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Averaging successive scans or readings
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G01J2003/2853
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/2853
Averaging successive scans or readings
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Patents Grants
last 30 patents
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Patent Grant
Apparatus and method for monitoring stability of spectrum
Patent number
11,255,729
Issue date
Feb 22, 2022
Samsung Electronics Co., Ltd.
Sang Kon Bae
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optimal weighted averaging pre-processing schemes for laser absorpt...
Patent number
10,641,704
Issue date
May 5, 2020
Daniele Angelosante
G01 - MEASURING TESTING
Information
Patent Grant
Optimal weighted averaging pre-processing schemes for laser absorpt...
Patent number
10,359,360
Issue date
Jul 23, 2019
Daniele Angelosante
G01 - MEASURING TESTING
Information
Patent Grant
Self-referencing cavity enhanced spectroscopy (SRCES) systems and m...
Patent number
9,778,110
Issue date
Oct 3, 2017
Picarro, Inc.
Chris W. Rella
G01 - MEASURING TESTING
Information
Patent Grant
Estimation of spectral feature of pulsed light beam
Patent number
9,599,510
Issue date
Mar 21, 2017
Cymer, LLC
Thomas P. Duffey
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for determining parameters of gaseous substances
Patent number
4,790,652
Issue date
Dec 13, 1988
Opsis AB
Leif Uneus
G01 - MEASURING TESTING
Information
Patent Grant
Analog-to-digital conversion and averaging system for an optical an...
Patent number
4,602,243
Issue date
Jul 22, 1986
Pacific Scientific Company
Kenneth P. Von Bargen
G01 - MEASURING TESTING
Information
Patent Grant
Holographic diffraction grating system for rapid scan spectral anal...
Patent number
4,285,596
Issue date
Aug 25, 1981
Neotec Corporation
Isaac J. Landa
G01 - MEASURING TESTING
Information
Patent Grant
Rapid scan spectral analysis system utilizing higher order spectral...
Patent number
4,264,205
Issue date
Apr 28, 1981
Neotec Corporation
Isaac J. Landa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
OPTIMAL WEIGHTED AVERAGING PRE-PROCESSING SCHEMES FOR LASER ABSORPT...
Publication number
20190339198
Publication date
Nov 7, 2019
ABB, Inc.
Daniele Angelosante
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MONITORING STABILITY OF SPECTRUM
Publication number
20180106678
Publication date
Apr 19, 2018
Samsung Electronics Co., Ltd.
SANG KON BAE
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER
Publication number
20170234728
Publication date
Aug 17, 2017
MKS TECHNOLOGY (D/B/A SNOWY RANGE INSTRUMENTS)
Shane Buller
G02 - OPTICS
Information
Patent Application
Spectral Image Acquiring Device And Spectral Image Acquiring Method
Publication number
20140354802
Publication date
Dec 4, 2014
Kabushiki Kaisha TOPCON
Fumio Ohtomo
G02 - OPTICS