Analysis of tester Performance; Tester characterization

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CPC
G01R31/31901

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31901Analysis of tester Performance; Tester characterization

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of finding optimized analog measurement hardware settings as...
- Patent number 12,140,630
- Issue date Nov 12, 2024
- Rohde & Schwarz GmbH & Co. KG
- Darren Tipton
- G01 - MEASURING TESTING
Information Patent Grant
Multi-rate sampling for hierarchical system analysis
- Patent number 11,774,498
- Issue date Oct 3, 2023
- International Business Machines Corporation
- David Wells Winston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing device and method
- Patent number 11,513,152
- Issue date Nov 29, 2022
- Siliconware Precision Industries Co., Ltd.
- Wen-Chin Liang
- G01 - MEASURING TESTING
Information Patent Grant
Self test for safety logic
- Patent number 11,320,488
- Issue date May 3, 2022
- Texas Instruments Incorporated
- Sundarrajan Rangachari
- G01 - MEASURING TESTING
Information Patent Grant
Correction of transmission line induced phase and amplitude errors...
- Patent number 11,215,655
- Issue date Jan 4, 2022
- Compass Technology Group, LLC
- John Weber Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Self test for safety logic
- Patent number 10,935,602
- Issue date Mar 2, 2021
- Texas Instruments Incorporated
- Sundarrajan Rangachari
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor able to identify an error condition
- Patent number 10,921,373
- Issue date Feb 16, 2021
- ALLEGRO MICROSYSTEMS, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for testing a tester
- Patent number 10,794,955
- Issue date Oct 6, 2020
- Optimal Plus Ltd.
- Hagay Gur
- G01 - MEASURING TESTING
Information Patent Grant
Built-in device testing of integrated circuits
- Patent number 10,768,230
- Issue date Sep 8, 2020
- International Business Machines Corporation
- Robert M. Casatuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery monitoring system, signal transmission method, and semicond...
- Patent number 10,564,225
- Issue date Feb 18, 2020
- Lapis Semiconductor Co., Ltd.
- Masato Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Test system for measuring propagation delay time of transmission line
- Patent number 10,304,708
- Issue date May 28, 2019
- Samsung Electronics Co., Ltd.
- Gyuyeol Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhancing spectral purity in high-speed testing
- Patent number 10,012,694
- Issue date Jul 3, 2018
- AAI Corporation
- James Joseph Jaklitsch
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring relative frequency response of a...
- Patent number 9,980,070
- Issue date May 22, 2018
- Cirrus Logic, Inc.
- Samuel Ponvarma Ebenezer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Self test for safety logic
- Patent number 9,964,597
- Issue date May 8, 2018
- Texas Instruments Incorporated
- Sundarrajan Rangachari
- G01 - MEASURING TESTING
Information Patent Grant
Multi-wire electrical parameter measurements via test patterns
- Patent number 9,832,094
- Issue date Nov 28, 2017
- QUALCOMM Incorporated
- George Alan Wiley
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus, test method, calibration device, and calibration me...
- Patent number 9,791,512
- Issue date Oct 17, 2017
- Advantest Corporation
- Shin Masuda
- G01 - MEASURING TESTING
Information Patent Grant
Determining electrical path length
- Patent number 9,784,555
- Issue date Oct 10, 2017
- Teradyne, Inc.
- Marc Spehlmann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for measuring relative frequency response of a...
- Patent number 9,674,626
- Issue date Jun 6, 2017
- Cirrus Logic, Inc.
- Samuel Ponvarma Ebenezer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test circuit and method for processing a test routine
- Patent number 9,116,875
- Issue date Aug 25, 2015
- Infineon Technologies AG
- Bernhard Moessler
- G01 - MEASURING TESTING
Information Patent Grant
Integrated cross-tester analysis and real-time adaptive test
- Patent number 8,855,959
- Issue date Oct 7, 2014
- International Business Machines Corporation
- Mark C. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and recording medium
- Patent number 8,407,522
- Issue date Mar 26, 2013
- Advantest Corporation
- Koji Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment self test
- Patent number 7,936,172
- Issue date May 3, 2011
- Honeywell International Inc.
- Kenny Nordstrom
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic program, a switching program, a testing apparatus, and a...
- Patent number 7,802,140
- Issue date Sep 21, 2010
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 7,696,771
- Issue date Apr 13, 2010
- Advantest Corporation
- Koichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Using statistical signatures for testing high-speed circuits
- Patent number 7,661,052
- Issue date Feb 9, 2010
- International Business Machines Corporation
- Hayden C. Cranford, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 7,543,199
- Issue date Jun 2, 2009
- Hynix Semiconductor, Inc
- Jae-Il Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for quantifying the timing error induced by an...
- Patent number 7,536,663
- Issue date May 19, 2009
- Verigy (Singapore) Pte. Ltd.
- Hiroshi Matsumiya
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Calibrating a testing device
- Patent number 7,480,581
- Issue date Jan 20, 2009
- Teradyne, Inc.
- Edward Roger Lew
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for monitoring the functionality of a wafer pr...
- Patent number 7,453,261
- Issue date Nov 18, 2008
- Xilinx, Inc.
- David Mark
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for identifying system links
- Patent number 7,434,128
- Issue date Oct 7, 2008
- Hewlett-Packard Development Company, L.P.
- Steven Wayne Terry
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAULT DETECTION IN PARALLEL HARDWARE
- Publication number 20240402250
- Publication date Dec 5, 2024
- NVIDIA Corporation
- Saurabh Hukerikar
- G01 - MEASURING TESTING
Information Patent Application
METHOD, CENTRAL TEST CONTROL UNIT, MEASUREMENT SYSTEM
- Publication number 20240241175
- Publication date Jul 18, 2024
- Rohde& Schwarz GmbH & Co. KG
- Thomas BRAUNSTORFINGER
- G01 - MEASURING TESTING
Information Patent Application
SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20240175922
- Publication date May 30, 2024
- Rohm Co., Ltd.
- Ryosuke SUMII
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM
- Publication number 20230288476
- Publication date Sep 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Huan LU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF FINDING OPTIMIZED ANALOG MEASUREMENT HARDWARE SETTINGS AS...
- Publication number 20230184832
- Publication date Jun 15, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Darren Tipton
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED VERIFICATION OF INTEGRATED CIRCUITS
- Publication number 20230076636
- Publication date Mar 9, 2023
- Celera, Inc.
- Calum MacRae
- G01 - MEASURING TESTING
Information Patent Application
USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREM...
- Publication number 20230012393
- Publication date Jan 12, 2023
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Application
MULTI-RATE SAMPLING FOR HIERARCHICAL SYSTEM ANALYSIS
- Publication number 20220390514
- Publication date Dec 8, 2022
- International Business Machines Corporation
- David Wells Winston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING DEVICE AND METHOD
- Publication number 20220196731
- Publication date Jun 23, 2022
- Siliconware Precision Industries Co., Ltd.
- Wen-Chin Liang
- G01 - MEASURING TESTING
Information Patent Application
Self Test for Safety Logic
- Publication number 20210148976
- Publication date May 20, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Sundarrajan Rangachari
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR TESTING A TESTER
- Publication number 20200116789
- Publication date Apr 16, 2020
- Optimal Plus Ltd.
- Hagay GUR
- G01 - MEASURING TESTING
Information Patent Application
An interferometric IQ-mixer/DAC solution for active, high speed vec...
- Publication number 20190391193
- Publication date Dec 26, 2019
- Vertigo Technologies B.V.
- Marco Spirito
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Magnetic Field Sensor Able To Identify An Error Condition
- Publication number 20190162784
- Publication date May 30, 2019
- Allegro Microsystems, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING
Information Patent Application
Self Test for Safety Logic
- Publication number 20180252771
- Publication date Sep 6, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Sundarrajan Rangachari
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND METHOD
- Publication number 20160011264
- Publication date Jan 14, 2016
- ACCTON TECHNOLOGY CORPORATION
- Kuo-En CHIU
- G01 - MEASURING TESTING
Information Patent Application
MULTI-WIRE ELECTRICAL PARAMETER MEASUREMENTS VIA TEST PATTERNS
- Publication number 20150271037
- Publication date Sep 24, 2015
- QUALCOMM Incorporated
- George Alan Wiley
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD, CALIBRATION DEVICE, AND CALIBRATION ME...
- Publication number 20150253388
- Publication date Sep 10, 2015
- Advantest Corporation
- Shin MASUDA
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND METHOD FOR PROCESSING A TEST ROUTINE
- Publication number 20140164832
- Publication date Jun 12, 2014
- INFINEON TECHNOLOGIES AG
- Bernhard Moessler
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CROSS-TESTER ANALYSIS AND REAL-TIME ADAPTIVE TEST
- Publication number 20120330593
- Publication date Dec 27, 2012
- International Business Machines Corporation
- Mark C. Johnson
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CROSS-TESTER ANALYSIS AND REAL-TIME ADAPTIVE TEST
- Publication number 20120049881
- Publication date Mar 1, 2012
- International Business Machines Corporation
- Mark C. Johnson
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND RECORDING MEDIUM
- Publication number 20100169714
- Publication date Jul 1, 2010
- Advantest Corporation
- Koji TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT SELF TEST
- Publication number 20100079151
- Publication date Apr 1, 2010
- Honeywell International Inc.
- Kenny Nordstrom
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20090058452
- Publication date Mar 5, 2009
- Advantest Corporation
- KOICHI TANAKA
- G01 - MEASURING TESTING
Information Patent Application
Flexible interposer system
- Publication number 20080309349
- Publication date Dec 18, 2008
- Computer Access Technology Corporation
- Albert Sutono
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and Method for Physical-Layer Testing of High-Speed Serial L...
- Publication number 20080192814
- Publication date Aug 14, 2008
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
USING STATISTICAL SIGNATURES FOR TESTING HIGH-SPEED CIRCUITS
- Publication number 20080133164
- Publication date Jun 5, 2008
- International Business Machines Corporation
- Hayden C. Cranford
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL DETECTING APPARATUS AND SIGNAL DETECTING SYSTEM
- Publication number 20080061796
- Publication date Mar 13, 2008
- Advantest Corporation
- Yasuo Takada
- G01 - MEASURING TESTING
Information Patent Application
Calibrating a testing device
- Publication number 20070299621
- Publication date Dec 27, 2007
- Edward Roger Lew
- G01 - MEASURING TESTING
Information Patent Application
Signal detecting apparatus and signal detecting system
- Publication number 20070279038
- Publication date Dec 6, 2007
- Advantest Corporation
- Yasuo Takada
- G01 - MEASURING TESTING
Information Patent Application
Method of testing integrated circuit and apparatus therefor
- Publication number 20070113124
- Publication date May 17, 2007
- Chi-Tung Chang
- G01 - MEASURING TESTING

Analysis of tester Performance; Tester characterization

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of finding optimized analog measurement hardware settings as...

Multi-rate sampling for hierarchical system analysis

Testing device and method

Self test for safety logic

Correction of transmission line induced phase and amplitude errors...

Self test for safety logic

Magnetic field sensor able to identify an error condition

Methods and systems for testing a tester

Built-in device testing of integrated circuits

Battery monitoring system, signal transmission method, and semicond...

Test system for measuring propagation delay time of transmission line

Enhancing spectral purity in high-speed testing

Apparatus and method for measuring relative frequency response of a...

Self test for safety logic

Multi-wire electrical parameter measurements via test patterns

Test apparatus, test method, calibration device, and calibration me...

Determining electrical path length

Apparatus and method for measuring relative frequency response of a...

Test circuit and method for processing a test routine

Integrated cross-tester analysis and real-time adaptive test

Test apparatus and recording medium

Automatic test equipment self test

Diagnostic program, a switching program, a testing apparatus, and a...

Test apparatus and test method

Using statistical signatures for testing high-speed circuits

Test device

Method and apparatus for quantifying the timing error induced by an...

Calibrating a testing device

Method of and system for monitoring the functionality of a wafer pr...

Systems and methods for identifying system links

Patents Applicationslast 30 patents

FAULT DETECTION IN PARALLEL HARDWARE

METHOD, CENTRAL TEST CONTROL UNIT, MEASUREMENT SYSTEM

SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE

METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM

METHOD OF FINDING OPTIMIZED ANALOG MEASUREMENT HARDWARE SETTINGS AS...

AUTOMATED VERIFICATION OF INTEGRATED CIRCUITS

USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREM...

MULTI-RATE SAMPLING FOR HIERARCHICAL SYSTEM ANALYSIS

TESTING DEVICE AND METHOD

Self Test for Safety Logic

METHODS AND SYSTEMS FOR TESTING A TESTER

An interferometric IQ-mixer/DAC solution for active, high speed vec...

Magnetic Field Sensor Able To Identify An Error Condition

Self Test for Safety Logic

TESTING SYSTEM AND METHOD

MULTI-WIRE ELECTRICAL PARAMETER MEASUREMENTS VIA TEST PATTERNS

TEST APPARATUS, TEST METHOD, CALIBRATION DEVICE, AND CALIBRATION ME...

TEST CIRCUIT AND METHOD FOR PROCESSING A TEST ROUTINE

INTEGRATED CROSS-TESTER ANALYSIS AND REAL-TIME ADAPTIVE TEST

INTEGRATED CROSS-TESTER ANALYSIS AND REAL-TIME ADAPTIVE TEST

TEST APPARATUS AND RECORDING MEDIUM

AUTOMATIC TEST EQUIPMENT SELF TEST

TEST APPARATUS AND TEST METHOD

Flexible interposer system

System and Method for Physical-Layer Testing of High-Speed Serial L...

USING STATISTICAL SIGNATURES FOR TESTING HIGH-SPEED CIRCUITS

SIGNAL DETECTING APPARATUS AND SIGNAL DETECTING SYSTEM

Calibrating a testing device

Signal detecting apparatus and signal detecting system

Method of testing integrated circuit and apparatus therefor