Aspects of quality control [QC]

Industry

CPC
G01R31/2894

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2894Aspects of quality control [QC]

Industries

Patents Grantslast 30 patents

Information Patent Grant
System and method for binning at final test
- Patent number 11,919,046
- Issue date Mar 5, 2024
- Optimal Plus Ltd.
- Reed Linde
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Methods and apparatus for data analysis
- Patent number 11,853,899
- Issue date Dec 26, 2023
- In-Depth Test LLC
- Deana Delp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 11,762,013
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip crack detection apparatus
- Patent number 11,733,289
- Issue date Aug 22, 2023
- Huawei Technologies Co., Ltd.
- Weiguo Hu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit manufacture and outlier detection
- Patent number 11,686,764
- Issue date Jun 27, 2023
- Texas Instruments Incorporated
- Sirish Boddikurapati
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for evaluating the reliability of semiconductor...
- Patent number 11,656,274
- Issue date May 23, 2023
- KLA Corporation
- Robert J. Rathert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process corner detection circuit and process corner detection method
- Patent number 11,573,263
- Issue date Feb 7, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shengcheng Deng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High accurate contact resistance measurement method using one or mo...
- Patent number 11,555,844
- Issue date Jan 17, 2023
- Infineon Technologies AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatuses for testing semiconductor packages and manufacturi...
- Patent number 11,474,149
- Issue date Oct 18, 2022
- Samsung Electronics Co., Ltd.
- Chansik Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test system and test method
- Patent number 11,385,284
- Issue date Jul 12, 2022
- Kioxia Corporation
- Kazuhito Hayasaka
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for detecting abnormal die
- Patent number 11,378,620
- Issue date Jul 5, 2022
- Integrated Silicon Solution Inc.
- Shou-Kang Fan
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring an electric property of a test sample
- Patent number 11,307,245
- Issue date Apr 19, 2022
- KLA Corporation
- Alberto Cagliani
- G11 - INFORMATION STORAGE
Information Patent Grant
Fault detection classification
- Patent number 11,275,975
- Issue date Mar 15, 2022
- Applied Materials, Inc.
- Dermot Cantwell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for binning at final test
- Patent number 11,235,355
- Issue date Feb 1, 2022
- Optimal Plus Ltd.
- Reed Linde
- G01 - MEASURING TESTING
Information Patent Grant
Test information management device, test information management met...
- Patent number 11,237,932
- Issue date Feb 1, 2022
- Yokogawa Electric Corporation
- Ryouhei Furihata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device and system for health monitoring of system-on-chip
- Patent number 11,231,702
- Issue date Jan 25, 2022
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Glitch detection circuit
- Patent number 11,226,365
- Issue date Jan 18, 2022
- Nuvoton Technology Corporation
- Po-Sheng Chen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit and test method for integrated circuit
- Patent number 11,221,362
- Issue date Jan 11, 2022
- Anhui Yunta Electronic Technologies CO., LTD
- Chengjie Zuo
- G01 - MEASURING TESTING
Information Patent Grant
Detecting damaged TMR sensors using bias currents and outliers
- Patent number 11,181,602
- Issue date Nov 23, 2021
- International Business Machines Corporation
- Icko E. T. Iben
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for data collection and analysis for semiconducto...
- Patent number 11,143,689
- Issue date Oct 12, 2021
- Optimal Plus Ltd.
- Shaul Teplinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tester and method for testing a device under test and tester and me...
- Patent number 11,105,855
- Issue date Aug 31, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fine-grained speed binning in an accelerated processing device
- Patent number 11,061,429
- Issue date Jul 13, 2021
- Advanced Micro Devices, Inc.
- Greg Sadowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring thermal stability factor of magneti...
- Patent number 11,054,463
- Issue date Jul 6, 2021
- Tohoku University
- Kenchi Ito
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor yield prediction
- Patent number 11,022,642
- Issue date Jun 1, 2021
- PDF Solutions, Inc.
- Jeffrey Drue David
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Forecasting wafer defects using frequency domain analysis
- Patent number 10,867,116
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating test vectors
- Patent number 10,789,550
- Issue date Sep 29, 2020
- Battelle Memorial Institute
- Katie T. Liszewski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for inline parts average testing and latent rel...
- Patent number 10,761,128
- Issue date Sep 1, 2020
- KLA-Tencor Corporation
- David W. Price
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring misalignment of chips, a method of fabricating...
- Patent number 10,720,365
- Issue date Jul 21, 2020
- Samsung Electronics Co., Ltd.
- Younghoon Sohn
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive testing of integrated circuit chips
- Patent number 10,651,099
- Issue date May 12, 2020
- International Business Machines Corporation
- David W. Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for through substrate via test
- Patent number 10,629,502
- Issue date Apr 21, 2020
- Micron Technology, Inc.
- Ebrahim H Hargan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Outlier Integrated Circuit Detection Method and Outlier Integrated...
- Publication number 20240133949
- Publication date Apr 25, 2024
- MEDIATEK INC.
- Yu-Lin Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE ME...
- Publication number 20240110969
- Publication date Apr 4, 2024
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20240003968
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE PROCESSING SYSTEM TOOLS FOR MONITORING, ASSESSING AND RES...
- Publication number 20230400508
- Publication date Dec 14, 2023
- LAM RESEARCH CORPORATION
- Bridget Hill FREESE
- G05 - CONTROLLING REGULATING
Information Patent Application
TESTING METHOD AND TESTING SYSTEM
- Publication number 20230128364
- Publication date Apr 27, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- Yi-Nan KUO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...
- Publication number 20230072615
- Publication date Mar 9, 2023
- Hamamatsu Photonics K.K.
- Masataka IKESU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST METHOD
- Publication number 20230067428
- Publication date Mar 2, 2023
- Fuji Electric Co., Ltd.
- Kenichi ISHII
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SENSOR
- Publication number 20230045474
- Publication date Feb 9, 2023
- SAMSUNG DISPLAY CO., LTD.
- KEEYONG KIM
- G01 - MEASURING TESTING
Information Patent Application
Illuminator Method and Device for Semiconductor Package Testing
- Publication number 20220390510
- Publication date Dec 8, 2022
- UTAC Headquarters Pte. Ltd.
- Boon Chew Goh
- G01 - MEASURING TESTING
Information Patent Application
PROCESS CORNER DETECTION CIRCUIT AND PROCESS CORNER DETECTION METHOD
- Publication number 20220276300
- Publication date Sep 1, 2022
- Shengcheng DENG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR EVALUATING THE RELIABILITY OF SEMICONDUCTOR...
- Publication number 20220260632
- Publication date Aug 18, 2022
- Robert J. Rathert
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR BINNING AT FINAL TEST
- Publication number 20220184665
- Publication date Jun 16, 2022
- Optimal Plus Ltd.
- Reed Linde
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF COPPER HILLOCK DETECTING
- Publication number 20220178992
- Publication date Jun 9, 2022
- UNITED MICROELECTRONICS CORP.
- Ching-Chih Chang
- G01 - MEASURING TESTING
Information Patent Application
FEED-FORWARD RUN-TO-RUN WAFER PRODUCTION CONTROL SYSTEM BASED ON RE...
- Publication number 20220165626
- Publication date May 26, 2022
- Yangtze Memory Technologies Co., Ltd.
- Fatih OLMEZ
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTION OF COUNTERFEIT AND CYBER ELECTRONIC...
- Publication number 20220164483
- Publication date May 26, 2022
- CYBORD LTD.
- Eyal Isachar WEISS
- G01 - MEASURING TESTING
Information Patent Application
CHIP CRACK DETECTION APPARATUS
- Publication number 20220082612
- Publication date Mar 17, 2022
- Huawei Technologies Co., Ltd
- Weiguo HU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING ABNORMAL DIE
- Publication number 20210349147
- Publication date Nov 11, 2021
- Integrated Silicon Solution Inc.
- Shou-Kang FAN
- G01 - MEASURING TESTING
Information Patent Application
GLITCH DETECTION CIRCUIT
- Publication number 20210247440
- Publication date Aug 12, 2021
- NUVOTON TECHNOLOGY CORPORATION
- Po-Sheng CHEN
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring An Electric Property of a Test Sample
- Publication number 20210231731
- Publication date Jul 29, 2021
- KLA Corporation
- Alberto Cagliani
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...
- Publication number 20210199713
- Publication date Jul 1, 2021
- Advantest Corporation
- Yuji SAKAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20210173007
- Publication date Jun 10, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUSES FOR TESTING SEMICONDUCTOR PACKAGES AND MANUFACTURI...
- Publication number 20210141014
- Publication date May 13, 2021
- Samsung Electronics Co., Ltd.
- Chansik KWON
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND TEST METHOD
- Publication number 20210072308
- Publication date Mar 11, 2021
- Kioxia Corporation
- Kazuhito HAYASAKA
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MANUFACTURE AND OUTLIER DETECTION
- Publication number 20210063479
- Publication date Mar 4, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Sirish Boddikurapati
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Forecasting Wafer Defects Using Frequency Domain Analysis
- Publication number 20200125785
- Publication date Apr 23, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH ACCURATE CONTACT RESISTANCE MEASUREMENT METHOD USING ONE OR MO...
- Publication number 20200003824
- Publication date Jan 2, 2020
- INFINEON TECHNOLOGIES AG
- RALF ARNOLD
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING THERMAL STABILITY FACTOR OF MAGNETI...
- Publication number 20190219633
- Publication date Jul 18, 2019
- TOHOKU UNIVERSITY
- Kenchi ITO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR BINNING AT FINAL TEST
- Publication number 20190160494
- Publication date May 30, 2019
- Optimal Plus Ltd.
- Reed Linde
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
APPARATUS AND METHODS FOR THROUGH SUBSTRATE VIA TEST
- Publication number 20190109057
- Publication date Apr 11, 2019
- Micron Technology, Inc.
- Ebrahim H. Hargan
- G11 - INFORMATION STORAGE
Information Patent Application
FAULT DETECTION CLASSIFICATION
- Publication number 20190108422
- Publication date Apr 11, 2019
- Applied Materials, Inc.
- Dermot CANTWELL
- G06 - COMPUTING CALCULATING COUNTING

Aspects of quality control [QC]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for binning at final test

Methods and apparatus for data analysis

Integrated circuit profiling and anomaly detection

Chip crack detection apparatus

Integrated circuit manufacture and outlier detection

Systems and methods for evaluating the reliability of semiconductor...

Process corner detection circuit and process corner detection method

High accurate contact resistance measurement method using one or mo...

Test apparatuses for testing semiconductor packages and manufacturi...

Test system and test method

Method and system for detecting abnormal die

Method for measuring an electric property of a test sample

Fault detection classification

System and method for binning at final test

Test information management device, test information management met...

Method, device and system for health monitoring of system-on-chip

Glitch detection circuit

Integrated circuit and test method for integrated circuit

Detecting damaged TMR sensors using bias currents and outliers

Method and system for data collection and analysis for semiconducto...

Tester and method for testing a device under test and tester and me...

Fine-grained speed binning in an accelerated processing device

Method and system for measuring thermal stability factor of magneti...

Semiconductor yield prediction

Forecasting wafer defects using frequency domain analysis

System and method for generating test vectors

Methods and systems for inline parts average testing and latent rel...

Method of measuring misalignment of chips, a method of fabricating...

Non-destructive testing of integrated circuit chips

Apparatus and methods for through substrate via test

Patents Applicationslast 30 patents

Outlier Integrated Circuit Detection Method and Outlier Integrated...

TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE ME...

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

SUBSTRATE PROCESSING SYSTEM TOOLS FOR MONITORING, ASSESSING AND RES...

TESTING METHOD AND TESTING SYSTEM

SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...

TEST METHOD

METHOD OF INSPECTING A SENSOR

Illuminator Method and Device for Semiconductor Package Testing

PROCESS CORNER DETECTION CIRCUIT AND PROCESS CORNER DETECTION METHOD

SYSTEMS AND METHODS FOR EVALUATING THE RELIABILITY OF SEMICONDUCTOR...

SYSTEM AND METHOD FOR BINNING AT FINAL TEST

METHOD OF COPPER HILLOCK DETECTING

FEED-FORWARD RUN-TO-RUN WAFER PRODUCTION CONTROL SYSTEM BASED ON RE...

SYSTEM AND METHOD FOR DETECTION OF COUNTERFEIT AND CYBER ELECTRONIC...

CHIP CRACK DETECTION APPARATUS

METHOD AND SYSTEM FOR DETECTING ABNORMAL DIE

GLITCH DETECTION CIRCUIT

Method for Measuring An Electric Property of a Test Sample

ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

TEST APPARATUSES FOR TESTING SEMICONDUCTOR PACKAGES AND MANUFACTURI...

TEST SYSTEM AND TEST METHOD

INTEGRATED CIRCUIT MANUFACTURE AND OUTLIER DETECTION

Forecasting Wafer Defects Using Frequency Domain Analysis

HIGH ACCURATE CONTACT RESISTANCE MEASUREMENT METHOD USING ONE OR MO...

METHOD AND SYSTEM FOR MEASURING THERMAL STABILITY FACTOR OF MAGNETI...

SYSTEM AND METHOD FOR BINNING AT FINAL TEST

APPARATUS AND METHODS FOR THROUGH SUBSTRATE VIA TEST

FAULT DETECTION CLASSIFICATION