and measuring excited X-rays

Industry

CPC
G01N23/2252

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/2252and measuring excited X-rays

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Scanning charged-particle-beam microscopy with energy-dispersive x-...
- Patent number 12,094,684
- Issue date Sep 17, 2024
- Mochii, Inc.
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-induced x-ray emission (PIXE) using hydrogen and multi-spe...
- Patent number 12,061,159
- Issue date Aug 13, 2024
- FEI Company
- Daniel Totonjian
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining variability of cryo-EM protein...
- Patent number 11,977,039
- Issue date May 7, 2024
- Ali Punjani
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,971,372
- Issue date Apr 30, 2024
- FEI Company
- Jan Klusácek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface analyzer
- Patent number 11,965,841
- Issue date Apr 23, 2024
- Shimadzu Corporation
- Akira Ogoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for inclusion analysis
- Patent number 11,921,053
- Issue date Mar 5, 2024
- FEI Company
- Jean-Marc Bohlen
- G01 - MEASURING TESTING
Information Patent Grant
Optical three-dimensional scanning for collision avoidance in micro...
- Patent number 11,821,860
- Issue date Nov 21, 2023
- Carl Zeiss X-ray Microscopy Inc.
- Lars Omlor
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods of inspecting samples with multiple beams of charged particles
- Patent number 11,815,473
- Issue date Nov 14, 2023
- ASML Netherlands B.V.
- Kuo-Feng Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Verification plates with automated evaluation of melt performance
- Patent number 11,733,187
- Issue date Aug 22, 2023
- Arcam AB
- David Svensson
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Analyzer and image processing method
- Patent number 11,733,188
- Issue date Aug 22, 2023
- Jeol Ltd.
- Kazunori Tsukamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coaxial cable and cable assembly
- Patent number 11,715,584
- Issue date Aug 1, 2023
- PROTERIAL, LTD.
- Hiromitsu Kuroda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for determining sample composition from spectral...
- Patent number 11,703,468
- Issue date Jul 18, 2023
- FEI Company
- Oleksii Kaplenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscopy analysis method
- Patent number 11,686,693
- Issue date Jun 27, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Nicolas Bernier
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis apparatus and method
- Patent number 11,674,913
- Issue date Jun 13, 2023
- Jeol Ltd.
- Takaomi Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis apparatus and method
- Patent number 11,668,662
- Issue date Jun 6, 2023
- Jeol Ltd.
- Yasuaki Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Surface analyzer
- Patent number 11,619,600
- Issue date Apr 4, 2023
- Shimadzu Corporation
- Akira Ogoshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for diagnosing a condition of an engine
- Patent number 11,614,436
- Issue date Mar 28, 2023
- Pratt & Whitney Canada Corp.
- Maurice Jean
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Analyzer
- Patent number 11,609,191
- Issue date Mar 21, 2023
- Jeol Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,598,733
- Issue date Mar 7, 2023
- FEI Company
- Tomas Tûma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining a material composition
- Patent number 11,579,100
- Issue date Feb 14, 2023
- Bruker Nano GmbH
- Ralf Terborg
- G01 - MEASURING TESTING
Information Patent Grant
Shutter assembly for x-ray detection
- Patent number 11,577,320
- Issue date Feb 14, 2023
- Thermo Electron Scientific Instruments LLC
- Justin Morrow
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
X-ray based evaluation of a status of a structure of a substrate
- Patent number 11,543,368
- Issue date Jan 3, 2023
- Applied Materials Israel Ltd.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 11,536,675
- Issue date Dec 27, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
SNR for x-ray detectors in SEM systems by using polarization filter
- Patent number 11,525,791
- Issue date Dec 13, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray imaging in cross-section using un-cut lamella with background...
- Patent number 11,501,951
- Issue date Nov 15, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic material observation method, and magnetic material observa...
- Patent number 11,474,169
- Issue date Oct 18, 2022
- NATIONAL INSTITUTES FOR QUANTUM SCIENCE AND TECHNOLOGY
- Toshiya Inami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...
- Publication number 20250028253
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- YEN-FONG CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20240418660
- Publication date Dec 19, 2024
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...
- Publication number 20240404786
- Publication date Dec 5, 2024
- Carl Zeiss SMT GMBH
- Ivo IHRKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20240328972
- Publication date Oct 3, 2024
- Rigaku Corporation
- Rieko SUENAGA
- G01 - MEASURING TESTING
Information Patent Application
DEEP LEARNING TECHNIQUES FOR FAST ANOMALY DETECTION IN EXPERIMENTAL...
- Publication number 20240280522
- Publication date Aug 22, 2024
- FEI Company
- Hans Vanrompay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
- Publication number 20240264098
- Publication date Aug 8, 2024
- Rigaku Corporation
- Tsutomu TADA
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...
- Publication number 20240255449
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
LIVE CHEMICAL IMAGING WITH MULTIPLE DETECTORS
- Publication number 20240241068
- Publication date Jul 18, 2024
- Oxford Instruments Nanotechnology Tools Limited
- Anthony Hyde
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...
- Publication number 20240151666
- Publication date May 9, 2024
- Shanghai Institute of Measurement and Testing Technology
- Lihua LEI
- G01 - MEASURING TESTING
Information Patent Application
Analyzing Method and Analyzer
- Publication number 20240142395
- Publication date May 2, 2024
- JEOL Ltd.
- Koki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS
- Publication number 20240085356
- Publication date Mar 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scanning Electron Microscope and Map Display Method for Absorption...
- Publication number 20240085357
- Publication date Mar 14, 2024
- JEOL Ltd.
- Hideyuki Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND
- Publication number 20240060912
- Publication date Feb 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Martin Chauvin
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EVALUATING CENTRAL SEGREGATION IN STEEL
- Publication number 20240044822
- Publication date Feb 8, 2024
- JFE STEEL CORPORATION
- Tomoharu ISHIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20240027377
- Publication date Jan 25, 2024
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CLASSIFYING UNKNOWN PARTICLES ON A SURFACE OF A SEMI-CON...
- Publication number 20230417644
- Publication date Dec 28, 2023
- Siltronic AG
- Sebastian ANDRES
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20230341341
- Publication date Oct 26, 2023
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...
- Publication number 20230296540
- Publication date Sep 21, 2023
- GATAN INC.
- Johannes ÖSTERREICHER
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PREPARATION METHOD AND APPARATUS
- Publication number 20230273136
- Publication date Aug 31, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- John Lindsay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMMUNOCHROMATOGRAPHY MEASUREMENT METHOD, AUXILIARY LIQUID FOR IMMUN...
- Publication number 20230258632
- Publication date Aug 17, 2023
- National University Corporation Hamamatsu University School of Medicine
- Hideya KAWASAKI
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
- Publication number 20230258587
- Publication date Aug 17, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Simon BURGESS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase Analyzer, Sample Analyzer, and Analysis Method
- Publication number 20230137130
- Publication date May 4, 2023
- JEOL Ltd.
- Kouta Itoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scatter Diagram Display Device, Scatter Diagram Display Method, and...
- Publication number 20230083479
- Publication date Mar 16, 2023
- JEOL Ltd.
- Naoki Kato
- G01 - MEASURING TESTING
Information Patent Application
SURFACE ANALYZER
- Publication number 20230039168
- Publication date Feb 9, 2023
- Shimadzu Corporation
- Akira OGOSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A SAMPLE BY MEANS OF MULTIPLE C...
- Publication number 20230020967
- Publication date Jan 19, 2023
- DELMIC IP B.V.
- Andries Pieter Johan EFFTING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL...
- Publication number 20230003675
- Publication date Jan 5, 2023
- FEI Company
- Oleksii KAPLENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SNR FOR X-RAY DETECTORS IN SEM SYSTEMS BY USING POLARIZATION FILTER
- Publication number 20220397540
- Publication date Dec 15, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IMAGING IN CROSS-SECTION USING UN-CUT LAMELLA WITH BACKGROUND...
- Publication number 20220367146
- Publication date Nov 17, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME
- Publication number 20220334072
- Publication date Oct 20, 2022
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- G01 - MEASURING TESTING
Information Patent Application
Spectrum Analysis Apparatus and Database Creation Method
- Publication number 20220307996
- Publication date Sep 29, 2022
- JEOL Ltd.
- Shogo Koshiya
- G01 - MEASURING TESTING

and measuring excited X-rays

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for measuring distribution of pores in electrode for seconda...

Imaging systems and methods of operating the same

X-ray spectrometer and pulse height prediction program

Scanning charged-particle-beam microscopy with energy-dispersive x-...

Particle-induced x-ray emission (PIXE) using hydrogen and multi-spe...

Methods and systems for determining variability of cryo-EM protein...

Method of examining a sample using a charged particle microscope

Surface analyzer

Method for improving an EBSD/TKD map

Methods and systems for inclusion analysis

Optical three-dimensional scanning for collision avoidance in micro...

Methods of inspecting samples with multiple beams of charged particles

Verification plates with automated evaluation of melt performance

Analyzer and image processing method

Coaxial cable and cable assembly

Method and system for determining sample composition from spectral...

Electron microscopy analysis method

Sample analysis apparatus and method

Sample analysis apparatus and method

Surface analyzer

System and method for diagnosing a condition of an engine

Analyzer

Method of examining a sample using a charged particle microscope

Method for determining a material composition

Shutter assembly for x-ray detection

X-ray based evaluation of a status of a structure of a substrate

Analytical method and apparatus

SNR for x-ray detectors in SEM systems by using polarization filter

X-ray imaging in cross-section using un-cut lamella with background...

Magnetic material observation method, and magnetic material observa...

Patents Applicationslast 30 patents

METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...

ANALYSIS APPARATUS, SYSTEM, METHOD, AND PROGRAM

DEEP LEARNING TECHNIQUES FOR FAST ANOMALY DETECTION IN EXPERIMENTAL...

X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM

NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...

LIVE CHEMICAL IMAGING WITH MULTIPLE DETECTORS

METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...

Analyzing Method and Analyzer

Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS

Scanning Electron Microscope and Map Display Method for Absorption...

ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND

METHOD OF EVALUATING CENTRAL SEGREGATION IN STEEL

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

METHOD FOR CLASSIFYING UNKNOWN PARTICLES ON A SURFACE OF A SEMI-CON...

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...

SAMPLE PREPARATION METHOD AND APPARATUS

IMMUNOCHROMATOGRAPHY MEASUREMENT METHOD, AUXILIARY LIQUID FOR IMMUN...

MATERIAL ANALYSIS WITH MULTIPLE DETECTORS

Phase Analyzer, Sample Analyzer, and Analysis Method

Scatter Diagram Display Device, Scatter Diagram Display Method, and...

SURFACE ANALYZER

METHOD AND APPARATUS FOR INSPECTING A SAMPLE BY MEANS OF MULTIPLE C...

METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL...

SNR FOR X-RAY DETECTORS IN SEM SYSTEMS BY USING POLARIZATION FILTER

X-RAY IMAGING IN CROSS-SECTION USING UN-CUT LAMELLA WITH BACKGROUND...

IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME

Spectrum Analysis Apparatus and Database Creation Method