Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES

G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

G01R31/001Measuring interference from external sources to, or emission from, the device under test G01R31/002where the device under test is an electronic circuit G01R31/003Environmental or reliability tests G01R31/005Testing of electric installations on transport means G01R31/006on road vehicles G01R31/007using microprocessors or computers G01R31/008on air- or spacecraft, railway rolling stock or sea-going vessels G01R31/01Subjecting similar articles in turn to test G01R31/013Testing passive components G01R31/016Testing of capacitors G01R31/02Testing of electric apparatus, lines or components, for short-circuits, discontinuities, leakage of current , or incorrect line connection G01R31/021Testing of cables or conductors G01R31/022Testing while the cable or conductor passes continuously the testing apparatus G01R31/023Identification of wires in a multicore cable G01R31/024Arrangements for indicating continuity or short-circuits in electric apparatus or lines, leakage or ground faults G01R31/025Testing short circuits, leakage or ground faults G01R31/026Testing continuity G01R31/027Testing of transformers G01R31/028Testing of capacitors G01R31/04Testing connections G01R31/041Testing of correct wire connections in electrical apparatus and circuits G01R31/043of releaseable connections G01R31/045of plugs, sockets or terminals at the end of a cable or a wire harness; of wall sockets; of power sockets in appliances G01R31/046of connections between components and printed circuit boards (PCB's) G01R31/048Details concerning testing solder joints G01R31/06Testing of electric windings G01R31/07Testing of fuses G01R31/08Locating faults in cables, transmission lines, or networks G01R31/081according to type of conductors G01R31/083in cables G01R31/085in power transmission or distribution lines, e.g.overhead G01R31/086in power transmission or distribution networks G01R31/088Aspects of digital computing G01R31/10by increasing destruction at fault G01R31/11using pulse reflection methods G01R31/12Testing dielectric strength or breakdown voltage; Testing or monitoring effectiveness or level of insulation G01R31/1209using acoustic measurements G01R31/1218using optical methods; using charged particle G01R31/1227of components, parts or materials G01R31/1236of surge arresters G01R31/1245of line insulators or spacers G01R31/1254of gas-insulated power appliances or vacuum gaps G01R31/1263of solid or fluid materials G01R31/1272of cable, line or wire insulation G01R31/1281of liquids or gases G01R31/129of components or parts made of semiconducting materials; of LV components or parts G01R31/14Circuits therefor G01R31/16Construction of testing vessels Electrodes therefor G01R31/18Subjecting similar articles in turn to test G01R31/20Preparation of articles or specimens to facilitate testing G01R31/24Testing of discharge tubes G01R31/245Testing of gas discharge tubes G01R31/25Testing of vacuum tubes G01R31/252Testing of electron multipliers G01R31/255Testing of transit-time tubes G01R31/257Testing of beam-tubes G01R31/26Testing of individual semiconductor devices G01R31/2601Apparatus or methods therefor G01R31/2603for curve tracing of semiconductor characteristics G01R31/2607Circuits therefor G01R31/2608for testing bipolar transistors G01R31/261for measuring break-down voltage or punch through voltage therefor G01R31/2612for measuring frequency response characteristics G01R31/2614for measuring gain factor thereof G01R31/2616for measuring noise G01R31/2617for measuring switching properties thereof G01R31/2619for measuring thermal properties thereof G01R31/2621for testing field effect transistors G01R31/2623for measuring break-down voltage therefor G01R31/2625for measuring gain factor thereof G01R31/2626for measuring noise G01R31/2628for measuring thermal properties thereof G01R31/263for testing thyristors G01R31/2632for testing diodes G01R31/2633for measuring switching properties thereof G01R31/2635Testing light-emitting diodes, laser diodes or photodiodes G01R31/2637for testing other individual devices G01R31/2639for testing field-effect devices G01R31/2641for testing charge coupled devices G01R31/2642Testing semiconductor operation lifetime or reliability G01R31/2644Adaptations of individual semiconductor devices to facilitate the testing thereof G01R31/2646for measuring noise G01R31/2648Characterising semiconductor materials G01R31/265Contactless testing G01R31/2653using electron beams G01R31/2656using non-ionising electromagnetic radiation G01R31/27Testing of devices without physical removal from the circuit of which they form part G01R31/275for testing individual semiconductor components within integrated circuits G01R31/28Testing of electronic circuits G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] G01R31/2803by means of functional tests G01R31/2805Bare printed circuit boards G01R31/2806Apparatus therefor G01R31/2808Holding, conveying or contacting devices G01R31/281Specific types of tests or tests for a specific type of fault G01R31/2812Checking for open circuits or shorts G01R31/2813Checking the presence, location, orientation or value G01R31/2815Functional tests G01R31/2817Environmental-, stress-, or burn-in tests G01R31/2818using test structures on, or modifications of, the card under test, made for the purpose of testing G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere G01R31/2822of microwave or radiofrequency circuits G01R31/2824testing of oscillators or resonators G01R31/2825in household appliances or professional audio/video equipment G01R31/2827Testing of electronic protection circuits G01R31/2829Testing of circuits in sensor or actuator systems G01R31/2831Testing of materials or semi-finished products G01R31/2832Specific tests of electronic circuits not provided for elsewhere G01R31/2834Automated test systems [ATE]; using microprocessors or computers G01R31/2836Fault-finding or characterising G01R31/2837Characterising or performance testing G01R31/2839using signal generators, power supplies or circuit analysers G01R31/2841Signal generators G01R31/2843In-circuit-testing G01R31/2844using test interfaces G01R31/2846using hard- or software simulation or using knowledge-based systems G01R31/2848using simulation G01R31/2849Environmental or reliability testing G01R31/2851Testing of integrated circuits [IC] G01R31/2853Electrical testing of internal connections or -isolation G01R31/2855Environmental, reliability or burn-in testing G01R31/2856Internal circuit aspects G01R31/2858Measuring of material aspects G01R31/286External aspects G01R31/2862Chambers or ovens; Tanks G01R31/2863Contacting devices G01R31/2865Holding devices G01R31/2867Handlers or transport devices G01R31/2868Complete testing stations; systems; procedures; software aspects G01R31/287Procedures; Software aspects G01R31/2872related to electrical or environmental aspects G01R31/2874related to temperature G01R31/2875related to heating G01R31/2877related to cooling G01R31/2879related to electrical aspects G01R31/2881related to environmental aspects other than temperature G01R31/2882Testing timing characteristics G01R31/2884using dedicated test connectors, test elements or test circuits on the IC under test G01R31/2886Features relating to contacting the IC under test G01R31/2887involving moving the probe head or the IC under test; docking stations G01R31/2889Interfaces G01R31/2891related to sensing or controlling of force, position, temperature G01R31/2893Handling, conveying or loading G01R31/2894Aspects of quality control [QC] G01R31/2896Testing of IC packages; Test features related to IC packages G01R31/2898Sample preparation G01R31/30Marginal testing G01R31/3004Current or voltage test G01R31/3008Quiescent current [IDDQ] test or leakage current test G01R31/3012Built-In-Current test [BIC] G01R31/3016Delay or race condition test G01R31/302Contactless testing G01R31/3025Wireless interface with the DUT G01R31/303of integrated circuits G01R31/304of printed or hybrid circuits G01R31/305using electron beams G01R31/306of printed or hybrid circuits G01R31/307of integrated circuits G01R31/308using non-ionising electromagnetic radiation G01R31/309of printed or hybrid circuits or circuit substrates G01R31/311of integrated circuits G01R31/312by capacitive methods G01R31/315by inductive methods G01R31/316Testing of analog circuits G01R31/3161Marginal testing G01R31/3163Functional testing G01R31/3167Testing of combined analog and digital circuits G01R31/317Testing of digital circuits G01R31/31701Arrangements for setting the Unit Under Test [UUT] in a test mode G01R31/31702Testing digital circuits including elements other than semiconductor transistors G01R31/31703Comparison aspects G01R31/31704Design for test; Design verification G01R31/31705Debugging aspects G01R31/31706involving differential digital signals G01R31/31707Test strategies G01R31/31708Analysis of signal quality G01R31/31709Jitter measurements; Jitter generators G01R31/3171BER [Bit Error Rate] test G01R31/31711Evaluation methods G01R31/31712Input or output aspects G01R31/31713Input or output interfaces for test G01R31/31715Testing of input or output circuits; test of circuitry between the I/C pins and the functional core G01R31/31716Testing of input or output with loop-back G01R31/31717Interconnect testing G01R31/31718Logistic aspects G01R31/31719Security aspects G01R31/3172Optimisation aspects G01R31/31721Power aspects G01R31/31722Addressing or selecting of test units G01R31/31723Hardware for routing the test signal within the device under test to the circuits to be tested G01R31/31724Test controller G01R31/31725Timing aspects G01R31/31726Synchronization G01R31/31727Clock circuits aspects G01R31/31728Optical aspects G01R31/3173Marginal testing G01R31/3177Testing of logic operation G01R31/3181Functional testing G01R31/31813Test pattern generators G01R31/31816Soft error testing; Soft error rate evaluation; Single event testing G01R31/3183Generation of test inputs G01R31/318307computer-aided G01R31/318314Tools G01R31/318321for combinational circuits G01R31/318328for delay tests G01R31/318335Test pattern compression or decompression G01R31/318342by preliminary fault modelling G01R31/31835Analysis of test coverage or failure detectability G01R31/318357Simulation G01R31/318364as a result of hardware simulation G01R31/318371Methodologies therefor G01R31/318378of patterns for devices arranged in a network G01R31/318385Random or pseudo-random test pattern G01R31/318392for sequential circuits G01R31/3185Reconfiguring for testing G01R31/318502Test of Combinational circuits G01R31/318505Test of Modular systems G01R31/318508Board Level Test G01R31/318511Wafer Test G01R31/318513Test of Multi-Chip-Moduls G01R31/318516Test of programmable logic devices [PLDs] G01R31/318519Test of field programmable gate arrays [FPGA] G01R31/318522Test of Sequential circuits G01R31/318525Test of flip-flops or latches G01R31/318527Test of counters G01R31/31853Test of registers G01R31/318533using scanning techniques G01R31/318536Scan chain arrangements G01R31/318538Topological or mechanical aspects G01R31/318541Scan latches or cell details G01R31/318544Scanning methods, algorithms and patterns G01R31/318547Data generators or compressors G01R31/31855Interconnection testing G01R31/318552Clock circuits details G01R31/318555Control logic G01R31/318558Addressing or selecting of subparts of the device under test G01R31/318561Identification of the subpart G01R31/318563Multiple simultaneous testing of subparts G01R31/318566Comparators; Diagnosing the device under test G01R31/318569Error indication, logging circuits G01R31/318572Input/Output interfaces G01R31/318575Power distribution; Power saving G01R31/318577AC testing G01R31/31858Delay testing G01R31/318583Design for test G01R31/318586with partial scan or non-scannable parts G01R31/318588Security aspects G01R31/318591Tools G01R31/318594Timing aspects G01R31/318597JTAG or boundary scan test of memory devices G01R31/3187Built-in tests G01R31/319Tester hardware G01R31/31901Analysis of tester Performance; Tester characterization G01R31/31903tester configuration G01R31/31905Interface with the device under test [DUT] G01R31/31907Modular tester G01R31/31908Tester set-up G01R31/3191Calibration G01R31/31912Tester/user interface G01R31/31914Portable Testers G01R31/31915In-circuit Testers G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT] G01R31/31919Storing and outputting test patterns G01R31/31921using compression techniques G01R31/31922Timing generation or clock distribution G01R31/31924Voltage or current aspects G01R31/31926Routing signals to or from the device under test [DUT] G01R31/31928Formatter G01R31/3193with comparison between actual response and known fault free response G01R31/31932Comparators G01R31/31935Storing data G01R31/31937Timing aspects G01R31/327Testing of circuit interrupters, switches or circuit-breakers G01R31/3271of high voltage or medium voltage devices G01R31/3272Apparatus, systems or circuits therefor G01R31/3274Details related to measuring G01R31/3275Fault detection or status indication G01R31/3277of low voltage devices G01R31/3278of relays, solenoids or reed switches G01R31/333Testing of the switching capacity of high-voltage circuit-breakers; Testing of breaking capacity or related variables G01R31/3333Apparatus, systems or circuits therefor G01R31/3336Synthetic testing G01R31/34Testing dynamo-electric machines G01R31/343in operation G01R31/346Testing of armature or field windings G01R31/36Apparatus for testing electrical condition of accumulators or electric batteries G01R31/3606Monitoring, i.e. measuring or determining some variables continuously or repeatedly over time G01R31/361using current integration G01R31/3613without voltage measurement G01R31/3617using analog integrators G01R31/362based on measuring voltage only G01R31/3624based on combined voltage and current measurement G01R31/3627Testing, i.e. making a one-time determination of some variables G01R31/3631based on the use of test loads G01R31/3634for determining the ampere-hour charge capacity or state-of-charge (SoC) G01R31/3637based on voltage measurements G01R31/3641related to manufacture G01R31/3644Various constructional arrangements G01R31/3648comprising digital calculation means G01R31/3651Software aspects G01R31/3655the digital calculation means being combined with the battery or battery pack G01R31/3658for testing or monitoring individual cells or groups of cells in a battery G01R31/3662involving measuring the internal battery impedance, conductance or related variables G01R31/3665whereby the type of battery is of primary emphasis G01R31/3668Lead-acid batteries G01R31/3672Primary cells G01R31/3675for compensating for temperature or ageing G01R31/3679for determining battery ageing or deterioration G01R31/3682for indicating electrical conditions or variables G01R31/3686the indicator being combined with the battery G01R31/3689the indication being remote from the battery G01R31/3693for determining the ability of a battery to perform a critical function G01R31/3696Battery pole connectors combined with measurement function G01R31/40Testing power supplies G01R31/42AC power supplies G01R31/44Testing lamps