and using a spectral variation of the interaction of the laser beam and the sample

Industry

CPC
G01N2021/393

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/393and using a spectral variation of the interaction of the laser beam and the sample

Industries

Patents Grantslast 30 patents

Information Patent Grant
Tunable light source cavity detection using a plurality of axial-pl...
- Patent number 10,976,248
- Issue date Apr 13, 2021
- Sparrow Detect, Inc.
- Eric R. Crosson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser system with optical feedback
- Patent number 10,790,634
- Issue date Sep 29, 2020
- Centre National de la Recherche Scientifique
- Samir Kassi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunable light source cavity detection using a plurality of axial-pl...
- Patent number 10,724,946
- Issue date Jul 28, 2020
- Sparrow Detect, Inc.
- Eric R. Crosson
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum inspecting apparatus
- Patent number 10,663,393
- Issue date May 26, 2020
- Nuctech Company Limited
- Haihui Liu
- G01 - MEASURING TESTING
Information Patent Grant
Chemical mapping using thermal microscopy at the micro and nano scales
- Patent number 9,841,324
- Issue date Dec 12, 2017
- The United States of America, as represented by the Secretary of the Navy
- Robert Furstenberg
- G02 - OPTICS
Information Patent Grant
Chemical mapping using thermal microscopy at the micro and nano scales
- Patent number 9,091,594
- Issue date Jul 28, 2015
- The United States of America, as represented by the Secretary of the Navy
- Robert Furstenberg
- G01 - MEASURING TESTING
Information Patent Grant
System and method for multi-target fluid concentration detection an...
- Patent number 7,508,520
- Issue date Mar 24, 2009
- ITT Manufacturing Enterprises, Inc.
- Raymond Todd Lines
- G01 - MEASURING TESTING
Information Patent Grant
System and method for encoded spatio-spectral information processing
- Patent number 6,859,275
- Issue date Feb 22, 2005
- Plain Sight Systems, Inc.
- William G. Fateley
- G01 - MEASURING TESTING
Information Patent Grant
Radiation filter, spectrometer and imager using a micro-mirror array
- Patent number 6,392,748
- Issue date May 21, 2002
- Plain Sight Systems, Inc.
- William G. Fateley
- G02 - OPTICS
Information Patent Grant
Radiation filter, spectrometer and imager using a micro-mirror array
- Patent number 6,128,078
- Issue date Oct 3, 2000
- Three LC, Inc.
- William G. Fateley
- G02 - OPTICS
Information Patent Grant
Method and apparatus for measuring internal defects for position an...
- Patent number 5,196,716
- Issue date Mar 23, 1993
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Spectroscopy Device Incorporating a Mid-Infrared Laser
- Publication number 20230408406
- Publication date Dec 21, 2023
- California Institute of Technology
- Mathieu Fradet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST SINGLE-MODE SPECTROSCOPY
- Publication number 20230304927
- Publication date Sep 28, 2023
- IonQ, Inc.
- Jason Hieu Van Nguyen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TUNABLE LIGHT SOURCE CAVITY DETECTION USING A PLURALITY OF AXIAL-PL...
- Publication number 20200319101
- Publication date Oct 8, 2020
- Sparrow Detect, Inc.
- Eric R. Crosson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME
- Publication number 20200182783
- Publication date Jun 11, 2020
- Samsung Electronics Co., Ltd.
- Sunhong JUN
- G01 - MEASURING TESTING
Information Patent Application
TUNABLE LIGHT SOURCE CAVITY DETECTION USING A PLURALITY OF AXIAL-PL...
- Publication number 20190086329
- Publication date Mar 21, 2019
- Sparrow Detect, Inc.
- Eric R. Crosson
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM INSPECTING APPARATUS
- Publication number 20180188158
- Publication date Jul 5, 2018
- Nuctech Company Limited
- Haihui Liu
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL MAPPING USING THERMAL MICROSCOPY AT THE MICRO AND NANO SCALES
- Publication number 20180066989
- Publication date Mar 8, 2018
- The Government of the United States of America, as represented by the Secreta...
- Robert Furstenberg
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL MAPPING USING THERMAL MICROSCOPY AT THE MICRO AND NANO SCALES
- Publication number 20130134310
- Publication date May 30, 2013
- Robert Furstenberg
- G02 - OPTICS
Information Patent Application
System and method for encoded spatio-spectral information processing
- Publication number 20070263214
- Publication date Nov 15, 2007
- William G. Fateley
- G02 - OPTICS
Information Patent Application
System and method for encoded spatio-spectral information processing
- Publication number 20050024640
- Publication date Feb 3, 2005
- William G. Fateley
- G02 - OPTICS
Information Patent Application
System and method for encoded spatio-spectral information processing
- Publication number 20020057431
- Publication date May 16, 2002
- William G. Fateley
- G01 - MEASURING TESTING

and using a spectral variation of the interaction of the laser beam and the sample

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Tunable light source cavity detection using a plurality of axial-pl...

Laser system with optical feedback

Tunable light source cavity detection using a plurality of axial-pl...

Spectrum inspecting apparatus

Chemical mapping using thermal microscopy at the micro and nano scales

Chemical mapping using thermal microscopy at the micro and nano scales

System and method for multi-target fluid concentration detection an...

System and method for encoded spatio-spectral information processing

Radiation filter, spectrometer and imager using a micro-mirror array

Radiation filter, spectrometer and imager using a micro-mirror array

Method and apparatus for measuring internal defects for position an...

Patents Applicationslast 30 patents

Spectroscopy Device Incorporating a Mid-Infrared Laser

FAST SINGLE-MODE SPECTROSCOPY

TUNABLE LIGHT SOURCE CAVITY DETECTION USING A PLURALITY OF AXIAL-PL...

MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME

TUNABLE LIGHT SOURCE CAVITY DETECTION USING A PLURALITY OF AXIAL-PL...

SPECTRUM INSPECTING APPARATUS

CHEMICAL MAPPING USING THERMAL MICROSCOPY AT THE MICRO AND NANO SCALES

CHEMICAL MAPPING USING THERMAL MICROSCOPY AT THE MICRO AND NANO SCALES

System and method for encoded spatio-spectral information processing

System and method for encoded spatio-spectral information processing

System and method for encoded spatio-spectral information processing