BER [Bit Error Rate] test

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CPC
G01R31/3171

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/3171BER [Bit Error Rate] test

Industries

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Patents Grantslast 30 patents

Information Patent Grant
High throughput sort
- Patent number 12,320,845
- Issue date Jun 3, 2025
- Infineon Technologies AG
- David Addison
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 12,320,844
- Issue date Jun 3, 2025
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Background reads for solid state storage
- Patent number 12,315,576
- Issue date May 27, 2025
- PURE STORAGE, INC.
- Hari Kannan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Secured scan access for a device including a scan chain
- Patent number 12,298,346
- Issue date May 13, 2025
- Texas Instruments Incorporated
- Mudasir Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Yield improvements for three-dimensionally stacked neural network a...
- Patent number 12,292,473
- Issue date May 6, 2025
- Google LLC
- Andreas Georg Nowatzyk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment comprising a device under test loopback an...
- Patent number 12,287,366
- Issue date Apr 29, 2025
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Grant
Component die validation built-in self-test (VBIST) engine
- Patent number 12,282,064
- Issue date Apr 22, 2025
- Ampere Computing LLC
- Sandeep Brahmadathan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error rate measurement apparatus and error rate measurement method
- Patent number 12,265,120
- Issue date Apr 1, 2025
- Anritsu Corporation
- Hiroyuki Onuma
- G01 - MEASURING TESTING
Information Patent Grant
Adhesive composition and methods of forming the same
- Patent number 12,258,495
- Issue date Mar 25, 2025
- Saint-Gobain Performance Plastics Corporation
- Nicky Chan
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Integrated circuit applicable to performing system protection throu...
- Patent number 12,254,125
- Issue date Mar 18, 2025
- Realtek Semiconductor Corp.
- Chang-Hsien Tai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, debug system, and debug method
- Patent number 12,253,561
- Issue date Mar 18, 2025
- Renesas Electronics Corporation
- Masahide Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Test system that converts command syntaxes
- Patent number 12,235,317
- Issue date Feb 25, 2025
- Teradyne, Inc.
- Richard W. Fanning
- G01 - MEASURING TESTING
Information Patent Grant
Methods for determining and calibrating non-linearity in a Phase In...
- Patent number 12,235,318
- Issue date Feb 25, 2025
- Samsung Electronics Co., Ltd.
- Gunjan Mandal
- G01 - MEASURING TESTING
Information Patent Grant
Integrated communication link testing
- Patent number 12,222,388
- Issue date Feb 11, 2025
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Grant
Test board for testing memory signal
- Patent number 12,222,389
- Issue date Feb 11, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Honglong Shi
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level methods of testing semiconductor devices using internal...
- Patent number 12,203,980
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Grant
Signal test
- Patent number 12,196,803
- Issue date Jan 14, 2025
- Infineon Technologies AG
- Muhammad Hassan
- G01 - MEASURING TESTING
Information Patent Grant
Electronic instrument for analyzing a DUT
- Patent number 12,196,809
- Issue date Jan 14, 2025
- Rohde & Schwarz GmbH & Co. KG
- Mathias Hellwig
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for controlling actions of testbench components w...
- Patent number 12,188,983
- Issue date Jan 7, 2025
- HCL America Inc.
- Manickam Muthiah
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test system and automatic test method for integrated-circ...
- Patent number 12,158,494
- Issue date Dec 3, 2024
- Kingston Digital, Inc.
- Chao-Kun Lee
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Systems, methods, and storage media for detecting a security intrus...
- Patent number 12,160,320
- Issue date Dec 3, 2024
- Level 3 Communications, LLC
- Steven E. Drake
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method, a device and a computer program for operating a modular tes...
- Patent number 12,153,091
- Issue date Nov 26, 2024
- Volkswagen Aktiengesellschaft
- Andreas Aal
- G01 - MEASURING TESTING
Information Patent Grant
Test system, test method, and non-transitory computer readable medium
- Patent number 12,146,910
- Issue date Nov 19, 2024
- Kioxia Corporation
- Kazuhiko Nakahara
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for avoiding collision between data
- Patent number 12,140,627
- Issue date Nov 12, 2024
- Hyundai Mobis Co., Ltd.
- Sung Hoon Bang
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Telephone connector to audio connector mapping and leveling device
- Patent number 12,140,633
- Issue date Nov 12, 2024
- Tony Dux
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Classifying comparators based on comparator offsets
- Patent number 12,134,713
- Issue date Nov 5, 2024
- Microchip Technology Incorporated
- Zhi-Yuan Zou
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Electronic component testing system and time certification method
- Patent number 12,135,350
- Issue date Nov 5, 2024
- CHROMA ATE INC.
- Tzu-Ching Yang
- G01 - MEASURING TESTING
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable JTAG architecture for implementation of programmable...
- Patent number 12,123,912
- Issue date Oct 22, 2024
- University of Florida Research Foundation, Incorporated
- Swarup Bhunia
- G01 - MEASURING TESTING
Information Patent Grant
Array of unit cells having pad structures
- Patent number 12,123,909
- Issue date Oct 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yu-Ching Chiu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ADHESIVE COMPOSITION AND METHODS OF FORMING THE SAME
- Publication number 20250188326
- Publication date Jun 12, 2025
- SAINT-GOBAIN PERFORMANCE PLASTICS CORPORATION
- Nicky CHAN
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
ANALYZING TRANSMISSION LINES
- Publication number 20250180629
- Publication date Jun 5, 2025
- Teradyne, Inc.
- Tushar Gohel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR SOLID STATE MEMORY REFRESH
- Publication number 20250166716
- Publication date May 22, 2025
- PURE STORAGE, INC.
- Hari Kannan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR JITTER MEASUREMENT
- Publication number 20250155499
- Publication date May 15, 2025
- Analog Devices International Unlimited Company
- Seamus Anthony RYAN
- G01 - MEASURING TESTING
Information Patent Application
Supply Chain Security for Chiplets
- Publication number 20250155500
- Publication date May 15, 2025
- ADVANCED MICRO DEVICES, INC.
- Robert Landon Pelt
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING METHOD AND APPARATUS
- Publication number 20250147101
- Publication date May 8, 2025
- XIAMEN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE CO., LTD.
- Yonghong HUANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR AUTOMATED DATA RETRIEVAL FROM AN INTEGRATED CIRCUIT FOR...
- Publication number 20250123329
- Publication date Apr 17, 2025
- NVIDIA Corporation
- Padmanabham Patki
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE TEST INSTRUCTION SET ARCHITECTURE
- Publication number 20250116701
- Publication date Apr 10, 2025
- Signature IP Corporation
- Shivam Mehra
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...
- Publication number 20250110175
- Publication date Apr 3, 2025
- Intel Corporation
- Rakesh KANDULA
- G01 - MEASURING TESTING
Information Patent Application
FAULT DETECTION CIRCUIT
- Publication number 20250110176
- Publication date Apr 3, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Weibing Jing
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20250093415
- Publication date Mar 20, 2025
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL TESTING DEVICE
- Publication number 20250085342
- Publication date Mar 13, 2025
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Chih-Jen CHIN
- G01 - MEASURING TESTING
Information Patent Application
Diagnosing Identical Circuit Blocks in Data Streaming Environment
- Publication number 20250076376
- Publication date Mar 6, 2025
- Siemens Industry Software Inc.
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Application
EYE-DIAGRAM INDEX ANALYTIC METHOD, COMPUTER READABLE RECORDING MEDI...
- Publication number 20250076379
- Publication date Mar 6, 2025
- NOVATEK MICROELECTRONICS CORP.
- Kai Li
- G01 - MEASURING TESTING
Information Patent Application
CLASSIFYING COMPARATORS BASED ON COMPARATOR OFFSETS
- Publication number 20250059414
- Publication date Feb 20, 2025
- MICROCHIP TECHNOLOGY INCORPORATED
- Zhi-Yuan Zou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20250052811
- Publication date Feb 13, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS AND POWER SUPPLY METHOD THEREOF
- Publication number 20250044353
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G01 - MEASURING TESTING
Information Patent Application
ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD
- Publication number 20250020718
- Publication date Jan 16, 2025
- Anritsu Corporation
- Hironori YOSHIOKA
- G01 - MEASURING TESTING
Information Patent Application
ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD
- Publication number 20250020717
- Publication date Jan 16, 2025
- Anritsu Corporation
- Tatsuya IWAI
- G01 - MEASURING TESTING
Information Patent Application
PROTECTION OF THE CONTENT OF A FUSE MEMORY
- Publication number 20250004051
- Publication date Jan 2, 2025
- STMicroelectronics (Grenoble 2) SAS
- Mark Trimmer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20240418774
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
VERIFICATION METHOD AND VERIFICATION DEVICE
- Publication number 20240385240
- Publication date Nov 21, 2024
- REALTEK SEMICONDUCTOR CORPORATION
- Xianghua SHEN
- G01 - MEASURING TESTING
Information Patent Application
ARRAY OF UNIT CELLS HAVING PAD STRUCTURES
- Publication number 20240369626
- Publication date Nov 7, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Yu-Ching CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN TEST IN A SINGLE-WIRE BUS CIRCUIT
- Publication number 20240345162
- Publication date Oct 17, 2024
- Qorvo US, Inc.
- Alexander Wayne Hietala
- G11 - INFORMATION STORAGE
Information Patent Application
System and Method for Utilizing Idle Computing Capacity
- Publication number 20240329133
- Publication date Oct 3, 2024
- Tapster Robotics, Inc.
- Jason Randolph Huggins
- G01 - MEASURING TESTING
Information Patent Application
MEMORY TIMING CHARACTERIZATION CIRCUITRY
- Publication number 20240319269
- Publication date Sep 26, 2024
- Intel Corporation
- Amit Agarwal
- G01 - MEASURING TESTING
Information Patent Application
BIT-CORRECTOR CIRCUITS FOR PHOTONIC CIRCUITS WITH CASCADED PHOTONIC...
- Publication number 20240310438
- Publication date Sep 19, 2024
- Milkshake Technology Inc.
- Bicky A. Marquez
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE
- Publication number 20240305301
- Publication date Sep 12, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO CHIEH LI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HIGH THROUGHPUT SORT
- Publication number 20240302431
- Publication date Sep 12, 2024
- INFINEON TECHNOLOGIES AG
- David Addison
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM ACCESS BOUNDARY SCAN VIA SYSTEM SIDEBAND SIGNAL CONNECTIONS
- Publication number 20240288497
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Michael Richard Spica
- G01 - MEASURING TESTING

BER [Bit Error Rate] test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High throughput sort

Integrated circuit profiling and anomaly detection

Background reads for solid state storage

Secured scan access for a device including a scan chain

Yield improvements for three-dimensionally stacked neural network a...

Automated test equipment comprising a device under test loopback an...

Component die validation built-in self-test (VBIST) engine

Error rate measurement apparatus and error rate measurement method

Adhesive composition and methods of forming the same

Integrated circuit applicable to performing system protection throu...

Semiconductor device, debug system, and debug method

Test system that converts command syntaxes

Methods for determining and calibrating non-linearity in a Phase In...

Integrated communication link testing

Test board for testing memory signal

Wafer level methods of testing semiconductor devices using internal...

Signal test

Electronic instrument for analyzing a DUT

Method and system for controlling actions of testbench components w...

Automatic test system and automatic test method for integrated-circ...

Systems, methods, and storage media for detecting a security intrus...

Method, a device and a computer program for operating a modular tes...

Test system, test method, and non-transitory computer readable medium

Apparatus and method for avoiding collision between data

Telephone connector to audio connector mapping and leveling device

Classifying comparators based on comparator offsets

Electronic component testing system and time certification method

Interface to full and reduced pin JTAG devices

Reconfigurable JTAG architecture for implementation of programmable...

Array of unit cells having pad structures

Patents Applicationslast 30 patents

ADHESIVE COMPOSITION AND METHODS OF FORMING THE SAME

ANALYZING TRANSMISSION LINES

SYSTEM AND METHOD FOR SOLID STATE MEMORY REFRESH

APPARATUSES AND METHODS FOR JITTER MEASUREMENT

Supply Chain Security for Chiplets

CHIP TESTING METHOD AND APPARATUS

SYSTEM FOR AUTOMATED DATA RETRIEVAL FROM AN INTEGRATED CIRCUIT FOR...

FLEXIBLE TEST INSTRUCTION SET ARCHITECTURE

METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...

FAULT DETECTION CIRCUIT

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

FUNCTIONAL TESTING DEVICE

Diagnosing Identical Circuit Blocks in Data Streaming Environment

EYE-DIAGRAM INDEX ANALYTIC METHOD, COMPUTER READABLE RECORDING MEDI...

CLASSIFYING COMPARATORS BASED ON COMPARATOR OFFSETS

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

SEMICONDUCTOR TEST APPARATUS AND POWER SUPPLY METHOD THEREOF

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

PROTECTION OF THE CONTENT OF A FUSE MEMORY

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

VERIFICATION METHOD AND VERIFICATION DEVICE

ARRAY OF UNIT CELLS HAVING PAD STRUCTURES

SCAN TEST IN A SINGLE-WIRE BUS CIRCUIT

System and Method for Utilizing Idle Computing Capacity

MEMORY TIMING CHARACTERIZATION CIRCUITRY

BIT-CORRECTOR CIRCUITS FOR PHOTONIC CIRCUITS WITH CASCADED PHOTONIC...

CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE

HIGH THROUGHPUT SORT

SYSTEM ACCESS BOUNDARY SCAN VIA SYSTEM SIDEBAND SIGNAL CONNECTIONS