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G01J1/00
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J1/00
Photometry
Sub Industries
G01J1/02
Details
G01J1/0204
Compact construction
G01J1/0209
Monolithic
G01J1/0214
Constructional arrangements for removing stray light
G01J1/0219
Electrical interface; User interface
G01J1/0223
Sample holders for photometry
G01J1/0228
Control of working procedures; Failure detection; Spectral bandwidth calculation
G01J1/0233
Handheld
G01J1/0238
making use of sensor-related data
G01J1/0242
Control or determination of height or angle information of sensors or receivers; Goniophotometry
G01J1/0247
using a charging unit
G01J1/0252
Constructional arrangements for compensating for fluctuations caused by
G01J1/0266
Field-of-view determination; Aiming or pointing of a photometer; Adjusting alignment; Encoding angular position; Size of the measurement area; Position tracking; Photodetection involving different fields of view for a single detector
G01J1/0271
Housings; Attachments or accessories for photometers
G01J1/029
Multi-channel photometry
G01J1/0295
Constructional arrangements for removing other types of optical noise or for performing calibration
G01J1/04
Optical or mechnical part supplementary adjustable parts
G01J1/0403
Mechanical elements; Supports for optical elements; Scanning arrangements
G01J1/0407
Optical elements not provided otherwise
G01J1/0411
using focussing or collimating elements
G01J1/0414
using plane or convex mirrors, parallel phase plates, or plane beam-splitters
G01J1/0418
using attenuators
G01J1/0422
using light concentrators, collectors or condensers
G01J1/0425
using optical fibers
G01J1/0429
using polarisation elements
G01J1/0433
using notch filters
G01J1/0437
using masks, aperture plates, spatial light modulators, spatial filters
G01J1/044
using shutters
G01J1/0444
using means for replacing an element by another
G01J1/0448
Adjustable
G01J1/0451
using means for illuminating a slit efficiently
G01J1/0455
having a throughhole enabling the optical element to fulfil an additional optical function
G01J1/0459
using an optical amplifier of light or coatings to improve optical coupling
G01J1/0462
Slit arrangements
G01J1/0466
with a sighting port
G01J1/047
using extension/expansion of solids or fluids, change of resonant frequency or extinction effect
G01J1/0474
Diffusers
G01J1/0477
Prisms, wedges
G01J1/0488
with spectral filtering
G01J1/0492
using at least two different filters
G01J1/06
Restricting the angle of incident light
G01J1/08
Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
G01J1/10
by comparison with reference light or electric value provisionally void
G01J1/12
using wholly visual means
G01J1/122
Visual exposure meters for determining the exposure time in photographical recording or reproducing
G01J1/124
based on the comparison of the intensity of measured light with a comparison source or comparison illuminated surface
G01J1/126
for enlarging apparatus
G01J1/128
for copy- or printing apparatus
G01J1/14
using comparison with a surface of graded brightness
G01J1/16
using electric radiation detectors
G01J1/1626
Arrangements with two photodetectors, the signals of which are compared
G01J1/18
using comparison with a reference electric value
G01J1/20
intensity of the measured or reference value being varied to equalise their effects at the detectors
G01J1/22
using a variable element in the light-path
G01J1/24
using electric radiation detectors
G01J1/26
adapted for automatic variation of the measured or reference value
G01J1/28
using variation of intensity or distance of source
G01J1/30
using electric radiation detectors
G01J1/32
adapted for automatic variation of the measured or reference value
G01J1/34
using separate light paths used alternately or sequentially
G01J1/36
using electric radiation detectors
G01J1/38
using wholly visual means
G01J1/40
using limit or visibility or extinction effect
G01J1/42
using electric radiation detectors
G01J1/4204
with determination of ambient light
G01J1/4209
Photoelectric exposure meters for determining the exposure time in recording or reproducing
G01J1/4214
specially adapted for view-taking apparatus
G01J1/4219
specially adapted for enlargers
G01J1/4223
specially adapted for copy - or printing apparatus
G01J1/4228
arrangements with two or more detectors
G01J1/4257
applied to monitoring the characteristics of a beam
G01J1/429
applied to measurement of ultraviolet light
G01J1/44
Electric circuits
G01J1/46
using a capacitor
G01J1/48
using chemical effects
G01J1/50
using change in colour of an indicator
G01J1/52
using photographic effects
G01J1/54
by observing photo-reactions between gases
G01J1/56
using radiation pressure or radiometer effect
G01J1/58
using luminescence generated by light
G01J1/60
by measuring the pupil of the eye
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G01 - MEASURING TESTING
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Issue date
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G01 - MEASURING TESTING
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Issue date
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Issue date
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A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent number
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Issue date
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G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Device and method for detecting a light irradiating angle
Patent number
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Issue date
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NATIONAL YANG MING CHIAO TUNG UNIVERSITY
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G01 - MEASURING TESTING
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Dual-amplifier circuit for optical signals
Patent number
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Issue date
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H03 - BASIC ELECTRONIC CIRCUITRY
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Substrate processing apparatus including light receiving device and...
Patent number
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection of optical surface of patient interface for ophthalmic la...
Patent number
12,216,272
Issue date
Feb 4, 2025
AMO Development, LLC
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G01 - MEASURING TESTING
Information
Patent Grant
Photocurrent amplification circuit, amplification control method, o...
Patent number
12,216,003
Issue date
Feb 4, 2025
BOE Technology Group Co., Ltd.
Xinshe Yin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Environment classification based on light assessment
Patent number
12,209,902
Issue date
Jan 28, 2025
Apple Inc.
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G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for an adaptable vehicle light fixture
Patent number
12,207,604
Issue date
Jan 28, 2025
Nacho LED LLC
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A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
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Non-spatial measurement calibration methods and associated systems...
Patent number
12,209,953
Issue date
Jan 28, 2025
Radiant Vision Systems, LLC
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
Display panel and display devices with light detection circuits
Patent number
12,213,369
Issue date
Jan 28, 2025
Shanghai Tianma Micro-Electronics Co., Ltd.
Feng Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Light receiving element and ranging system
Patent number
12,203,807
Issue date
Jan 21, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Tatsuki Nishino
H01 - BASIC ELECTRIC ELEMENTS
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Anti-blooming buffered direct injection pixels
Patent number
12,203,808
Issue date
Jan 21, 2025
Raytheon Company
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G01 - MEASURING TESTING
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Sunshine recorder and sunshine measurement method
Patent number
12,203,806
Issue date
Jan 21, 2025
EKO Instruments Co., Ltd.
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G01 - MEASURING TESTING
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Methods and apparatuses for aligning and diagnosing a laser beam
Patent number
12,204,161
Issue date
Jan 21, 2025
Cymer, LLC
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G01 - MEASURING TESTING
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Light microscope with reconfigurable sensor array
Patent number
12,204,082
Issue date
Jan 21, 2025
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G01 - MEASURING TESTING
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Combi-sensor systems
Patent number
12,203,805
Issue date
Jan 21, 2025
View, Inc.
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E06 - DOORS, WINDOWS, SHUTTERS, OR ROLLER BLINDS IN GENERAL LADDERS
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Solid-state image sensor and electronic device
Patent number
12,207,008
Issue date
Jan 21, 2025
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H01 - BASIC ELECTRIC ELEMENTS
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Concealment component for an optical sensor device
Patent number
12,196,611
Issue date
Jan 14, 2025
Viavi Solutions Inc.
William D. Houck
G01 - MEASURING TESTING
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Patent Grant
Photodetecting device for detecting different wavelengths
Patent number
12,196,610
Issue date
Jan 14, 2025
Artilux, Inc.
Yen-Cheng Lu
G01 - MEASURING TESTING
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Ambient light sensing
Patent number
12,200,367
Issue date
Jan 14, 2025
Texas Instruments Incorporated
Karthik Rajagopal Ganapathy
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Publication date
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KAZUHIRO GOI
G01 - MEASURING TESTING
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SENSOR DEVICE
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20250056913
Publication date
Feb 13, 2025
Sony Semiconductor Solutions Corporation
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H01 - BASIC ELECTRIC ELEMENTS
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H01 - BASIC ELECTRIC ELEMENTS
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G01 - MEASURING TESTING
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Publication date
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G01 - MEASURING TESTING
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PHOTOELECTRIC CONVERSION DEVICE
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20250056138
Publication date
Feb 13, 2025
Canon Kabushiki Kaisha
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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ALIGNING A LASER AND A WAVEGUIDE USING A SPECTRAL SIGNATURE
Publication number
20250055260
Publication date
Feb 13, 2025
DustPhotonics
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H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
METHOD FOR DETERMINING NATURAL LIGHT DURATION, AND ELECTRONIC DEVICE
Publication number
20250052607
Publication date
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G01 - MEASURING TESTING
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COMPUTER IMPLEMENTED METHOD FOR DETECTING SHORT PULSE LASERS
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20250044160
Publication date
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The Secretary of State for Defence
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G01 - MEASURING TESTING
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AMBIENT LIGHT SENSORS
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Publication date
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Snap One, LLC
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G01 - MEASURING TESTING
Information
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Publication number
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Publication date
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ACER INCORPORATED
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G01 - MEASURING TESTING
Information
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A NON-LIVE WIRE MOUNTED SENSOR MODULE AND METHOD FOR MOUNTING THEREOF
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20250044450
Publication date
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G01 - MEASURING TESTING
Information
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METHOD FOR AN ARBITRARY WAVEFORM MEASUREMENT AND A SYSTEM TO OPERAT...
Publication number
20250044161
Publication date
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Karlsruher Institut für Technologie
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G01 - MEASURING TESTING
Information
Patent Application
AMBIENT LIGHT SENSOR AND ELECTRONIC DEVICE
Publication number
20250044150
Publication date
Feb 6, 2025
Shenzhen Goodix Technology Co., Ltd.
Fulin LI
G01 - MEASURING TESTING
Information
Patent Application
ADJUSTABLE SIGNAL SOURCE WITH LOW PHASE NOISE
Publication number
20250044151
Publication date
Feb 6, 2025
UNIVERSITAT PADERBORN
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G01 - MEASURING TESTING
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IMAGE CAPTURING APPARATUS FOR PHOTOMETRY, CONTROL METHOD, AND STORA...
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20250047988
Publication date
Feb 6, 2025
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G01 - MEASURING TESTING
Information
Patent Application
DISPLAY APPARATUS
Publication number
20250039345
Publication date
Jan 30, 2025
SONY GROUP CORPORATION
EIJI TORATANI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Publication date
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F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
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SIGNAL GENERATION CIRCUIT AND LIGHT DETECTING UNIT
Publication number
20250035484
Publication date
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H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ANTI-BLOOMING BUFFERED DIRECT INJECTION PIXELS
Publication number
20250027811
Publication date
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G01 - MEASURING TESTING
Information
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Stress-Responsive Composites
Publication number
20250026896
Publication date
Jan 23, 2025
Arizona Board of Regents on behalf of Arizona State University
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G01 - MEASURING TESTING
Information
Patent Application
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Publication number
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Publication date
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G01 - MEASURING TESTING
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Sampling High Power Beam Profiling
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Publication date
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G01 - MEASURING TESTING
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Publication number
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Publication date
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G05 - CONTROLLING REGULATING
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Patent Application
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Publication date
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G01 - MEASURING TESTING
Information
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20250020507
Publication date
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G01 - MEASURING TESTING
Information
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Publication date
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
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Publication number
20250024015
Publication date
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G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DIAGNOSTICS OF AN ON-BOARD WATER GENERATION SYSTEM
Publication number
20250019269
Publication date
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FORD GLOBAL TECHNOLOGIES, L.L.C.
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B60 - VEHICLES IN GENERAL
Information
Patent Application
OPTICAL DETECTOR, OPTICAL RECEIVER, AND OPTICAL TRANSCEIVER
Publication number
20250012627
Publication date
Jan 9, 2025
FUJITSU OPTICAL COMPONENTS LIMITED
Akira OKA
G01 - MEASURING TESTING