Avalanche transistors

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H01L29/7313

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier

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H01L29/7313Avalanche transistors

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Patents Grantslast 30 patents

Information Patent Grant
Latch-up test structure
- Patent number 12,119,274
- Issue date Oct 15, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- G01 - MEASURING TESTING
Information Patent Grant
Single electron transistor triggered by photovoltaic diode
- Patent number 10,636,918
- Issue date Apr 28, 2020
- The Charles Stark Draper Laboratory, Inc.
- Steven J. Spector
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Power device on bulk substrate
- Patent number 10,290,702
- Issue date May 14, 2019
- Silanna Asia Pte Ltd
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including semiconductor substrate, silicon car...
- Patent number 10,229,973
- Issue date Mar 12, 2019
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Masao Uchida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for measuring ultra small electrical currents...
- Patent number 8,067,953
- Issue date Nov 29, 2011
- Ecole Polytechnique Federale de Lausanne
- Marc Lany
- G01 - MEASURING TESTING
Information Patent Grant
Radiation-emitting semiconductor device and method of manufacturing...
- Patent number 7,352,042
- Issue date Apr 1, 2008
- Koninklijke Philips Electronics N.V.
- Johan Hendrik Klootwijk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heterojunction avalanche transistor
- Patent number 5,036,372
- Issue date Jul 30, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Toshiyuki Ohishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche transistor operating above breakdown
- Patent number 4,041,515
- Issue date Aug 9, 1977
- RCA Corporation
- Kern Ko Nan Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate modulated bipolar transistor
- Patent number 3,979,769
- Issue date Sep 7, 1976
- General Electric Company
- Douglas E. Houston
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3821657
- Patent number 3,821,657
- Issue date Jun 28, 1974
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3060327
- Patent number 3,060,327
- Issue date Oct 23, 1962
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
LATCH-UP TEST STRUCTURE
- Publication number 20230041116
- Publication date Feb 9, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING SEMICONDUCTOR SUBSTRATE, SILICON CAR...
- Publication number 20170317173
- Publication date Nov 2, 2017
- Panasonic Intellectual Property Management Co., Ltd.
- MASAO UCHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER DEVICE ON BULK SUBSTRATE
- Publication number 20170229536
- Publication date Aug 10, 2017
- Silanna Asia Pte Ltd
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device For Measuring Ultra Small Electrical Currents...
- Publication number 20100013458
- Publication date Jan 21, 2010
- Marc Lany
- G01 - MEASURING TESTING
Information Patent Application
Radiation-emitting semiconductor device and method of manufacturing...
- Publication number 20050280011
- Publication date Dec 22, 2005
- Koninklijke Philips Electronics N.V.
- Johan Hendrik Klootwijk
- H01 - BASIC ELECTRIC ELEMENTS

Avalanche transistors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Latch-up test structure

Single electron transistor triggered by photovoltaic diode

Power device on bulk substrate

Semiconductor device including semiconductor substrate, silicon car...

Semiconductor device for measuring ultra small electrical currents...

Radiation-emitting semiconductor device and method of manufacturing...

Heterojunction avalanche transistor

Avalanche transistor operating above breakdown

Gate modulated bipolar transistor

3821657

3060327

Patents Applicationslast 30 patents

LATCH-UP TEST STRUCTURE

SEMICONDUCTOR DEVICE INCLUDING SEMICONDUCTOR SUBSTRATE, SILICON CAR...

POWER DEVICE ON BULK SUBSTRATE

Semiconductor Device For Measuring Ultra Small Electrical Currents...

Radiation-emitting semiconductor device and method of manufacturing...