Aspects of interferometers not specifically covered by any group under G01B9/02

Industry

CPC
G01B2290/00

This industry / category may be too specific. Please go to a parent level for more data

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device and method for measuring laser displacement
- Patent number 12,158,340
- Issue date Dec 3, 2024
- National Institute of Metrology, China
- Jianjun Cui
- G01 - MEASURING TESTING
Information Patent Grant
Mirror unit and optical module
- Patent number 12,152,878
- Issue date Nov 26, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical coherence tomography system
- Patent number 12,140,426
- Issue date Nov 12, 2024
- AIT Austrian Institute of Technology GmbH
- Rainer Hainberger
- G01 - MEASURING TESTING
Information Patent Grant
Four-quadrant interferometry system based on an integrated array wa...
- Patent number 12,140,425
- Issue date Nov 12, 2024
- National Institute of Metrology, China
- Xiaofei Diao
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring a substrate and method for correcting cyclic e...
- Patent number 12,135,211
- Issue date Nov 5, 2024
- Carl Zeiss SMT GmbH
- Stephan Zschaeck
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Spatially filtered talbot interferometer for wafer distortion measu...
- Patent number 12,104,891
- Issue date Oct 1, 2024
- Daniel Gene Smith
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring using multiple modalities
- Patent number 12,085,380
- Issue date Sep 10, 2024
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, systems and methods for detecting light
- Patent number 12,072,188
- Issue date Aug 27, 2024
- PANTECH CORPORATION
- Xin Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Optical systems and methods for measuring turbine blade tip clearance
- Patent number 12,060,865
- Issue date Aug 13, 2024
- Parker-Hannifin Corporation
- Lewis J. Boyd
- G01 - MEASURING TESTING
Information Patent Grant
Parallel optical coherence tomography apparatuses, systems, and rel...
- Patent number 12,029,481
- Issue date Jul 9, 2024
- Digital Diagnostics Inc.
- Michael D. Abramoff
- G01 - MEASURING TESTING
Information Patent Grant
Miniature 3D position-to-optical displacement sensor
- Patent number 12,025,438
- Issue date Jul 2, 2024
- The Curators of the University of Missouri
- Genda Chen
- G01 - MEASURING TESTING
Information Patent Grant
Determining angular orientation for imaging
- Patent number 12,004,842
- Issue date Jun 11, 2024
- NINEPOINT MEDICAL, INC.
- Benedikt Graf
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Polarization-separated, phase-shifted interferometer
- Patent number 12,000,698
- Issue date Jun 4, 2024
- Massachusetts Institute of Technology
- Noah Gilbert
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Quantum interferometer with improved entangled photon identification
- Patent number 11,933,608
- Issue date Mar 19, 2024
- Qubit Moving and Storage, LLC
- Gary Vacon
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determining the position of a target stru...
- Patent number 11,927,891
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
System and method for correcting optical path length measurement er...
- Patent number 11,920,928
- Issue date Mar 5, 2024
- Tokyo Electron Limited
- Kenji Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact angle measuring apparatus
- Patent number 11,903,755
- Issue date Feb 20, 2024
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for measuring thickness and refractive index of m...
- Patent number 11,906,281
- Issue date Feb 20, 2024
- Korea Research Institute of Standards and Science
- Young-Sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,892,292
- Issue date Feb 6, 2024
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device for interferometric distance measurement
- Patent number 11,885,607
- Issue date Jan 30, 2024
- Dr. Johannes Heidenhain GmbH
- Herbert Huber-Lenk
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer having a vibrator to modulate light for displa...
- Patent number 11,879,730
- Issue date Jan 23, 2024
- Seiko Epson Corporation
- Jun Kitagawa
- G02 - OPTICS
Information Patent Grant
Mirror unit and optical module
- Patent number 11,879,731
- Issue date Jan 23, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Interferometric measurement method and interferometric measurement...
- Patent number 11,879,721
- Issue date Jan 23, 2024
- Carl Zeiss SMT GmbH
- Alexander Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Optomechanical inertial reference mirror for atom interferometer an...
- Patent number 11,867,713
- Issue date Jan 9, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Felipe Guzmán
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne one-dimensional grating measuring device and measuring m...
- Patent number 11,860,057
- Issue date Jan 2, 2024
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
System for precision displacement measurement based on self-traceab...
- Patent number 11,802,758
- Issue date Oct 31, 2023
- Tongji University
- Xiao Deng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring using multiple modalities
- Patent number 11,802,760
- Issue date Oct 31, 2023
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simultaneous phase-shift point diffraction interferometer and metho...
- Patent number 11,788,829
- Issue date Oct 17, 2023
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Peng Feng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Relative intensity noise Cat's-eye swept source laser for OCT and s...
- Publication number 20240418497
- Publication date Dec 19, 2024
- KineoLabs, Inc.
- Walid A. Atia
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL COHERENCE TOMOGRAPH
- Publication number 20240393099
- Publication date Nov 28, 2024
- FURUKAWA ELECTRIC CO., LTD.
- Noritaka MATSUBARA
- G02 - OPTICS
Information Patent Application
Multi-Channel Self-Mixing Interferometric Sensor
- Publication number 20240384980
- Publication date Nov 21, 2024
- Apple Inc.
- Tong Chen
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...
- Publication number 20240384978
- Publication date Nov 21, 2024
- SEIKO EPSON CORPORATION
- Jun KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...
- Publication number 20240369345
- Publication date Nov 7, 2024
- Martin Berz
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER FOR CARRYING OUT AN OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20240337480
- Publication date Oct 10, 2024
- HEIDELBERG ENGINEERING GMBH
- Andreas FRITZ
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...
- Publication number 20240324875
- Publication date Oct 3, 2024
- Digital Diagnostics Inc.
- Michael D. Abramoff
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Laser Interferometer
- Publication number 20240318951
- Publication date Sep 26, 2024
- SEIKO EPSON CORPORATION
- Nobuhito HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS
- Publication number 20240310158
- Publication date Sep 19, 2024
- Oxford University Innovation Limited
- Armin REICHOLD
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ANGULAR ORIENTATION FOR IMAGING
- Publication number 20240285169
- Publication date Aug 29, 2024
- NINEPOINT MEDICAL, INC.
- Benedikt GRAF
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Interferometric Measurement System Using Time-Correlated Photons
- Publication number 20240263936
- Publication date Aug 8, 2024
- Qubit Moving and Storage, LLC
- Gary Vacon
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240230314
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
RAPID COHERENT SYNTHETIC WAVELENGTH INTERFEROMETRIC ABSOLUTE DISTAN...
- Publication number 20240219167
- Publication date Jul 4, 2024
- DUKE UNIVERSITY
- Joseph A. IZATT
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...
- Publication number 20240210158
- Publication date Jun 27, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20240183650
- Publication date Jun 6, 2024
- Mitsubishi Electric Corporation
- Takanori YAMAUCHI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH ABSORBING LAYER
- Publication number 20240175671
- Publication date May 30, 2024
- Murata Manufacturing Co., Ltd.
- Ville KAAJAKARI
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20240175674
- Publication date May 30, 2024
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240133673
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
- Publication number 20240118072
- Publication date Apr 11, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
- Publication number 20240115222
- Publication date Apr 11, 2024
- Weng-Dah Ken
- G04 - HOROLOGY
Information Patent Application
PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...
- Publication number 20240085776
- Publication date Mar 14, 2024
- TECHNOLOGIES DIGITHO INC.
- Richard BEAUDRY
- G01 - MEASURING TESTING
Information Patent Application
MULTIPHASE OPTICAL COHERENCE MICROSCOPY IMAGING
- Publication number 20240061226
- Publication date Feb 22, 2024
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Stephen A. Boppart
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES
- Publication number 20240027181
- Publication date Jan 25, 2024
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES
- Publication number 20240019241
- Publication date Jan 18, 2024
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUANTUM SENSOR AND SYNXAPPS ARRAY
- Publication number 20240011763
- Publication date Jan 11, 2024
- Demond Adams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS
- Publication number 20230417541
- Publication date Dec 28, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G02 - OPTICS
Information Patent Application
INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD
- Publication number 20230417532
- Publication date Dec 28, 2023
- BEIJING U-PRECISION TECH CO., LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
AXIAL LENGTH MEASUREMENT MONITOR
- Publication number 20230414097
- Publication date Dec 28, 2023
- Acucela Inc.
- Ryo KUBOTA
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...
- Publication number 20230408250
- Publication date Dec 21, 2023
- BEIJING U-PRECISION TECH CO.. LTD.
- Guohua SUN
- G01 - MEASURING TESTING

Aspects of interferometers not specifically covered by any group under G01B9/02

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Device and method for imaging and interferometry measurements

Device and method for measuring laser displacement

Mirror unit and optical module

Optical coherence tomography system

Four-quadrant interferometry system based on an integrated array wa...

Device for measuring a substrate and method for correcting cyclic e...

Spatially filtered talbot interferometer for wafer distortion measu...

System and method for measuring using multiple modalities

Apparatus, systems and methods for detecting light

Optical systems and methods for measuring turbine blade tip clearance

Parallel optical coherence tomography apparatuses, systems, and rel...

Miniature 3D position-to-optical displacement sensor

Determining angular orientation for imaging

Polarization-separated, phase-shifted interferometer

Interferometer and optical instrument with integrated optical compo...

Quantum interferometer with improved entangled photon identification

Apparatus and methods for determining the position of a target stru...

System and method for correcting optical path length measurement er...

Non-contact angle measuring apparatus

Device and method for measuring thickness and refractive index of m...

Methods and systems of holographic interferometry

Device for interferometric distance measurement

Laser interferometer having a vibrator to modulate light for displa...

Mirror unit and optical module

Interferometric measurement method and interferometric measurement...

Optomechanical inertial reference mirror for atom interferometer an...

Heterodyne one-dimensional grating measuring device and measuring m...

System for precision displacement measurement based on self-traceab...

System and method for measuring using multiple modalities

Simultaneous phase-shift point diffraction interferometer and metho...

Patents Applicationslast 30 patents

Relative intensity noise Cat's-eye swept source laser for OCT and s...

OPTICAL COHERENCE TOMOGRAPH

Multi-Channel Self-Mixing Interferometric Sensor

Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...

METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

INTERFEROMETER FOR CARRYING OUT AN OPTICAL COHERENCE TOMOGRAPHY

PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...

Laser Interferometer

INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS

DETERMINING ANGULAR ORIENTATION FOR IMAGING

Interferometric Measurement System Using Time-Correlated Photons

SEMICONDUCTOR MEASUREMENT APPARATUS

RAPID COHERENT SYNTHETIC WAVELENGTH INTERFEROMETRIC ABSOLUTE DISTAN...

INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...

OPTICAL MEASUREMENT DEVICE

INTERFEROMETER WITH ABSORBING LAYER

Laser Interferometer

SEMICONDUCTOR MEASUREMENT APPARATUS

LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME

ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS

PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...

MULTIPHASE OPTICAL COHERENCE MICROSCOPY IMAGING

SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES

SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES

QUANTUM SENSOR AND SYNXAPPS ARRAY

MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS

INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD

AXIAL LENGTH MEASUREMENT MONITOR

HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...