Aspects of interferometers not specifically covered by any group under G01B9/02

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Patents Grantslast 30 patents

Information Patent Grant
Jogbox with 3D scanner
- Patent number 12,320,627
- Issue date Jun 3, 2025
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Level sensor and substrate processing apparatus including the same
- Patent number 12,313,393
- Issue date May 27, 2025
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer
- Patent number 12,313,448
- Issue date May 27, 2025
- Seiko Epson Corporation
- Kohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system and lithographic apparatus
- Patent number 12,305,979
- Issue date May 20, 2025
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Optical device
- Patent number 12,298,132
- Issue date May 13, 2025
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of measuring electro-optic characteristic of a traveling wav...
- Patent number 12,298,650
- Issue date May 13, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ming Yang Jung
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne laser interferometer based on integrated dual polarizati...
- Patent number 12,287,198
- Issue date Apr 29, 2025
- Harbin Institute of Technology
- Haijin Fu
- G01 - MEASURING TESTING
Information Patent Grant
Compact dual pass interferometer for a plane mirror interferometer
- Patent number 12,270,644
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G02 - OPTICS
Information Patent Grant
Distance measurement device and method based on secondary mixing of...
- Patent number 12,259,240
- Issue date Mar 25, 2025
- Harbin Institute of Technology
- Ruitao Yang
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 12,259,230
- Issue date Mar 25, 2025
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement system using time-correlated photons
- Patent number 12,253,357
- Issue date Mar 18, 2025
- Qubit Moving and Storage, LLC
- Gary Vacon
- G01 - MEASURING TESTING
Information Patent Grant
Bidirectional Littrow two-degree-of-freedom grating interference me...
- Patent number 12,241,739
- Issue date Mar 4, 2025
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-precision timing clock method
- Patent number 12,226,246
- Issue date Feb 18, 2025
- Weng-Dah Ken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Polarizing Fizeau interferometer
- Patent number 12,228,400
- Issue date Feb 18, 2025
- Mitutoyo Corporation
- Shimpei Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne light source for use in metrology system
- Patent number 12,228,399
- Issue date Feb 18, 2025
- Mitutoyo Corporation
- Nick Hartmann
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus, measuring method using the same, and...
- Patent number 12,215,974
- Issue date Feb 4, 2025
- Samsung Electronics Co., Ltd.
- Seung Woo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for polarization-sensitive optical coherence to...
- Patent number 12,209,952
- Issue date Jan 28, 2025
- Singapore Health Services Pte Ltd.
- Leopold Schmetterer
- G01 - MEASURING TESTING
Information Patent Grant
Compact snapshot dual-mode interferometric system
- Patent number 12,203,752
- Issue date Jan 21, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Grant
Broadband interferometry and method for measurement range extension...
- Patent number 12,196,551
- Issue date Jan 14, 2025
- Automated Precision Inc.
- Yongwoo Park
- G01 - MEASURING TESTING
Information Patent Grant
Truncated nonlinear interferometer-based sensor system
- Patent number 12,181,773
- Issue date Dec 31, 2024
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Laser interferometer
- Patent number 12,181,277
- Issue date Dec 31, 2024
- Seiko Epson Corporation
- Kohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and media for multiple reference arm spectral dom...
- Patent number 12,181,280
- Issue date Dec 31, 2024
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Grant
Composite measurement system for measuring nanometer displacement
- Patent number 12,174,017
- Issue date Dec 24, 2024
- National Institute of Metrology, China
- Yushu Shi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device and method for measuring laser displacement
- Patent number 12,158,340
- Issue date Dec 3, 2024
- National Institute of Metrology, China
- Jianjun Cui
- G01 - MEASURING TESTING
Information Patent Grant
Mirror unit and optical module
- Patent number 12,152,878
- Issue date Nov 26, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical coherence tomography system
- Patent number 12,140,426
- Issue date Nov 12, 2024
- AIT Austrian Institute of Technology GmbH
- Rainer Hainberger
- G01 - MEASURING TESTING
Information Patent Grant
Four-quadrant interferometry system based on an integrated array wa...
- Patent number 12,140,425
- Issue date Nov 12, 2024
- National Institute of Metrology, China
- Xiaofei Diao
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring a substrate and method for correcting cyclic e...
- Patent number 12,135,211
- Issue date Nov 5, 2024
- Carl Zeiss SMT GmbH
- Stephan Zschaeck
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Spatially filtered talbot interferometer for wafer distortion measu...
- Patent number 12,104,891
- Issue date Oct 1, 2024
- Daniel Gene Smith
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD
- Publication number 20250176925
- Publication date Jun 5, 2025
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Line-field OCT System with Multi Transverse Mode Laser
- Publication number 20250164234
- Publication date May 22, 2025
- KineoLabs, Inc.
- Yisi Liu
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ELECTROMAGNETIC WAVE CONTROL FOR MATTER-WAVE INTERFEROM...
- Publication number 20250085099
- Publication date Mar 13, 2025
- ColdQuanta, Inc.
- Lennart Maximilian Seifert
- G01 - MEASURING TESTING
Information Patent Application
Self-Configuration and Error Correction in Linear Photonic Circuits
- Publication number 20250085100
- Publication date Mar 13, 2025
- Massachusetts Institute of Technology
- Ryan HAMERLY
- G01 - MEASURING TESTING
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20250044074
- Publication date Feb 6, 2025
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
OPTICAL INTERFERENCE MEASUREMENT DEVICE
- Publication number 20250035427
- Publication date Jan 30, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- YASUHIRO KABETANI
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE MOLD GAP MEASUREMENT USING OPTICAL FIBER INTERFERO...
- Publication number 20250003735
- Publication date Jan 2, 2025
- THE CURATORS OF THE UNIVERSITY OF MISSOURI
- Jie Huang
- G01 - MEASURING TESTING
Information Patent Application
BACKLIGHT-FREE AUGMENTED REALITY USING DIGITAL HOLOGRAPHY
- Publication number 20250004275
- Publication date Jan 2, 2025
- NVIDIA Corp.
- Jonghyun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Relative intensity noise Cat's-eye swept source laser for OCT and s...
- Publication number 20240418497
- Publication date Dec 19, 2024
- KineoLabs, Inc.
- Walid A. Atia
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL COHERENCE TOMOGRAPH
- Publication number 20240393099
- Publication date Nov 28, 2024
- FURUKAWA ELECTRIC CO., LTD.
- Noritaka MATSUBARA
- G02 - OPTICS
Information Patent Application
Multi-Channel Self-Mixing Interferometric Sensor
- Publication number 20240384980
- Publication date Nov 21, 2024
- Apple Inc.
- Tong Chen
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...
- Publication number 20240384978
- Publication date Nov 21, 2024
- SEIKO EPSON CORPORATION
- Jun KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...
- Publication number 20240369345
- Publication date Nov 7, 2024
- Martin Berz
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER FOR CARRYING OUT AN OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20240337480
- Publication date Oct 10, 2024
- HEIDELBERG ENGINEERING GMBH
- Andreas FRITZ
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...
- Publication number 20240324875
- Publication date Oct 3, 2024
- Digital Diagnostics Inc.
- Michael D. Abramoff
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Laser Interferometer
- Publication number 20240318951
- Publication date Sep 26, 2024
- SEIKO EPSON CORPORATION
- Nobuhito HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS
- Publication number 20240310158
- Publication date Sep 19, 2024
- Oxford University Innovation Limited
- Armin REICHOLD
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ANGULAR ORIENTATION FOR IMAGING
- Publication number 20240285169
- Publication date Aug 29, 2024
- NINEPOINT MEDICAL, INC.
- Benedikt GRAF
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Interferometric Measurement System Using Time-Correlated Photons
- Publication number 20240263936
- Publication date Aug 8, 2024
- Qubit Moving and Storage, LLC
- Gary Vacon
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240230314
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
RAPID COHERENT SYNTHETIC WAVELENGTH INTERFEROMETRIC ABSOLUTE DISTAN...
- Publication number 20240219167
- Publication date Jul 4, 2024
- DUKE UNIVERSITY
- Joseph A. IZATT
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...
- Publication number 20240210158
- Publication date Jun 27, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20240183650
- Publication date Jun 6, 2024
- Mitsubishi Electric Corporation
- Takanori YAMAUCHI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH ABSORBING LAYER
- Publication number 20240175671
- Publication date May 30, 2024
- Murata Manufacturing Co., Ltd.
- Ville KAAJAKARI
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20240175674
- Publication date May 30, 2024
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240133673
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
- Publication number 20240118072
- Publication date Apr 11, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
- Publication number 20240115222
- Publication date Apr 11, 2024
- Weng-Dah Ken
- G04 - HOROLOGY
Information Patent Application
PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...
- Publication number 20240085776
- Publication date Mar 14, 2024
- TECHNOLOGIES DIGITHO INC.
- Richard BEAUDRY
- G01 - MEASURING TESTING

Aspects of interferometers not specifically covered by any group under G01B9/02

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Jogbox with 3D scanner

Level sensor and substrate processing apparatus including the same

Laser interferometer

Interferometer system and lithographic apparatus

Optical device

Method of measuring electro-optic characteristic of a traveling wav...

Heterodyne laser interferometer based on integrated dual polarizati...

Compact dual pass interferometer for a plane mirror interferometer

Distance measurement device and method based on secondary mixing of...

Three-dimensional measurement device

Interferometric measurement system using time-correlated photons

Bidirectional Littrow two-degree-of-freedom grating interference me...

Ultra-precision timing clock method

Polarizing Fizeau interferometer

Heterodyne light source for use in metrology system

Optical measurement apparatus, measuring method using the same, and...

Methods and systems for polarization-sensitive optical coherence to...

Compact snapshot dual-mode interferometric system

Broadband interferometry and method for measurement range extension...

Truncated nonlinear interferometer-based sensor system

Laser interferometer

Systems, methods, and media for multiple reference arm spectral dom...

Composite measurement system for measuring nanometer displacement

Device and method for imaging and interferometry measurements

Device and method for measuring laser displacement

Mirror unit and optical module

Optical coherence tomography system

Four-quadrant interferometry system based on an integrated array wa...

Device for measuring a substrate and method for correcting cyclic e...

Spatially filtered talbot interferometer for wafer distortion measu...

Patents Applicationslast 30 patents

NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD

Line-field OCT System with Multi Transverse Mode Laser

DETERMINING ELECTROMAGNETIC WAVE CONTROL FOR MATTER-WAVE INTERFEROM...

Self-Configuration and Error Correction in Linear Photonic Circuits

MIRROR UNIT AND OPTICAL MODULE

OPTICAL INTERFERENCE MEASUREMENT DEVICE

HIGH TEMPERATURE MOLD GAP MEASUREMENT USING OPTICAL FIBER INTERFERO...

BACKLIGHT-FREE AUGMENTED REALITY USING DIGITAL HOLOGRAPHY

Relative intensity noise Cat's-eye swept source laser for OCT and s...

OPTICAL COHERENCE TOMOGRAPH

Multi-Channel Self-Mixing Interferometric Sensor

Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...

METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

INTERFEROMETER FOR CARRYING OUT AN OPTICAL COHERENCE TOMOGRAPHY

PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...

Laser Interferometer

INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS

DETERMINING ANGULAR ORIENTATION FOR IMAGING

Interferometric Measurement System Using Time-Correlated Photons

SEMICONDUCTOR MEASUREMENT APPARATUS

RAPID COHERENT SYNTHETIC WAVELENGTH INTERFEROMETRIC ABSOLUTE DISTAN...

INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...

OPTICAL MEASUREMENT DEVICE

INTERFEROMETER WITH ABSORBING LAYER

Laser Interferometer

SEMICONDUCTOR MEASUREMENT APPARATUS

LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME

ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS

PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...