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based on the comparison of the intensity of measured light with a comparison source or comparison illuminated surface

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  • G01J1/124
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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J1/00Photometry

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G01J1/124based on the comparison of the intensity of measured light with a comparison source or comparison illuminated surface
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Patents Grantslast 30 patents

  • Information Patent Grant

    Method of acquiring outside luminance using camera sensor and elect...
    • Patent number 11,610,558
    • Issue date Mar 21, 2023
    • Samsung Electronics Co., Ltd.
    • Wanjae Ju
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method of acquiring outside luminance using camera sensor and elect...
    • Patent number 11,393,410
    • Issue date Jul 19, 2022
    • Samsung Electronics Co., Ltd.
    • Wanjae Ju
    • G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
  • Information Patent Grant

    Electronic device and operating method of controlling brightness of...
    • Patent number 11,317,034
    • Issue date Apr 26, 2022
    • Samsung Electronics Co., Ltd.
    • Sunil Rathour
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Carbon isotope analysis device and carbon isotope analysis method
    • Patent number 10,386,231
    • Issue date Aug 20, 2019
    • National University Corporation Nagoya University
    • Tetsuo Iguchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrum verification imaging system and method
    • Patent number 7,773,224
    • Issue date Aug 10, 2010
    • Motorola, Inc.
    • Fan He
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring method and instrument comprising image sensor
    • Patent number 7,274,829
    • Issue date Sep 25, 2007
    • ARKRAY, Inc.
    • Atsusi Wada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Correction method for sensor output
    • Patent number 7,110,901
    • Issue date Sep 19, 2006
    • ARKRAY, Inc.
    • Atsusi Wada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3644048
    • Patent number 3,644,048
    • Issue date Feb 22, 1972
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3447877
    • Patent number 3,447,877
    • Issue date Jun 3, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3416867
    • Patent number 3,416,867
    • Issue date Dec 17, 1968
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    3416866
    • Patent number 3,416,866
    • Issue date Dec 17, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3413066
    • Patent number 3,413,066
    • Issue date Nov 26, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3368447
    • Patent number 3,368,447
    • Issue date Feb 13, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3357230
    • Patent number 3,357,230
    • Issue date Dec 12, 1967
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    3323431
    • Patent number 3,323,431
    • Issue date Jun 6, 1967
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3323430
    • Patent number 3,323,430
    • Issue date Jun 6, 1967
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3315579
    • Patent number 3,315,579
    • Issue date Apr 25, 1967
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    2899859
    • Patent number 2,899,859
    • Issue date Aug 18, 1959
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2771000
    • Patent number 2,771,000
    • Issue date Nov 20, 1956
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2649017
    • Patent number 2,649,017
    • Issue date Aug 18, 1953
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2491654
    • Patent number 2,491,654
    • Issue date Dec 20, 1949
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2440266
    • Patent number 2,440,266
    • Issue date Apr 27, 1948
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2324581
    • Patent number 2,324,581
    • Issue date Jul 20, 1943
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2294876
    • Patent number 2,294,876
    • Issue date Sep 1, 1942
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2269723
    • Patent number 2,269,723
    • Issue date Jan 13, 1942
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2243383
    • Patent number 2,243,383
    • Issue date May 27, 1941
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2235590
    • Patent number 2,235,590
    • Issue date Mar 18, 1941
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2190553
    • Patent number 2,190,553
    • Issue date Feb 13, 1940
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2151187
    • Patent number 2,151,187
    • Issue date Mar 21, 1939
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1483473
    • Patent number 1,483,473
    • Issue date Feb 12, 1924
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents