Applications, other than SPM, of scanning-probe techniques

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Current Industry

G01Q80/00Applications, other than SPM, of scanning-probe techniques

Industries

Patents Grantslast 30 patents

Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 12,078,654
- Issue date Sep 3, 2024
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self-packing three-arm thermal scanning probe for micro-nano manufa...
- Patent number 11,970,392
- Issue date Apr 30, 2024
- Zhejiang University
- Huan Hu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,964,310
- Issue date Apr 23, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Cantilever, ultrasound acoustic microscopy device comprising the ca...
- Patent number 11,927,564
- Issue date Mar 12, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Tuning local conductances of molecular networks: applications to ar...
- Patent number 11,823,032
- Issue date Nov 21, 2023
- International Business Machines Corporation
- Leo Gross
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
- Patent number 11,733,186
- Issue date Aug 22, 2023
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 11,708,384
- Issue date Jul 25, 2023
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nano-indent process for creating single photon emitters in a two-di...
- Patent number 11,705,535
- Issue date Jul 18, 2023
- The Government of the United States of America, as represented by the Secreta...
- Berend T. Jonker
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods and devices configured to operated scanning tunneling micro...
- Patent number 11,650,222
- Issue date May 16, 2023
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Initiating and monitoring the evolution of single electrons within...
- Patent number 11,635,450
- Issue date Apr 25, 2023
- QUANTUM SILICON INC.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable, electro-optically induced force system and method
- Patent number 11,605,475
- Issue date Mar 14, 2023
- Geoffrey James Germann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 11,592,463
- Issue date Feb 28, 2023
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Debris removal in high aspect structures
- Patent number 11,577,286
- Issue date Feb 14, 2023
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,391,664
- Issue date Jul 19, 2022
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Grant
System and method for autonomous scanning probe microscopy with in-...
- Patent number 11,320,455
- Issue date May 3, 2022
- The Governors of the University of Alberta
- Mohammad Rashidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, atomic force microscopy system and computer program product
- Patent number 11,289,367
- Issue date Mar 29, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Grant
Scalable, electro-optically induced force system and method
- Patent number 11,239,002
- Issue date Feb 1, 2022
- Geoffrey James Germann
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 11,148,944
- Issue date Oct 19, 2021
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods and devices configured to operated scanning tunneling micro...
- Patent number 11,143,671
- Issue date Oct 12, 2021
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Initiating and monitoring the evolution of single electrons within...
- Patent number 11,047,877
- Issue date Jun 29, 2021
- QUANTUM SILICON INC.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 11,040,379
- Issue date Jun 22, 2021
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Phononic system to achieve quantum-analogue phase-based unitary ope...
- Patent number 11,017,756
- Issue date May 25, 2021
- Arizona Board of Regents on behalf of the University of Arizona
- Pierre A. Deymier
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 11,002,758
- Issue date May 11, 2021
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device and method for analysing a defect of a photolithographic mas...
- Patent number 10,983,075
- Issue date Apr 20, 2021
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Grant
Depassivation lithography by scanning tunneling microscopy
- Patent number 10,983,142
- Issue date Apr 20, 2021
- Zyvex Labs, LLC
- John Randall
- G01 - MEASURING TESTING
Information Patent Grant
In situ tribometer and methods of use
- Patent number 10,908,069
- Issue date Feb 2, 2021
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- G01 - MEASURING TESTING
Information Patent Grant
Method of preparing sample surface, method of analyzing sample surf...
- Patent number 10,895,538
- Issue date Jan 19, 2021
- Sumco Corporation
- Keiichiro Mori
- G01 - MEASURING TESTING
Information Patent Grant
Thermal nanolithography method and system
- Patent number 10,852,641
- Issue date Dec 1, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for mechanosynthesis
- Patent number 10,822,229
- Issue date Nov 3, 2020
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Systems and methods for nano-tribological manufacturing of nanostru...
- Patent number 10,768,202
- Issue date Sep 8, 2020
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
- Publication number 20240269717
- Publication date Aug 15, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...
- Publication number 20240230712
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Gyubaek Lee
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope, Sample Observation Processing System, an...
- Publication number 20240168052
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Toru AISO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...
- Publication number 20240133919
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Gyubaek Lee
- G01 - MEASURING TESTING
Information Patent Application
SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...
- Publication number 20240002220
- Publication date Jan 4, 2024
- ZHEJIANG UNIVERSITY
- Huan HU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING A SAMPLE
- Publication number 20230418153
- Publication date Dec 28, 2023
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...
- Publication number 20230417795
- Publication date Dec 28, 2023
- University of Central Florida Research Foundation, Inc.
- Laurene Tetard
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE
- Publication number 20220357360
- Publication date Nov 10, 2022
- ACTOPROBE LLC
- ALEXANDER A. UKHANOV
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-...
- Publication number 20220155339
- Publication date May 19, 2022
- Quantum Silicon Inc.
- Mohammad Rashidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Mechanosynthesis
- Publication number 20220106338
- Publication date Apr 7, 2022
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Application
CANTILEVER, ULTRASOUND ACOUSTIC MICROSCOPY DEVICE COMPRISING THE CA...
- Publication number 20220091069
- Publication date Mar 24, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Maarten Hubertus VAN ES
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...
- Publication number 20220082582
- Publication date Mar 17, 2022
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD
- Publication number 20220050125
- Publication date Feb 17, 2022
- SHOWA DENKO K.K.
- Tsuyoshi KATO
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Mechanosynthesis
- Publication number 20210403322
- Publication date Dec 30, 2021
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Application
Device, and Method of Manufacture, for use in Mechanically Cleaning...
- Publication number 20210396784
- Publication date Dec 23, 2021
- Bruker Nano, Inc.
- Weijie Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-...
- Publication number 20210373045
- Publication date Dec 2, 2021
- Quantum Silicon Inc.
- Mohammad Rashidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...
- Publication number 20210325429
- Publication date Oct 21, 2021
- Quantum Silicon Inc.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20210263069
- Publication date Aug 26, 2021
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEVICE AND METHOD FOR ANALYSING A DEFECT OF A PHOTOLITHOGRAPHIC MAS...
- Publication number 20210247336
- Publication date Aug 12, 2021
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...
- Publication number 20210132109
- Publication date May 6, 2021
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Mechanosynthesis
- Publication number 20210047178
- Publication date Feb 18, 2021
- CBN Nano Technologies Inc.
- Ralph C. Merkle
- B82 - NANO-TECHNOLOGY
Information Patent Application
PHONONIC SYSTEM TO ACHIEVE QUANTUM-ANALOGUE PHASE-BASED UNITARY OPE...
- Publication number 20200388263
- Publication date Dec 10, 2020
- Arizona Board of Regends on Behalf of the University of Arizona
- Pierre A. Deymier
- G01 - MEASURING TESTING
Information Patent Application
INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...
- Publication number 20200249256
- Publication date Aug 6, 2020
- Quantum Silicon Inc.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Tuning Local Conductances Of Molecular Networks: Applications To Ar...
- Publication number 20200234104
- Publication date Jul 23, 2020
- International Business Machines Corporation
- Leo Gross
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT
- Publication number 20200227311
- Publication date Jul 16, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Application
Depassivation Lithography by Scanning Tunneling Microscopy
- Publication number 20200132718
- Publication date Apr 30, 2020
- ZYVEX LABS, LLC
- John Randall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A SYSTEM FOR MICRODROPLET MANIPULATION
- Publication number 20190358623
- Publication date Nov 28, 2019
- SHILPS SCIECES PRIVATE LIMITED
- Ashwin LAL
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
THERMAL NANOLITHOGRAPHY METHOD AND SYSTEM
- Publication number 20190361356
- Publication date Nov 28, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MODIFYING A SURFACE OF A SAMPLE, AND A SCANNING PROBE MIC...
- Publication number 20190353681
- Publication date Nov 21, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
Build Sequences for Mechanosynthesis
- Publication number 20190250187
- Publication date Aug 15, 2019
- CBN Nano Technologies Inc.
- Damian G. Allis
- B82 - NANO-TECHNOLOGY

Applications, other than SPM, of scanning-probe techniques

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Self-packing three-arm thermal scanning probe for micro-nano manufa...

Debris removal from high aspect structures

Cantilever, ultrasound acoustic microscopy device comprising the ca...

Tuning local conductances of molecular networks: applications to ar...

Device and method for analyzing a defect of a photolithographic mas...

Systems and methods for mechanosynthesis

Nano-indent process for creating single photon emitters in a two-di...

Methods and devices configured to operated scanning tunneling micro...

Initiating and monitoring the evolution of single electrons within...

Scalable, electro-optically induced force system and method

Systems and methods for mechanosynthesis

Debris removal in high aspect structures

Debris removal from high aspect structures

System and method for autonomous scanning probe microscopy with in-...

Method, atomic force microscopy system and computer program product

Scalable, electro-optically induced force system and method

Systems and methods for mechanosynthesis

Methods and devices configured to operated scanning tunneling micro...

Initiating and monitoring the evolution of single electrons within...

Debris removal in high aspect structures

Phononic system to achieve quantum-analogue phase-based unitary ope...

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Device and method for analysing a defect of a photolithographic mas...

Depassivation lithography by scanning tunneling microscopy

In situ tribometer and methods of use

Method of preparing sample surface, method of analyzing sample surf...

Thermal nanolithography method and system

Systems and methods for mechanosynthesis

Systems and methods for nano-tribological manufacturing of nanostru...

Patents Applicationslast 30 patents

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...

Scanning Probe Microscope, Sample Observation Processing System, an...

METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...

SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...

METHOD AND APPARATUS FOR PROCESSING A SAMPLE

CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...

SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE

SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-...

Systems and Methods for Mechanosynthesis

CANTILEVER, ULTRASOUND ACOUSTIC MICROSCOPY DEVICE COMPRISING THE CA...

METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...

PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD

Systems and Methods for Mechanosynthesis

Device, and Method of Manufacture, for use in Mechanically Cleaning...

SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-...

INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

DEVICE AND METHOD FOR ANALYSING A DEFECT OF A PHOTOLITHOGRAPHIC MAS...

METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...

Systems and Methods for Mechanosynthesis

PHONONIC SYSTEM TO ACHIEVE QUANTUM-ANALOGUE PHASE-BASED UNITARY OPE...

INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...

Tuning Local Conductances Of Molecular Networks: Applications To Ar...

METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT

Depassivation Lithography by Scanning Tunneling Microscopy

A SYSTEM FOR MICRODROPLET MANIPULATION

THERMAL NANOLITHOGRAPHY METHOD AND SYSTEM

METHOD OF MODIFYING A SURFACE OF A SAMPLE, AND A SCANNING PROBE MIC...

Build Sequences for Mechanosynthesis