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Astronomic interferometers
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G01B2290/10
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B2290/00
Aspects of interferometers not specifically covered by any group under G01B9/02
Current Industry
G01B2290/10
Astronomic interferometers
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Patents Grants
last 30 patents
Information
Patent Grant
Modular interferometric telescope
Patent number
10,422,625
Issue date
Sep 24, 2019
The Boeing Company
David Roderick Gerwe
G01 - MEASURING TESTING
Information
Patent Grant
Phasing an optical interferometer using the radio emission from the...
Patent number
10,082,382
Issue date
Sep 25, 2018
The United States of America, as represented by the Secretary of the Navy
Henrique Schmitt
G01 - MEASURING TESTING
Information
Patent Grant
Chip-scale star tracker
Patent number
9,891,305
Issue date
Feb 13, 2018
The Charles Stark Draper Laboratory, Inc.
Juha-Pekka Laine
G02 - OPTICS
Information
Patent Grant
Signal acquisition and distance variation measurement system for la...
Patent number
9,557,411
Issue date
Jan 31, 2017
Airbus DS GmbH
Filippo Ales
G01 - MEASURING TESTING
Information
Patent Grant
Chip-scale star tracker
Patent number
9,372,250
Issue date
Jun 21, 2016
The Charles Stark Draper Laboratory, Inc.
Juha-Pekka Laine
G01 - MEASURING TESTING
Information
Patent Grant
Lensless imaging with reduced aperture
Patent number
9,354,037
Issue date
May 31, 2016
John Farah
G01 - MEASURING TESTING
Information
Patent Grant
Fiber stabilization of optical path differences (OPD) over a wide b...
Patent number
9,041,992
Issue date
May 26, 2015
The Boeing Company
Paul V. Knowlton
G01 - MEASURING TESTING
Information
Patent Grant
Chip-scale star tracker
Patent number
9,019,509
Issue date
Apr 28, 2015
The Charles Stark Draper Laboratory, Inc.
Juha-Pekka Laine
G01 - MEASURING TESTING
Information
Patent Grant
Lensless imaging with reduced aperture
Patent number
8,693,001
Issue date
Apr 8, 2014
John Farah
G01 - MEASURING TESTING
Information
Patent Grant
Lensless imaging with reduced aperture
Patent number
8,379,214
Issue date
Feb 19, 2013
John Farah
G01 - MEASURING TESTING
Information
Patent Grant
Polarization nulling interferometry
Patent number
8,233,220
Issue date
Jul 31, 2012
Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
Julien Felix Paul Spronck
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric tracking device
Patent number
8,045,178
Issue date
Oct 25, 2011
Optical Physics Company
Richard A. Hutchin
G01 - MEASURING TESTING
Information
Patent Grant
Lensless imaging with reduced aperture
Patent number
7,499,174
Issue date
Mar 3, 2009
John Farah
G01 - MEASURING TESTING
Information
Patent Grant
High precision interferometer apparatus employing a grating beamspl...
Patent number
7,414,730
Issue date
Aug 19, 2008
The Board of Trustees of the Leland Stanford Junior University
Ke-Xun Sun
G01 - MEASURING TESTING
Information
Patent Grant
Phase-preserving amplifier for a stellar interferometer
Patent number
7,154,608
Issue date
Dec 26, 2006
The Board of Trustees of Southern Illnois University
Jack Glassman
G01 - MEASURING TESTING
Information
Patent Grant
Combined dispersive/interference spectroscopy for producing a vecto...
Patent number
6,351,307
Issue date
Feb 26, 2002
The Regents of the University of California
David J. Erskine
G01 - MEASURING TESTING
Information
Patent Grant
Variable shear A. C. interferometer
Patent number
6,304,325
Issue date
Oct 16, 2001
Raytheon Company
John W. Hardy
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring retarded light through very long baseline inte...
Patent number
5,847,830
Issue date
Dec 8, 1998
Allen D. Allen
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer delay line with an optical payload supported by aero...
Patent number
5,610,717
Issue date
Mar 11, 1997
Aerospatiale Societe Nationale Industrielle
Jean-Marc Leblanc
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for realtime-monitoring astronomical object wi...
Patent number
4,913,549
Issue date
Apr 3, 1990
Hamamatsu Photonics Kabushiki Kaisha
Katsuyoshi Fujita
G01 - MEASURING TESTING
Information
Patent Grant
Self-referencing Mach-Zehnder interferometer
Patent number
4,637,725
Issue date
Jan 20, 1987
Lockheed Missiles & Space Company, Inc.
Michael E. Stefanov
G01 - MEASURING TESTING
Information
Patent Grant
Fiber stellar interferometer
Patent number
4,505,588
Issue date
Mar 19, 1985
Jacques E. Ludman
G01 - MEASURING TESTING
Information
Patent Grant
3626192
Patent number
3,626,192
Issue date
Dec 7, 1971
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Phasing an Optical Interferometer Using the Radio Emission from the...
Publication number
20170307351
Publication date
Oct 26, 2017
The Government of the United States of America, as represented by the Secreta...
Henrique Schmitt
G01 - MEASURING TESTING
Information
Patent Application
LENSLESS IMAGING WITH REDUCED APERTURE
Publication number
20140268162
Publication date
Sep 18, 2014
John Farah
G01 - MEASURING TESTING
Information
Patent Application
Fiber Stabilization of Optical Path Differences (OPD) Over a Wide B...
Publication number
20140204439
Publication date
Jul 24, 2014
The Boeing Company
Paul V. Knowlton
G02 - OPTICS
Information
Patent Application
LENSLESS IMAGING WITH REDUCED APERTURE
Publication number
20130222814
Publication date
Aug 29, 2013
John Farah
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL WAVE-FRONT RECOVERY FOR ACTIVE AND ADAPTIVE IMAGING CONTROL
Publication number
20110157600
Publication date
Jun 30, 2011
USA as represented by the Administrator of the
Richard G. Lyon
G02 - OPTICS
Information
Patent Application
POLARIZATION NULLING INTERFEROMETRY
Publication number
20100079852
Publication date
Apr 1, 2010
Nederlandse Organisatie voor toegepast- natuurwetenschappelikj Onderzoek TNO
Julien Felix Paul Spronck
G02 - OPTICS
Information
Patent Application
INTERFEROMETRIC TRACKING DEVICE
Publication number
20100002242
Publication date
Jan 7, 2010
Richard A. Hutchin
G01 - MEASURING TESTING
Information
Patent Application
Lensless imaging with reduced aperture
Publication number
20090219541
Publication date
Sep 3, 2009
John Farah
G01 - MEASURING TESTING
Information
Patent Application
High precision interferometer apparatus employing a grating beamspl...
Publication number
20060290943
Publication date
Dec 28, 2006
Ke-Xun Sun
G01 - MEASURING TESTING
Information
Patent Application
Interferometric imaging with reduced aperture
Publication number
20060154156
Publication date
Jul 13, 2006
John Farah
G01 - MEASURING TESTING