Arrangements for deflecting ray or beam

Industry

CPC
H01J29/70

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J29/00Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00

Current Industry

H01J29/70Arrangements for deflecting ray or beam

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Atomic ovens based on electric discharge
- Patent number 12,106,926
- Issue date Oct 1, 2024
- IONQ, INC.
- Kai Hudek
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magneto-electrostatic sensing, focusing, and steering of electron b...
- Patent number 11,961,693
- Issue date Apr 16, 2024
- ELVE INC.
- Diana Gamzina Daugherty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magneto-electrostatic sensing, focusing, and steering of electron b...
- Patent number 11,915,900
- Issue date Feb 27, 2024
- ELVE INC.
- Diana Gamzina Daugherty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-layer vacuum electron device and method of manufacture
- Patent number 11,894,208
- Issue date Feb 6, 2024
- ELVE INC.
- Diana Gamzina Daugherty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atomic ovens based on electric discharge
- Patent number 11,749,488
- Issue date Sep 5, 2023
- IONQ, INC.
- Kai Hudek
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Beam position monitors for medical radiation machines
- Patent number 10,879,028
- Issue date Dec 29, 2020
- Varian Medical Systems, Inc.
- Mark E. Trail
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device for producing an electron beam
- Patent number 9,773,635
- Issue date Sep 26, 2017
- LILAS GMBH
- Vitalij Lissotschenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Positioning apparatus for an electron beam
- Patent number 9,748,067
- Issue date Aug 29, 2017
- Siemens Aktiengesellschaft
- Jan Berk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 9,368,314
- Issue date Jun 14, 2016
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Grant
Switching micro-resonant structures by modulating a beam of charged...
- Patent number 9,076,623
- Issue date Jul 7, 2015
- Advanced Plasmonics, Inc.
- Jonathan Gorrell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 8,803,103
- Issue date Aug 12, 2014
- Ebara Corporation
- Mamoru Nakasuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,785,878
- Issue date Jul 22, 2014
- Canon Kabushiki Kaisha
- Keiichi Arita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switching micro-resonant structures by modulating a beam of charged...
- Patent number 8,384,042
- Issue date Feb 26, 2013
- Advanced Plasmonics, Inc.
- Jonathan Gorrell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 8,368,031
- Issue date Feb 5, 2013
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 8,053,726
- Issue date Nov 8, 2011
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Grant
Deflection yoke for cathode ray tube
- Patent number 7,629,754
- Issue date Dec 8, 2009
- Samsung SDI Co., Ltd.
- Do-Nyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switching micro-resonant structures using at least one director
- Patent number 7,586,097
- Issue date Sep 8, 2009
- Virgin Islands Microsystems, Inc.
- Jonathan Gorrell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 7,411,191
- Issue date Aug 12, 2008
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Grant
Cathode-ray tube apparatus with magnetic spacers between magnetic r...
- Patent number 7,385,341
- Issue date Jun 10, 2008
- Matsushita Toshiba Picture Display Co., Ltd.
- Koji Nishiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Color cathode-ray tube apparatus
- Patent number 7,315,112
- Issue date Jan 1, 2008
- Matsushita Toshiba Picture Display Co., Ltd.
- Ryu Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Color cathode ray tube apparatus
- Patent number 7,312,565
- Issue date Dec 25, 2007
- Matsushita Toshiba Picture Display Co., Ltd.
- Kenichiro Taniwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 7,241,993
- Issue date Jul 10, 2007
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Grant
Cathode-ray tube device capable of reducing misconvergence
- Patent number 7,227,301
- Issue date Jun 5, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kazuhiro Sugimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Velocity modulation coil apparatus and cathode-ray tube apparatus
- Patent number 7,129,628
- Issue date Oct 31, 2006
- Matsushita Toshiba Picture Display Co., Ltd.
- Kenichiro Taniwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cathode-ray tube apparatus
- Patent number 7,119,485
- Issue date Oct 10, 2006
- Matsushita Toshiba Picture Display Co., Ltd.
- Katsuyo Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deflection yoke having magnets for correcting raster distortion and...
- Patent number 7,061,170
- Issue date Jun 13, 2006
- Matsushita Electric Industrial Co., Ltd.
- Katsuyo Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Color picture tube apparatus having a pair of bar shaped magnets fo...
- Patent number 7,038,368
- Issue date May 2, 2006
- Matsushita Toshiba Picture Display Co., Ltd.
- Katsuyo Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic device for correcting image geometry defects for cathode-r...
- Patent number 7,005,788
- Issue date Feb 28, 2006
- Thomson Licensing
- Nacerdine Azzi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Color picture tube apparatus with pincushion distortion correction
- Patent number 6,984,929
- Issue date Jan 10, 2006
- Matsushita Electric Industrial Co., Ltd.
- Etsuji Tagami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deflection yoke having short-circuited coil in convergence yoke por...
- Patent number 6,933,667
- Issue date Aug 23, 2005
- Sanyo Electric Co., Ltd.
- Masahiko Miyazaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MAGNETO-ELECTROSTATIC SENSING, FOCUSING, AND STEERING OF ELECTRON B...
- Publication number 20240258061
- Publication date Aug 1, 2024
- Elve Inc.
- Diana Gamzina Daugherty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-LAYER VACUUM ELECTRON DEVICE AND METHOD OF MANUFACTURE
- Publication number 20240242916
- Publication date Jul 18, 2024
- Elve Inc.
- Diana Gamzina Daugherty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOMIC OVENS BASED ON ELECTRIC DISCHARGE
- Publication number 20240047166
- Publication date Feb 8, 2024
- IonQ, Inc.
- Kai HUDEK
- B82 - NANO-TECHNOLOGY
Information Patent Application
Magneto-electrostatic sensing, focusing, and steering of electron b...
- Publication number 20220157550
- Publication date May 19, 2022
- ELVE INC.
- Diana Gamzina Daugherty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOMIC OVENS BASED ON ELECTRIC DISCHARGE
- Publication number 20210257177
- Publication date Aug 19, 2021
- IonQ, Inc.
- Kai HUDEK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRID AMPLIFIER FOR INDUCTIVE LOAD
- Publication number 20210233731
- Publication date Jul 29, 2021
- Freemelt AB
- Robin STEPHANSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR RECIRCULATION WITH CONTROL OF SYNCHROTRON...
- Publication number 20150221467
- Publication date Aug 6, 2015
- Jefferson Science Associates, LLC
- David R. Douglas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device for Producing an Electron Beam
- Publication number 20150144800
- Publication date May 28, 2015
- LIMO PATENTVERWALTUNG GMBH & CO. KG
- Vitalij Lissotschenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...
- Publication number 20140319346
- Publication date Oct 30, 2014
- EBARA CORPORATION
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...
- Publication number 20140034831
- Publication date Feb 6, 2014
- KABUSHIKI KAISHA TOSHIBA
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD OF IRRADIATING CHARGED P...
- Publication number 20130248733
- Publication date Sep 26, 2013
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWITCHING MICRO-RESONANT STRUCTURES BY MODULATING A BEAM OF CHARGED...
- Publication number 20130161529
- Publication date Jun 27, 2013
- ADVANCED PLASMONICS, INC.
- Jonathan Gorrell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130143161
- Publication date Jun 6, 2013
- Canon Kabushiki Kaisha
- Keiichi ARITA
- B82 - NANO-TECHNOLOGY
Information Patent Application
INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...
- Publication number 20120032079
- Publication date Feb 9, 2012
- KABUSHIKI KAISHA TOSHIBA
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
SWITCHING MICRO-RESONANT STRUCTURES BY MODULATING A BEAM OF CHARGED...
- Publication number 20090140178
- Publication date Jun 4, 2009
- Virgin Islands Microsystems, Inc.
- Jonathan Gorrell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Magnetic Field Compensation Apparatus for Cathode Ray Tube
- Publication number 20090108729
- Publication date Apr 30, 2009
- Istvan Gorog
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Inspection system by charged particle beam and method of manufactur...
- Publication number 20090032708
- Publication date Feb 5, 2009
- EBARA CORPORATION
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
Inspection system by charged particle beam and method of manufactur...
- Publication number 20070235644
- Publication date Oct 11, 2007
- EBARA CORPORATION
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
Color cathode-ray tube apparatus
- Publication number 20070222359
- Publication date Sep 27, 2007
- MATSUSHITA TOSHIBA PICTURE DISPLAY CO., LTD.
- Kenichiro Taniwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cathode-ray tube apparatus
- Publication number 20070182305
- Publication date Aug 9, 2007
- MATSUSHITA TOSHIBA PICTURE DISPLAY CO., LTD.
- Katsuyo Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Switching micro-resonant structures using at least one director
- Publication number 20070154846
- Publication date Jul 5, 2007
- Virgin Islands Microsystems, Inc.
- Jonathan Gorrell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Hdtv crt display having optimized tube geometry, yoke field and gun...
- Publication number 20070109217
- Publication date May 17, 2007
- Thomson Licensing S.A.
- Robert LLoyd Barbin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Color cathode ray tube apparatus
- Publication number 20070103049
- Publication date May 10, 2007
- MATSUSHITA TOSHIBA PICTURE DISPLAY CO., LTD.
- Kenichiro Taniwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Display device comprising a deflection unit and a deflection unit f...
- Publication number 20060273708
- Publication date Dec 7, 2006
- LG. Philips Displays
- Leendert J. Noordermeer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cathode-ray tube display apparatus
- Publication number 20060202642
- Publication date Sep 14, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Jae-Wook Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Deflection yoke for cathode ray tube
- Publication number 20060181229
- Publication date Aug 17, 2006
- Do-Nyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Deflection coil for cathode ray tube
- Publication number 20060097668
- Publication date May 11, 2006
- Serge Petit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Color picture tube apparatus
- Publication number 20060043867
- Publication date Mar 2, 2006
- MATSUSHITA TOSHIBA PICTURE DISPLAY CO., LTD.
- Etsuji Tagami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Color cathode-ray tube apparatus
- Publication number 20060028116
- Publication date Feb 9, 2006
- MATSUSHITA TOSHIBA PICTURE DISPLAY CO., LTD.
- Ryu Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Velocity modulation coil apparatus and cathode-ray tube apparatus
- Publication number 20050275332
- Publication date Dec 15, 2005
- MATSUSHITA TOSHIBA PICTURE DISPLAY CO., LTD.
- Kenichiro Taniwa
- H01 - BASIC ELECTRIC ELEMENTS

Arrangements for deflecting ray or beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Atomic ovens based on electric discharge

Magneto-electrostatic sensing, focusing, and steering of electron b...

Magneto-electrostatic sensing, focusing, and steering of electron b...

Multi-layer vacuum electron device and method of manufacture

Atomic ovens based on electric discharge

Beam position monitors for medical radiation machines

Device for producing an electron beam

Positioning apparatus for an electron beam

Inspection system by charged particle beam and method of manufactur...

Switching micro-resonant structures by modulating a beam of charged...

Inspection system by charged particle beam and method of manufactur...

Charged particle beam apparatus

Switching micro-resonant structures by modulating a beam of charged...

Inspection system by charged particle beam and method of manufactur...

Inspection system by charged particle beam and method of manufactur...

Deflection yoke for cathode ray tube

Switching micro-resonant structures using at least one director

Inspection system by charged particle beam and method of manufactur...

Cathode-ray tube apparatus with magnetic spacers between magnetic r...

Color cathode-ray tube apparatus

Color cathode ray tube apparatus

Inspection system by charged particle beam and method of manufactur...

Cathode-ray tube device capable of reducing misconvergence

Velocity modulation coil apparatus and cathode-ray tube apparatus

Cathode-ray tube apparatus

Deflection yoke having magnets for correcting raster distortion and...

Color picture tube apparatus having a pair of bar shaped magnets fo...

Magnetic device for correcting image geometry defects for cathode-r...

Color picture tube apparatus with pincushion distortion correction

Deflection yoke having short-circuited coil in convergence yoke por...

Patents Applicationslast 30 patents

MAGNETO-ELECTROSTATIC SENSING, FOCUSING, AND STEERING OF ELECTRON B...

MULTI-LAYER VACUUM ELECTRON DEVICE AND METHOD OF MANUFACTURE

ATOMIC OVENS BASED ON ELECTRIC DISCHARGE

Magneto-electrostatic sensing, focusing, and steering of electron b...

ATOMIC OVENS BASED ON ELECTRIC DISCHARGE

HYBRID AMPLIFIER FOR INDUCTIVE LOAD

METHOD AND APPARATUS FOR RECIRCULATION WITH CONTROL OF SYNCHROTRON...

Device for Producing an Electron Beam

INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...

INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...

CHARGED PARTICLE BEAM APPARATUS AND METHOD OF IRRADIATING CHARGED P...

SWITCHING MICRO-RESONANT STRUCTURES BY MODULATING A BEAM OF CHARGED...

CHARGED PARTICLE BEAM APPARATUS

INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...

SWITCHING MICRO-RESONANT STRUCTURES BY MODULATING A BEAM OF CHARGED...

Magnetic Field Compensation Apparatus for Cathode Ray Tube

Inspection system by charged particle beam and method of manufactur...

Inspection system by charged particle beam and method of manufactur...

Color cathode-ray tube apparatus

Cathode-ray tube apparatus

Switching micro-resonant structures using at least one director

Hdtv crt display having optimized tube geometry, yoke field and gun...

Color cathode ray tube apparatus

Display device comprising a deflection unit and a deflection unit f...

Cathode-ray tube display apparatus

Deflection yoke for cathode ray tube

Deflection coil for cathode ray tube

Color picture tube apparatus

Color cathode-ray tube apparatus

Velocity modulation coil apparatus and cathode-ray tube apparatus