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Patents Grants
last 30 patents
Information
Patent Grant
Memory test systems and memory test methods
Patent number
11,862,278
Issue date
Jan 2, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Hao He
G11 - INFORMATION STORAGE
Information
Patent Grant
Carrier based high volume system level testing of devices with pop...
Patent number
11,742,055
Issue date
Aug 29, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Grant
Shared error correction coding circuitry
Patent number
11,742,047
Issue date
Aug 29, 2023
Micron Technology, Inc.
Marco Sforzin
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor wafer testing system and related method for improving...
Patent number
11,719,742
Issue date
Aug 8, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Harry-Hak-Lay Chuang
G11 - INFORMATION STORAGE
Information
Patent Grant
Redundancy analysis method and redundancy analysis apparatus
Patent number
11,631,474
Issue date
Apr 18, 2023
UIF (University Industry Foundation), Yonsei University
Sung Ho Kang
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus for testing semiconductor device and method of testing th...
Patent number
11,626,184
Issue date
Apr 11, 2023
NANYA TECHNOLOGY CORPORATION
Chen-Yen Tsai
G11 - INFORMATION STORAGE
Information
Patent Grant
Carrier based high volume system level testing of devices with pop...
Patent number
11,587,640
Issue date
Feb 21, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor wafer testing system and related method for improving...
Patent number
11,506,706
Issue date
Nov 22, 2022
Taiwan Semiconductor Manufacturing Company, Ltd
Harry-Hak-Lay Chuang
G11 - INFORMATION STORAGE
Information
Patent Grant
Hamming-distance analyzer and method for analyzing hamming-distance
Patent number
11,195,593
Issue date
Dec 7, 2021
Taiwan Semiconductor Manufacturing Co., Ltd
Shih-Lien Linus Lu
G11 - INFORMATION STORAGE
Information
Patent Grant
Environment control apparatus
Patent number
11,183,265
Issue date
Nov 23, 2021
ONE TEST SYSTEMS
Chen-Lung Tsai
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field transducer mounting methods for MTJ device testers
Patent number
11,162,981
Issue date
Nov 2, 2021
Integrated Silicon Solution, (Cayman) Inc.
Danny Yam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic field generator
Patent number
11,139,099
Issue date
Oct 5, 2021
Centre National de la Recherche Scientifique
Isabelle Joumard
G11 - INFORMATION STORAGE
Information
Patent Grant
Test control circuit, semiconductor memory apparatus and semiconduc...
Patent number
11,004,531
Issue date
May 11, 2021
SK hynix Inc.
Haeng Seon Chae
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnet mounting apparatus for MTJ device testers
Patent number
10,962,590
Issue date
Mar 30, 2021
Spin Memory, Inc.
Danny Yam
G11 - INFORMATION STORAGE
Information
Patent Grant
Artificial intelligence based monitoring of solid state drives and...
Patent number
10,930,365
Issue date
Feb 23, 2021
Intel Corporation
Pavel Poliakov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory device with memory modules located within liquid coolant cha...
Patent number
10,888,031
Issue date
Jan 5, 2021
Hewlett Packard Enterprise Development LP
John Franz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor wafer testing system and related method for improving...
Patent number
10,877,089
Issue date
Dec 29, 2020
Taiwan Semiconductor Manufacturing Co., Ltd
Harry-Hak-Lay Chuang
G01 - MEASURING TESTING
Information
Patent Grant
Receiver equalization and stressed eye testing system
Patent number
10,859,626
Issue date
Dec 8, 2020
FutureWei Technologies, Inc.
Gang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor apparatuses and test system for performing burn-in te...
Patent number
10,816,591
Issue date
Oct 27, 2020
SK hynix Inc.
Jung Hyun Kim
G01 - MEASURING TESTING
Information
Patent Grant
Test interface boards, test systems, and methods of operating test...
Patent number
10,811,118
Issue date
Oct 20, 2020
Samsung Electronics Co., Ltd.
Sung-Ho Joo
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having a test circuit
Patent number
10,790,039
Issue date
Sep 29, 2020
Micron Technology, Inc.
Hyunui Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated wafer-level processing system
Patent number
10,748,877
Issue date
Aug 18, 2020
International Business Machines Corporation
Philip G. Emma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Loading and unloading device for a solid state disk test system
Patent number
10,730,705
Issue date
Aug 4, 2020
WORLD PRECISION MANUFACTURING (DONGGUAN) CO., LTD.
Jinsuo Sun
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic field transducer mounting apparatus for MTJ device testers
Patent number
10,684,310
Issue date
Jun 16, 2020
Spin Memory, Inc.
Danny Yam
G11 - INFORMATION STORAGE
Information
Patent Grant
DUT testing with configurable cooling control using DUT internal te...
Patent number
10,677,842
Issue date
Jun 9, 2020
Advantest Corporation
Leon Chen
G01 - MEASURING TESTING
Information
Patent Grant
Direct memory characterization using periphery transistors
Patent number
10,679,723
Issue date
Jun 9, 2020
PDF Solutions, Inc.
Dong Kyu Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Non-contact measurement of memory cell threshold voltage
Patent number
10,672,500
Issue date
Jun 2, 2020
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for testing MRAM device and test apparatus thereof
Patent number
10,665,321
Issue date
May 26, 2020
Taiwan Semiconductor Manufacturing Co., Ltd
Chia-Yu Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Non-contact electron beam probing techniques and related structures
Patent number
10,650,891
Issue date
May 12, 2020
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE
Information
Patent Grant
Hamming-distance analyzer
Patent number
10,515,710
Issue date
Dec 24, 2019
Taiwan Semiconductor Manufacturing Co., Ltd
Shih-Lien Linus Lu
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
Latch Performance Detection Method, Device and Electronic Device
Publication number
20240170092
Publication date
May 23, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC
Tao Du
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY WITH PARALLEL MAIN AND TEST INTERFACES
Publication number
20240071556
Publication date
Feb 29, 2024
Micron Technology, Inc.
James Brian Johnson
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY TEST METHOD, MEMORY TEST APPARATUS, MEMORY TEST DEVICE, AND...
Publication number
20240021265
Publication date
Jan 18, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Xiaolei LI
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
Publication number
20230333157
Publication date
Oct 19, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Harry-Hak-Lay Chuang
G01 - MEASURING TESTING
Information
Patent Application
HOST CONTROLLED MEDIA TESTING OF MEMORY
Publication number
20230290427
Publication date
Sep 14, 2023
Micron Technology, Inc.
Danilo Caraccio
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TEST DEVICE, TEST METHOD, AND TEST MACHINE
Publication number
20230215510
Publication date
Jul 6, 2023
Yangtze Memory Technologies Co., Ltd.
Xiao TONG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
Publication number
20230197185
Publication date
Jun 22, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
Publication number
20230062440
Publication date
Mar 2, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY TEST SYSTEMS AND MEMORY TEST METHODS
Publication number
20230055639
Publication date
Feb 23, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Hao He
G11 - INFORMATION STORAGE
Information
Patent Application
SHARED ERROR CORRECTION CODING CIRCUITRY
Publication number
20220415426
Publication date
Dec 29, 2022
Micron Technology, Inc.
Marco Sforzin
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
Publication number
20220373594
Publication date
Nov 24, 2022
Taiwan Semiconductor Manufacturing Company, Ltd.
Harry-Hak-Lay Chuang
G11 - INFORMATION STORAGE
Information
Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
Publication number
20220284982
Publication date
Sep 8, 2022
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Application
REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS
Publication number
20220130486
Publication date
Apr 28, 2022
UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
Sung Ho Kang
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICE AND METHOD OF TESTING TH...
Publication number
20210343360
Publication date
Nov 4, 2021
NANYA TECHNOLOGY CORPORATION
Chen-Yen TSAI
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
Publication number
20210109152
Publication date
Apr 15, 2021
Taiwan Semiconductor Manufacturing Co., LTD
Harry-Hak-Lay Chuang
G11 - INFORMATION STORAGE
Information
Patent Application
ENVIRONMENT CONTROL APPARATUS
Publication number
20210020260
Publication date
Jan 21, 2021
ONE TEST SYSTEMS
CHEN-LUNG TSAI
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Transducer Mounting Methods for MTJ Device Testers
Publication number
20200166544
Publication date
May 28, 2020
Spin Memory, Inc.
Danny YAM
G11 - INFORMATION STORAGE
Information
Patent Application
HAMMING-DISTANCE ANALYZER AND METHOD FOR ANALYZING HAMMING-DISTANCE
Publication number
20200135294
Publication date
Apr 30, 2020
Taiwan Semiconductor Manufacturing Co., Ltd.
Shih-Lien Linus Lu
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
Publication number
20200096559
Publication date
Mar 26, 2020
Taiwan Semiconductor Manufacturing Co., LTD
Harry-Hak-Lay Chuang
G01 - MEASURING TESTING
Information
Patent Application
RECEIVER EQUALIZATION AND STRESSED EYE TESTING SYSTEM
Publication number
20200025824
Publication date
Jan 23, 2020
FutureWei Technologies, Inc.
Gang Zhao
G01 - MEASURING TESTING
Information
Patent Application
TEST CONTROL CIRCUIT, SEMICONDUCTOR MEMORY APPARATUS AND SEMICONDUC...
Publication number
20200013475
Publication date
Jan 9, 2020
SK HYNIX INC.
Haeng Seon CHAE
G11 - INFORMATION STORAGE
Information
Patent Application
TEST INTERFACE BOARDS, TEST SYSTEMS, AND METHODS OF OPERATING TEST...
Publication number
20190378590
Publication date
Dec 12, 2019
Samsung Electronics Co., Ltd.
SUNG-HO JOO
G11 - INFORMATION STORAGE
Information
Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
Publication number
20190355418
Publication date
Nov 21, 2019
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE
Information
Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
Publication number
20190341122
Publication date
Nov 7, 2019
Micron Technology, Inc.
Amitava Majumdar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR APPARATUS AND TEST SYSTEM INCLUDING THE SEMICONDUCTOR...
Publication number
20190277906
Publication date
Sep 12, 2019
SK HYNIX INC.
Jung Hyun KIM
G11 - INFORMATION STORAGE
Information
Patent Application
INTEGRATED WAFER-LEVEL PROCESSING SYSTEM
Publication number
20190229095
Publication date
Jul 25, 2019
International Business Machines Corporation
Philip G. Emma
G02 - OPTICS
Information
Patent Application
TEST CONTROL CIRCUIT, SEMICONDUCTOR MEMORY APPARATUS AND SEMICONDUC...
Publication number
20190198130
Publication date
Jun 27, 2019
SK HYNIX INC.
Haeng Seon CHAE
G11 - INFORMATION STORAGE
Information
Patent Application
TEST INTERFACE BOARD AND SYSTEM INCLUDING THE SAME
Publication number
20190164851
Publication date
May 30, 2019
SAMSUNG ELECTRONICS CO., LTD.
JONGWOON YOO
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD FOR TESTING MRAM DEVICE AND TEST APPARATUS THEREOF
Publication number
20190066820
Publication date
Feb 28, 2019
Taiwan Semiconductor Manufacturing Co., Ltd.
Chia-Yu Wang
G11 - INFORMATION STORAGE
Information
Patent Application
DUT TESTING WITH CONFIGURABLE COOLING CONTROL USING DUT INTERNAL TE...
Publication number
20180340974
Publication date
Nov 29, 2018
Advantest Corporation
Leon Chen
G01 - MEASURING TESTING