Analysis of signal quality

Industry

CPC
G01R31/31708

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31708Analysis of signal quality

Industries

Patents Grantslast 30 patents

Information Patent Grant
Cyclic loop image representation for waveform data
- Patent number 12,092,692
- Issue date Sep 17, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for detecting glitch at high sampling rate
- Patent number 11,965,929
- Issue date Apr 23, 2024
- UESTC (Shenzhen) Advanced Research Institute
- Zhijian Dai
- G01 - MEASURING TESTING
Information Patent Grant
Identifying data valid windows
- Patent number 11,815,554
- Issue date Nov 14, 2023
- Micron Technology, Inc.
- Phillip A. Rasmussen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal processing apparatus and method for mixing a high frequency...
- Patent number 11,815,550
- Issue date Nov 14, 2023
- Rohde & Schwarz GmbH & Co. KG
- Kay-Uwe Sander
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Transition fault testing of functionally asynchronous paths in an i...
- Patent number 11,709,203
- Issue date Jul 25, 2023
- Texas Instruments Incorporated
- Prakash Narayanan
- G01 - MEASURING TESTING
Information Patent Grant
Low frequency S-parameter measurement
- Patent number 11,598,805
- Issue date Mar 7, 2023
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of internal wire delay
- Patent number 11,567,128
- Issue date Jan 31, 2023
- Micron Technology, Inc.
- Toshiyuki Sato
- G01 - MEASURING TESTING
Information Patent Grant
Signal analyzer and method of analyzing a signal
- Patent number 11,402,430
- Issue date Aug 2, 2022
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal analysis method and measurement instrument
- Patent number 11,346,884
- Issue date May 31, 2022
- Rohde & Schwarz GmbH & Co. KG
- Adrian Ispas
- G01 - MEASURING TESTING
Information Patent Grant
Transistion fault testing of funtionally asynchronous paths in an i...
- Patent number 11,300,615
- Issue date Apr 12, 2022
- Texas Instruments Incorporated
- Prakash Narayanan
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatuses including probe card for testing semiconductor dev...
- Patent number 11,243,232
- Issue date Feb 8, 2022
- Samsung Electronics Co., Ltd.
- Gyuyeol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Tester and method for testing a device under test and tester and me...
- Patent number 11,105,855
- Issue date Aug 31, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Noise source monitoring apparatus and noise source monitoring method
- Patent number 11,029,358
- Issue date Jun 8, 2021
- FANUC CORPORATION
- Makine Yuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cross-correlation measurements for modulation quality measurements
- Patent number 10,841,019
- Issue date Nov 17, 2020
- National Instruments Corporation
- Syed Jaffar Shah
- G01 - MEASURING TESTING
Information Patent Grant
Crosstalk generation and detection for digital isolators
- Patent number 10,805,123
- Issue date Oct 13, 2020
- Texas Instruments Incorporated
- Atul Singh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Technique for determining performance characteristics of electronic...
- Patent number 10,782,344
- Issue date Sep 22, 2020
- RAMBUS INC.
- Haw-Jyh Liaw
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for duty cycle measurement, analysis, and compe...
- Patent number 10,775,431
- Issue date Sep 15, 2020
- SanDisk Technologies LLC
- Hitoshi Miwa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and semiconductor system
- Patent number 10,651,163
- Issue date May 12, 2020
- SK hynix Inc.
- Jung Hyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for providing automation of microprocessor analog...
- Patent number 10,613,143
- Issue date Apr 7, 2020
- Hamilton Sundstrand Corporation
- Lon R. Hoegberg
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method, device and article to test digital circuits
- Patent number 10,578,672
- Issue date Mar 3, 2020
- STMicroelectronics (Grenoble 2) SAS
- David Jacquet
- G01 - MEASURING TESTING
Information Patent Grant
Backplane testing system
- Patent number 10,352,996
- Issue date Jul 16, 2019
- Dell Products L.P.
- Umesh Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuits for integrated circuit counterfeit detection
- Patent number 10,254,334
- Issue date Apr 9, 2019
- National Technology & Engineering Solutions of Sandia, LLC
- Ryan Helinski
- G01 - MEASURING TESTING
Information Patent Grant
Eye pattern measurement apparatus, and clock and data recovery syst...
- Patent number 10,168,385
- Issue date Jan 1, 2019
- MStar Semiconductor, Inc.
- Wen cai Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor chip, test system, and method of testing the semicond...
- Patent number 10,132,865
- Issue date Nov 20, 2018
- Samsung Electronics Co., Ltd.
- Seon-kyoo Lee
- G01 - MEASURING TESTING
Information Patent Grant
Processing method and electronic apparatus for digital signal
- Patent number 10,114,072
- Issue date Oct 30, 2018
- MStar Semiconductor, Inc.
- Yuan Yuan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and semiconductor system
- Patent number 10,090,288
- Issue date Oct 2, 2018
- SK hynix Inc.
- Jung Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing spectral purity in high-speed testing
- Patent number 10,012,694
- Issue date Jul 3, 2018
- AAI Corporation
- James Joseph Jaklitsch
- G01 - MEASURING TESTING
Information Patent Grant
Signal quality detection circuit for generating signal quality dete...
- Patent number 10,002,650
- Issue date Jun 19, 2018
- Mediatek Inc.
- Pin-Huan Hsu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Technique for determining performance characteristics of electronic...
- Patent number 9,977,076
- Issue date May 22, 2018
- Rambus Inc.
- Haw-Jyh Liaw
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-wire electrical parameter measurements via test patterns
- Patent number 9,832,094
- Issue date Nov 28, 2017
- QUALCOMM Incorporated
- George Alan Wiley
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ANALYZING A DEMODULATED MEASUREMENT SIGNAL, COMPUTER-REA...
- Publication number 20250004050
- Publication date Jan 2, 2025
- ROHDE &SCHWARZ GMBH & CO. KG
- PB BALASUBRAMANIUM
- G01 - MEASURING TESTING
Information Patent Application
GENERATING A TEST PROGRAM
- Publication number 20240426906
- Publication date Dec 26, 2024
- Teradyne, Inc.
- Charles J. Carline
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION DEVICE AND METHOD
- Publication number 20240036075
- Publication date Feb 1, 2024
- Rohde& Schwarz GmbH & Co. KG
- Christoph HOLZLEITNER
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ABNORMALITY DETECTION SYSTEM AND METHOD THEREOF
- Publication number 20230341464
- Publication date Oct 26, 2023
- ASUSTEK COMPUTER INC.
- Hung-Ju Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OSCILLATION HANDLING METHOD, APPARATUS USING THE SAME, AND STORAGE...
- Publication number 20230280397
- Publication date Sep 7, 2023
- SHENZHEN HUAPTEC CO., LTD.
- Chuanzhen OU
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUE FOR ENABLING ON-DIE NOISE MEASUREMENT DURING ATE TESTING...
- Publication number 20230146920
- Publication date May 11, 2023
- NVIDIA Corporation
- Bonita Bhaskaran
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING GLITCH AT HIGH SAMPLING RATE
- Publication number 20230061075
- Publication date Mar 2, 2023
- UESTC (Shenzhen) Advanced Research Institute
- Zhijian DAI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL OPERATING DEVICE AND METHOD FOR RECOGNIZING MALFUNCTIONS
- Publication number 20220244310
- Publication date Aug 4, 2022
- Siemens Aktiengesellschaft
- Dennis Persdorf
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TRANSISTION FAULT TESTING OF FUNTIONALLY ASYNCHRONOUS PATHS IN AN I...
- Publication number 20220196738
- Publication date Jun 23, 2022
- TEXAS INSTRUMENTS INCORPORATED
- PRAKASH NARAYANAN
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD FOR HIGH-SPEED SIGNAL FREQUENCY MEASUREMENT AND SIGNAL...
- Publication number 20220187350
- Publication date Jun 16, 2022
- NANJING MACROTEST SEMICONDUCTOR TECHNOLOGY CO., LTD.
- CHUNWEI XIAO
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING APPARATUS AND METHOD FOR MIXING A HIGH FREQUENCY...
- Publication number 20220043061
- Publication date Feb 10, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Kay-Uwe Sander
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD FOR SEPARATION AND CLASSIFICATION OF SIGNALS USIN...
- Publication number 20210390456
- Publication date Dec 16, 2021
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT OF INTERNAL WIRE DELAY
- Publication number 20210356520
- Publication date Nov 18, 2021
- Micron Technology, Inc.
- Toshiyuki Sato
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ANALYZER AND METHOD OF ANALYZING A SIGNAL
- Publication number 20210223312
- Publication date Jul 22, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR AUTOMATED MEASUREMENT OF SEVERAL...
- Publication number 20210018561
- Publication date Jan 21, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Matthias RUENGELER
- G01 - MEASURING TESTING
Information Patent Application
LOW FREQUENCY S-PARAMETER MEASUREMENT
- Publication number 20200386809
- Publication date Dec 10, 2020
- Tektronix, Inc.
- John J. PICKERD
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUSES INCLUDING PROBE CARD FOR TESTING SEMICONDUCTOR DEV...
- Publication number 20200386786
- Publication date Dec 10, 2020
- Samsung Electronics Co., Ltd.
- Gyuyeol KIM
- G01 - MEASURING TESTING
Information Patent Application
NOISE SOURCE MONITORING APPARATUS AND NOISE SOURCE MONITORING METHOD
- Publication number 20200018793
- Publication date Jan 16, 2020
- FANUC CORPORATION
- Makine YUYAMA
- G01 - MEASURING TESTING
Information Patent Application
TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...
- Publication number 20190377027
- Publication date Dec 12, 2019
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROVIDING AUTOMATION OF MICROPROCESSOR ANALOG...
- Publication number 20190302182
- Publication date Oct 3, 2019
- HAMILTON SUNDSTRAND CORPORATION
- Lon R. Hoegberg
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Duty Cycle Measurement, Analysis, and Compe...
- Publication number 20190004111
- Publication date Jan 3, 2019
- SanDisk Technologies LLC
- Hitoshi Miwa
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM
- Publication number 20180366458
- Publication date Dec 20, 2018
- SK HYNIX INC.
- Jung Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
Technique for Determining Performance Characteristics Of Electronic...
- Publication number 20180335477
- Publication date Nov 22, 2018
- RAMBUS INC.
- Haw-Jyh Liaw
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST CIRCUITS FOR INTEGRATED CIRCUIT COUNTERFEIT DETECTION
- Publication number 20180328984
- Publication date Nov 15, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Ryan Helinski
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SIGNAL QUALITY DETECTION CIRCUIT FOR GENERATING SIGNAL QUALITY DETE...
- Publication number 20180174626
- Publication date Jun 21, 2018
- MEDIATEK INC.
- Pin-Huan Hsu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROCESSING METHOD AND ELECTRONIC APPARATUS FOR DIGITAL SIGNAL
- Publication number 20180080985
- Publication date Mar 22, 2018
- Mstar Semiconductor, Inc.
- Yuan Yuan
- G01 - MEASURING TESTING
Information Patent Application
NOISE DETECTION CIRCUIT AND SEMICONDUCTOR SYSTEM USING THE SAME
- Publication number 20170236598
- Publication date Aug 17, 2017
- SK HYNIX INC.
- Tae Wook KANG
- G01 - MEASURING TESTING
Information Patent Application
Technique for Determining Performance Characteristics Of Electronic...
- Publication number 20170199242
- Publication date Jul 13, 2017
- RAMBUS INC.
- Haw-Jyh Liaw
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICE AND ARTICLE TO TEST DIGITAL CIRCUITS
- Publication number 20170192053
- Publication date Jul 6, 2017
- STMicroelectronics (Grenoble 2) SAS
- David Jacquet
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INJECTING FAULT AND ANALYZING FAULT TOLERANCE
- Publication number 20160334467
- Publication date Nov 17, 2016
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Yong-Cheol CHO
- G01 - MEASURING TESTING

Analysis of signal quality

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cyclic loop image representation for waveform data

Method and system for detecting glitch at high sampling rate

Identifying data valid windows

Signal processing apparatus and method for mixing a high frequency...

Transition fault testing of functionally asynchronous paths in an i...

Low frequency S-parameter measurement

Measurement of internal wire delay

Signal analyzer and method of analyzing a signal

Signal analysis method and measurement instrument

Transistion fault testing of funtionally asynchronous paths in an i...

Test apparatuses including probe card for testing semiconductor dev...

Tester and method for testing a device under test and tester and me...

Noise source monitoring apparatus and noise source monitoring method

Cross-correlation measurements for modulation quality measurements

Crosstalk generation and detection for digital isolators

Technique for determining performance characteristics of electronic...

Systems and methods for duty cycle measurement, analysis, and compe...

Semiconductor device and semiconductor system

System and method for providing automation of microprocessor analog...

Method, device and article to test digital circuits

Backplane testing system

Test circuits for integrated circuit counterfeit detection

Eye pattern measurement apparatus, and clock and data recovery syst...

Semiconductor chip, test system, and method of testing the semicond...

Processing method and electronic apparatus for digital signal

Semiconductor device and semiconductor system

Enhancing spectral purity in high-speed testing

Signal quality detection circuit for generating signal quality dete...

Technique for determining performance characteristics of electronic...

Multi-wire electrical parameter measurements via test patterns

Patents Applicationslast 30 patents

METHOD FOR ANALYZING A DEMODULATED MEASUREMENT SIGNAL, COMPUTER-REA...

GENERATING A TEST PROGRAM

MEASUREMENT APPLICATION DEVICE AND METHOD

SIGNAL ABNORMALITY DETECTION SYSTEM AND METHOD THEREOF

OSCILLATION HANDLING METHOD, APPARATUS USING THE SAME, AND STORAGE...

TECHNIQUE FOR ENABLING ON-DIE NOISE MEASUREMENT DURING ATE TESTING...

METHOD AND SYSTEM FOR DETECTING GLITCH AT HIGH SAMPLING RATE

ELECTRICAL OPERATING DEVICE AND METHOD FOR RECOGNIZING MALFUNCTIONS

TRANSISTION FAULT TESTING OF FUNTIONALLY ASYNCHRONOUS PATHS IN AN I...

TEST METHOD FOR HIGH-SPEED SIGNAL FREQUENCY MEASUREMENT AND SIGNAL...

SIGNAL PROCESSING APPARATUS AND METHOD FOR MIXING A HIGH FREQUENCY...

SYSTEM AND METHOD FOR SEPARATION AND CLASSIFICATION OF SIGNALS USIN...

MEASUREMENT OF INTERNAL WIRE DELAY

SIGNAL ANALYZER AND METHOD OF ANALYZING A SIGNAL

MEASUREMENT SYSTEM AND METHOD FOR AUTOMATED MEASUREMENT OF SEVERAL...

LOW FREQUENCY S-PARAMETER MEASUREMENT

TEST APPARATUSES INCLUDING PROBE CARD FOR TESTING SEMICONDUCTOR DEV...

NOISE SOURCE MONITORING APPARATUS AND NOISE SOURCE MONITORING METHOD

TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...

SYSTEM AND METHOD FOR PROVIDING AUTOMATION OF MICROPROCESSOR ANALOG...

Systems and Methods for Duty Cycle Measurement, Analysis, and Compe...

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM

Technique for Determining Performance Characteristics Of Electronic...

TEST CIRCUITS FOR INTEGRATED CIRCUIT COUNTERFEIT DETECTION

SIGNAL QUALITY DETECTION CIRCUIT FOR GENERATING SIGNAL QUALITY DETE...

PROCESSING METHOD AND ELECTRONIC APPARATUS FOR DIGITAL SIGNAL

NOISE DETECTION CIRCUIT AND SEMICONDUCTOR SYSTEM USING THE SAME

Technique for Determining Performance Characteristics Of Electronic...

METHOD, DEVICE AND ARTICLE TO TEST DIGITAL CIRCUITS

METHOD AND APPARATUS FOR INJECTING FAULT AND ANALYZING FAULT TOLERANCE