Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES

G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

G01R1/02General constructional details G01R1/025concerning dedicated user interfaces G01R1/04Housings Supporting members Arrangements of terminals G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets G01R1/0416Connectors, terminals G01R1/0425Test clips G01R1/0433Sockets for IC's or transistors G01R1/0441Details G01R1/045Sockets or component fixtures for RF or HF testing G01R1/0458related to environmental aspects G01R1/0466concerning contact pieces or mechanical details G01R1/0475for TAB IC's G01R1/0483Sockets for un-leaded IC's having matrix type contact fields G01R1/0491for testing integrated circuits on wafers G01R1/06Measuring leads Measuring probes G01R1/067Measuring probes G01R1/06705Apparatus for holding or moving single probes G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins G01R1/06716Elastic G01R1/06722Spring-loaded G01R1/06727Cantilever beams G01R1/06733Geometry aspects G01R1/06738related to tip portion G01R1/06744Microprobes G01R1/0675Needle-like G01R1/06755Material aspects G01R1/06761related to layers G01R1/06766Input circuits therefor G01R1/06772High frequency probes G01R1/06777High voltage probes G01R1/06783containing liquids G01R1/06788Hand-held or hand-manipulated probes G01R1/06794Devices for sensing when probes are in contact, or in position to contact, with measured object G01R1/07Non-contact-making probes G01R1/071containing electro-optic elements G01R1/072containing ionised gas G01R1/073Multiple probes G01R1/07307with individual probe elements G01R1/07314the body of the probe being perpendicular to test object G01R1/07321the probes being of different lengths G01R1/07328for testing printed circuit boards G01R1/07335for double-sided contacting or for testing boards with surface-mounted devices (SMD's) G01R1/07342the body of the probe being at an angle other than perpendicular to test object G01R1/0735arranged on a flexible frame or film G01R1/07357with flexible bodies G01R1/07364with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch G01R1/07371using an intermediate card or back card with apertures through which the probes pass G01R1/07378using an intermediate adapter G01R1/07385using switching of signals between probe tips and test bed G01R1/07392manipulating each probe element or tip individually G01R1/08Pointers Scales Scale illumination G01R1/10Arrangements of bearings G01R1/12of strip or wire bearings G01R1/14Braking arrangements Damping arrangements G01R1/16Magnets G01R1/18Screening arrangements against electric or magnetic fields G01R1/20Modifications of basic electric elements for use in electric measuring instruments Structural combinations of such elements with such instruments G01R1/203Resistors used for electric measuring G01R1/206Switches for connection of measuring instruments or electric motors to measuring loads G01R1/22Tong testers acting as secondary windings of current tranformers G01R1/24Transmission-line G01R1/26with linear movement of probe G01R1/28Provision in measuring instruments for reference values G01R1/30Structural combination of electric measuring instruments with basic electronic circuits G01R1/36Overload protection arrangements or circuits for electric measuring instruments G01R1/38Arrangements for altering the indicating characteristic G01R1/40Modifications of instruments to indicate the maximum or the minimum value reached in a time interval G01R1/42thermally operated G01R1/44Modifications of instruments for temperature compensation