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G01J2001/448
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2001/448
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Patents Grants
last 30 patents
Information
Patent Grant
Light-receiving apparatus with cycle setting according to illuminat...
Patent number
12,188,816
Issue date
Jan 7, 2025
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Hongbo Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensing system and signal processing apparatus
Patent number
12,164,077
Issue date
Dec 10, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Atsumi Niwa
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Methods and devices for obtaining silicon photomultiplier data
Patent number
12,163,828
Issue date
Dec 10, 2024
Meso Scale Technologies, LLC.
Manish Kochar
G01 - MEASURING TESTING
Information
Patent Grant
Superconducting electronic signal output circuit and readout array
Patent number
12,163,832
Issue date
Dec 10, 2024
SINGLE QUANTUM B.V.
Iman Esmaeil Zadeh
G01 - MEASURING TESTING
Information
Patent Grant
Breakdown voltage detection
Patent number
12,140,622
Issue date
Nov 12, 2024
X-FAB Global Services GmbH
Alexander Zimmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Voltage control system
Patent number
12,123,773
Issue date
Oct 22, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Masato Takemoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Emitter structures for ultra-small vertical cavity surface emitting...
Patent number
12,123,769
Issue date
Oct 22, 2024
Sense Photonics, Inc.
Scott Burroughs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated photodetector with charge storage bin of varied detectio...
Patent number
12,123,772
Issue date
Oct 22, 2024
Quantum-Si Incorporated
Thomas Raymond Thurston
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus providing a plurality of light beams
Patent number
12,123,975
Issue date
Oct 22, 2024
STMicroelectronics (Research & Development) Limited
Christopher Townsend
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Geiger-mode focal plane array having increased tolerance to optical...
Patent number
12,125,857
Issue date
Oct 22, 2024
LG Innotek Co., Ltd
Mark Allen Itzler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Comparator of a voltage of a sense node of a pixel to a comparison...
Patent number
12,107,099
Issue date
Oct 1, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
François Ayel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Bias voltage generation in an optical measurement system
Patent number
12,085,789
Issue date
Sep 10, 2024
HI LLC
Ryan Field
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Diffuser for irradiance sensor including diffuser protruding from e...
Patent number
12,055,434
Issue date
Aug 6, 2024
MICASENSE, INC.
Justin Bates McAllister
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor and apparatus comprising an optical sensor
Patent number
11,994,425
Issue date
May 28, 2024
STMicroelectronics (Research & Development) Limited
Jeffrey M. Raynor
G01 - MEASURING TESTING
Information
Patent Grant
Image sensor with improved light conversion efficiency
Patent number
11,955,501
Issue date
Apr 9, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Shih-Yu Liao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light sensor and ranging method
Patent number
11,953,629
Issue date
Apr 9, 2024
Guangzhou Tyrafos Semiconductor Technologies Co., LTD
Ping-Hung Yin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor device and sensing method
Patent number
11,953,373
Issue date
Apr 9, 2024
Japan Display Inc.
Naoki Takada
G01 - MEASURING TESTING
Information
Patent Grant
Visible light sensor configured for glare detection and controlling...
Patent number
11,927,057
Issue date
Mar 12, 2024
Lutron Technology Company LLC
Craig A. Casey
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for detecting pulsed radiation
Patent number
11,920,978
Issue date
Mar 5, 2024
The Secretary of State for Defence
Sean Michael Tsi-Ong Tipper
G01 - MEASURING TESTING
Information
Patent Grant
In-cell optical sensing display panel
Patent number
11,906,355
Issue date
Feb 20, 2024
Novatek Microelectronics Corp.
Yu-Ying Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Geiger-mode focal plane array with monolithically integrated resistors
Patent number
11,888,000
Issue date
Jan 30, 2024
LG Innotek Co., Ltd
Mark Allen Itzler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device enumeration in an optical measurement system
Patent number
11,877,825
Issue date
Jan 23, 2024
HI LLC
Benjamin Siepser
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
System and method for an optical blood flow measurement
Patent number
11,872,022
Issue date
Jan 16, 2024
The General Hospital Corporation
Maria Angela Franceschini
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus providing a plurality of light beams
Patent number
11,815,628
Issue date
Nov 14, 2023
STMicroelectronics (Research & Development) Limited
Christopher Townsend
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical sensor and apparatus comprising an optical sensor having a...
Patent number
11,796,386
Issue date
Oct 24, 2023
STMicroelectronics (Research & Development) Limited
Jeffrey M. Raynor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photodetector device
Patent number
11,774,283
Issue date
Oct 3, 2023
Hamamatsu Photonics K.K.
Takashi Baba
G01 - MEASURING TESTING
Information
Patent Grant
Light-receiving apparatus with cycle setting according to photon co...
Patent number
11,754,442
Issue date
Sep 12, 2023
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Hongbo Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photoconductor readout circuit
Patent number
11,754,443
Issue date
Sep 12, 2023
trinamiX GmbH
Bertram Feuerstein
G01 - MEASURING TESTING
Information
Patent Grant
Light sensor and calibration method thereof
Patent number
11,747,451
Issue date
Sep 5, 2023
Guangzhou Tyrafos Semiconductor Technologies Co., LTD
Ping-Hung Yin
G01 - MEASURING TESTING
Information
Patent Grant
Light detection apparatus
Patent number
11,747,195
Issue date
Sep 5, 2023
Hamamatsu Photonics K.K.
Tatsuya Hashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
GEIGER-MODE FOCAL PLANE ARRAY HAVING INCREASED TOLERANCE TO OPTICAL...
Publication number
20240429251
Publication date
Dec 26, 2024
LG Innotek Co., Ltd.
Mark Allen ITZLER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THERMALLY COUPLED IMAGER FOR PERFORMING TIME AND POSITION SENSITIVE...
Publication number
20240402007
Publication date
Dec 5, 2024
Government of the United States of America, as Represented by the Secretary o...
Adam Nykoruk McCaughan
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS
Publication number
20240377246
Publication date
Nov 14, 2024
UNM Rainforest Innovations
Steven R.J. BRUECK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
All-Optical Epsilon-Near-Zero Enabled Streak Camera
Publication number
20240369404
Publication date
Nov 7, 2024
Purdue Research Foundation
Vladimir M. SHALAEV
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHODS OF OPERATION OF IMAGE SENSOR
Publication number
20240337531
Publication date
Oct 10, 2024
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Peiyan CAO
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DETECTION DEVICE
Publication number
20240328855
Publication date
Oct 3, 2024
Japan Display Inc.
Kaoru ITO
G01 - MEASURING TESTING
Information
Patent Application
SUPERCONDUCTING ELECTRONIC SIGNAL OUTPUT CIRCUIT AND READOUT ARRAY
Publication number
20240328856
Publication date
Oct 3, 2024
Single Quantum B.V.
Iman ESMAEIL ZADEH
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE AND ELECTRONIC DEVICE
Publication number
20240302206
Publication date
Sep 12, 2024
Sony Semiconductor Solutions Corporation
DAIZO TAKATA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DETECTION SUBSTRATE AND DETECTION DEVICE
Publication number
20240271997
Publication date
Aug 15, 2024
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
Gen HUANG
G01 - MEASURING TESTING
Information
Patent Application
IMAGE SENSOR WITH IMPROVED LIGHT CONVERSION EFFICIENCY
Publication number
20240204032
Publication date
Jun 20, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Shih-Yu LIAO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VISIBLE LIGHT SENSOR CONFIGURED FOR GLARE DETECTION AND CONTROLLING...
Publication number
20240167334
Publication date
May 23, 2024
Lutron Technology Company LLC
Craig A. Casey
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SENSOR AND SENSOR ARRAY AND DISPLAY PANEL AND ELECTRONIC DEVICE
Publication number
20240159587
Publication date
May 16, 2024
Samsung Electronics Co., Ltd.
Chul Joon HEO
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE AND SENSING METHOD
Publication number
20240125647
Publication date
Apr 18, 2024
Japan Display Inc.
Naoki TAKADA
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS HAVING A SINGLE PHOTON AVALANCHE DIODE (SPAD) WITH IMPROV...
Publication number
20240063321
Publication date
Feb 22, 2024
Koninklijke Philips N.V.
Thomas Frach
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS PROVIDING A PLURALITY OF LIGHT BEAMS
Publication number
20240061083
Publication date
Feb 22, 2024
STMicroelectronics (Research and Development) Limited
Christopher Townsend
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOLID-STATE IMAGE PICKUP DEVICE, METHOD OF MANUFACTURING SOLID-STAT...
Publication number
20240047490
Publication date
Feb 8, 2024
SONY GROUP CORPORATION
Ryosuke NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
SENSING SYSTEM AND SIGNAL PROCESSING APPARATUS
Publication number
20240027645
Publication date
Jan 25, 2024
Sony Semiconductor Solutions Corporation
ATSUMI NIWA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
OPTICAL SENSOR AND APPARATUS COMPRISING AN OPTICAL SENSOR
Publication number
20240011828
Publication date
Jan 11, 2024
STMicroelectronics (Research and Development) Limited
Jeffrey M. RAYNOR
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VOLTAGE CONTROL SYSTEM
Publication number
20230408331
Publication date
Dec 21, 2023
Panasonic Intellectual Property Management Co., Ltd.
Masato TAKEMOTO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTOELECTRIC DETECTION DEVICE WITH SEALED DESIGN AND UNDISTORTED P...
Publication number
20230392982
Publication date
Dec 7, 2023
Institute of Microelectronics, Chinese Academy of Sciences
Jing LI
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR OBTAINING SILICON PHOTOMULTIPLIER DATA
Publication number
20230375402
Publication date
Nov 23, 2023
MESO SCALE TECHNOLOGIES, LLC.
Manish KOCHAR
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR RECORDING SIMULTANEOUSLY VISIBLE LIGHT IMAG...
Publication number
20230371780
Publication date
Nov 23, 2023
Cedars-Sinai Medical Center
Pramod Butte
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SMART QUANTUM LIGHT DETECTOR
Publication number
20230375399
Publication date
Nov 23, 2023
Board of Supervisors of Louisiana State University and Agricultural and Mecha...
Omar MAGANA-LOAIZA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHT-RECEIVING APPARATUS
Publication number
20230358608
Publication date
Nov 9, 2023
Sony Semiconductor Solutions Corporation
Hongbo Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTOELECTRIC CONVERSION APPARATUS, OPTICAL DETECTION SYSTEM, AND M...
Publication number
20230343879
Publication date
Oct 26, 2023
Canon Kabushiki Kaisha
YASUHARU OTA
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC RANGE EXTENSION OF SPAD-BASED DEVICES
Publication number
20230332948
Publication date
Oct 19, 2023
ams International AG
André VAN DER AVOIRD
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC RANGE EXTENSION OF SPAD-BASED DEVICES
Publication number
20230324220
Publication date
Oct 12, 2023
ams International AG
André VAN DER AVOIRD
G01 - MEASURING TESTING
Information
Patent Application
COMPACT WIDE FIELD IMAGER FOR LASER DETECTION
Publication number
20230296432
Publication date
Sep 21, 2023
Marek Kowarz
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND LIGHT MICROSCOPE WITH A PLURALITY OF ARRAYS OF PHOTON-CO...
Publication number
20230288687
Publication date
Sep 14, 2023
CARL ZEISS MICROSCOPY GMBH
Tiemo ANHUT
G01 - MEASURING TESTING
Information
Patent Application
AMBIENT LIGHT SENSOR
Publication number
20230268928
Publication date
Aug 24, 2023
STMicroelectronics (Grenoble 2) SAS
Nicolas MOENECLAEY
H01 - BASIC ELECTRIC ELEMENTS