Built-in arrangements for testing

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/12Built-in arrangements for testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Techniques for retiring blocks of a memory system
- Patent number 12,362,030
- Issue date Jul 15, 2025
- Micron Technology, Inc.
- Deping He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory test circuit, memory chip, and testing method of memory chip
- Patent number 12,362,028
- Issue date Jul 15, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jui-Jen Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Indicating a status of a memory built-in self-test for multiple mem...
- Patent number 12,362,031
- Issue date Jul 15, 2025
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit using clock signals having mutually different frequency
- Patent number 12,354,686
- Issue date Jul 8, 2025
- Micron Technology, Inc.
- Yutaka Uemura
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for read reference voltage calibration for non-vo...
- Patent number 12,354,688
- Issue date Jul 8, 2025
- HYPERSTONE GMBH
- Johann-Philipp Thiers
- G11 - INFORMATION STORAGE
Information Patent Grant
Command address control circuit, and semiconductor apparatus and se...
- Patent number 12,354,687
- Issue date Jul 8, 2025
- SK hynix Inc.
- Ji Hwan Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method of testing the semiconductor device
- Patent number 12,354,690
- Issue date Jul 8, 2025
- SK hynix Inc.
- Jun Hyuk Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Error detection pin encoding scheme to avoid maximum transitions an...
- Patent number 12,347,508
- Issue date Jul 1, 2025
- NVIDIA Corp.
- Sunil Sudhakaran
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system including a sub-controller and operating method of th...
- Patent number 12,347,509
- Issue date Jul 1, 2025
- SK Hynix Inc.
- Jong Joo Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic device for adjusting driving voltage of volatile memory...
- Patent number 12,340,857
- Issue date Jun 24, 2025
- Samsung Electronics Co., Ltd.
- Changmi Shin
- G11 - INFORMATION STORAGE
Information Patent Grant
Hybrid memory system with increased bandwidth
- Patent number 12,340,859
- Issue date Jun 24, 2025
- QUALCOMM Incorporated
- Jungwon Suh
- G11 - INFORMATION STORAGE
Information Patent Grant
Scheme to fetch optimal read parameters by skipping invalid wordlines
- Patent number 12,334,169
- Issue date Jun 17, 2025
- SanDisk Technologies, Inc.
- Darshan Pagariya
- G11 - INFORMATION STORAGE
Information Patent Grant
Data integrity checks based on voltage distribution metrics
- Patent number 12,334,166
- Issue date Jun 17, 2025
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Controlling memory including managing a correction value table
- Patent number 12,334,171
- Issue date Jun 17, 2025
- Kioxia Corporation
- Masanobu Shirakawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Link evaluation for a memory device
- Patent number 12,334,172
- Issue date Jun 17, 2025
- Micron Technology, Inc.
- Markus Balb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic devices related to compensation of monitoring signals
- Patent number 12,334,174
- Issue date Jun 17, 2025
- SK hynix Inc.
- Yoon Jae Shin
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic fuse device and operation method thereof
- Patent number 12,326,473
- Issue date Jun 10, 2025
- Faraday Technology Corp.
- Chi-Chou Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Digital verify failbit count (VFC) circuit
- Patent number 12,322,465
- Issue date Jun 3, 2025
- Yangtze Memory Technologies Co., Ltd.
- Teng Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device including sense amplifying circuit
- Patent number 12,315,579
- Issue date May 27, 2025
- SK Hynix Inc.
- Yeonsu Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and operating method of the memory device
- Patent number 12,315,582
- Issue date May 27, 2025
- SK hynix Inc.
- Min Ho Her
- G11 - INFORMATION STORAGE
Information Patent Grant
Reconfigurable MBIST method based on adaptive march algorithm
- Patent number 12,308,085
- Issue date May 20, 2025
- Nanjing University Of Posts And Telecommunications
- Zhikuang Cai
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for testing memory device
- Patent number 12,308,086
- Issue date May 20, 2025
- NANYA TECHNOLOGY CORPORATION
- Jui-Chung Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
In-situ detection of anomalies in integrated circuits using machine...
- Patent number 12,307,747
- Issue date May 20, 2025
- Intel Corporation
- Sriram R. Vangal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Volatile memory devices and methods of operating same to improve re...
- Patent number 12,308,083
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Junyoung Ko
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable testing and repair system for non-volatile memory
- Patent number 12,308,081
- Issue date May 20, 2025
- iSTART-TEK INC.
- Cheng-Yen Han
- G11 - INFORMATION STORAGE
Information Patent Grant
Interactive DRAM signal analyzer and method of analyzing and calibr...
- Patent number 12,308,084
- Issue date May 20, 2025
- COSIGNON
- Sung Ho Park
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory devices that support enhanced data recovery op...
- Patent number 12,308,082
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Seungjun Oh
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable scan chain architecture for multi-port memory
- Patent number 12,300,338
- Issue date May 13, 2025
- ARM Limited
- Andy Wangkun Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system including a sub-controller and operating method of th...
- Patent number 12,300,341
- Issue date May 13, 2025
- SK Hynix Inc.
- Jong Joo Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for testing a non-volatile memory
- Patent number 12,300,342
- Issue date May 13, 2025
- Infineon Technologies LLC
- Bogdan Georgescu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
COMPONENT DIE VALIDATION BUILT-IN SELF-TEST (VBIST) ENGINE
- Publication number 20250231236
- Publication date Jul 17, 2025
- Ampere Computing LLC
- Sandeep BRAHMADATHAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND A METHOD OF OPERATING...
- Publication number 20250232828
- Publication date Jul 17, 2025
- Samsung Electronics Co., LTD
- Myeong-Woo Lee
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20250226051
- Publication date Jul 10, 2025
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY DEVICE INCLUDING MEMORY PLANES, AND STORAGE DEVI...
- Publication number 20250225072
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Youngkyu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-VOLATILE MEMORY WITH ENHANCED EARLY PROGRAM TERMINATION MODE FO...
- Publication number 20250226044
- Publication date Jul 10, 2025
- Western Digital Technologies, Inc.
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND SYSTEMS FOR IMPROVING ECC OPERATION OF MEMORIES
- Publication number 20250226046
- Publication date Jul 10, 2025
- Micron Technology, Inc.
- Christophe Laurent
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY BIST CIRCUIT AND METHOD
- Publication number 20250218524
- Publication date Jul 3, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Application
IN-MEMORY READ THRESHOLD ADAPTATION
- Publication number 20250218523
- Publication date Jul 3, 2025
- SK HYNIX INC.
- Pengfei HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
READ DISTURB CHARGE LOSS HANDLING
- Publication number 20250218528
- Publication date Jul 3, 2025
- Micron Technology, Inc.
- Murong Lang
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR CHIP THAT ADJUSTS STROBE SIGNAL DELAY
- Publication number 20250218525
- Publication date Jul 3, 2025
- SK HYNIX INC.
- Kyung Jun CHO
- G11 - INFORMATION STORAGE
Information Patent Application
ON-DIE TESTING FOR A MEMORY DEVICE
- Publication number 20250218526
- Publication date Jul 3, 2025
- Micron Technology, Inc.
- David W. Overgaard
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE
- Publication number 20250210123
- Publication date Jun 26, 2025
- Lodestar Licensing Group LLC
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
DIE-LEVEL BLOCK FAMILY ERROR AVOIDANCE
- Publication number 20250201326
- Publication date Jun 19, 2025
- Micron Technology, Inc.
- Murong Lang
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR TESTING MEMORY DEVICE
- Publication number 20250201327
- Publication date Jun 19, 2025
- NANYA TECHNOLOGY CORPORATION
- Yaochang CHIU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM
- Publication number 20250201325
- Publication date Jun 19, 2025
- KIOXIA Corporation
- Tsukasa TOKUTOMI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF
- Publication number 20250201330
- Publication date Jun 19, 2025
- SK HYNIX INC.
- Jeong Hwan SONG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY, MEMORY SYSTEM, PROGRAM METHOD OF MEMORY, AND ELECTRONIC APP...
- Publication number 20250191668
- Publication date Jun 12, 2025
- Yangtze Memory Technologies Co., Ltd.
- Hongtao Liu
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, DEVICE, AND CIRCUIT FOR HIGH-SPEED MEMORIES
- Publication number 20250191669
- Publication date Jun 12, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jaspal Singh SHAH
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE INCLUDING BUILT-IN-SELF-TES...
- Publication number 20250191671
- Publication date Jun 12, 2025
- Samsung Electronics Co., Ltd.
- Jaehyeok KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SOLID STATE STORAGE DEVICE AND PATROL READ METHOD USING WORD LINE G...
- Publication number 20250181498
- Publication date Jun 5, 2025
- KIOXIA Corporation
- Bai-Jun XIAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE DEVICE
- Publication number 20250182838
- Publication date Jun 5, 2025
- Canon Kabushiki Kaisha
- YOSHIHISA SUZUKI
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY
- Publication number 20250174292
- Publication date May 29, 2025
- CXMT CORPORATION
- Weibing SHANG
- G11 - INFORMATION STORAGE
Information Patent Application
CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...
- Publication number 20250174293
- Publication date May 29, 2025
- Samsung Electronics Co., Ltd.
- Jinuk Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY REPAIR CIRCUIT, A MEMORY REPAIR METHOD, AND A MEMORY DEVICE
- Publication number 20250166720
- Publication date May 22, 2025
- Samsung Electronics Co., Ltd.
- Hyunseok KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER DETECTING CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
- Publication number 20250167139
- Publication date May 22, 2025
- Samsung Electronics Co., Ltd.
- Cheolhwan LIM
- G11 - INFORMATION STORAGE
Information Patent Application
ACTIVATION FUNCTIONS FOR ARTIFICIAL INTELLIGENCE OPERATIONS
- Publication number 20250157509
- Publication date May 15, 2025
- Micron Technology, Inc.
- Alberto Troia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERACTIVE DRAM SIGNAL ANALYZER AND METHOD OF ANALYZING AND CALIBR...
- Publication number 20250157558
- Publication date May 15, 2025
- COSIGNON
- Sung Ho PARK
- G01 - MEASURING TESTING
Information Patent Application
STORAGE DEVICE AND OPERATING METHOD THEREOF
- Publication number 20250157559
- Publication date May 15, 2025
- SK HYNIX INC.
- Jung Sik Choi
- G11 - INFORMATION STORAGE
Information Patent Application
TEST MODE STATE MACHINE FOR A MEMORY DEVICE
- Publication number 20250138744
- Publication date May 1, 2025
- Micron Technology, Inc.
- Rucha Deepak Geedh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE HAVING CELL OVER PERIPHERY STRUCTURE AND SEMICONDUCTO...
- Publication number 20250140332
- Publication date May 1, 2025
- Samsung Electronics Co., Ltd.
- Changyoung Lee
- G11 - INFORMATION STORAGE

Built-in arrangements for testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Techniques for retiring blocks of a memory system

Memory test circuit, memory chip, and testing method of memory chip

Indicating a status of a memory built-in self-test for multiple mem...

Test circuit using clock signals having mutually different frequency

Method and system for read reference voltage calibration for non-vo...

Command address control circuit, and semiconductor apparatus and se...

Semiconductor device and method of testing the semiconductor device

Error detection pin encoding scheme to avoid maximum transitions an...

Memory system including a sub-controller and operating method of th...

Electronic device for adjusting driving voltage of volatile memory...

Hybrid memory system with increased bandwidth

Scheme to fetch optimal read parameters by skipping invalid wordlines

Data integrity checks based on voltage distribution metrics

Controlling memory including managing a correction value table

Link evaluation for a memory device

Electronic devices related to compensation of monitoring signals

Electronic fuse device and operation method thereof

Digital verify failbit count (VFC) circuit

Memory device including sense amplifying circuit

Memory device and operating method of the memory device

Reconfigurable MBIST method based on adaptive march algorithm

System and method for testing memory device

In-situ detection of anomalies in integrated circuits using machine...

Volatile memory devices and methods of operating same to improve re...

Configurable testing and repair system for non-volatile memory

Interactive DRAM signal analyzer and method of analyzing and calibr...

Semiconductor memory devices that support enhanced data recovery op...

Configurable scan chain architecture for multi-port memory

Memory system including a sub-controller and operating method of th...

System and method for testing a non-volatile memory

Patents Applicationslast 30 patents

COMPONENT DIE VALIDATION BUILT-IN SELF-TEST (VBIST) ENGINE

3-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND A METHOD OF OPERATING...

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

NONVOLATILE MEMORY DEVICE INCLUDING MEMORY PLANES, AND STORAGE DEVI...

NON-VOLATILE MEMORY WITH ENHANCED EARLY PROGRAM TERMINATION MODE FO...

METHODS AND SYSTEMS FOR IMPROVING ECC OPERATION OF MEMORIES

MEMORY BIST CIRCUIT AND METHOD

IN-MEMORY READ THRESHOLD ADAPTATION

READ DISTURB CHARGE LOSS HANDLING

SEMICONDUCTOR CHIP THAT ADJUSTS STROBE SIGNAL DELAY

ON-DIE TESTING FOR A MEMORY DEVICE

MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE

DIE-LEVEL BLOCK FAMILY ERROR AVOIDANCE

SYSTEM AND METHOD FOR TESTING MEMORY DEVICE

MEMORY SYSTEM

SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF

MEMORY, MEMORY SYSTEM, PROGRAM METHOD OF MEMORY, AND ELECTRONIC APP...

METHOD, DEVICE, AND CIRCUIT FOR HIGH-SPEED MEMORIES

BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE INCLUDING BUILT-IN-SELF-TES...

SOLID STATE STORAGE DEVICE AND PATROL READ METHOD USING WORD LINE G...

STORAGE DEVICE

MEMORY

CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...

MEMORY REPAIR CIRCUIT, A MEMORY REPAIR METHOD, AND A MEMORY DEVICE

LASER DETECTING CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME

ACTIVATION FUNCTIONS FOR ARTIFICIAL INTELLIGENCE OPERATIONS

INTERACTIVE DRAM SIGNAL ANALYZER AND METHOD OF ANALYZING AND CALIBR...

STORAGE DEVICE AND OPERATING METHOD THEREOF

TEST MODE STATE MACHINE FOR A MEMORY DEVICE

MEMORY DEVICE HAVING CELL OVER PERIPHERY STRUCTURE AND SEMICONDUCTO...