based on image processing techniques

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CPC
G01N2021/8887

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8887based on image processing techniques

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Detecting damaged semiconductor wafers utilizing a semiconductor wa...
- Patent number 12,249,526
- Issue date Mar 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chen Min Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for detecting defect of electrode tab and method for detecti...
- Patent number 12,247,926
- Issue date Mar 11, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Han Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System comprising a dishwasher and method for operating a dishwasher
- Patent number 12,239,274
- Issue date Mar 4, 2025
- BSH Hausgeräte GmbH
- Alfredo Calvimontes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface analysis of gemstones
- Patent number 12,228,521
- Issue date Feb 18, 2025
- Gemological Institute of America, Inc.
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems to locate anomalies along an inside surface of...
- Patent number 12,228,524
- Issue date Feb 18, 2025
- SonDance Solutions LLC
- Jeffery M Wilkinson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device
- Patent number 12,216,064
- Issue date Feb 4, 2025
- FUJI CORPORATION
- Tomoya Fujimoto
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system having human-machine interaction function
- Patent number 12,217,498
- Issue date Feb 4, 2025
- KAPITO INC.
- Feng-Tso Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device which can determine a dirtiness level
- Patent number 12,216,063
- Issue date Feb 4, 2025
- PixArt Imaging Inc.
- Tsung-Fa Wang
- G01 - MEASURING TESTING
Information Patent Grant
Qualitative or quantitative characterization of a coating surface
- Patent number 12,203,868
- Issue date Jan 21, 2025
- Evonik Operations GmbH
- Philipp Isken
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Microscopic non-destructive measurement method of microstructure li...
- Patent number 12,190,495
- Issue date Jan 7, 2025
- NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Zhishan Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Station and method for translationally detecting glaze defects on g...
- Patent number 12,181,419
- Issue date Dec 31, 2024
- TIAMA
- Laurent Cosneau
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring health of low-cost sensors used in...
- Patent number 12,175,680
- Issue date Dec 24, 2024
- TATA Consultancy Services Limited
- Prachin Lalit Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Broadband wafer defect detection
- Patent number 12,158,434
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method for multivariate testing, development, and validation of a m...
- Patent number 12,158,432
- Issue date Dec 3, 2024
- Stratasys, Inc.
- Joel Ong
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Inspection system, inspection method, and inspection program
- Patent number 12,148,145
- Issue date Nov 19, 2024
- Mitsubishi Heavy Industries, Ltd.
- Takahiro Tachibana
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Product-inspection apparatus, product-inspection method, and non-tr...
- Patent number 12,148,143
- Issue date Nov 19, 2024
- NEC Corporation
- Keiko Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for checking compliance of a mechanical part of a vehicle
- Patent number 12,135,293
- Issue date Nov 5, 2024
- JTEKT Europe
- Sarah Tallet-Pinet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface inspection system for foil article
- Patent number 12,111,268
- Issue date Oct 8, 2024
- KAPITO INC.
- Feng-Tso Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for detecting surface type of object and artificial neural n...
- Patent number 12,111,267
- Issue date Oct 8, 2024
- Getac Holdings Corporation
- Kun-Yu Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device, inspection method, machine learning device, and...
- Patent number 12,094,102
- Issue date Sep 17, 2024
- Sintokogio, Ltd.
- Takehiro Sugino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device and coating apparatus equipped with the same
- Patent number 12,085,514
- Issue date Sep 10, 2024
- Daifuku Co., Ltd.
- Masahiro Ooe
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method based on edge field and deep learning
- Patent number 12,078,599
- Issue date Sep 3, 2024
- Cognex Corporation
- Hunmin Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized printing defect compensation using automatic job image re...
- Patent number 12,076,976
- Issue date Sep 3, 2024
- Xerox Corporation
- Dara N. Lubin
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Portable visual inspection apparatus and method for inspecting article
- Patent number 12,072,296
- Issue date Aug 27, 2024
- Tyco Electronics (Shanghai) Co., Ltd.
- Lei (Alex) Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synthesizing a diamond using machine learning
- Patent number 12,072,299
- Issue date Aug 27, 2024
- Fraunhofer USA, Inc.
- Rohan Reddy Mekala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized path planning for defect inspection based on effective re...
- Patent number 12,063,442
- Issue date Aug 13, 2024
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Tai Wai David Chik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterization system and method with guided defect discovery
- Patent number 12,062,165
- Issue date Aug 13, 2024
- KLA Corporation
- Bradley Ries
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer surface defect inspection method and apparatus thereof
- Patent number 12,044,631
- Issue date Jul 23, 2024
- GlobalWafers Co., Ltd.
- Shang-Chi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting defects in product and computer device
- Patent number 12,045,970
- Issue date Jul 23, 2024
- Hon Hai Precision Industry Co., Ltd.
- Chin-Pin Kuo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluating defect in monoclinic gallium oxide
- Patent number 12,038,388
- Issue date Jul 16, 2024
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Soon-Ku Hong
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
SENSOR FUSION WITH EDDY CURRENT SENSING
- Publication number 20250073780
- Publication date Mar 6, 2025
- DIVERGENT TECHNOLOGIES, INC.
- Farzaneh KAJI
- B22 - CASTING POWDER METALLURGY
Information Patent Application
TOPOGRAPHICAL INSPECTION
- Publication number 20250076207
- Publication date Mar 6, 2025
- SPIRIT AEROSYSTEMS, INC
- Mark Haynes
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE STATUS OF GREASE CONTAINING PARTICLES BY...
- Publication number 20250078543
- Publication date Mar 6, 2025
- Aktiebolaget SKF
- Weichen GU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...
- Publication number 20250060316
- Publication date Feb 20, 2025
- SCUOLA UNIVERSITARIA PROFESSIONALE DELLA SVIZZERA ITALIANA (SUPSI)
- Daniele Guido ALLEGRI
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...
- Publication number 20250045898
- Publication date Feb 6, 2025
- Konica Minolta, Inc.
- Yoshihito SOUMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT INSPECTION SYSTEM
- Publication number 20250044241
- Publication date Feb 6, 2025
- SYNTEC RESOURCES CO., LTD.
- KANG-FENG FAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...
- Publication number 20250035559
- Publication date Jan 30, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Baiquan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...
- Publication number 20250026603
- Publication date Jan 23, 2025
- Konica Minolta, Inc.
- Hiromu Nagato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED IN...
- Publication number 20250027884
- Publication date Jan 23, 2025
- COGNEX CORPORATION
- Eric Moore
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20250027886
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-CHIEN CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GAS LEAK DETECTION DEVICE AND DETECTING METHOD
- Publication number 20250012655
- Publication date Jan 9, 2025
- VIA TECHNOLOGIES, INC.
- Yeh Cho
- G08 - SIGNALLING
Information Patent Application
PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...
- Publication number 20250003888
- Publication date Jan 2, 2025
- Onto Innovation Inc.
- John M. Thornell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PORTABLE SCANNING DEVICE FOR ASCERTAINING ATTRIBUTES OF SAMPLE MATE...
- Publication number 20250003887
- Publication date Jan 2, 2025
- BRITESCAN, INC.
- Danica HARBAUGH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXAMINATION APPARATUS
- Publication number 20250003890
- Publication date Jan 2, 2025
- FUJIFILM CORPORATION
- Yoshinobu MIURA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20250003889
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Tomoe Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Product Detection System
- Publication number 20240426762
- Publication date Dec 26, 2024
- TE Connectivity Solutions GMBH
- Qing (Carrie) Zhou
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...
- Publication number 20240426750
- Publication date Dec 26, 2024
- Heraeus Quartz North America LLC
- Maximilian SCHMITT
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IDENTIFYING AND CHARACTERIZING, BY MEANS OF ARTIFICIAL I...
- Publication number 20240404032
- Publication date Dec 5, 2024
- Brembo S.p.A.
- Stefano BELOTTI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...
- Publication number 20240402093
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Xiaodong MENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
GEMSTONE ANALYSIS DEVICE, SYSTEM, AND METHOD USING NEURAL NETWORKS
- Publication number 20240393255
- Publication date Nov 28, 2024
- Parikh Holdings LLC
- Aniket Parikh
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND COMPUTER DEVICE FOR AUTOMATED VISUAL INSPECTION...
- Publication number 20240385121
- Publication date Nov 21, 2024
- Musashi AI North America Inc.
- Saeed Bakhshmand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD BASED ON EDGE FIELD AND DEEP LEARNING
- Publication number 20240385122
- Publication date Nov 21, 2024
- COGNEX CORPORATION
- Hunmin CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE SENSOR AND ELECTRONIC CAMERA
- Publication number 20240377628
- Publication date Nov 14, 2024
- Nikon Corporation
- Osamu SARUWATARI
- G01 - MEASURING TESTING
Information Patent Application
WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF...
- Publication number 20240369498
- Publication date Nov 7, 2024
- Republic of Korea (National Forensic Service Director Ministry of the Interio...
- Kyu Young LIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DEFECT DETECTION USING VISIBLE LIGHT CAMERAS...
- Publication number 20240354930
- Publication date Oct 24, 2024
- EIGEN INNOVATIONS INC.
- Jacob WILSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUF...
- Publication number 20240353350
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Kihong CHUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING APPARATUS AND OPERATION METHOD THEREOF
- Publication number 20240353348
- Publication date Oct 24, 2024
- LG ENERGY SOLUTION, LTD.
- Min Ji KIM
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPEARANCE INSPECTING DEVICE, WELDING SYSTEM, SHAPE DATA CORRECTING...
- Publication number 20240337604
- Publication date Oct 10, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Toru SAKAI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

based on image processing techniques

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detecting damaged semiconductor wafers utilizing a semiconductor wa...

System for detecting defect of electrode tab and method for detecti...

System comprising a dishwasher and method for operating a dishwasher

Surface analysis of gemstones

Methods and systems to locate anomalies along an inside surface of...

Inspection device

Defect inspection system having human-machine interaction function

Electronic device which can determine a dirtiness level

Qualitative or quantitative characterization of a coating surface

Microscopic non-destructive measurement method of microstructure li...

Station and method for translationally detecting glaze defects on g...

System and method for monitoring health of low-cost sensors used in...

Broadband wafer defect detection

Method for multivariate testing, development, and validation of a m...

Inspection system, inspection method, and inspection program

Product-inspection apparatus, product-inspection method, and non-tr...

Method for checking compliance of a mechanical part of a vehicle

Surface inspection system for foil article

System for detecting surface type of object and artificial neural n...

Inspection device, inspection method, machine learning device, and...

Inspection device and coating apparatus equipped with the same

Inspection method based on edge field and deep learning

Optimized printing defect compensation using automatic job image re...

Portable visual inspection apparatus and method for inspecting article

Systems and methods for synthesizing a diamond using machine learning

Optimized path planning for defect inspection based on effective re...

Characterization system and method with guided defect discovery

Wafer surface defect inspection method and apparatus thereof

Method for detecting defects in product and computer device

Method for evaluating defect in monoclinic gallium oxide

Patents Applicationslast 30 patents

SENSOR FUSION WITH EDDY CURRENT SENSING

TOPOGRAPHICAL INSPECTION

METHOD FOR DETERMINING THE STATUS OF GREASE CONTAINING PARTICLES BY...

APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...

SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...

WAFER DEFECT INSPECTION SYSTEM

METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...

SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED IN...

DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM

GAS LEAK DETECTION DEVICE AND DETECTING METHOD

PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...

PORTABLE SCANNING DEVICE FOR ASCERTAINING ATTRIBUTES OF SAMPLE MATE...

EXAMINATION APPARATUS

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

Product Detection System

TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...

METHOD FOR IDENTIFYING AND CHARACTERIZING, BY MEANS OF ARTIFICIAL I...

METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...

GEMSTONE ANALYSIS DEVICE, SYSTEM, AND METHOD USING NEURAL NETWORKS

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

SYSTEM, METHOD, AND COMPUTER DEVICE FOR AUTOMATED VISUAL INSPECTION...

INSPECTION METHOD BASED ON EDGE FIELD AND DEEP LEARNING

IMAGE SENSOR AND ELECTRONIC CAMERA

WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF...

SYSTEM AND METHOD FOR DEFECT DETECTION USING VISIBLE LIGHT CAMERAS...

WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUF...

MONITORING APPARATUS AND OPERATION METHOD THEREOF

APPEARANCE INSPECTING DEVICE, WELDING SYSTEM, SHAPE DATA CORRECTING...