Apparatus for holding or moving single probes

Industry

CPC
G01R1/06705

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06705Apparatus for holding or moving single probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Connection line for high currents and/or voltages, testing device,...
- Patent number 12,308,145
- Issue date May 20, 2025
- Lisa Draxlmaier GmbH
- Manuel Kagerhuber
- G01 - MEASURING TESTING
Information Patent Grant
Controlling alignment during a thermal cycle
- Patent number 12,298,328
- Issue date May 13, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Adjustment control device for precise measurement
- Patent number 12,259,405
- Issue date Mar 25, 2025
- PAMTEK Co., Ltd.
- Jae Woong Kim
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Manufacturing fixture and process for electrode of neuromodulation...
- Patent number 12,203,960
- Issue date Jan 21, 2025
- Industrial Technology Research Institute
- Jo-Ping Lee
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit spike check probing apparatus and method
- Patent number 12,169,220
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic prober
- Patent number 12,135,335
- Issue date Nov 5, 2024
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Probe-holder support and corresponding probes with facilitated moun...
- Patent number 12,099,087
- Issue date Sep 24, 2024
- Giuseppe Amelio
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive test fixture for screening electrical continuity
- Patent number 12,050,253
- Issue date Jul 30, 2024
- Galvani Bioelectronics Limited
- Ellen Kaplan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Probe apparatus
- Patent number 12,000,862
- Issue date Jun 4, 2024
- HIOKI E.E. CORPORATION
- Masashi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,977,098
- Issue date May 7, 2024
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Tool for precise locating of fasteners under coatings
- Patent number 11,747,127
- Issue date Sep 5, 2023
- The Boeing Company
- Keenan S. Rickless
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Probe cable assembly and method
- Patent number 11,733,266
- Issue date Aug 22, 2023
- Rohde & Schwarz GmbH & Co. KG
- Franz Strasser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Touch screen testing platform for engaging a dynamically positioned...
- Patent number 11,724,402
- Issue date Aug 15, 2023
- T-Mobile USA, Inc.
- David Ross Jenkinson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe assembly with two spaced probes for high frequency circuit bo...
- Patent number 11,674,979
- Issue date Jun 13, 2023
- Huntron, Inc.
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 11,609,245
- Issue date Mar 21, 2023
- Leeno Industrial Inc.
- Dong-hoon Park
- G01 - MEASURING TESTING
Information Patent Grant
Multi-angle sample holder with integrated micromanipulator
- Patent number 11,604,212
- Issue date Mar 14, 2023
- Meta Platforms, Inc.
- Pradip Sairam Pichumani
- G01 - MEASURING TESTING
Information Patent Grant
Pressure relief valve
- Patent number 11,592,465
- Issue date Feb 28, 2023
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Probe adapter for a blade outer air seal and method for using same
- Patent number 11,513,034
- Issue date Nov 29, 2022
- Raytheon Technologies Corporation
- Bryan J. Hackett
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Grant
Apparatuses and methods for mitigating sticking of units-under-test
- Patent number 11,486,923
- Issue date Nov 1, 2022
- Intel Corporation
- Jagat Shakya
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit spike check test point identification apparatus...
- Patent number 11,454,665
- Issue date Sep 27, 2022
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Portable probe stand assembly
- Patent number 11,293,945
- Issue date Apr 5, 2022
- Kuan-Hung Chen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method and apparatus for testing printed circuit boards
- Patent number 11,255,877
- Issue date Feb 22, 2022
- Acculogic Corporation
- Karim Dehkordi
- G01 - MEASURING TESTING
Information Patent Grant
Robot-assisted hardware testing
- Patent number 11,221,349
- Issue date Jan 11, 2022
- POSIT SYSTEMS LTD.
- David Arlinsky
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Inspection device
- Patent number 11,204,368
- Issue date Dec 21, 2021
- Yokowo Co., Ltd.
- Masaki Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic prober
- Patent number 11,175,309
- Issue date Nov 16, 2021
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Staggered probe card
- Patent number 11,175,312
- Issue date Nov 16, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Shielded RF and thermal connection for on-wafer load pull
- Patent number 11,125,777
- Issue date Sep 21, 2021
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Pressure relief valve
- Patent number 11,112,429
- Issue date Sep 7, 2021
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and electronic device testing system
- Patent number 11,112,430
- Issue date Sep 7, 2021
- Intel Corporation
- Anil Kaza
- G01 - MEASURING TESTING
Information Patent Grant
Methods of controlling the operation of probe stations and probe st...
- Patent number 11,016,121
- Issue date May 25, 2021
- FormFactor, Inc.
- Sia Choon Beng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250224423
- Publication date Jul 10, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
PROBE, PROBE-HOLDING DEVICE, AND METHOD FOR MANUFACTURING PROBE
- Publication number 20250199031
- Publication date Jun 19, 2025
- Kabushiki Kaisha Nihon Micronics
- Yasutaka KISHI
- G01 - MEASURING TESTING
Information Patent Application
LOW FRICTION HORIZONTAL PROBING FIXTURE
- Publication number 20250147068
- Publication date May 8, 2025
- Kuan-Hung Chen
- G01 - MEASURING TESTING
Information Patent Application
MANAGEMENT SYSTEM FOR PROBE CARDS
- Publication number 20250130253
- Publication date Apr 24, 2025
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE STORAGE JIG, PROBE STORAGE SYSTEM, AND PROBE STORAGE METHOD
- Publication number 20250116685
- Publication date Apr 10, 2025
- Kabushiki Kaisha Nihon Micronics
- Toshinaga TAKEYA
- G01 - MEASURING TESTING
Information Patent Application
DETACHABLE PROTECTIVE STRUCTURE OF DETECTION DEVICE
- Publication number 20250044320
- Publication date Feb 6, 2025
- NATIONAL APPLIED RESEARCH LABORATORIES
- GUO-WEI HUANG
- G01 - MEASURING TESTING
Information Patent Application
ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT
- Publication number 20240393365
- Publication date Nov 28, 2024
- VIEWON CO., LTD.
- Young Wook YOON
- G01 - MEASURING TESTING
Information Patent Application
Test head for a finger tester, and method for testing printed circu...
- Publication number 20240385215
- Publication date Nov 21, 2024
- ATG LUTHER & MAELZER GMBH
- Christian Weindel
- G01 - MEASURING TESTING
Information Patent Application
Probe-holder support and corresponding probes with facilitated moun...
- Publication number 20240353481
- Publication date Oct 24, 2024
- Microtest S.p.A.
- Giuseppe Amelio
- G01 - MEASURING TESTING
Information Patent Application
Electrical Testing Device with Probe Having an Adjustable Angle
- Publication number 20240288473
- Publication date Aug 29, 2024
- Snap-on Incorporated
- Nicholas A. Gabbey
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD DETECTION DEVICE
- Publication number 20240248129
- Publication date Jul 25, 2024
- MPI Corporation
- Wen-Wei Lin
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE
- Publication number 20240241169
- Publication date Jul 18, 2024
- Mitsubishi Electric Corporation
- Tomohito TANIUCHI
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
- Publication number 20240230714
- Publication date Jul 11, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
FENCE TESTER
- Publication number 20240118312
- Publication date Apr 11, 2024
- Forcefield Active Technology Limited
- Aidan MURPHY
- B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information Patent Application
REMOTE CONTROL DEVICES FOR PROBE SYSTEMS, PROBE SYSTEMS THAT INCLUD...
- Publication number 20240110942
- Publication date Apr 4, 2024
- FormFactor, Inc.
- Benjamin E. Waters
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE FOR DISPLAY APPARATUS AND INSPECTION METHOD FOR D...
- Publication number 20240094246
- Publication date Mar 21, 2024
- SAMSUNG DISPLAY CO., LTD.
- Daewon Lee
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD
- Publication number 20240085454
- Publication date Mar 14, 2024
- Federal Institute of Metrology METAS
- Johannes Hoffmann
- G01 - MEASURING TESTING
Information Patent Application
PROBE PIN
- Publication number 20240085456
- Publication date Mar 14, 2024
- LUKEN Technologies
- Yun Tae AN
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTMENT CONTROL DEVICE FOR PRECISE MEASUREMENT
- Publication number 20230366911
- Publication date Nov 16, 2023
- PAMTEK Co., Ltd.
- Jae Woong KIM
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Touch Screen Testing Platform for Engaging a Dynamically Positioned...
- Publication number 20230364799
- Publication date Nov 16, 2023
- T-Mobile USA, Inc.
- David Ross Jenkinson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE UNIT AND HOLDER FOR A PROBE UNIT
- Publication number 20230333140
- Publication date Oct 19, 2023
- CARL MAHR HOLDING GMBH
- Matthias RUDKOWSKI
- G01 - MEASURING TESTING
Information Patent Application
A probe-holder support and corresponding probes with facilitated mo...
- Publication number 20230213576
- Publication date Jul 6, 2023
- MICROTEST S.R.L.
- GIUSEPPE AMELIO
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING FIXTURE AND PROCESS FOR ELECTRODE OF NEUROMODULATION...
- Publication number 20230204627
- Publication date Jun 29, 2023
- Industrial Technology Research Institute
- JO-PING LEE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...
- Publication number 20230168277
- Publication date Jun 1, 2023
- AEHR TEST SYSTEMS
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY WITH TWO SPACED PROBES FOR HIGH FREQUENCY CIRCUIT BO...
- Publication number 20230120201
- Publication date Apr 20, 2023
- Alan Howard
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE INSPECTION SOCKET, AND DEVICE AND METHOD FOR MANU...
- Publication number 20230093356
- Publication date Mar 23, 2023
- UNITED PRECISION TECHNOLOGIES CO., LTD.
- MASARU IENAGA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CABLE ASSEMBLY AND METHOD
- Publication number 20230024181
- Publication date Jan 26, 2023
- Rohde& Schwarz GmbH & Co. KG
- Franz STRASSER
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION APPARATUS AND WAFER INSPECTION METHOD
- Publication number 20220381818
- Publication date Dec 1, 2022
- SEMES CO., LTD.
- Hyuk Ju LEE
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION LINE FOR HIGH CURRENTS AND/OR VOLTAGES, TESTING DEVICE,...
- Publication number 20220262546
- Publication date Aug 18, 2022
- LISA DRAXLMAIER GMBH
- Manuel KAGERHUBER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE TEST FIXTURE FOR SCREENING ELECTRICAL CONTINUITY
- Publication number 20220206083
- Publication date Jun 30, 2022
- Galvani Bioelectronics Limited
- Ellen KAPLAN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Apparatus for holding or moving single probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Connection line for high currents and/or voltages, testing device,...

Controlling alignment during a thermal cycle

Adjustment control device for precise measurement

Manufacturing fixture and process for electrode of neuromodulation...

Integrated circuit spike check probing apparatus and method

Semi-automatic prober

Probe-holder support and corresponding probes with facilitated moun...

Non-destructive test fixture for screening electrical continuity

Probe apparatus

System for testing an integrated circuit of a device and its method...

Tool for precise locating of fasteners under coatings

Probe cable assembly and method

Touch screen testing platform for engaging a dynamically positioned...

Probe assembly with two spaced probes for high frequency circuit bo...

Test device

Multi-angle sample holder with integrated micromanipulator

Pressure relief valve

Probe adapter for a blade outer air seal and method for using same

Apparatuses and methods for mitigating sticking of units-under-test

Integrated circuit spike check test point identification apparatus...

Portable probe stand assembly

Method and apparatus for testing printed circuit boards

Robot-assisted hardware testing

Inspection device

Semi-automatic prober

Staggered probe card

Shielded RF and thermal connection for on-wafer load pull

Pressure relief valve

Probe head and electronic device testing system

Methods of controlling the operation of probe stations and probe st...

Patents Applicationslast 30 patents

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

PROBE, PROBE-HOLDING DEVICE, AND METHOD FOR MANUFACTURING PROBE

LOW FRICTION HORIZONTAL PROBING FIXTURE

MANAGEMENT SYSTEM FOR PROBE CARDS

PROBE STORAGE JIG, PROBE STORAGE SYSTEM, AND PROBE STORAGE METHOD

DETACHABLE PROTECTIVE STRUCTURE OF DETECTION DEVICE

ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT

Test head for a finger tester, and method for testing printed circu...

Probe-holder support and corresponding probes with facilitated moun...

Electrical Testing Device with Probe Having an Adjustable Angle

CIRCUIT BOARD DETECTION DEVICE

INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE

CONTROLLING ALIGNMENT DURING A THERMAL CYCLE

FENCE TESTER

REMOTE CONTROL DEVICES FOR PROBE SYSTEMS, PROBE SYSTEMS THAT INCLUD...

INSPECTION DEVICE FOR DISPLAY APPARATUS AND INSPECTION METHOD FOR D...

COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD

PROBE PIN

ADJUSTMENT CONTROL DEVICE FOR PRECISE MEASUREMENT

Touch Screen Testing Platform for Engaging a Dynamically Positioned...

PROBE UNIT AND HOLDER FOR A PROBE UNIT

A probe-holder support and corresponding probes with facilitated mo...

MANUFACTURING FIXTURE AND PROCESS FOR ELECTRODE OF NEUROMODULATION...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...

PROBE ASSEMBLY WITH TWO SPACED PROBES FOR HIGH FREQUENCY CIRCUIT BO...

ELECTRONIC DEVICE INSPECTION SOCKET, AND DEVICE AND METHOD FOR MANU...

PROBE CABLE ASSEMBLY AND METHOD

WAFER INSPECTION APPARATUS AND WAFER INSPECTION METHOD

CONNECTION LINE FOR HIGH CURRENTS AND/OR VOLTAGES, TESTING DEVICE,...

NON-DESTRUCTIVE TEST FIXTURE FOR SCREENING ELECTRICAL CONTINUITY