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G01N2021/8887
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2021/8887
based on image processing techniques
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection device, PTP packaging machine and inspection method
Patent number
11,981,469
Issue date
May 14, 2024
CKD Corporation
Yukihiro Taguchi
G01 - MEASURING TESTING
Information
Patent Grant
System and method for visual production line inspection of differen...
Patent number
11,983,857
Issue date
May 14, 2024
INSPEKTO A.M.V. LTD.
Yonatan Hyatt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device for recognizing defects in finished surface of product
Patent number
11,982,629
Issue date
May 14, 2024
Fu Tai Hua Industry (Shenzhen) Co., Ltd.
Liu-Bin Hu
G01 - MEASURING TESTING
Information
Patent Grant
Learning device, inspection device, learning method, and inspection...
Patent number
11,977,033
Issue date
May 7, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Yuya Sugasawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for inspecting transparent cylindrical contain...
Patent number
11,971,362
Issue date
Apr 30, 2024
NUOVA OMPI S.R.L.
Luca Vallati
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical etendue matching methods for extreme ultraviolet metrology
Patent number
11,968,772
Issue date
Apr 23, 2024
KLA Corporation
Zefram Marks
G01 - MEASURING TESTING
Information
Patent Grant
Damage figure creation supporting apparatus, damage figure creation...
Patent number
11,959,862
Issue date
Apr 16, 2024
FUJIFILM Corporation
Shuhei Horita
G01 - MEASURING TESTING
Information
Patent Grant
Defect examination on a semiconductor specimen
Patent number
11,961,221
Issue date
Apr 16, 2024
Applied Materials Israel Ltd.
Dror Shemesh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for defect inspection
Patent number
11,953,448
Issue date
Apr 9, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Tsun-Cheng Tang
G01 - MEASURING TESTING
Information
Patent Grant
Defective part recognition device and defective part recognition me...
Patent number
11,953,447
Issue date
Apr 9, 2024
V Technology Co., Ltd.
Michinobu Mizumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image view angle conversion/fault determination method and device,...
Patent number
11,956,407
Issue date
Apr 9, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Ruirui Zhao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Vision inspection system and method of inspecting parts
Patent number
11,935,216
Issue date
Mar 19, 2024
Tyco Electronics (Shanghai) Co., Ltd.
Roberto Francisco-Yi Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated system for assessing and modeling integrity of wheels an...
Patent number
11,921,084
Issue date
Mar 5, 2024
CleanSolv International LTD
Thomas Shumka
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Apparatuses and methods for determining wafer defects
Patent number
11,922,613
Issue date
Mar 5, 2024
Micron Technology, Inc.
Yutao Gong
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection with previous step subtraction
Patent number
11,921,052
Issue date
Mar 5, 2024
KLA Corporation
Robert M. Danen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cleaved semiconductor wafer camera system
Patent number
11,921,054
Issue date
Mar 5, 2024
GlobalWafers Co., Ltd.
Benjamin Michael Meyer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for analyzing a bodily sample
Patent number
11,914,133
Issue date
Feb 27, 2024
S.D. SIGHT DIAGNOSTICS LTD.
Yochay Shlomo Eshel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus, control method, and program
Patent number
11,906,441
Issue date
Feb 20, 2024
NEC Corporation
Kyota Higa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical inspection method, non-transitory storage medium storing op...
Patent number
11,906,439
Issue date
Feb 20, 2024
Kaushiki Kaisha Toshiba
Hiroya Kano
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and inspection method
Patent number
11,906,440
Issue date
Feb 20, 2024
Kioxia Corporation
Ryoji Yoshikawa
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspecting and maintaining the exterior eleva...
Patent number
11,906,506
Issue date
Feb 20, 2024
Omidreza Ghanadiof
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hot spot defect detecting method and hot spot defect detecting system
Patent number
11,900,586
Issue date
Feb 13, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Chien-Huei Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Information processing apparatus, information processing method, an...
Patent number
11,898,966
Issue date
Feb 13, 2024
Canon Kabushiki Kaisha
Shoichi Hoshino
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for checking for surface defect, using image sensor
Patent number
11,892,414
Issue date
Feb 6, 2024
VIEW-ON LTD.
Young Yeop Yoon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection support system
Patent number
11,869,177
Issue date
Jan 9, 2024
IXS CO., LTD.
Fuminori Yamasaki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical-interference analysis
Patent number
11,867,611
Issue date
Jan 9, 2024
Optonor AS
Eiolf Vikhagen
G01 - MEASURING TESTING
Information
Patent Grant
Image processing techniques for multi-sensor inspection of pipe int...
Patent number
11,867,641
Issue date
Jan 9, 2024
RedZone Robotics, Inc.
Todd Kueny
G01 - MEASURING TESTING
Information
Patent Grant
Broadband wafer defect detection
Patent number
11,852,593
Issue date
Dec 26, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Nai-Han Cheng
G01 - MEASURING TESTING
Information
Patent Grant
System, device and method for effective deployment of a dust accumu...
Patent number
11,841,305
Issue date
Dec 12, 2023
Industrial Intelligence, Inc.
George T Armbruster
G01 - MEASURING TESTING
Information
Patent Grant
Intelligent quantitative microscopic identification system and inte...
Patent number
11,841,355
Issue date
Dec 12, 2023
Yangtze University
Yan Liu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND APPARATUS FOR ANALYZING A BODILY SAMPLE
Publication number
20240151959
Publication date
May 9, 2024
S.D. SIGHT DIAGNOSTICS LTD
Yochay Shlomo ESHEL
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
Publication number
20240151650
Publication date
May 9, 2024
Canon Kabushiki Kaisha
Shoichi Hoshino
G01 - MEASURING TESTING
Information
Patent Application
Surface Water Quality Monitoring Method Based on High Spatial Resol...
Publication number
20240151703
Publication date
May 9, 2024
Wuhan University
Yanjun ZHANG
G01 - MEASURING TESTING
Information
Patent Application
HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM
Publication number
20240144467
Publication date
May 2, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chien-Huei Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR ROAD INSPECTION
Publication number
20240141601
Publication date
May 2, 2024
Telefonaktiebolaget LM Ericsson (publ)
Ning ZHANG
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information
Patent Application
SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES
Publication number
20240133772
Publication date
Apr 25, 2024
SPINFRAME TECHNOLOGIES LTD
Ori Yakov DANGUR
G01 - MEASURING TESTING
Information
Patent Application
MACRO PLASTIC AND MICRO PLASTIC DETECTION METHOD BASED ON RGB AND H...
Publication number
20240125712
Publication date
Apr 18, 2024
Tongji University
Pinjing He
G01 - MEASURING TESTING
Information
Patent Application
DEFECT DETECTION AND REMOVAL APPARATUS AND METHOD
Publication number
20240118222
Publication date
Apr 11, 2024
PlayNitride Display Co., Ltd.
Chang-Rong Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTEGRATED FLUID LEAK DETECTION USING MULTIPLE SENSORS
Publication number
20240110878
Publication date
Apr 4, 2024
Chevron U.S.A. Inc.
Nikolaos Ioannis Salmatanis
G01 - MEASURING TESTING
Information
Patent Application
LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
Publication number
20240102939
Publication date
Mar 28, 2024
Apple Inc.
Mikael B. MANNBERG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR DETECTING DEFECT OF ELECTRODE ASSEMBLY, AND C...
Publication number
20240094137
Publication date
Mar 21, 2024
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Zhiyu Wang
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD AND SYSTEM FOR DETERMINING THE LOCATION OF A SURFA...
Publication number
20240094145
Publication date
Mar 21, 2024
HUA YANG Precision Machinery Co.,Ltd
Hsien-Te HSIAO
G01 - MEASURING TESTING
Information
Patent Application
MOBILE VOLUMETRIC CONCRETE-PRODUCTION SYSTEM
Publication number
20240083068
Publication date
Mar 14, 2024
Sensolyzer Advanced Sensing Systems Ltd.
Yaniv KNOP
B28 - WORKING CEMENT, CLAY, OR STONE
Information
Patent Application
WELDED PORTION INSPECTION DEVICE AND WELDED PORTION INSPECTION METHOD
Publication number
20240077427
Publication date
Mar 7, 2024
Honda Motor Co., Ltd.
Satoshi Fukui
G01 - MEASURING TESTING
Information
Patent Application
BROADBAND WAFER DEFECT DETECTION
Publication number
20240068957
Publication date
Feb 29, 2024
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Nai-Han CHENG
G01 - MEASURING TESTING
Information
Patent Application
GRADING COSMETIC APPEARANCE OF A TEST OBJECT
Publication number
20240062363
Publication date
Feb 22, 2024
FUTURE DIAL, INC.
Yan Zhou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SUBSTRATE DEFECT-DETECTION AND COMPARISON
Publication number
20240062361
Publication date
Feb 22, 2024
ONTO INNOVATION INC.
Jason Paul Remillard
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION DEVICE AND METHOD OF INSPECTING INSPECTION TARGET USING...
Publication number
20240060903
Publication date
Feb 22, 2024
SAMSUNG DISPLAY CO., LTD.
MYOUNGCHUL KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT
Publication number
20240060904
Publication date
Feb 22, 2024
SAMSUNG DISPLAY CO., LTD.
Jeong Moon LEE
G01 - MEASURING TESTING
Information
Patent Application
Optimized Path Planning for Defect Inspection based on Effective Re...
Publication number
20240048848
Publication date
Feb 8, 2024
Hong Kong Applied Science and Technology Resrearch Institute Company Limited
Tai Wai David CHIK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DRILLING FLUID CONTAMINATION DETERMINATION FOR DOWNHOLE FLUID SAMPL...
Publication number
20240044248
Publication date
Feb 8, 2024
Halliburton Energy Services, Inc.
Mehdi Ali Pour Kallehbasti
G01 - MEASURING TESTING
Information
Patent Application
HANDHELD FASTENER REMOVAL INSPECTION DEVICE
Publication number
20240027360
Publication date
Jan 25, 2024
Perfect Point EDM
William Palleva
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD OF CREASE DEGREE OF SCREEN AND VISUAL DETECTION DE...
Publication number
20240027366
Publication date
Jan 25, 2024
WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
Yali LIU
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS UTILIZING ELECTRIC ENERGY FOR PROCESSING OF BLOOD TO NEUT...
Publication number
20240024552
Publication date
Jan 25, 2024
William M. Gosney
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System For Detecting Surface Type Of Object And Artificial Neural N...
Publication number
20240011916
Publication date
Jan 11, 2024
GETAC TECHNOLOGY CORPORATION
Kun-Yu Tsai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR DETECTING DEFECTS OF THE HORIZONTAL MOLD SEAL FOR GLASS...
Publication number
20240003823
Publication date
Jan 4, 2024
TIAMA
Lubin FAYOLLE
G01 - MEASURING TESTING
Information
Patent Application
METHOD, DEVICE, SYSTEM AND COMPUTER READABLE MEDIUM FOR RAPIDLY DET...
Publication number
20240003828
Publication date
Jan 4, 2024
Nanjing University of Finance & Economics
Xiaolong Shao
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING PRODUCT FOR DEFECTS, ELECTRONIC DEVICE, AND ST...
Publication number
20230384235
Publication date
Nov 30, 2023
HON HAI PRECISION INDUSTRY CO., LTD.
CHUNG-YU WU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING
Publication number
20230349835
Publication date
Nov 2, 2023
Fraunhofer USA, Inc.
Rohan Reddy MEKALA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NEW TYPE OF DEVICE(S) FOR AUTOMATICALLY MONITORING A COATING AND/OR...
Publication number
20230349692
Publication date
Nov 2, 2023
QUISS QUALITAETS-INSPEKTIONSSYSTEME UND SERVICE GMBH
Bernhard GRUBER
G01 - MEASURING TESTING