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G11C29/56016

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

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G11C29/56016Apparatus features

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Latch performance detection method, device and electronic device
- Patent number 12,106,816
- Issue date Oct 1, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Tao Du
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,099,424
- Issue date Sep 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory test systems and memory test methods
- Patent number 11,862,278
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G11 - INFORMATION STORAGE
Information Patent Grant
Carrier based high volume system level testing of devices with pop...
- Patent number 11,742,055
- Issue date Aug 29, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Grant
Shared error correction coding circuitry
- Patent number 11,742,047
- Issue date Aug 29, 2023
- Micron Technology, Inc.
- Marco Sforzin
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 11,719,742
- Issue date Aug 8, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy analysis method and redundancy analysis apparatus
- Patent number 11,631,474
- Issue date Apr 18, 2023
- UIF (University Industry Foundation), Yonsei University
- Sung Ho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for testing semiconductor device and method of testing th...
- Patent number 11,626,184
- Issue date Apr 11, 2023
- NANYA TECHNOLOGY CORPORATION
- Chen-Yen Tsai
- G11 - INFORMATION STORAGE
Information Patent Grant
Carrier based high volume system level testing of devices with pop...
- Patent number 11,587,640
- Issue date Feb 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 11,506,706
- Issue date Nov 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Hamming-distance analyzer and method for analyzing hamming-distance
- Patent number 11,195,593
- Issue date Dec 7, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Environment control apparatus
- Patent number 11,183,265
- Issue date Nov 23, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field transducer mounting methods for MTJ device testers
- Patent number 11,162,981
- Issue date Nov 2, 2021
- Integrated Silicon Solution, (Cayman) Inc.
- Danny Yam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field generator
- Patent number 11,139,099
- Issue date Oct 5, 2021
- Centre National de la Recherche Scientifique
- Isabelle Joumard
- G11 - INFORMATION STORAGE
Information Patent Grant
Test control circuit, semiconductor memory apparatus and semiconduc...
- Patent number 11,004,531
- Issue date May 11, 2021
- SK hynix Inc.
- Haeng Seon Chae
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnet mounting apparatus for MTJ device testers
- Patent number 10,962,590
- Issue date Mar 30, 2021
- Spin Memory, Inc.
- Danny Yam
- G11 - INFORMATION STORAGE
Information Patent Grant
Artificial intelligence based monitoring of solid state drives and...
- Patent number 10,930,365
- Issue date Feb 23, 2021
- Intel Corporation
- Pavel Poliakov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device with memory modules located within liquid coolant cha...
- Patent number 10,888,031
- Issue date Jan 5, 2021
- Hewlett Packard Enterprise Development LP
- John Franz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 10,877,089
- Issue date Dec 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Receiver equalization and stressed eye testing system
- Patent number 10,859,626
- Issue date Dec 8, 2020
- FutureWei Technologies, Inc.
- Gang Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor apparatuses and test system for performing burn-in te...
- Patent number 10,816,591
- Issue date Oct 27, 2020
- SK hynix Inc.
- Jung Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test interface boards, test systems, and methods of operating test...
- Patent number 10,811,118
- Issue date Oct 20, 2020
- Samsung Electronics Co., Ltd.
- Sung-Ho Joo
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having a test circuit
- Patent number 10,790,039
- Issue date Sep 29, 2020
- Micron Technology, Inc.
- Hyunui Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated wafer-level processing system
- Patent number 10,748,877
- Issue date Aug 18, 2020
- International Business Machines Corporation
- Philip G. Emma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Loading and unloading device for a solid state disk test system
- Patent number 10,730,705
- Issue date Aug 4, 2020
- WORLD PRECISION MANUFACTURING (DONGGUAN) CO., LTD.
- Jinsuo Sun
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field transducer mounting apparatus for MTJ device testers
- Patent number 10,684,310
- Issue date Jun 16, 2020
- Spin Memory, Inc.
- Danny Yam
- G11 - INFORMATION STORAGE
Information Patent Grant
DUT testing with configurable cooling control using DUT internal te...
- Patent number 10,677,842
- Issue date Jun 9, 2020
- Advantest Corporation
- Leon Chen
- G01 - MEASURING TESTING
Information Patent Grant
Direct memory characterization using periphery transistors
- Patent number 10,679,723
- Issue date Jun 9, 2020
- PDF Solutions, Inc.
- Dong Kyu Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact measurement of memory cell threshold voltage
- Patent number 10,672,500
- Issue date Jun 2, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing MRAM device and test apparatus thereof
- Patent number 10,665,321
- Issue date May 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Yu Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MIRRORING STORAGE IMPLEMENTATION METHOD AND APPARATUS FOR MEMORY MO...
- Publication number 20240412807
- Publication date Dec 12, 2024
- BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD.
- Xin JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE
- Publication number 20240395355
- Publication date Nov 28, 2024
- ETRON TECHNOLOGY, INC.
- Chun Shiah
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE
- Publication number 20240395354
- Publication date Nov 28, 2024
- Sony Semiconductor Solutions Corporation
- DAISHI ISOGAI
- G11 - INFORMATION STORAGE
Information Patent Application
SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING
- Publication number 20240371460
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Smruti Subhash Jhaveri
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE AT LOW TE...
- Publication number 20240347129
- Publication date Oct 17, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH ELECTRICALLY PROGRAMMABLE FUSES AND RELATED TESTER
- Publication number 20240331797
- Publication date Oct 3, 2024
- ETRON TECHNOLOGY, INC.
- Ho-Yin Chen
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR MEMORY TESTING
- Publication number 20240312556
- Publication date Sep 19, 2024
- WINBOND ELECTRONICS CORP.
- Shih-Hung Chen
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH BUILT-IN SYNCHRONOUS-WRITE-THROUGH REDUNDANCY AND ASSOC...
- Publication number 20240312557
- Publication date Sep 19, 2024
- MEDIATEK INC.
- Che-Wei Chou
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME
- Publication number 20240304274
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- Jiyong YOO
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIP...
- Publication number 20240274222
- Publication date Aug 15, 2024
- Tektronix, Inc.
- Swapnil Jhawar
- G11 - INFORMATION STORAGE
Information Patent Application
MODE REGISTER UPDATE (MRUPD) MODE
- Publication number 20240249795
- Publication date Jul 25, 2024
- Intel Corporation
- Saravanan SETHURAMAN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND OPERATION MET...
- Publication number 20240233857
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Kuihan Ko
- G11 - INFORMATION STORAGE
Information Patent Application
DIGITAL VERIFY FAILBIT COUNT (VFC) CIRCUIT
- Publication number 20240221859
- Publication date Jul 4, 2024
- Yangtze Memory Technologies Co., Ltd.
- Teng CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
CALIBRATE SYSTEM WITH CALCULATED RECEIVE EYE FOR VOLUME TESTING BAS...
- Publication number 20240212784
- Publication date Jun 27, 2024
- Intel NDTM US LLC
- Ashish SHUKLA
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...
- Publication number 20240193058
- Publication date Jun 13, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Latch Performance Detection Method, Device and Electronic Device
- Publication number 20240170092
- Publication date May 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Tao Du
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH PARALLEL MAIN AND TEST INTERFACES
- Publication number 20240071556
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- James Brian Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST METHOD, MEMORY TEST APPARATUS, MEMORY TEST DEVICE, AND...
- Publication number 20240021265
- Publication date Jan 18, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xiaolei LI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20230333157
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Application
HOST CONTROLLED MEDIA TESTING OF MEMORY
- Publication number 20230290427
- Publication date Sep 14, 2023
- Micron Technology, Inc.
- Danilo Caraccio
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST DEVICE, TEST METHOD, AND TEST MACHINE
- Publication number 20230215510
- Publication date Jul 6, 2023
- Yangtze Memory Technologies Co., Ltd.
- Xiao TONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20230197185
- Publication date Jun 22, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20230062440
- Publication date Mar 2, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST SYSTEMS AND MEMORY TEST METHODS
- Publication number 20230055639
- Publication date Feb 23, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G11 - INFORMATION STORAGE
Information Patent Application
SHARED ERROR CORRECTION CODING CIRCUITRY
- Publication number 20220415426
- Publication date Dec 29, 2022
- Micron Technology, Inc.
- Marco Sforzin
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20220373594
- Publication date Nov 24, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20220284982
- Publication date Sep 8, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS
- Publication number 20220130486
- Publication date Apr 28, 2022
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sung Ho Kang
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICE AND METHOD OF TESTING TH...
- Publication number 20210343360
- Publication date Nov 4, 2021
- NANYA TECHNOLOGY CORPORATION
- Chen-Yen TSAI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20210109152
- Publication date Apr 15, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE

Apparatus features

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Latch performance detection method, device and electronic device

Apparatus, systems, and methods for dynamically reconfigured semico...

Memory test systems and memory test methods

Carrier based high volume system level testing of devices with pop...

Shared error correction coding circuitry

Semiconductor wafer testing system and related method for improving...

Redundancy analysis method and redundancy analysis apparatus

Apparatus for testing semiconductor device and method of testing th...

Carrier based high volume system level testing of devices with pop...

Semiconductor wafer testing system and related method for improving...

Hamming-distance analyzer and method for analyzing hamming-distance

Environment control apparatus

Magnetic field transducer mounting methods for MTJ device testers

Magnetic field generator

Test control circuit, semiconductor memory apparatus and semiconduc...

Magnet mounting apparatus for MTJ device testers

Artificial intelligence based monitoring of solid state drives and...

Memory device with memory modules located within liquid coolant cha...

Semiconductor wafer testing system and related method for improving...

Receiver equalization and stressed eye testing system

Semiconductor apparatuses and test system for performing burn-in te...

Test interface boards, test systems, and methods of operating test...

Semiconductor device having a test circuit

Integrated wafer-level processing system

Loading and unloading device for a solid state disk test system

Magnetic field transducer mounting apparatus for MTJ device testers

DUT testing with configurable cooling control using DUT internal te...

Direct memory characterization using periphery transistors

Non-contact measurement of memory cell threshold voltage

Method for testing MRAM device and test apparatus thereof

Patents Applicationslast 30 patents

MIRRORING STORAGE IMPLEMENTATION METHOD AND APPARATUS FOR MEMORY MO...

MEMORY DEVICE

SEMICONDUCTOR STORAGE DEVICE

SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING

SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE AT LOW TE...

MEMORY WITH ELECTRICALLY PROGRAMMABLE FUSES AND RELATED TESTER

METHOD AND APPARATUS FOR MEMORY TESTING

MEMORY WITH BUILT-IN SYNCHRONOUS-WRITE-THROUGH REDUNDANCY AND ASSOC...

ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME

TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIP...

MODE REGISTER UPDATE (MRUPD) MODE

MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND OPERATION MET...

DIGITAL VERIFY FAILBIT COUNT (VFC) CIRCUIT

CALIBRATE SYSTEM WITH CALCULATED RECEIVE EYE FOR VOLUME TESTING BAS...

APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...

Latch Performance Detection Method, Device and Electronic Device

MEMORY WITH PARALLEL MAIN AND TEST INTERFACES

MEMORY TEST METHOD, MEMORY TEST APPARATUS, MEMORY TEST DEVICE, AND...

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

HOST CONTROLLED MEDIA TESTING OF MEMORY

TEST DEVICE, TEST METHOD, AND TEST MACHINE

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

MEMORY TEST SYSTEMS AND MEMORY TEST METHODS

SHARED ERROR CORRECTION CODING CIRCUITRY

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS

APPARATUS FOR TESTING SEMICONDUCTOR DEVICE AND METHOD OF TESTING TH...

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...