibrating nano measurement scale and standard material...
- Patent number 11,852,581
- Issue date Dec 26, 2023
- KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
- Kyung Joong Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sensor probe assembly
- Patent number 11,841,330
- Issue date Dec 12, 2023
- Physik-Instrumente (PI) GmbH & Co. KG
- Scott Jordan
- G01 - MEASURING TESTING
Information Patent Grant
Systems, method and computer-accessible medium for providing balanc...
- Patent number 11,835,545
- Issue date Dec 5, 2023
- The Trustees of Columbia University In the City of New York
- Alexander Swinton McLeod
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Sample, method for manufacturing sample, and method for measuring i...
- Patent number 11,828,772
- Issue date Nov 28, 2023
- Kioxia Corporation
- Machiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Thin free-standing oxide membranes
- Patent number 11,821,081
- Issue date Nov 21, 2023
- The Regents of the University of California
- Yi-Hsien Lu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
AFM imaging with metrology-preserving real time denoising
- Patent number 11,796,565
- Issue date Oct 24, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Line edge roughness analysis using atomic force microscopy
- Patent number 11,774,241
- Issue date Oct 3, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wei-Shan Hu
- G01 - MEASURING TESTING
Information Patent Grant
Thin film metrology
- Patent number 11,761,751
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih Hung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying the extent of aging in an asphalt
- Patent number 11,760,882
- Issue date Sep 19, 2023
- A.L.M. Holding Company
- Gerald H. Reinke
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-scale programmable films for semiconductor planarization and...
- Patent number 11,762,284
- Issue date Sep 19, 2023
- Board of Regents, The University of Texas System
- Sidlgata V. Sreenivasan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for identifying sample position in atomic forc...
- Patent number 11,761,981
- Issue date Sep 19, 2023
- Park Systems Corp.
- JeongHun An
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting ferroelectric signal
- Patent number 11,703,523
- Issue date Jul 18, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Shan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanomechanical profiling of breast cancer molecular subtypes
- Patent number 11,686,720
- Issue date Jun 27, 2023
- Universitat Basel
- Marija Plodinec
- G01 - MEASURING TESTING
Information Patent Grant
Roll-to-roll programmable film imprint lithography
- Patent number 11,669,009
- Issue date Jun 6, 2023
- Board of Regents, The University of Texas System
- Sidlgata V. Sreenivasan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Three-dimensional surface metrology of wafers
- Patent number 11,662,324
- Issue date May 30, 2023
- Applied Materials Israel Ltd.
- Ido Almog
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring dimension of semiconductor structure
- Patent number 11,656,245
- Issue date May 23, 2023
- Changxin Memory Technologies, Inc.
- Zheng Li
- G01 - MEASURING TESTING
Information Patent Grant
Initiating and monitoring the evolution of single electrons within...
- Patent number 11,635,450
- Issue date Apr 25, 2023
- QUANTUM SILICON INC.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for simultaneously and microscopically measuring vapor cell...
- Patent number 11,614,464
- Issue date Mar 28, 2023
- North University of China
- Zongmin Ma
- G01 - MEASURING TESTING
Information Patent Grant
Truncated non-linear interferometer-based sensor system
- Patent number 11,561,453
- Issue date Jan 24, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope probes and methods of manufacturing probes
- Patent number 11,499,990
- Issue date Nov 15, 2022
- Nanosurf AG
- Dominik Ziegler
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for semiconductor chip surface topography metro...
- Patent number 11,448,499
- Issue date Sep 20, 2022
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Frequency tracking for subsurface atomic force microscopy
- Patent number 11,402,405
- Issue date Aug 2, 2022
- Nederlandse Oganisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Paul Louis Maria Joseph Van Neer
- G01 - MEASURING TESTING
Information Patent Grant
Thin film metrology
- Patent number 11,397,078
- Issue date Jul 26, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chih Hung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy system for and method of mapping nanostru...
- Patent number 11,320,454
- Issue date May 3, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CRUDE STEROL AS AN ADDITIVE IN ASPHALT BINDER
- Publication number 20240141170
- Publication date May 2, 2024
- ALM Holding Co.
- Gerald H. Reinke
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...
- Publication number 20240133919
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Gyubaek Lee
- G01 - MEASURING TESTING
Information Patent Application
LEVEL DIFFERENCE MEASURING APPARATUS AND METHOD OF CALCULATING LEVE...
- Publication number 20240061014
- Publication date Feb 22, 2024
- KIOXIA Corporation
- Kiminori YOSHINO
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM METROLOGY
- Publication number 20230375330
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih Hung CHEN
- G01 - MEASURING TESTING
Information Patent Application
NANOMECHANICAL PROFILING OF BREAST CANCER MOLECULAR SUBTYPES
- Publication number 20230358724
- Publication date Nov 9, 2023
- UNIVERSITAT BASEL
- Marija PLODINEC
- G01 - MEASURING TESTING
Information Patent Application
RAZOR BLADES
- Publication number 20230311353
- Publication date Oct 5, 2023
- The Gillette Company LLC
- Michael Joseph Baxter
- B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information Patent Application
SURFACE ANALYSIS METHOD, SURFACE ANALYSIS SYSTEM, AND SURFACE ANALY...
- Publication number 20230273237
- Publication date Aug 31, 2023
- Yuki ARAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE, METHOD FOR MANUFACTURING SAMPLE, AND METHOD FOR MEASURING I...
- Publication number 20230236221
- Publication date Jul 27, 2023
- KIOXIA Corporation
- Machiko ITO
- G01 - MEASURING TESTING
Information Patent Application
DETECTION AND IMAGING OF AMYLOID AGGREGATES IN BLOOD
- Publication number 20230184661
- Publication date Jun 15, 2023
- EMPA EIDGENOSSISCHE MATERIALPRUFUNGS- UND FORSCHUNGSANSTALT
- Peter NIRMALRAJ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM
- Publication number 20230161220
- Publication date May 25, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Application
DOUBLE-STRANDED DNA MOLECULE FOR THE DETECTING AND CHARACTERIZING M...
- Publication number 20230054300
- Publication date Feb 23, 2023
- PARIS SCIENCES ET LETTRES - QUARTIER LATIN
- Térence STRICK
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MASK CHARACTERIZATION METHODS AND APPARATUSES
- Publication number 20220357660
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Cheng Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
AFM Imaging with Metrology-Preserving Real Time Denoising
- Publication number 20220326277
- Publication date Oct 13, 2022
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR NANOSCALE INFRARED ABSORPTION TOMOGRAPHY
- Publication number 20220326148
- Publication date Oct 13, 2022
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Rohit Bhargava
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM METROLOGY
- Publication number 20220316861
- Publication date Oct 6, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih Hung CHEN
- G01 - MEASURING TESTING
Information Patent Application
NITRIDE SEMICONDUCTOR, WAFER, SEMICONDUCTOR DEVICE, AND METHOD FOR...
- Publication number 20220283199
- Publication date Sep 8, 2022
- Kabushiki Kaisha Toshiba
- Hajime NAGO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING OPTICAL CONSTANTS OF THIN FILM OF FLUORINE-CON...
- Publication number 20220276151
- Publication date Sep 1, 2022
- Shin-Etsu Chemical Co., Ltd.
- Takashi UCHIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING DIMENSION OF SEMICONDUCTOR STRUCTURE
- Publication number 20220229087
- Publication date Jul 21, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Zheng LI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IDENTIFYING SAMPLE POSITION IN ATOMIC FORC...
- Publication number 20220206039
- Publication date Jun 30, 2022
- Park Systems Corp.
- JeongHun AN
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR IDENTIFYING THE EXTENT OF AGING IN AN ASPHALT
- Publication number 20220195193
- Publication date Jun 23, 2022
- ALM Holding Co.
- Gerald H. Reinke
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
SYSTEM FOR SIMULTANEOUSLY AND MICROSCOPICALLY MEASURING VAPOR CELL...
- Publication number 20220196700
- Publication date Jun 23, 2022
- NORTH UNIVERSITY OF CHINA
- Zongmin MA
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTIVE OPTICAL ELEMENT FOR A TEST INTERFEROMETER
- Publication number 20220170735
- Publication date Jun 2, 2022
- Carl Zeiss SMT GMBH
- Alexander Winkler
- G01 - MEASURING TESTING
Information Patent Application
A REMOTE CONTROL METHOD OF SAMPLE PREPARATION AND/OR SAMPLE ANALYSIS
- Publication number 20220107332
- Publication date Apr 7, 2022
- MSSCORPS CO., LTD.
- CHI-LUN LIU
- G05 - CONTROLLING REGULATING
Information Patent Application
LINE EDGE ROUGHNESS ANALYSIS USING ATOMIC FORCE MICROSCOPY
- Publication number 20220107179
- Publication date Apr 7, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wei-Shan HU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR QUANTITATIVELY EVALUATING SURFACE ROUGHNESS O...
- Publication number 20220057199
- Publication date Feb 24, 2022
- Northeast Petroleum University
- Shansi Tian
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING THICKNESS OF BONDED RUBBER OF CARBON BLACK IN...
- Publication number 20220049072
- Publication date Feb 17, 2022
- SICHUAN UNIVERSITY OF SCIENCE & ENGINEERING
- Jian Chen
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
Novel Methods
- Publication number 20210403972
- Publication date Dec 30, 2021
- Colgate-Palmolive Company
- Tulika SARMA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
TRUNCATED NON-LINEAR INTERFEROMETER-BASED SENSOR SYSTEM
- Publication number 20210405503
- Publication date Dec 30, 2021
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Application
THROUGH-FOCUS IMAGE-BASED METROLOGY DEVICE, OPERATION METHOD THEREO...
- Publication number 20210396510
- Publication date Dec 23, 2021
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING
Information Patent Application
WAFER-SCALE PROGRAMMABLE FILMS FOR SEMICONDUCTOR PLANARIZATION AND...
- Publication number 20210389666
- Publication date Dec 16, 2021
- Board of Regents, The University of Texas System
- Sidlgata V. Sreenivasan
- G01 - MEASURING TESTING

AFM [Atomic Force Microscopy] or apparatus therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for detecting thickness of bonded rubber of carbon black in...

Method and system for quantitatively evaluating surface roughness o...

Method of evaluating silicon wafer, method of evaluating silicon wa...

Crude sterol as an additive in asphalt binder

Method and apparatus for nanoscale infrared absorption tomography

Modified method to fit cell elastic modulus based on Sneddon model

Method for calibrating nano measurement scale and standard material...

Sensor probe assembly

Systems, method and computer-accessible medium for providing balanc...

Sample, method for manufacturing sample, and method for measuring i...

Thin free-standing oxide membranes

AFM imaging with metrology-preserving real time denoising

Line edge roughness analysis using atomic force microscopy

Thin film metrology

Method for identifying the extent of aging in an asphalt

Wafer-scale programmable films for semiconductor planarization and...

Method and apparatus for identifying sample position in atomic forc...

Method and apparatus for detecting ferroelectric signal

Nanomechanical profiling of breast cancer molecular subtypes

Roll-to-roll programmable film imprint lithography

Three-dimensional surface metrology of wafers

Method and device for measuring dimension of semiconductor structure

Initiating and monitoring the evolution of single electrons within...

System for simultaneously and microscopically measuring vapor cell...

Truncated non-linear interferometer-based sensor system

Atomic force microscope probes and methods of manufacturing probes

Systems and methods for semiconductor chip surface topography metro...

Frequency tracking for subsurface atomic force microscopy

Thin film metrology

Scanning probe microscopy system for and method of mapping nanostru...

Patents Applicationslast 30 patents

CRUDE STEROL AS AN ADDITIVE IN ASPHALT BINDER

METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...

LEVEL DIFFERENCE MEASURING APPARATUS AND METHOD OF CALCULATING LEVE...

THIN FILM METROLOGY

NANOMECHANICAL PROFILING OF BREAST CANCER MOLECULAR SUBTYPES

RAZOR BLADES

SURFACE ANALYSIS METHOD, SURFACE ANALYSIS SYSTEM, AND SURFACE ANALY...

SAMPLE, METHOD FOR MANUFACTURING SAMPLE, AND METHOD FOR MEASURING I...

DETECTION AND IMAGING OF AMYLOID AGGREGATES IN BLOOD

TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM

DOUBLE-STRANDED DNA MOLECULE FOR THE DETECTING AND CHARACTERIZING M...

MASK CHARACTERIZATION METHODS AND APPARATUSES

AFM Imaging with Metrology-Preserving Real Time Denoising

METHOD AND APPARATUS FOR NANOSCALE INFRARED ABSORPTION TOMOGRAPHY

THIN FILM METROLOGY

NITRIDE SEMICONDUCTOR, WAFER, SEMICONDUCTOR DEVICE, AND METHOD FOR...

METHOD FOR MEASURING OPTICAL CONSTANTS OF THIN FILM OF FLUORINE-CON...

METHOD AND DEVICE FOR MEASURING DIMENSION OF SEMICONDUCTOR STRUCTURE

METHOD AND APPARATUS FOR IDENTIFYING SAMPLE POSITION IN ATOMIC FORC...

METHOD FOR IDENTIFYING THE EXTENT OF AGING IN AN ASPHALT

SYSTEM FOR SIMULTANEOUSLY AND MICROSCOPICALLY MEASURING VAPOR CELL...

DIFFRACTIVE OPTICAL ELEMENT FOR A TEST INTERFEROMETER

A REMOTE CONTROL METHOD OF SAMPLE PREPARATION AND/OR SAMPLE ANALYSIS

LINE EDGE ROUGHNESS ANALYSIS USING ATOMIC FORCE MICROSCOPY

METHOD AND SYSTEM FOR QUANTITATIVELY EVALUATING SURFACE ROUGHNESS O...

METHOD FOR DETECTING THICKNESS OF BONDED RUBBER OF CARBON BLACK IN...

Novel Methods

TRUNCATED NON-LINEAR INTERFEROMETER-BASED SENSOR SYSTEM

THROUGH-FOCUS IMAGE-BASED METROLOGY DEVICE, OPERATION METHOD THEREO...

WAFER-SCALE PROGRAMMABLE FILMS FOR SEMICONDUCTOR PLANARIZATION AND...