Bores or yokes

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CPC
H01J2237/1415

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/1415Bores or yokes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for electron beam focusing in electron beam add...
- Patent number 12,148,592
- Issue date Nov 19, 2024
- General Electric Company
- John Scott Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope device and electron beam inspection ap...
- Patent number 11,908,657
- Issue date Feb 20, 2024
- Zhongke Jingyuan Electron Limited
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for electron beam focusing in electron beam add...
- Patent number 11,837,428
- Issue date Dec 5, 2023
- General Electric Company
- John Scott Price
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Axial alignment assembly, and charged particle microscope comprisin...
- Patent number 11,773,905
- Issue date Oct 3, 2023
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole unit and charged particle beam device
- Patent number 11,769,649
- Issue date Sep 26, 2023
- HITACHI HIGH-TECH CORPORATION
- Masanori Mita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens arrangement usable in particle-optical systems
- Patent number 11,527,379
- Issue date Dec 13, 2022
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field free sample plane for charged particle microscope
- Patent number 11,450,505
- Issue date Sep 20, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam optical system, exposure apparatus, exposure...
- Patent number 11,276,546
- Issue date Mar 15, 2022
- Nikon Corporation
- Takehisa Yahiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning magnet design with enhanced efficiency
- Patent number 11,114,270
- Issue date Sep 7, 2021
- Axcelis Technologies, Inc.
- Bo Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 11,075,053
- Issue date Jul 27, 2021
- ASML Netherlands B.V.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic lens and exciting current control method
- Patent number 10,923,312
- Issue date Feb 16, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens arrangement usable in particle-optical systems
- Patent number 10,622,184
- Issue date Apr 14, 2020
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 10,468,227
- Issue date Nov 5, 2019
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gun lens design in a charged particle microscope
- Patent number 10,410,827
- Issue date Sep 10, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 10,032,600
- Issue date Jul 24, 2018
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 9,812,283
- Issue date Nov 7, 2017
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 9,799,484
- Issue date Oct 24, 2017
- Hermes-Microvision, Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques and apparatus for manipulating an ion beam
- Patent number 9,793,087
- Issue date Oct 17, 2017
- Varian Semiconductor Equipment Associates, Inc.
- James S. Buff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source
- Patent number 9,754,760
- Issue date Sep 5, 2017
- Hermes Microvision Inc.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combined multipole magnet and dipole scanning magnet
- Patent number 9,620,327
- Issue date Apr 11, 2017
- Axcelis Technologies, Inc.
- Edward C. Eisner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic lens for focusing a beam of charged particles
- Patent number 9,595,359
- Issue date Mar 14, 2017
- FEI Company
- Ondrej Shanel
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Ion implantation apparatus
- Patent number 9,520,265
- Issue date Dec 13, 2016
- Sumitomo Heavy Industries Ion Technology Co., Ltd.
- Takanori Yagita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Notched magnetic lens for improved sample access in an SEM
- Patent number 9,443,693
- Issue date Sep 13, 2016
- KLA-Tencor Corporation
- Christopher M. Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole lens, method of fabricating same, and charged particle be...
- Patent number 9,396,904
- Issue date Jul 19, 2016
- Jeol Ltd.
- Yuji Kohno
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,384,940
- Issue date Jul 5, 2016
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole lens, aberration corrector, and electron microscope
- Patent number 9,349,565
- Issue date May 24, 2016
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of plural charged particle beams with multi-axis magnetic...
- Patent number 9,105,440
- Issue date Aug 11, 2015
- Hermes-Microvision, Inc.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-axis magnetic lens for focusing a plurality of charged partic...
- Patent number 9,000,394
- Issue date Apr 7, 2015
- Hermes-Microvision, Inc.
- Weiming Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam devices
- Patent number 8,859,992
- Issue date Oct 14, 2014
- Carl Zeiss NTS Limited
- Stewart John Bean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-axis magnetic lens for focusing a plurality of charged partic...
- Patent number 8,835,867
- Issue date Sep 16, 2014
- Hermes-Microvision, Inc.
- Zhongwei Chen
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM MICROSCOPE
- Publication number 20240304410
- Publication date Sep 12, 2024
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR DEMAGNETIZING MAGNETIC...
- Publication number 20240274395
- Publication date Aug 15, 2024
- Hitachi High-Tech Corporatiom
- Shingo HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adjustable Permanent Magnetic Lens Having Thermal Control Device
- Publication number 20240021403
- Publication date Jan 18, 2024
- IMS Nanofabrication GmbH
- Dietmar Puchberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adjustable Permanent Magnetic Lens Having Shunting Device
- Publication number 20230360878
- Publication date Nov 9, 2023
- IMS Nanofabrication GmbH
- Dietmar Puchberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE DEVICE AND ELECTRON BEAM INSPECTION AP...
- Publication number 20230005704
- Publication date Jan 5, 2023
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multipole Unit and Charged Particle Beam Device
- Publication number 20220270844
- Publication date Aug 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Masanori MITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD FREE SAMPLE PLANE FOR CHARGED PARTICLE MICROSCOPE
- Publication number 20220199353
- Publication date Jun 23, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SOURCE
- Publication number 20220068589
- Publication date Mar 3, 2022
- ASML NETHERLANDS B.V.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECTIVE LENS ARRANGEMENT USABLE IN PARTICLE-OPTICAL SYSTEMS
- Publication number 20200243296
- Publication date Jul 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Rainer KNIPPELMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SOURCE
- Publication number 20200126753
- Publication date Apr 23, 2020
- ASML NETHERLANDS B.V.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM OPTICAL SYSTEM, EXPOSURE APPARATUS, EXPOSURE...
- Publication number 20200051774
- Publication date Feb 13, 2020
- Nikon Corporation
- Takehisa YAHIRO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MAGNETIC LENS AND EXCITING CURRENT CONTROL METHOD
- Publication number 20190295808
- Publication date Sep 26, 2019
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20190057833
- Publication date Feb 21, 2019
- HERMES MICROVISION, INC.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20170125202
- Publication date May 4, 2017
- HERMES MICROVISION INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source
- Publication number 20170125204
- Publication date May 4, 2017
- HERMES MICROVISION INC.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES AND APPARATUS FOR MANIPULATING AN ION BEAM
- Publication number 20170076908
- Publication date Mar 16, 2017
- Varian Semiconductor Equipment Associates, Inc.
- James S. Buff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Combined Multipole Magnet and Dipole Scanning Magnet
- Publication number 20160189913
- Publication date Jun 30, 2016
- Axcelis Technologies, Inc.
- Edward C. Eisner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multipole Lens, Aberration Corrector, and Electron Microscope
- Publication number 20150332889
- Publication date Nov 19, 2015
- JEOL Ltd.
- Hidetaka SAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150294833
- Publication date Oct 15, 2015
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multipole Lens, Method of Fabricating Same, and Charged Particle Be...
- Publication number 20150287566
- Publication date Oct 8, 2015
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE MICRO-MACHINED MULTI-POLE ELECTROMAGNETS
- Publication number 20150129772
- Publication date May 14, 2015
- The Regents of the University of California
- Robert N. Candler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED PARTICLE BEAMS WITH MULTI-AXIS MAGNETIC...
- Publication number 20150060662
- Publication date Mar 5, 2015
- HERMES MICROVISION, INC.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC LENS FOR FOCUSING A BEAM OF CHARGED PARTICLES
- Publication number 20150021476
- Publication date Jan 22, 2015
- FEI Company
- Ondrej Shanel
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ELECTROMAGNETIC LENS FOR ELECTRON BEAM EXPOSURE APPARATUS
- Publication number 20140166893
- Publication date Jun 19, 2014
- Advantest Corporation
- Akio Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Configurable Charged-Particle Apparatus
- Publication number 20140110597
- Publication date Apr 24, 2014
- FEI Company
- Lubomir Tuma
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...
- Publication number 20130248730
- Publication date Sep 26, 2013
- HERMES MICROVISION, INC.
- Weiming Ren
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...
- Publication number 20130181138
- Publication date Jul 18, 2013
- HERMES MICROVISION, INC.
- Zhongwei Chen
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...
- Publication number 20130153782
- Publication date Jun 20, 2013
- HERMES MICROVISION, INC.
- Weiming Ren
- B82 - NANO-TECHNOLOGY
Information Patent Application
Vector Potential Photoelectron Microscope
- Publication number 20120298861
- Publication date Nov 29, 2012
- Raymond Browning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF PLURAL CHARGED PARTICLE BEAMS WITH MULTI-AXIS MAGNETIC...
- Publication number 20120145917
- Publication date Jun 14, 2012
- Hermes Microvision, Inc.
- ZHONGWEI CHEN
- H01 - BASIC ELECTRIC ELEMENTS

Bores or yokes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for electron beam focusing in electron beam add...

Scanning electron microscope device and electron beam inspection ap...

Systems and methods for electron beam focusing in electron beam add...

Axial alignment assembly, and charged particle microscope comprisin...

Multipole unit and charged particle beam device

Objective lens arrangement usable in particle-optical systems

Magnetic field free sample plane for charged particle microscope

Charged particle beam optical system, exposure apparatus, exposure...

Scanning magnet design with enhanced efficiency

Charged particle source

Magnetic lens and exciting current control method

Objective lens arrangement usable in particle-optical systems

Charged particle source

Gun lens design in a charged particle microscope

Charged particle source

Charged particle source

Charged particle source

Techniques and apparatus for manipulating an ion beam

Charged particle source

Combined multipole magnet and dipole scanning magnet

Magnetic lens for focusing a beam of charged particles

Ion implantation apparatus

Notched magnetic lens for improved sample access in an SEM

Multipole lens, method of fabricating same, and charged particle be...

Charged particle beam apparatus

Multipole lens, aberration corrector, and electron microscope

Apparatus of plural charged particle beams with multi-axis magnetic...

Multi-axis magnetic lens for focusing a plurality of charged partic...

Charged particle beam devices

Multi-axis magnetic lens for focusing a plurality of charged partic...

Patents Applicationslast 30 patents

ELECTRON BEAM MICROSCOPE

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR DEMAGNETIZING MAGNETIC...

Adjustable Permanent Magnetic Lens Having Thermal Control Device

Adjustable Permanent Magnetic Lens Having Shunting Device

SCANNING ELECTRON MICROSCOPE DEVICE AND ELECTRON BEAM INSPECTION AP...

Multipole Unit and Charged Particle Beam Device

MAGNETIC FIELD FREE SAMPLE PLANE FOR CHARGED PARTICLE MICROSCOPE

CHARGED PARTICLE SOURCE

OBJECTIVE LENS ARRANGEMENT USABLE IN PARTICLE-OPTICAL SYSTEMS

CHARGED PARTICLE SOURCE

CHARGED PARTICLE BEAM OPTICAL SYSTEM, EXPOSURE APPARATUS, EXPOSURE...

MAGNETIC LENS AND EXCITING CURRENT CONTROL METHOD

Charged Particle Source

Charged Particle Source

Charged Particle Source

TECHNIQUES AND APPARATUS FOR MANIPULATING AN ION BEAM

Combined Multipole Magnet and Dipole Scanning Magnet

Multipole Lens, Aberration Corrector, and Electron Microscope

CHARGED PARTICLE BEAM APPARATUS

Multipole Lens, Method of Fabricating Same, and Charged Particle Be...

SURFACE MICRO-MACHINED MULTI-POLE ELECTROMAGNETS

APPARATUS OF PLURAL CHARGED PARTICLE BEAMS WITH MULTI-AXIS MAGNETIC...

MAGNETIC LENS FOR FOCUSING A BEAM OF CHARGED PARTICLES

ELECTROMAGNETIC LENS FOR ELECTRON BEAM EXPOSURE APPARATUS

Configurable Charged-Particle Apparatus

Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...

Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...

Multi-axis Magnetic Lens for Focusing a Plurality of Charged Partic...

Vector Potential Photoelectron Microscope

APPARATUS OF PLURAL CHARGED PARTICLE BEAMS WITH MULTI-AXIS MAGNETIC...