based on image processing techniques

Industry

CPC
G01N2021/8887

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8887based on image processing techniques

Industries

Patents Grantslast 30 patents

Information Patent Grant
Inspection system, inspection method, and inspection program
- Patent number 12,148,145
- Issue date Nov 19, 2024
- Mitsubishi Heavy Industries, Ltd.
- Takahiro Tachibana
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Product-inspection apparatus, product-inspection method, and non-tr...
- Patent number 12,148,143
- Issue date Nov 19, 2024
- NEC Corporation
- Keiko Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for checking compliance of a mechanical part of a vehicle
- Patent number 12,135,293
- Issue date Nov 5, 2024
- JTEKT Europe
- Sarah Tallet-Pinet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface inspection system for foil article
- Patent number 12,111,268
- Issue date Oct 8, 2024
- KAPITO INC.
- Feng-Tso Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for detecting surface type of object and artificial neural n...
- Patent number 12,111,267
- Issue date Oct 8, 2024
- Getac Holdings Corporation
- Kun-Yu Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device, inspection method, machine learning device, and...
- Patent number 12,094,102
- Issue date Sep 17, 2024
- Sintokogio, Ltd.
- Takehiro Sugino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device and coating apparatus equipped with the same
- Patent number 12,085,514
- Issue date Sep 10, 2024
- Daifuku Co., Ltd.
- Masahiro Ooe
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method based on edge field and deep learning
- Patent number 12,078,599
- Issue date Sep 3, 2024
- Cognex Corporation
- Hunmin Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized printing defect compensation using automatic job image re...
- Patent number 12,076,976
- Issue date Sep 3, 2024
- Xerox Corporation
- Dara N. Lubin
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Portable visual inspection apparatus and method for inspecting article
- Patent number 12,072,296
- Issue date Aug 27, 2024
- Tyco Electronics (Shanghai) Co., Ltd.
- Lei (Alex) Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synthesizing a diamond using machine learning
- Patent number 12,072,299
- Issue date Aug 27, 2024
- Fraunhofer USA, Inc.
- Rohan Reddy Mekala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized path planning for defect inspection based on effective re...
- Patent number 12,063,442
- Issue date Aug 13, 2024
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Tai Wai David Chik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterization system and method with guided defect discovery
- Patent number 12,062,165
- Issue date Aug 13, 2024
- KLA Corporation
- Bradley Ries
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer surface defect inspection method and apparatus thereof
- Patent number 12,044,631
- Issue date Jul 23, 2024
- GlobalWafers Co., Ltd.
- Shang-Chi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting defects in product and computer device
- Patent number 12,045,970
- Issue date Jul 23, 2024
- Hon Hai Precision Industry Co., Ltd.
- Chin-Pin Kuo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluating defect in monoclinic gallium oxide
- Patent number 12,038,388
- Issue date Jul 16, 2024
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Soon-Ku Hong
- C30 - CRYSTAL GROWTH
Information Patent Grant
Detection method of crease degree of screen and visual detection de...
- Patent number 12,025,570
- Issue date Jul 2, 2024
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G01 - MEASURING TESTING
Information Patent Grant
Stamping line defect quality monitoring systems and methods of moni...
- Patent number 12,023,722
- Issue date Jul 2, 2024
- Ford Global Technologies, LLC
- Raj Sohmshetty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quality detection method for porous metal material
- Patent number 12,025,552
- Issue date Jul 2, 2024
- HANGZHOU DIANZI UNIVERSITY
- Chuanyong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and methods for inspecting an optical surface of...
- Patent number 12,025,565
- Issue date Jul 2, 2024
- The Boeing Company
- Fei Cai
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and device for processing product manufacturing messages, el...
- Patent number 12,020,516
- Issue date Jun 25, 2024
- BOE Technology Group Co., Ltd.
- Meijuan Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cleaved semiconductor wafer imaging system
- Patent number 12,019,031
- Issue date Jun 25, 2024
- GlobalWafers Co., Ltd.
- Benjamin Michael Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for detection of mobile device fault conditions
- Patent number 12,013,346
- Issue date Jun 18, 2024
- BLANCCO TECHNOLOGY GROUP IP OY
- William Fitzgerald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for fault recognition in a hearing aid
- Patent number 12,014,487
- Issue date Jun 18, 2024
- Sivantos Pte. Ltd.
- Ulrich Giese
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Portable scanning device for ascertaining attributes of sample mate...
- Patent number 12,007,332
- Issue date Jun 11, 2024
- BriteScan, Inc.
- Danica T. H. Reynaud
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for detecting glass-ceramic material
- Patent number 12,007,337
- Issue date Jun 11, 2024
- Saint-Gobain Isover
- Hugues Chenneviere
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for treating plastic preforms with inspection...
- Patent number 11,999,093
- Issue date Jun 4, 2024
- Krones AG
- Florian Geltinger
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Inspection device, packaging sheet manufacturing device, and inspec...
- Patent number 11,994,477
- Issue date May 28, 2024
- CKD Corporation
- Takamasa Ohtani
- G01 - MEASURING TESTING
Information Patent Grant
Through-focus image-based metrology device, operation method thereo...
- Patent number 11,988,495
- Issue date May 21, 2024
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Detection and grading of the effect of blue fluorescence on diamond...
- Patent number 11,988,610
- Issue date May 21, 2024
- Gemological Institute of America, Inc. (GIA)
- Yun Luo
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM, METHOD, AND COMPUTER DEVICE FOR AUTOMATED VISUAL INSPECTION...
- Publication number 20240385121
- Publication date Nov 21, 2024
- Musashi AI North America Inc.
- Saeed Bakhshmand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD BASED ON EDGE FIELD AND DEEP LEARNING
- Publication number 20240385122
- Publication date Nov 21, 2024
- COGNEX CORPORATION
- Hunmin CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE SENSOR AND ELECTRONIC CAMERA
- Publication number 20240377628
- Publication date Nov 14, 2024
- Nikon Corporation
- Osamu SARUWATARI
- G01 - MEASURING TESTING
Information Patent Application
WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF...
- Publication number 20240369498
- Publication date Nov 7, 2024
- Republic of Korea (National Forensic Service Director Ministry of the Interio...
- Kyu Young LIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DEFECT DETECTION USING VISIBLE LIGHT CAMERAS...
- Publication number 20240354930
- Publication date Oct 24, 2024
- EIGEN INNOVATIONS INC.
- Jacob WILSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUF...
- Publication number 20240353350
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Kihong CHUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING APPARATUS AND OPERATION METHOD THEREOF
- Publication number 20240353348
- Publication date Oct 24, 2024
- LG ENERGY SOLUTION, LTD.
- Min Ji KIM
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPEARANCE INSPECTING DEVICE, WELDING SYSTEM, SHAPE DATA CORRECTING...
- Publication number 20240337604
- Publication date Oct 10, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Toru SAKAI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING QUALITY OF SEMICONDUCTOR CHIP
- Publication number 20240337607
- Publication date Oct 10, 2024
- OPTO SYSTEM CO., LTD.
- Kenichi IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR ASSESSING THE STATE OF A PRESSING PUNCH
- Publication number 20240326369
- Publication date Oct 3, 2024
- FETTE COMPACTING GMBH
- Sven Vulp
- B30 - PRESSES
Information Patent Application
MOTION BASED DYNAMIC TENSIOMETER FOR DETECTING THE PRESENCE OF SURF...
- Publication number 20240328959
- Publication date Oct 3, 2024
- ECOLAB USA INC.
- Stephan Doerries
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION METHOD OF CREASE DEGREE OF SCREEN AND VISUAL DETECTION AP...
- Publication number 20240310295
- Publication date Sep 19, 2024
- Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Yali LIU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER
- Publication number 20240302288
- Publication date Sep 12, 2024
- Japan Tobacco Inc.
- Shota KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Virtual color sensor for recognizing and distinguishing different-c...
- Publication number 20240302289
- Publication date Sep 12, 2024
- KRONES AG
- Ahmad ALSHEIKH
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR PROCESSING PRODUCT MANUFACTURING MESSAGES, EL...
- Publication number 20240304034
- Publication date Sep 12, 2024
- BOE TECHNOLOGY GROUP CO., LTD.
- Meijuan ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULAR APPARATUS FOR THE INSPECTION OF INDUSTRIAL PRODUCTS AND REL...
- Publication number 20240288377
- Publication date Aug 29, 2024
- MICROTEC S.R.L.
- Francesco DEPPIERI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROAD SURFACE MANAGEMENT DEVICE, ROAD SURFACE MANAGEMENT METHOD, AND...
- Publication number 20240287748
- Publication date Aug 29, 2024
- NEC Corporation
- Chisato SUGAWARA
- G01 - MEASURING TESTING
Information Patent Application
CURVED SUBSTRATE BUBBLE DETECTION METHOD AND DETECTION SYSTEM
- Publication number 20240288376
- Publication date Aug 29, 2024
- BOE TECHNOLOGY GROUP CO., LTD.
- Xing Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CLASSIFICATION OF INTERFERENCE WITH DIAGNOSTIC TESTING OF DEFECTS I...
- Publication number 20240290085
- Publication date Aug 29, 2024
- Bio-Rad Europe GmbH
- Thomas Picard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEBRIS DETERMINATION METHOD
- Publication number 20240281960
- Publication date Aug 22, 2024
- Shin-Etsu Handotai Co., Ltd.
- Tomohiro SAITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE INSPECTION SYSTEM AND METHOD
- Publication number 20240272086
- Publication date Aug 15, 2024
- Ninox 360 LLC
- Peter Abeles
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTING APPARATUS AND INSPECTING METHOD FOR DISPLAY DEVICE
- Publication number 20240274047
- Publication date Aug 15, 2024
- SAMSUNG DISPLAY CO., LTD.
- YONGCHAE IM
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPIC NON-DESTRUCTIVE MEASUREMENT METHOD OF MICROSTRUCTURE LI...
- Publication number 20240265520
- Publication date Aug 8, 2024
- NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Zhishan GAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYPERSPECTRAL IMAGING AND ARTIFICIAL INTELLIGENCE DETECTION METHODS...
- Publication number 20240264088
- Publication date Aug 8, 2024
- SHWETA GUPTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UTILIZATION OF IMAGE ANALYTICS TO DETECT ABNORMALITIES ON FAN BLADE...
- Publication number 20240264092
- Publication date Aug 8, 2024
- Raytheon Technologies Corporation
- Jeremiah C. Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION AND GRADING OF THE EFFECT OF BLUE FLUORESCENCE ON DIAMOND...
- Publication number 20240241063
- Publication date Jul 18, 2024
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Yun LUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES
- Publication number 20240230473
- Publication date Jul 11, 2024
- SPINFRAME TECHNOLOGIES LTD
- Ori Yakov DANGUR
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING ABNORMAL DEFECT ON STEEL SURFACE BASED ON SEMI...
- Publication number 20240210329
- Publication date Jun 27, 2024
- Zhejiang University
- Haoji HU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION SYSTEM AND OPTICAL INSPECTION METHOD
- Publication number 20240201098
- Publication date Jun 20, 2024
- SAMSUNG DISPLAY CO., LTD.
- INHYE PARK
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD USING T...
- Publication number 20240201100
- Publication date Jun 20, 2024
- SAMSUNG DISPLAY CO., LTD.
- SUNG HUNE YOO
- G01 - MEASURING TESTING

based on image processing techniques

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inspection system, inspection method, and inspection program

Product-inspection apparatus, product-inspection method, and non-tr...

Method for checking compliance of a mechanical part of a vehicle

Surface inspection system for foil article

System for detecting surface type of object and artificial neural n...

Inspection device, inspection method, machine learning device, and...

Inspection device and coating apparatus equipped with the same

Inspection method based on edge field and deep learning

Optimized printing defect compensation using automatic job image re...

Portable visual inspection apparatus and method for inspecting article

Systems and methods for synthesizing a diamond using machine learning

Optimized path planning for defect inspection based on effective re...

Characterization system and method with guided defect discovery

Wafer surface defect inspection method and apparatus thereof

Method for detecting defects in product and computer device

Method for evaluating defect in monoclinic gallium oxide

Detection method of crease degree of screen and visual detection de...

Stamping line defect quality monitoring systems and methods of moni...

Quality detection method for porous metal material

Inspection system and methods for inspecting an optical surface of...

Method and device for processing product manufacturing messages, el...

Cleaved semiconductor wafer imaging system

System and method for detection of mobile device fault conditions

Method and system for fault recognition in a hearing aid

Portable scanning device for ascertaining attributes of sample mate...

System and method for detecting glass-ceramic material

Apparatus and method for treating plastic preforms with inspection...

Inspection device, packaging sheet manufacturing device, and inspec...

Through-focus image-based metrology device, operation method thereo...

Detection and grading of the effect of blue fluorescence on diamond...

Patents Applicationslast 30 patents

SYSTEM, METHOD, AND COMPUTER DEVICE FOR AUTOMATED VISUAL INSPECTION...

INSPECTION METHOD BASED ON EDGE FIELD AND DEEP LEARNING

IMAGE SENSOR AND ELECTRONIC CAMERA

WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF...

SYSTEM AND METHOD FOR DEFECT DETECTION USING VISIBLE LIGHT CAMERAS...

WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUF...

MONITORING APPARATUS AND OPERATION METHOD THEREOF

APPEARANCE INSPECTING DEVICE, WELDING SYSTEM, SHAPE DATA CORRECTING...

METHOD AND APPARATUS FOR DETERMINING QUALITY OF SEMICONDUCTOR CHIP

METHOD AND DEVICE FOR ASSESSING THE STATE OF A PRESSING PUNCH

MOTION BASED DYNAMIC TENSIOMETER FOR DETECTING THE PRESENCE OF SURF...

DETECTION METHOD OF CREASE DEGREE OF SCREEN AND VISUAL DETECTION AP...

INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER

Virtual color sensor for recognizing and distinguishing different-c...

METHOD AND DEVICE FOR PROCESSING PRODUCT MANUFACTURING MESSAGES, EL...

MODULAR APPARATUS FOR THE INSPECTION OF INDUSTRIAL PRODUCTS AND REL...

ROAD SURFACE MANAGEMENT DEVICE, ROAD SURFACE MANAGEMENT METHOD, AND...

CURVED SUBSTRATE BUBBLE DETECTION METHOD AND DETECTION SYSTEM

CLASSIFICATION OF INTERFERENCE WITH DIAGNOSTIC TESTING OF DEFECTS I...

DEBRIS DETERMINATION METHOD

SURFACE INSPECTION SYSTEM AND METHOD

INSPECTING APPARATUS AND INSPECTING METHOD FOR DISPLAY DEVICE

MICROSCOPIC NON-DESTRUCTIVE MEASUREMENT METHOD OF MICROSTRUCTURE LI...

HYPERSPECTRAL IMAGING AND ARTIFICIAL INTELLIGENCE DETECTION METHODS...

UTILIZATION OF IMAGE ANALYTICS TO DETECT ABNORMALITIES ON FAN BLADE...

DETECTION AND GRADING OF THE EFFECT OF BLUE FLUORESCENCE ON DIAMOND...

SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES

METHOD FOR DETECTING ABNORMAL DEFECT ON STEEL SURFACE BASED ON SEMI...

OPTICAL INSPECTION SYSTEM AND OPTICAL INSPECTION METHOD

SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD USING T...