Atomic force probe

Industry

CPC
Y10S977/863

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Y10S977/863Atomic force probe

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of making thin film probe tip for atomic force microscopy
- Patent number 8,689,361
- Issue date Apr 1, 2014
- Oicmicro, LLC
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Methods utilizing scanning probe microscope tips and products there...
- Patent number 8,247,032
- Issue date Aug 21, 2012
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods utilizing scanning probe microscope tips and products there...
- Patent number 8,163,345
- Issue date Apr 24, 2012
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Hybrid contact mode scanning cantilever system
- Patent number 8,156,568
- Issue date Apr 10, 2012
- Picocal, Inc.
- Angelo Gaitas
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope and interaction force measurement method us...
- Patent number 7,975,316
- Issue date Jul 5, 2011
- Osaka University
- Masahiro Ota
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope apparatus
- Patent number 7,904,966
- Issue date Mar 8, 2011
- Japan Science and Technology Agency
- Dai Kobayashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanolithography methods and products therefor and produced thereby
- Patent number 7,887,885
- Issue date Feb 15, 2011
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever device and cantilever controlling method
- Patent number 7,886,366
- Issue date Feb 8, 2011
- National Institute of Advanced Industrial Science and Technology
- Masaharu Kuroda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for microfabricating a probe with integrated handle, cantile...
- Patent number 7,861,315
- Issue date Dec 28, 2010
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanolithography methods and products therefor and produced thereby
- Patent number 7,744,963
- Issue date Jun 29, 2010
- Northwestern University
- Chad A. Mirkin
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Self-sensing tweezer devices and associated methods for micro and n...
- Patent number 7,735,358
- Issue date Jun 15, 2010
- Insitutec, Inc.
- Marcin B. Bauza
- G01 - MEASURING TESTING
Information Patent Grant
Nanolithography methods and products therefor and produced thereby
- Patent number 7,722,928
- Issue date May 25, 2010
- Northwestern University
- Chad A. Mirkin
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Bridge-enhanced nanoscale impedance microscopy
- Patent number 7,705,617
- Issue date Apr 27, 2010
- Northwestern University
- Mark C. Hersam
- G01 - MEASURING TESTING
Information Patent Grant
Methods for additive repair of phase shift masks by selectively dep...
- Patent number 7,691,541
- Issue date Apr 6, 2010
- NanoInk, Inc.
- Percy Van Crocker
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Short and thin silicon cantilever with tip and fabrication thereof
- Patent number 7,637,960
- Issue date Dec 29, 2009
- University of Houston
- Chengzhi Cai
- G01 - MEASURING TESTING
Information Patent Grant
Methods utilizing scanning probe microscope tips and products there...
- Patent number 7,569,252
- Issue date Aug 4, 2009
- Northwestern University
- Chad A. Mirkin
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Carbon thin line probe
- Patent number 7,543,482
- Issue date Jun 9, 2009
- Olympus Corporation
- Masashi Kitazawa
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Direct-write nanolithography method of transporting ink with an ela...
- Patent number 7,491,422
- Issue date Feb 17, 2009
- Nanoink, Inc.
- Hua Zhang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical detection alignment/tracking method and apparatus
- Patent number 7,478,552
- Issue date Jan 20, 2009
- Veeco Instruments Inc.
- Doug Gotthard
- G01 - MEASURING TESTING
Information Patent Grant
Method for locally highly resolved, mass-spectroscopic characteriza...
- Patent number 7,442,922
- Issue date Oct 28, 2008
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for analyzing a specimen using atomic force mic...
- Patent number 7,430,898
- Issue date Oct 7, 2008
- KLA-Tencor Technologies Corp.
- Michael Weber-Grabau
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe characterization of surfaces
- Patent number 7,420,106
- Issue date Sep 2, 2008
- The University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a probe having a field effect transistor chan...
- Patent number 7,402,736
- Issue date Jul 22, 2008
- Postech Foundation
- Wonkyu Moon
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of making a force curve measurement on a sample
- Patent number 7,387,035
- Issue date Jun 17, 2008
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 7,312,619
- Issue date Dec 25, 2007
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing radioactive brachytherapy source material,...
- Patent number 7,311,655
- Issue date Dec 25, 2007
- Nucletron B.V.
- Dennis Robert Schaart
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Dynamic activation for an atomic force microscope and method of use...
- Patent number 7,204,131
- Issue date Apr 17, 2007
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Tailoring domain engineered structures in ferroelectric materials
- Patent number 7,151,257
- Issue date Dec 19, 2006
- Ramot At Tel-Aviv University Ltd.
- Gil Rosenman
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 7,098,678
- Issue date Aug 29, 2006
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Sensing mode atomic force microscope
- Patent number 7,095,020
- Issue date Aug 22, 2006
- Brookhaven Science Associates
- Paul V. C. Hough
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS UTILIZING SCANNING PROBE MICROSCOPE TIPS AND PRODUCTS THERE...
- Publication number 20120295029
- Publication date Nov 22, 2012
- Northwestern University
- Chad A MIRKIN
- G01 - MEASURING TESTING
Information Patent Application
METHODS UTILIZING SCANNING PROBE MICROSCOPE TIPS AND PRODUCTS THERE...
- Publication number 20100098857
- Publication date Apr 22, 2010
- Northwestern University
- Chad A MIRKIN
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE AND INTERACTION FORCE MEASUREMENT METHOD US...
- Publication number 20100071099
- Publication date Mar 18, 2010
- Masahiro Ota
- G01 - MEASURING TESTING
Information Patent Application
METHODS UTILIZING SCANNING PROBE MICROSCOPE TIPS AND PRODUCTS THERE...
- Publication number 20100040847
- Publication date Feb 18, 2010
- Northwestern University
- Chad A MIRKIN
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER DEVICE AND CANTILEVER CONTROLLING METHOD
- Publication number 20090293161
- Publication date Nov 26, 2009
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Masaharu Kuroda
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE APPARATUS
- Publication number 20090261249
- Publication date Oct 22, 2009
- JAPAN SCIENCE AND TECHNOLOGY AGENCY
- Dai Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Method for microfabricating a probe with integrated handle, cantile...
- Publication number 20090178166
- Publication date Jul 9, 2009
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Hybrid Contact Mode Scanning Cantilever System
- Publication number 20080266575
- Publication date Oct 30, 2008
- Angelo Gaitas
- G01 - MEASURING TESTING
Information Patent Application
NANOLITHOGRAPHY METHODS AND PRODUCTS THEREFOR AND PRODUCED THEREBY
- Publication number 20080113099
- Publication date May 15, 2008
- Northwestern University
- Chad Mirkin
- G01 - MEASURING TESTING
Information Patent Application
Self-sensing tweezer devices and associated methods for micro and n...
- Publication number 20070240516
- Publication date Oct 18, 2007
- INSITUTEC, INC.
- Marcin B. Bauza
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Optical detection alignment/tracking method and apparatus
- Publication number 20070220958
- Publication date Sep 27, 2007
- Veeco Instruments Inc.
- Doug Gotthard
- G01 - MEASURING TESTING
Information Patent Application
Carbon thin line probe
- Publication number 20070204681
- Publication date Sep 6, 2007
- OLYMPUS CORPORATION
- Masashi Kitazawa
- G01 - MEASURING TESTING
Information Patent Application
Short and thin silicon cantilever with tip and fabrication thereof
- Publication number 20070125160
- Publication date Jun 7, 2007
- The University of Houston
- Chengzhi Cai
- G01 - MEASURING TESTING
Information Patent Application
FORCE SCANNING PROBE MICROSCOPE
- Publication number 20060283240
- Publication date Dec 21, 2006
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20060255818
- Publication date Nov 16, 2006
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Probe of scanning probe microscope having a field effect transistor...
- Publication number 20060230475
- Publication date Oct 12, 2006
- POSTECH FOUNDATION
- Wonkyu Moon
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe characterization of surfaces
- Publication number 20060225164
- Publication date Oct 5, 2006
- The University of Utah
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
Dynamic activation for an atomic force microscope and method of use...
- Publication number 20060191329
- Publication date Aug 31, 2006
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Method for locally highly resolved, mass-spectroscopic characterisa...
- Publication number 20060097164
- Publication date May 11, 2006
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Direct-write nanolithography with stamp tips: fabrication and appli...
- Publication number 20050255237
- Publication date Nov 17, 2005
- NanoInk, Inc.
- Hua Zhang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Nanolithography methods and products therefor and produced thereby
- Publication number 20050191434
- Publication date Sep 1, 2005
- Northwestern University
- Chad A. Mirkin
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20050184746
- Publication date Aug 25, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Force scanning probe microscope
- Publication number 20050081610
- Publication date Apr 21, 2005
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Active probe for an atomic force microscope and method for use thereof
- Publication number 20050066714
- Publication date Mar 31, 2005
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20050040836
- Publication date Feb 24, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Sensing mode atomic force microscope
- Publication number 20050029450
- Publication date Feb 10, 2005
- Paul V.C. Hough
- G01 - MEASURING TESTING
Information Patent Application
Tailoring domain engineered structures in ferroelectric materials
- Publication number 20050023462
- Publication date Feb 3, 2005
- Ramot at Tel-Aviv University Ltd.
- Gil Rosenman
- G02 - OPTICS
Information Patent Application
Dynamic activation for an atomic force microscope and method of use...
- Publication number 20040255651
- Publication date Dec 23, 2004
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Nanometer-scale engineered structures, methods and apparatus for fa...
- Publication number 20040175631
- Publication date Sep 9, 2004
- NanoInk, Inc.
- Percy Van Crocker
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Nanolithography methods and products therefor and produced thereby
- Publication number 20040131843
- Publication date Jul 8, 2004
- Chad A Mirkin
- G01 - MEASURING TESTING

Atomic force probe

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of making thin film probe tip for atomic force microscopy

Methods utilizing scanning probe microscope tips and products there...

Methods utilizing scanning probe microscope tips and products there...

Hybrid contact mode scanning cantilever system

Atomic force microscope and interaction force measurement method us...

Scanning probe microscope apparatus

Nanolithography methods and products therefor and produced thereby

Cantilever device and cantilever controlling method

Method for microfabricating a probe with integrated handle, cantile...

Nanolithography methods and products therefor and produced thereby

Self-sensing tweezer devices and associated methods for micro and n...

Nanolithography methods and products therefor and produced thereby

Bridge-enhanced nanoscale impedance microscopy

Methods for additive repair of phase shift masks by selectively dep...

Short and thin silicon cantilever with tip and fabrication thereof

Methods utilizing scanning probe microscope tips and products there...

Carbon thin line probe

Direct-write nanolithography method of transporting ink with an ela...

Optical detection alignment/tracking method and apparatus

Method for locally highly resolved, mass-spectroscopic characteriza...

Methods and systems for analyzing a specimen using atomic force mic...

Scanning probe characterization of surfaces

Method of fabricating a probe having a field effect transistor chan...

Method of making a force curve measurement on a sample

Multiple local probe measuring device and method

Method for manufacturing radioactive brachytherapy source material,...

Dynamic activation for an atomic force microscope and method of use...

Tailoring domain engineered structures in ferroelectric materials

Multiple local probe measuring device and method

Sensing mode atomic force microscope

Patents Applicationslast 30 patents

METHODS UTILIZING SCANNING PROBE MICROSCOPE TIPS AND PRODUCTS THERE...

METHODS UTILIZING SCANNING PROBE MICROSCOPE TIPS AND PRODUCTS THERE...

ATOMIC FORCE MICROSCOPE AND INTERACTION FORCE MEASUREMENT METHOD US...

METHODS UTILIZING SCANNING PROBE MICROSCOPE TIPS AND PRODUCTS THERE...

CANTILEVER DEVICE AND CANTILEVER CONTROLLING METHOD

SCANNING PROBE MICROSCOPE APPARATUS

Method for microfabricating a probe with integrated handle, cantile...

Hybrid Contact Mode Scanning Cantilever System

NANOLITHOGRAPHY METHODS AND PRODUCTS THEREFOR AND PRODUCED THEREBY

Self-sensing tweezer devices and associated methods for micro and n...

Optical detection alignment/tracking method and apparatus

Carbon thin line probe

Short and thin silicon cantilever with tip and fabrication thereof

FORCE SCANNING PROBE MICROSCOPE

Multiple local probe measuring device and method

Probe of scanning probe microscope having a field effect transistor...

Scanning probe characterization of surfaces

Dynamic activation for an atomic force microscope and method of use...

Method for locally highly resolved, mass-spectroscopic characterisa...

Direct-write nanolithography with stamp tips: fabrication and appli...

Nanolithography methods and products therefor and produced thereby

Multiple local probe measuring device and method

Force scanning probe microscope

Active probe for an atomic force microscope and method for use thereof

Multiple local probe measuring device and method

Sensing mode atomic force microscope

Tailoring domain engineered structures in ferroelectric materials

Dynamic activation for an atomic force microscope and method of use...

Nanometer-scale engineered structures, methods and apparatus for fa...

Nanolithography methods and products therefor and produced thereby