Claims
- 1. A method for controlling the interaction of radiation with physical objects having at least one material capable of reacting predictably to one or more radiation components in a predetermined spectrum range, comprising the steps of:
(a) providing a controllable source of radiation capable of generating arbitrary combinations of spectral radiation components within the predetermined spectrum range, a combination of spectral radiation components being defined as a spectral signature; and (b) irradiating at least one of said physical objects with a predetermined spectral signature from the provided controllable source of radiation to cause the predictable reaction of the material.
- 2. The method of claim 1, wherein individual spectral radiation components in the spectral signature are encoded to enable realtime analysis and quantification of the interaction.
- 3. A tunable source of radiation, comprising:
a broad-band radiation source providing a substantially continuous spectrum of radiation components within a predetermined portion of the spectrum; a wavelength dispersing device spatially dispersing radiation from the source into a series of radiation bands, each corresponding to a particular wavelength; and a spatial light modulator (SLM) modulating said series of radiation bands individually to generate a tunable output pattern having predetermined characteristics.
- 4. The tunable source of radiation of claim 3, wherein the SLM is an optical switch array.
- 5. The tunable source radiation of claim 4, wherein the SLM is a digital micro-mirror array (DMA).
- 6. The tunable source of radiation of claim 3, wherein the SLM encodes at least some of said series of radiation bands in a known manner.
- 7. A method of analyzing samples of material, comprising the steps of:
(a) providing a controllable source of radiation capable of generating arbitrary combinations of spectral radiation components within the predetermined spectrum range, a combination of spectral radiation components being defined as a spectral signature; and (b) irradiating a sample of material with a predetermined spectral signature from the provided controllable source of radiation; (c) directing radiation from the irradiated sample to one or more detector elements; and (d) analyzing the output of the detector elements to determine properties of said sample of material.
- 8. A device for measuring interaction of electromagnetic radiation with samples of material, comprising:
a radiation source for irradiating at least one sample of the material with electromagnetic radiation, said source having predetermined characteristics; means for encoding arbitrary radiation bands from the sample with a unique code; processing means for processing encoded radiation bands in the analog domain; detector means receiving input from said processing means and providing on output an indication of the interaction between the electromagnetic radiation from the source with the sample of material.
- 9. The device of claim 8, wherein the means for encoding apply an orthogonal basis of encoding functions.
Parent Case Info
[0001] This application is a continuation-in-part of application Serial No. 09/672,257, filed Sep. 28, 2000, which is a continuation of application Ser. No. 09/502,758 filed Feb. 11, 2000, now U.S. Pat. No. 6,128,078, which is a continuation of application Ser. No. 09/289,482 filed Apr. 9, 1999, now U.S. Pat. No. 6,046,808.
Continuations (2)
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09502758 |
Feb 2000 |
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09672257 |
Sep 2000 |
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Parent |
09289482 |
Apr 1999 |
US |
Child |
09502758 |
Feb 2000 |
US |
Continuation in Parts (1)
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09672257 |
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09798860 |
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