analysing diffraction pattern

Industry

CPC
G01N2223/0566

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/0566analysing diffraction pattern

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for analysis and determination of heavy metal occurrence key...
- Patent number 12,159,691
- Issue date Dec 3, 2024
- Central South University
- Zhang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
- Patent number 12,099,024
- Issue date Sep 24, 2024
- FEI Company
- Austin Penrose Day
- G01 - MEASURING TESTING
Information Patent Grant
Diffractometer-based global in situ diagnostic system for animals
- Patent number 12,094,609
- Issue date Sep 17, 2024
- Arion Diagnostics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diffraction-based global in vitro diagnostic system
- Patent number 12,094,610
- Issue date Sep 17, 2024
- Bragg Analytics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for the detection and correction of lens distortions in an e...
- Patent number 12,078,603
- Issue date Sep 3, 2024
- Joerg Kaercher
- G01 - MEASURING TESTING
Information Patent Grant
Methods for determining crystal structure and apparatus for carryin...
- Patent number 12,072,305
- Issue date Aug 27, 2024
- FYZIKALNI USTAV AV CR. V.V.I
- Lukas Palatinus
- G01 - MEASURING TESTING
Information Patent Grant
Crosslinked fluoropolymer resin and control method for same
- Patent number 11,946,924
- Issue date Apr 2, 2024
- PROTERIAL, LTD.
- Kazufumi Suenaga
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Electron diffraction holography
- Patent number 11,906,450
- Issue date Feb 20, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining atomic coordinates from X-ray diffraction data
- Patent number 11,860,114
- Issue date Jan 2, 2024
- David Hurwitz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Degree-of-crystallinity measurement apparatus, degree-of-crystallin...
- Patent number 11,852,597
- Issue date Dec 26, 2023
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
- Patent number 11,703,465
- Issue date Jul 18, 2023
- Kioxia Corporation
- Nobuhito Kuge
- G01 - MEASURING TESTING
Information Patent Grant
Energy-dispersive X-ray diffraction analyser comprising a substanti...
- Patent number 11,614,414
- Issue date Mar 28, 2023
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- James Richard Tickner
- G01 - MEASURING TESTING
Information Patent Grant
Estimating wear for BHA components using borehole hardness
- Patent number 11,579,329
- Issue date Feb 14, 2023
- Halliburton Energy Services, Inc.
- Ian David Campbell Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method, device and program for processing diffraction images of a c...
- Patent number 11,526,980
- Issue date Dec 13, 2022
- Electricite de France
- Félix Latourte
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron diffraction holography
- Patent number 11,460,419
- Issue date Oct 4, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative phase analysis device for analyzing non-crystalline ph...
- Patent number 11,402,341
- Issue date Aug 2, 2022
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of crystallite size distribution in polycrystalline mat...
- Patent number 11,397,154
- Issue date Jul 26, 2022
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring fiber orientation degree, fiber orientation de...
- Patent number 11,360,035
- Issue date Jun 14, 2022
- NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
- Atsuhiko Yamanaka
- G01 - MEASURING TESTING
Information Patent Grant
Full beam metrology for x-ray scatterometry systems
- Patent number 11,313,816
- Issue date Apr 26, 2022
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring stress
- Patent number 11,221,304
- Issue date Jan 11, 2022
- Kobe Steel, Ltd.
- Hiroyuki Takamatsu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction and X-ray spectroscopy method and related apparatus
- Patent number 11,105,756
- Issue date Aug 31, 2021
- NINGBO GALAXY MATERIALS TECHNOLOGY CO. LTD.
- Xiao-dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting an anomaly in a single crystal structure
- Patent number 11,099,143
- Issue date Aug 24, 2021
- Rolls-Royce PLC
- Jacqueline Griffiths
- G01 - MEASURING TESTING
Information Patent Grant
Method for non-destructive testing of a turbomachine part
- Patent number 10,996,180
- Issue date May 4, 2021
- SAFRAN AIRCRAFT ENGINES
- Clément Remacha
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method for determining crystal ori...
- Patent number 10,935,505
- Issue date Mar 2, 2021
- Jeol Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Grant
Method for displaying measurement results from x-ray diffraction me...
- Patent number 10,801,976
- Issue date Oct 13, 2020
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...
- Publication number 20240361260
- Publication date Oct 31, 2024
- TOHOKU UNIVERSITY
- Hiroshi JINNAI
- G01 - MEASURING TESTING
Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20240272100
- Publication date Aug 15, 2024
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...
- Publication number 20230280290
- Publication date Sep 7, 2023
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTION-BASED GLOBAL IN VITRO DIAGNOSTIC SYSTEM
- Publication number 20230207074
- Publication date Jun 29, 2023
- Bragg Analytics, Inc.
- Pavel LAZAREV
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYSIS AND DETERMINATION OF HEAVY METAL OCCURRENCE KEY...
- Publication number 20230117820
- Publication date Apr 20, 2023
- Central South University
- Zhang LIN
- G01 - MEASURING TESTING
Information Patent Application
Methods for determining crystal structure and apparatus for carryin...
- Publication number 20230065841
- Publication date Mar 2, 2023
- Fyzikální ústav AV CR, v.v.i.
- Lukas Palatinus
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...
- Publication number 20230031147
- Publication date Feb 2, 2023
- Merck Patent GmbH
- Carolina VON ESSEN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20230003672
- Publication date Jan 5, 2023
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUANTITATIVE ANALYSIS APPARATUS, METHOD AND PROGRAM AND MANUFACTURI...
- Publication number 20220390394
- Publication date Dec 8, 2022
- Rigaku Corporation
- Takahiro KUZUMAKI
- G01 - MEASURING TESTING
Information Patent Application
DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...
- Publication number 20220390392
- Publication date Dec 8, 2022
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
- Publication number 20220317066
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...
- Publication number 20220317068
- Publication date Oct 6, 2022
- Bruker AXS, LLC
- Joerg KAERCHER
- G01 - MEASURING TESTING
Information Patent Application
Full Beam Metrology For X-Ray Scatterometry Systems
- Publication number 20220268714
- Publication date Aug 25, 2022
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR IMPROVING AN EBSD/TKD MAP
- Publication number 20220221412
- Publication date Jul 14, 2022
- BRUKER NANO GMBH
- Daniel Radu GORAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...
- Publication number 20220136985
- Publication date May 5, 2022
- VG SYSTEMS LIMITED
- Austin Penrose DAY
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICE AND METHOD FOR INSPEC...
- Publication number 20220065802
- Publication date Mar 3, 2022
- KIOXIA Corporation
- Nobuhito KUGE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20210302333
- Publication date Sep 30, 2021
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ATOMIC COORDINATES FROM X-RAY DIFFRACTION DATA
- Publication number 20210302332
- Publication date Sep 30, 2021
- David HURWITZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CROSSLINKED FLUOROPOLYMER RESIN AND CONTROL METHOD FOR SAME
- Publication number 20210231636
- Publication date Jul 29, 2021
- Hitachi Metals, Ltd.
- Kazufumi Suenaga
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF CRYSTALLITE SIZE DISTRIBUTION IN POLYCRYSTALLINE MAT...
- Publication number 20210033546
- Publication date Feb 4, 2021
- Bruker AXS, LLC
- Bob Baoping HE
- G01 - MEASURING TESTING
Information Patent Application
Quantitative Phase Analysis Device For Analyzing Non-Crystalline Ph...
- Publication number 20210018452
- Publication date Jan 21, 2021
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR NON-DESTRUCTIVE TESTING OF A TURBOMACHINE PART
- Publication number 20200386695
- Publication date Dec 10, 2020
- SAFRAN
- Clément Remacha
- G01 - MEASURING TESTING
Information Patent Application
Method, Device And Program For Processing Diffraction Images Of A C...
- Publication number 20200349690
- Publication date Nov 5, 2020
- ELECTRICITE DE FRANCE
- Félix Latourte
- G01 - MEASURING TESTING
Information Patent Application
Full Beam Metrology For X-Ray Scatterometry Systems
- Publication number 20200300790
- Publication date Sep 24, 2020
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING FIBER ORIENTATION DEGREE, FIBER ORIENTATION DE...
- Publication number 20200300788
- Publication date Sep 24, 2020
- NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
- Atsuhiko YAMANAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING AN ANOMALY IN A SINGLE CRYSTAL STRUCTURE
- Publication number 20200225171
- Publication date Jul 16, 2020
- Rolls-Royce plc
- Jacqueline GRIFFITHS
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING STRESS
- Publication number 20200141885
- Publication date May 7, 2020
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Hiroyuki TAKAMATSU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INDUCING HIGH-SPEED VARIABLE-TILT WOBBLE M...
- Publication number 20200096459
- Publication date Mar 26, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF DETERMINING THE MINERALOGY OF CALCINED AND FLUX-CALCINED...
- Publication number 20190285560
- Publication date Sep 19, 2019
- EP MINERALS, LLC
- Peter E. Lenz
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Charged Particle Beam Device and Analysis Method
- Publication number 20190204245
- Publication date Jul 4, 2019
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING

analysing diffraction pattern

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for analysis and determination of heavy metal occurrence key...

Device and method for measuring short-wavelength characteristic X-r...

Methods and apparatus for electron backscatter diffraction sample c...

Diffractometer-based global in situ diagnostic system for animals

Diffraction-based global in vitro diagnostic system

Method for the detection and correction of lens distortions in an e...

Methods for determining crystal structure and apparatus for carryin...

Crosslinked fluoropolymer resin and control method for same

Method for improving an EBSD/TKD map

System and method for in-situ X-ray diffraction-based real-time mon...

Screening system

Electron diffraction holography

Determining atomic coordinates from X-ray diffraction data

Degree-of-crystallinity measurement apparatus, degree-of-crystallin...

Methods and systems for acquiring three-dimensional electron diffra...

Apparatus for inspecting semiconductor device and method for inspec...

Energy-dispersive X-ray diffraction analyser comprising a substanti...

Estimating wear for BHA components using borehole hardness

Method, device and program for processing diffraction images of a c...

Electron diffraction holography

Quantitative phase analysis device for analyzing non-crystalline ph...

Measurement of crystallite size distribution in polycrystalline mat...

Method for measuring fiber orientation degree, fiber orientation de...

Full beam metrology for x-ray scatterometry systems

Method for measuring stress

X-ray diffraction and X-ray spectroscopy method and related apparatus

Method of detecting an anomaly in a single crystal structure

Method for non-destructive testing of a turbomachine part

Scanning electron microscope and method for determining crystal ori...

Method for displaying measurement results from x-ray diffraction me...

Patents Applicationslast 30 patents

METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...

BIFOCAL ELECTRON MICROSCOPE

DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...

DIFFRACTION-BASED GLOBAL IN VITRO DIAGNOSTIC SYSTEM

METHOD FOR ANALYSIS AND DETERMINATION OF HEAVY METAL OCCURRENCE KEY...

Methods for determining crystal structure and apparatus for carryin...

SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...

ELECTRON DIFFRACTION HOLOGRAPHY

QUANTITATIVE ANALYSIS APPARATUS, METHOD AND PROGRAM AND MANUFACTURI...

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...

METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...

METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...

Full Beam Metrology For X-Ray Scatterometry Systems

METHOD FOR IMPROVING AN EBSD/TKD MAP

METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...

APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICE AND METHOD FOR INSPEC...

ELECTRON DIFFRACTION HOLOGRAPHY

DETERMINING ATOMIC COORDINATES FROM X-RAY DIFFRACTION DATA

CROSSLINKED FLUOROPOLYMER RESIN AND CONTROL METHOD FOR SAME

MEASUREMENT OF CRYSTALLITE SIZE DISTRIBUTION IN POLYCRYSTALLINE MAT...

Quantitative Phase Analysis Device For Analyzing Non-Crystalline Ph...

METHOD FOR NON-DESTRUCTIVE TESTING OF A TURBOMACHINE PART

Method, Device And Program For Processing Diffraction Images Of A C...

Full Beam Metrology For X-Ray Scatterometry Systems

METHOD FOR MEASURING FIBER ORIENTATION DEGREE, FIBER ORIENTATION DE...

METHOD OF DETECTING AN ANOMALY IN A SINGLE CRYSTAL STRUCTURE

METHOD FOR MEASURING STRESS

APPARATUS AND METHOD FOR INDUCING HIGH-SPEED VARIABLE-TILT WOBBLE M...

METHODS OF DETERMINING THE MINERALOGY OF CALCINED AND FLUX-CALCINED...

Charged Particle Beam Device and Analysis Method