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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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Patents Grantslast 30 patents

Information Patent Grant
Interface circuit for photodetectors providing full-frame integrati...
- Patent number 12,192,658
- Issue date Jan 7, 2025
- Nu-Trek, Inc.
- Stephen Holden Black
- G01 - MEASURING TESTING
Information Patent Grant
Thermal infrared detector
- Patent number 12,181,344
- Issue date Dec 31, 2024
- Samsung Electronics Co., Ltd.
- Dongkyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Interface circuit for photodetectors providing full-frame integrati...
- Patent number 12,155,951
- Issue date Nov 26, 2024
- Nu-Trek, Inc.
- Stephen Holden Black
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Bolometer pixel-based thermally actuated trigger ROIC with self-hea...
- Patent number 12,130,185
- Issue date Oct 29, 2024
- Raytheon Company
- Jehyuk Rhee
- G01 - MEASURING TESTING
Information Patent Grant
Method for processing an image
- Patent number 12,044,578
- Issue date Jul 23, 2024
- Schneider Electric Industries SAS
- Laurent Chiesi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Infrared detecting device
- Patent number 11,971,306
- Issue date Apr 30, 2024
- Mitsubishi Electric Corporation
- Daisuke Fujisawa
- G01 - MEASURING TESTING
Information Patent Grant
Microbolometer systems and methods
- Patent number 11,955,504
- Issue date Apr 9, 2024
- Teledyne FLIR Commercial Systems, Inc.
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for multi-channel pyrometer allowing non-contact...
- Patent number 11,933,675
- Issue date Mar 19, 2024
- Lawrence Livermore National Security, LLC
- Jeffrey Montgomery
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector including field effect transistor in resonant ca...
- Patent number 11,835,391
- Issue date Dec 5, 2023
- Timbre Technologies, Inc.
- Saeed Assadi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microbolometer systems and methods
- Patent number 11,824,078
- Issue date Nov 21, 2023
- TELEDYNE FLIR, LLC
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computational radiation tolerance for high quality infrared focal p...
- Patent number 11,781,914
- Issue date Oct 10, 2023
- Sivananthan Laboratories, Inc.
- Nigel Browning
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for thermal imaging
- Patent number 11,761,821
- Issue date Sep 19, 2023
- Basler AG
- Julian Wingert
- G01 - MEASURING TESTING
Information Patent Grant
Infrared image sensor
- Patent number 11,761,820
- Issue date Sep 19, 2023
- LYNRED
- Nicolas Boudou
- G01 - MEASURING TESTING
Information Patent Grant
Thermal detector for detecting electromagnetic radiation comprising...
- Patent number 11,754,448
- Issue date Sep 12, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Laurent Dussopt
- G01 - MEASURING TESTING
Information Patent Grant
Microbolometer and method of manufacturing
- Patent number 11,740,134
- Issue date Aug 29, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Gerwin Hermanus Gelinck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bolometer-type detector and method for manufacturing the same
- Patent number 11,733,102
- Issue date Aug 22, 2023
- NEC Corporation
- Tomo Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Continuous full-resolution two-color infrared detector
- Patent number 11,674,850
- Issue date Jun 13, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- Michael Goldflam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermistor element and electromagnetic wave sensor
- Patent number 11,676,744
- Issue date Jun 13, 2023
- TDK Corporation
- Susumu Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermistor element and electromagnetic wave sensor
- Patent number 11,668,607
- Issue date Jun 6, 2023
- TDK Corporation
- Maiko Shirokawa
- G01 - MEASURING TESTING
Information Patent Grant
Snapshot infrared sensor
- Patent number 11,656,129
- Issue date May 23, 2023
- LYNRED
- Patrick Robert
- G01 - MEASURING TESTING
Information Patent Grant
Bolometer and method for manufacturing same
- Patent number 11,650,104
- Issue date May 16, 2023
- NEC Corporation
- Tomo Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method for processing a raw image collected by a bolometer detector...
- Patent number 11,639,875
- Issue date May 2, 2023
- Schneider Electric Industries SAS
- Laurent Chiesi
- G01 - MEASURING TESTING
Information Patent Grant
Connected monitoring system
- Patent number 11,423,761
- Issue date Aug 23, 2022
- Gentex Corporation
- David E. Christian
- G07 - CHECKING-DEVICES
Information Patent Grant
Photonic- and phononic-structured pixel for electromagnetic radiati...
- Patent number 11,300,453
- Issue date Apr 12, 2022
- William N. Carr
- G01 - MEASURING TESTING
Information Patent Grant
Thermal image sensing system and thermal image sensing method
- Patent number 11,290,663
- Issue date Mar 29, 2022
- Industrial Technology Research Institute
- Han-Kuei Fu
- G01 - MEASURING TESTING
Information Patent Grant
Method for processing an image
- Patent number 11,262,245
- Issue date Mar 1, 2022
- Schneider Electric Industries SAS
- Laurent Chiesi
- G01 - MEASURING TESTING
Information Patent Grant
Infrared imaging element, infrared imaging array, and method for ma...
- Patent number 11,231,326
- Issue date Jan 25, 2022
- Mitsubishi Electric Corporation
- Tomohiro Maegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining a temperature without contact, and infrared...
- Patent number 11,215,509
- Issue date Jan 4, 2022
- Robert Bosch GmbH
- Michael Frank
- G01 - MEASURING TESTING
Information Patent Grant
Multiple microbolometer selection for simultaneous readout
- Patent number 11,212,466
- Issue date Dec 28, 2021
- FLIR Systems, Inc.
- Brian B. Simolon
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector including field effect transistor in resonant ca...
- Patent number 11,209,318
- Issue date Dec 28, 2021
- Timbre Technologies, Inc.
- Saeed Assadi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
- Publication number 20240339482
- Publication date Oct 10, 2024
- Teledyne FLIR Commercial Systems, Inc.
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMISTOR ELEMENT AND ELECTROMAGNETIC WAVE SENSOR
- Publication number 20240304361
- Publication date Sep 12, 2024
- TDK Corporation
- Maiko KOKUBO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMAGNETIC WAVE DETECTION ELEMENT AND ELECTROMAGNETIC WAVE SEN...
- Publication number 20240280409
- Publication date Aug 22, 2024
- TDK Corporation
- Susumu AOKI
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR, SENSING SYSTEM, AND INFRARED SENSING METHOD
- Publication number 20240264004
- Publication date Aug 8, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- NAOKI TAMBO
- G01 - MEASURING TESTING
Information Patent Application
MICROBOLOMETER DETECTORS WITH RESONANT CAVITIES FOR ENHANCED OPTICA...
- Publication number 20240240990
- Publication date Jul 18, 2024
- Institut National D'Optique
- Francis GÉNÉREUX
- G01 - MEASURING TESTING
Information Patent Application
Device for the Spectrally Resolved Detection of Optical Radiation
- Publication number 20240219238
- Publication date Jul 4, 2024
- 4D Photonics GmbH
- Christoph Franz
- G01 - MEASURING TESTING
Information Patent Application
MICRO-BOLOMETER AND THERMAL SENSING METHOD THEREOF
- Publication number 20240175756
- Publication date May 30, 2024
- SONIX TECHNOLOGY CO., LTD.
- Chien-Liang Lin
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE SENSOR
- Publication number 20240159591
- Publication date May 16, 2024
- TDK Corporation
- Maiko KOKUBO
- G01 - MEASURING TESTING
Information Patent Application
LONG-WAVE INFRARED SENSOR AND ELECTRONIC DEVICE INCLUDING THE SAME
- Publication number 20240142311
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- Jinmyoung Kim
- G01 - MEASURING TESTING
Information Patent Application
AN INTERFACE CIRCUIT FOR PHOTODETECTORS PROVIDING FULL-FRAME INTEGR...
- Publication number 20240053204
- Publication date Feb 15, 2024
- Nu-Trek, Inc.
- Stephen Holden Black
- G01 - MEASURING TESTING
Information Patent Application
BOLOMETER USING CARBON NANOTUBES
- Publication number 20240011841
- Publication date Jan 11, 2024
- NEC Corporation
- Mayumi KOSAKA
- G01 - MEASURING TESTING
Information Patent Application
BOLOMETER AND METHOD FOR MANUFACTURING SAME
- Publication number 20230384166
- Publication date Nov 30, 2023
- NEC Corporation
- Mayumi KOSAKA
- G01 - MEASURING TESTING
Information Patent Application
BOLOMETER-TYPE INFRARED DETECTOR AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20230384165
- Publication date Nov 30, 2023
- NEC Corporation
- Tomo TANAKA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL READOUT FOR THERMAL DETECTOR ARRAY
- Publication number 20230375413
- Publication date Nov 23, 2023
- Government of the United States of America, as Represented by the Secretary o...
- Nathan Andrew Tomlin
- G02 - OPTICS
Information Patent Application
INFRARED SENSOR
- Publication number 20230304867
- Publication date Sep 28, 2023
- HON HAI PRECISION INDUSTRY CO., LTD.
- Kuang-Hao CHIANG
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE SENSOR AND MANUFACTURING METHOD THEREOF
- Publication number 20230296443
- Publication date Sep 21, 2023
- TDK Corporation
- Naoki OHTA
- G01 - MEASURING TESTING
Information Patent Application
BOLOMETER MATERIAL, INFRARED SENSOR AND METHOD FOR MANUFACTURING SAME
- Publication number 20230288262
- Publication date Sep 14, 2023
- NEC Corporation
- Ryota YUGE
- G01 - MEASURING TESTING
Information Patent Application
LONG WAVELENGTH INFRARED SENSOR AND ELECTRONIC DEVICE INCLUDING THE...
- Publication number 20230213390
- Publication date Jul 6, 2023
- Samsung Electronics Co., Ltd.
- Jinmyoung KIM
- G01 - MEASURING TESTING
Information Patent Application
Thermal Radiation Detection Device and System, as Well as Electroni...
- Publication number 20230184591
- Publication date Jun 15, 2023
- Huawei Technologies Co., Ltd
- Torsten Wipiejewski
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE BODY AND ELECTROMAGNETIC WAVE SENSOR
- Publication number 20230064502
- Publication date Mar 2, 2023
- TDK Corporation
- Susumu AOKI
- G01 - MEASURING TESTING
Information Patent Application
ANALOG-TO-DIGITAL CONVERTER AND THERMOPILE ARRAY
- Publication number 20230067583
- Publication date Mar 2, 2023
- CSMC TECHNOLOGIES FAB2 CO., LTD.
- Chen LI
- G01 - MEASURING TESTING
Information Patent Application
BODY AND ELECTROMAGNETIC WAVE SENSOR
- Publication number 20230062983
- Publication date Mar 2, 2023
- TDK Corporation
- Maiko SHIROKAWA
- G01 - MEASURING TESTING
Information Patent Application
DUAL-BAND TEMPERATURE DETECTION SYSTEMS AND METHODS
- Publication number 20230054197
- Publication date Feb 23, 2023
- FLIR Systems AB
- Austin A. Richards
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE COMPENSATION IN INFRARED IMAGING SYSTEMS AND METHODS
- Publication number 20230048503
- Publication date Feb 16, 2023
- Teledyne FLIR Commercial Systems, Inc.
- Per O. Elmfors
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INFRARED DETECTING DEVICE
- Publication number 20230003584
- Publication date Jan 5, 2023
- Mitsubishi Electric Corporation
- Daisuke FUJISAWA
- G01 - MEASURING TESTING
Information Patent Application
DEVICES, SYSTEMS, AND METHODS FOR CALIBRATING AND MAINTAINING A TEM...
- Publication number 20220395904
- Publication date Dec 15, 2022
- Arcam AB
- Tomas Lock
- B22 - CASTING POWDER METALLURGY
Information Patent Application
BOLOMETER-TYPE DETECTOR AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220333994
- Publication date Oct 20, 2022
- NEC Corporation
- Tomo TANAKA
- G01 - MEASURING TESTING
Information Patent Application
Computational Radiation Tolerance for High Quality Infrared Focal P...
- Publication number 20220333996
- Publication date Oct 20, 2022
- Sivananthan Laboratories, Inc.
- Nigel Browning
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
THERMAL DETECTOR FOR DETECTING ELECTROMAGNETIC RADIATION COMPRISING...
- Publication number 20220291048
- Publication date Sep 15, 2022
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Laurent DUSSOPT
- G01 - MEASURING TESTING
Information Patent Application
ULTRAFAST IMAGING SYSTEM WITHOUT ACTIVE PIXEL RESET
- Publication number 20220260425
- Publication date Aug 18, 2022
- Purdue Research Foundation
- Zubin Jacob
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Interface circuit for photodetectors providing full-frame integrati...

Thermal infrared detector

Interface circuit for photodetectors providing full-frame integrati...

Bolometer pixel-based thermally actuated trigger ROIC with self-hea...

Method for processing an image

Infrared detecting device

Microbolometer systems and methods

System and method for multi-channel pyrometer allowing non-contact...

Radiation detector including field effect transistor in resonant ca...

Microbolometer systems and methods

Computational radiation tolerance for high quality infrared focal p...

System and method for thermal imaging

Infrared image sensor

Thermal detector for detecting electromagnetic radiation comprising...

Microbolometer and method of manufacturing

Bolometer-type detector and method for manufacturing the same

Continuous full-resolution two-color infrared detector

Thermistor element and electromagnetic wave sensor

Thermistor element and electromagnetic wave sensor

Snapshot infrared sensor

Bolometer and method for manufacturing same

Method for processing a raw image collected by a bolometer detector...

Connected monitoring system

Photonic- and phononic-structured pixel for electromagnetic radiati...

Thermal image sensing system and thermal image sensing method

Method for processing an image

Infrared imaging element, infrared imaging array, and method for ma...

Method for determining a temperature without contact, and infrared...

Multiple microbolometer selection for simultaneous readout

Radiation detector including field effect transistor in resonant ca...

Patents Applicationslast 30 patents

MICROBOLOMETER SYSTEMS AND METHODS

THERMISTOR ELEMENT AND ELECTROMAGNETIC WAVE SENSOR

ELECTROMAGNETIC WAVE DETECTION ELEMENT AND ELECTROMAGNETIC WAVE SEN...

INFRARED SENSOR, SENSING SYSTEM, AND INFRARED SENSING METHOD

MICROBOLOMETER DETECTORS WITH RESONANT CAVITIES FOR ENHANCED OPTICA...

Device for the Spectrally Resolved Detection of Optical Radiation

MICRO-BOLOMETER AND THERMAL SENSING METHOD THEREOF

ELECTROMAGNETIC WAVE SENSOR

LONG-WAVE INFRARED SENSOR AND ELECTRONIC DEVICE INCLUDING THE SAME

AN INTERFACE CIRCUIT FOR PHOTODETECTORS PROVIDING FULL-FRAME INTEGR...

BOLOMETER USING CARBON NANOTUBES

BOLOMETER AND METHOD FOR MANUFACTURING SAME

BOLOMETER-TYPE INFRARED DETECTOR AND METHOD FOR MANUFACTURING THE SAME

OPTICAL READOUT FOR THERMAL DETECTOR ARRAY

INFRARED SENSOR

ELECTROMAGNETIC WAVE SENSOR AND MANUFACTURING METHOD THEREOF

BOLOMETER MATERIAL, INFRARED SENSOR AND METHOD FOR MANUFACTURING SAME

LONG WAVELENGTH INFRARED SENSOR AND ELECTRONIC DEVICE INCLUDING THE...

Thermal Radiation Detection Device and System, as Well as Electroni...

STRUCTURE BODY AND ELECTROMAGNETIC WAVE SENSOR

ANALOG-TO-DIGITAL CONVERTER AND THERMOPILE ARRAY

BODY AND ELECTROMAGNETIC WAVE SENSOR

DUAL-BAND TEMPERATURE DETECTION SYSTEMS AND METHODS

TEMPERATURE COMPENSATION IN INFRARED IMAGING SYSTEMS AND METHODS

INFRARED DETECTING DEVICE

DEVICES, SYSTEMS, AND METHODS FOR CALIBRATING AND MAINTAINING A TEM...

BOLOMETER-TYPE DETECTOR AND METHOD FOR MANUFACTURING THE SAME

Computational Radiation Tolerance for High Quality Infrared Focal P...

THERMAL DETECTOR FOR DETECTING ELECTROMAGNETIC RADIATION COMPRISING...

ULTRAFAST IMAGING SYSTEM WITHOUT ACTIVE PIXEL RESET