beam is modified for scan

Industry

CPC
G01N2223/3301

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/3301beam is modified for scan

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus of stationary-source nonplanar-trajectory narr...
- Patent number 12,181,424
- Issue date Dec 31, 2024
- MALCOVA, INC.
- Peymon Mirsaeid Ghazi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray backscatter imaging system for precise searching for containe...
- Patent number 12,181,428
- Issue date Dec 31, 2024
- KOREA INSTITUTE OF OCEAN SCIENCE & TECHNOLOGY
- Jongwon Park
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,044,638
- Issue date Jul 23, 2024
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel static CT device
- Patent number 11,906,447
- Issue date Feb 20, 2024
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for imaging a sample
- Patent number 11,742,171
- Issue date Aug 29, 2023
- Excillum AB
- Björn Hansson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray imaging apparatus and method
- Patent number 11,681,068
- Issue date Jun 20, 2023
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Handheld backscatter imaging systems with primary and secondary det...
- Patent number 11,579,327
- Issue date Feb 14, 2023
- American Science and Engineering, Inc.
- Aaron J. Couture
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Additive manufacturing system with x-ray backscatter imaging system...
- Patent number 11,554,544
- Issue date Jan 17, 2023
- The Boeing Company
- Gary E. Georgeson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined scanning x-ray generator, composite inspection apparatus,...
- Patent number 11,467,105
- Issue date Oct 11, 2022
- Nuctech Company Limited
- Zhiqiang Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System, kit, and method for x-ray imaging with removably attachable...
- Patent number 11,448,606
- Issue date Sep 20, 2022
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging reference scan
- Patent number 11,231,378
- Issue date Jan 25, 2022
- Koninklijke Philips N.V.
- Andriy Yaroshenko
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 11,215,571
- Issue date Jan 4, 2022
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source optics for small-angle X-ray scatterometry
- Patent number 10,976,268
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection optics for small-angle X-ray scatterometry
- Patent number 10,976,270
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
Wafer alignment for small-angle x-ray scatterometry
- Patent number 10,976,269
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING
Information Patent Grant
Reducing scatter for computed tomography
- Patent number 10,948,428
- Issue date Mar 16, 2021
- Delavan Inc.
- Thomas J. Ocken
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 10,908,103
- Issue date Feb 2, 2021
- Bruker Nano GmbH
- Ulrich Waldschläger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Set-up and method for spatially resolved measurement with a wavelen...
- Patent number 10,794,845
- Issue date Oct 6, 2020
- Frank Filsinger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multiple charged particle beam inspection apparatus and multiple ch...
- Patent number 10,768,126
- Issue date Sep 8, 2020
- NuFlare Technology, Inc.
- Riki Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High speed pipe inspection system
- Patent number 10,502,697
- Issue date Dec 10, 2019
- The Boeing Company
- Gary Ernest Georgeson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for scanning a structure
- Patent number 10,073,048
- Issue date Sep 11, 2018
- Johnson Matthey Public Limited Company
- Paul David Featonby
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam inspection apparatus and charged particle bea...
- Patent number 10,041,892
- Issue date Aug 7, 2018
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computed tomography device based on straight trajectory and X-ray i...
- Patent number 9,632,041
- Issue date Apr 25, 2017
- Nuctech Company Limited
- Mingliang Li
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scanning illuminating device, imaging device comprising same and me...
- Patent number 9,557,284
- Issue date Jan 31, 2017
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Rene Vogler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dynamic focus adjustment with optical height detection apparatus in...
- Patent number 9,400,176
- Issue date Jul 26, 2016
- Hermes-Microvision, Inc.
- Joe Wang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction apparatus and method of measuring X-ray diffraction
- Patent number 9,322,792
- Issue date Apr 26, 2016
- Rigaku Corporation
- Shintaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Integrated backscatter X-ray system
- Patent number 9,151,721
- Issue date Oct 6, 2015
- The Boeing Company
- Morteza Safai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Defect inspection method and device therefor
- Patent number 9,148,631
- Issue date Sep 29, 2015
- Hitachi High-Technologies Corporation
- Makoto Ono
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS
- Publication number 20240402102
- Publication date Dec 5, 2024
- FEI Company
- Scott Connors
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20240288391
- Publication date Aug 29, 2024
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE
- Publication number 20240249911
- Publication date Jul 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...
- Publication number 20230375484
- Publication date Nov 23, 2023
- The University of North Carolina at Chapel Hill
- Christina Inscoe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron Microscope and Aberration Measurement Method
- Publication number 20230349839
- Publication date Nov 2, 2023
- JEOL Ltd.
- Hidetaka Sawada
- G01 - MEASURING TESTING
Information Patent Application
BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM
- Publication number 20230288350
- Publication date Sep 14, 2023
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES AND METHODS FOR A PENCIL BEAM X-RAY SCANNER
- Publication number 20230280481
- Publication date Sep 7, 2023
- Seethru Al Inc.
- Omar Al-Kofahi
- G01 - MEASURING TESTING
Information Patent Application
OBJECTIVE LENS ARRAY ASSEMBLY, ELECTRON-OPTICAL SYSTEM, ELECTRON-OP...
- Publication number 20230245849
- Publication date Aug 3, 2023
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Handheld Backscatter Scanning Systems With Different Detector Panel...
- Publication number 20230221457
- Publication date Jul 13, 2023
- American Science and Engineering, Inc.
- Aaron J. Couture
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMAGING A SAMPLE
- Publication number 20220262591
- Publication date Aug 18, 2022
- Excillum AB
- Björn HANSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20220260508
- Publication date Aug 18, 2022
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
System, Kit, and Method for X-Ray Imaging with Removably Attachable...
- Publication number 20220091054
- Publication date Mar 24, 2022
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
System and Method for X-Ray Backscatter Imaging with Removable Dete...
- Publication number 20200326291
- Publication date Oct 15, 2020
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20200300789
- Publication date Sep 24, 2020
- Rigaku Corporation
- Takeshi OSAKABE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING REFERENCE SCAN
- Publication number 20200232937
- Publication date Jul 23, 2020
- Koninklijke Philips N.V.
- ANDRIY YAROSHENKO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
REDUCING SCATTER FOR COMPUTED TOMOGRAPHY
- Publication number 20190360947
- Publication date Nov 28, 2019
- DELAVAN INC
- Thomas J. Ocken
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE CHARGED PARTICLE BEAM INSPECTION APPARATUS AND MULTIPLE CH...
- Publication number 20190360951
- Publication date Nov 28, 2019
- NuFlare Technology, Inc.
- Riki OGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray source optics for small-angle X-ray scatterometry
- Publication number 20190323975
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
System and Kit for X-Ray Backscatter Imaging with Removable Detector
- Publication number 20190242834
- Publication date Aug 8, 2019
- Heuresis Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
High Speed Pipe Inspection System
- Publication number 20190079028
- Publication date Mar 14, 2019
- The Boeing Company
- Gary Ernest Georgeson
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM INSPECTION APPARATUS AND CHARGED PARTICLE BEA...
- Publication number 20180031498
- Publication date Feb 1, 2018
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- G01 - MEASURING TESTING
Information Patent Application
Test Device for Defect Inspection
- Publication number 20170176358
- Publication date Jun 22, 2017
- HERMES MICROVISION INC.
- Roland YEH
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SCANNING A STRUCTURE
- Publication number 20170045465
- Publication date Feb 16, 2017
- Johnson Matthey Public Limited Company
- Paul David FEATONBY
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ILLUMINATING DEVICE, IMAGING DEVICE COMPRISING SAME AND ME...
- Publication number 20150346120
- Publication date Dec 3, 2015
- Commissariat A L'Energie Atomique Et Aux Energies Alternatives
- Rene VOGLER
- G01 - MEASURING TESTING
Information Patent Application
CONE BEAM CT SCANNING
- Publication number 20140321605
- Publication date Oct 30, 2014
- Moshe Ein-Gal
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Focus Adjustment with Optical Height Detection Apparatus in...
- Publication number 20140291517
- Publication date Oct 2, 2014
- JOE WANG
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BACKSCATTER X-RAY SYSTEM
- Publication number 20140064453
- Publication date Mar 6, 2014
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Application
Single Beam Backscatter X-Ray System
- Publication number 20130287169
- Publication date Oct 31, 2013
- The Boeing Company
- Michael Liesenfelt
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE THEREFOR
- Publication number 20130235182
- Publication date Sep 12, 2013
- Makoto Ono
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20130070895
- Publication date Mar 21, 2013
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING

beam is modified for scan

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus of stationary-source nonplanar-trajectory narr...

X-ray backscatter imaging system for precise searching for containe...

System, method, and apparatus for x-ray backscatter inspection of p...

Rotational X-ray inspection system and method

System to inspect, modify or analyze a region of interest of a samp...

Multi-channel static CT device

Method for imaging a sample

X-ray imaging apparatus and method

Handheld backscatter imaging systems with primary and secondary det...

Additive manufacturing system with x-ray backscatter imaging system...

Combined scanning x-ray generator, composite inspection apparatus,...

System, kit, and method for x-ray imaging with removably attachable...

X-ray imaging reference scan

X-ray analysis apparatus

X-ray source optics for small-angle X-ray scatterometry

X-ray detection optics for small-angle X-ray scatterometry

Wafer alignment for small-angle x-ray scatterometry

Reducing scatter for computed tomography

X-ray fluorescence spectrometer

Set-up and method for spatially resolved measurement with a wavelen...

Multiple charged particle beam inspection apparatus and multiple ch...

High speed pipe inspection system

Apparatus and method for scanning a structure

Charged particle beam inspection apparatus and charged particle bea...

Computed tomography device based on straight trajectory and X-ray i...

Scanning illuminating device, imaging device comprising same and me...

Dynamic focus adjustment with optical height detection apparatus in...

X-ray diffraction apparatus and method of measuring X-ray diffraction

Integrated backscatter X-ray system

Defect inspection method and device therefor

Patents Applicationslast 30 patents

AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE

SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...

Electron Microscope and Aberration Measurement Method

BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM

SYSTEMS, DEVICES AND METHODS FOR A PENCIL BEAM X-RAY SCANNER

OBJECTIVE LENS ARRAY ASSEMBLY, ELECTRON-OPTICAL SYSTEM, ELECTRON-OP...

Handheld Backscatter Scanning Systems With Different Detector Panel...

METHOD FOR IMAGING A SAMPLE

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

System, Kit, and Method for X-Ray Imaging with Removably Attachable...

System and Method for X-Ray Backscatter Imaging with Removable Dete...

X-RAY ANALYSIS APPARATUS

X-RAY IMAGING REFERENCE SCAN

REDUCING SCATTER FOR COMPUTED TOMOGRAPHY

MULTIPLE CHARGED PARTICLE BEAM INSPECTION APPARATUS AND MULTIPLE CH...

X-ray source optics for small-angle X-ray scatterometry

System and Kit for X-Ray Backscatter Imaging with Removable Detector

High Speed Pipe Inspection System

CHARGED PARTICLE BEAM INSPECTION APPARATUS AND CHARGED PARTICLE BEA...

Test Device for Defect Inspection

APPARATUS AND METHOD FOR SCANNING A STRUCTURE

SCANNING ILLUMINATING DEVICE, IMAGING DEVICE COMPRISING SAME AND ME...

CONE BEAM CT SCANNING

Dynamic Focus Adjustment with Optical Height Detection Apparatus in...

INTEGRATED BACKSCATTER X-RAY SYSTEM

Single Beam Backscatter X-Ray System

DEFECT INSPECTION METHOD AND DEVICE THEREFOR

X-RAY IMAGING APPARATUS