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Averaging successive scans or readings
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G01J2003/2853
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/2853
Averaging successive scans or readings
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for monitoring stability of spectrum
Patent number
11,255,729
Issue date
Feb 22, 2022
Samsung Electronics Co., Ltd.
Sang Kon Bae
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optimal weighted averaging pre-processing schemes for laser absorpt...
Patent number
10,641,704
Issue date
May 5, 2020
Daniele Angelosante
G01 - MEASURING TESTING
Information
Patent Grant
Optimal weighted averaging pre-processing schemes for laser absorpt...
Patent number
10,359,360
Issue date
Jul 23, 2019
Daniele Angelosante
G01 - MEASURING TESTING
Information
Patent Grant
Self-referencing cavity enhanced spectroscopy (SRCES) systems and m...
Patent number
9,778,110
Issue date
Oct 3, 2017
Picarro, Inc.
Chris W. Rella
G01 - MEASURING TESTING
Information
Patent Grant
Estimation of spectral feature of pulsed light beam
Patent number
9,599,510
Issue date
Mar 21, 2017
Cymer, LLC
Thomas P. Duffey
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for determining parameters of gaseous substances
Patent number
4,790,652
Issue date
Dec 13, 1988
Opsis AB
Leif Uneus
G01 - MEASURING TESTING
Information
Patent Grant
Analog-to-digital conversion and averaging system for an optical an...
Patent number
4,602,243
Issue date
Jul 22, 1986
Pacific Scientific Company
Kenneth P. Von Bargen
G01 - MEASURING TESTING
Information
Patent Grant
Holographic diffraction grating system for rapid scan spectral anal...
Patent number
4,285,596
Issue date
Aug 25, 1981
Neotec Corporation
Isaac J. Landa
G01 - MEASURING TESTING
Information
Patent Grant
Rapid scan spectral analysis system utilizing higher order spectral...
Patent number
4,264,205
Issue date
Apr 28, 1981
Neotec Corporation
Isaac J. Landa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
OPTIMAL WEIGHTED AVERAGING PRE-PROCESSING SCHEMES FOR LASER ABSORPT...
Publication number
20190339198
Publication date
Nov 7, 2019
ABB, Inc.
Daniele Angelosante
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MONITORING STABILITY OF SPECTRUM
Publication number
20180106678
Publication date
Apr 19, 2018
Samsung Electronics Co., Ltd.
SANG KON BAE
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER
Publication number
20170234728
Publication date
Aug 17, 2017
MKS TECHNOLOGY (D/B/A SNOWY RANGE INSTRUMENTS)
Shane Buller
G02 - OPTICS
Information
Patent Application
Spectral Image Acquiring Device And Spectral Image Acquiring Method
Publication number
20140354802
Publication date
Dec 4, 2014
Kabushiki Kaisha TOPCON
Fumio Ohtomo
G02 - OPTICS