Built-in arrangements for testing

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/12Built-in arrangements for testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electronic device for adjusting driving voltage of volatile memory...
- Patent number 12,340,857
- Issue date Jun 24, 2025
- Samsung Electronics Co., Ltd.
- Changmi Shin
- G11 - INFORMATION STORAGE
Information Patent Grant
Hybrid memory system with increased bandwidth
- Patent number 12,340,859
- Issue date Jun 24, 2025
- QUALCOMM Incorporated
- Jungwon Suh
- G11 - INFORMATION STORAGE
Information Patent Grant
Scheme to fetch optimal read parameters by skipping invalid wordlines
- Patent number 12,334,169
- Issue date Jun 17, 2025
- SanDisk Technologies, Inc.
- Darshan Pagariya
- G11 - INFORMATION STORAGE
Information Patent Grant
Data integrity checks based on voltage distribution metrics
- Patent number 12,334,166
- Issue date Jun 17, 2025
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Controlling memory including managing a correction value table
- Patent number 12,334,171
- Issue date Jun 17, 2025
- Kioxia Corporation
- Masanobu Shirakawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Link evaluation for a memory device
- Patent number 12,334,172
- Issue date Jun 17, 2025
- Micron Technology, Inc.
- Markus Balb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic devices related to compensation of monitoring signals
- Patent number 12,334,174
- Issue date Jun 17, 2025
- SK hynix Inc.
- Yoon Jae Shin
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic fuse device and operation method thereof
- Patent number 12,326,473
- Issue date Jun 10, 2025
- Faraday Technology Corp.
- Chi-Chou Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Digital verify failbit count (VFC) circuit
- Patent number 12,322,465
- Issue date Jun 3, 2025
- Yangtze Memory Technologies Co., Ltd.
- Teng Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device including sense amplifying circuit
- Patent number 12,315,579
- Issue date May 27, 2025
- SK Hynix Inc.
- Yeonsu Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and operating method of the memory device
- Patent number 12,315,582
- Issue date May 27, 2025
- SK hynix Inc.
- Min Ho Her
- G11 - INFORMATION STORAGE
Information Patent Grant
Reconfigurable MBIST method based on adaptive march algorithm
- Patent number 12,308,085
- Issue date May 20, 2025
- Nanjing University Of Posts And Telecommunications
- Zhikuang Cai
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for testing memory device
- Patent number 12,308,086
- Issue date May 20, 2025
- NANYA TECHNOLOGY CORPORATION
- Jui-Chung Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
In-situ detection of anomalies in integrated circuits using machine...
- Patent number 12,307,747
- Issue date May 20, 2025
- Intel Corporation
- Sriram R. Vangal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Volatile memory devices and methods of operating same to improve re...
- Patent number 12,308,083
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Junyoung Ko
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable testing and repair system for non-volatile memory
- Patent number 12,308,081
- Issue date May 20, 2025
- iSTART-TEK INC.
- Cheng-Yen Han
- G11 - INFORMATION STORAGE
Information Patent Grant
Interactive DRAM signal analyzer and method of analyzing and calibr...
- Patent number 12,308,084
- Issue date May 20, 2025
- COSIGNON
- Sung Ho Park
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory devices that support enhanced data recovery op...
- Patent number 12,308,082
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Seungjun Oh
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable scan chain architecture for multi-port memory
- Patent number 12,300,338
- Issue date May 13, 2025
- ARM Limited
- Andy Wangkun Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system including a sub-controller and operating method of th...
- Patent number 12,300,341
- Issue date May 13, 2025
- SK Hynix Inc.
- Jong Joo Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for testing a non-volatile memory
- Patent number 12,300,342
- Issue date May 13, 2025
- Infineon Technologies LLC
- Bogdan Georgescu
- G11 - INFORMATION STORAGE
Information Patent Grant
Adjusting memory power consumption
- Patent number 12,300,340
- Issue date May 13, 2025
- Microsoft Technology Licensing, LLC
- Ori Laslo
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device, memory device test method, and test system
- Patent number 12,300,344
- Issue date May 13, 2025
- Samsung Electronics Co., Ltd.
- Hong-Jun Jin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory interface and semiconductor memory device and semiconductor...
- Patent number 12,293,801
- Issue date May 6, 2025
- Samsung Electronics Co., Ltd.
- Hojun Yoon
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory with layout adaptive problematic word line dete...
- Patent number 12,293,800
- Issue date May 6, 2025
- SanDisk Technologies, Inc.
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test burst patterns based on architecture of memory
- Patent number 12,293,803
- Issue date May 6, 2025
- Micron Technology, Inc.
- William Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit and receiving circuit having test function
- Patent number 12,288,589
- Issue date Apr 29, 2025
- SK hynix Inc.
- Gi Moon Hong
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit for detecting word line defect and semiconductor appar...
- Patent number 12,283,331
- Issue date Apr 22, 2025
- SK hynix Inc.
- Suk Hwan Choi
- G11 - INFORMATION STORAGE
Information Patent Grant
Bit retiring to mitigate bit errors
- Patent number 12,283,333
- Issue date Apr 22, 2025
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Grant
Component die validation built-in self-test (VBIST) engine
- Patent number 12,282,064
- Issue date Apr 22, 2025
- Ampere Computing LLC
- Sandeep Brahmadathan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE
- Publication number 20250210123
- Publication date Jun 26, 2025
- Lodestar Licensing Group LLC
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
DIE-LEVEL BLOCK FAMILY ERROR AVOIDANCE
- Publication number 20250201326
- Publication date Jun 19, 2025
- Micron Technology, Inc.
- Murong Lang
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR TESTING MEMORY DEVICE
- Publication number 20250201327
- Publication date Jun 19, 2025
- NANYA TECHNOLOGY CORPORATION
- Yaochang CHIU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM
- Publication number 20250201325
- Publication date Jun 19, 2025
- KIOXIA Corporation
- Tsukasa TOKUTOMI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF
- Publication number 20250201330
- Publication date Jun 19, 2025
- SK HYNIX INC.
- Jeong Hwan SONG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY, MEMORY SYSTEM, PROGRAM METHOD OF MEMORY, AND ELECTRONIC APP...
- Publication number 20250191668
- Publication date Jun 12, 2025
- Yangtze Memory Technologies Co., Ltd.
- Hongtao Liu
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, DEVICE, AND CIRCUIT FOR HIGH-SPEED MEMORIES
- Publication number 20250191669
- Publication date Jun 12, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jaspal Singh SHAH
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE INCLUDING BUILT-IN-SELF-TES...
- Publication number 20250191671
- Publication date Jun 12, 2025
- Samsung Electronics Co., Ltd.
- Jaehyeok KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SOLID STATE STORAGE DEVICE AND PATROL READ METHOD USING WORD LINE G...
- Publication number 20250181498
- Publication date Jun 5, 2025
- KIOXIA Corporation
- Bai-Jun XIAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE DEVICE
- Publication number 20250182838
- Publication date Jun 5, 2025
- Canon Kabushiki Kaisha
- YOSHIHISA SUZUKI
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY
- Publication number 20250174292
- Publication date May 29, 2025
- CXMT CORPORATION
- Weibing SHANG
- G11 - INFORMATION STORAGE
Information Patent Application
CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...
- Publication number 20250174293
- Publication date May 29, 2025
- Samsung Electronics Co., Ltd.
- Jinuk Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY REPAIR CIRCUIT, A MEMORY REPAIR METHOD, AND A MEMORY DEVICE
- Publication number 20250166720
- Publication date May 22, 2025
- Samsung Electronics Co., Ltd.
- Hyunseok KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER DETECTING CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
- Publication number 20250167139
- Publication date May 22, 2025
- Samsung Electronics Co., Ltd.
- Cheolhwan LIM
- G11 - INFORMATION STORAGE
Information Patent Application
ACTIVATION FUNCTIONS FOR ARTIFICIAL INTELLIGENCE OPERATIONS
- Publication number 20250157509
- Publication date May 15, 2025
- Micron Technology, Inc.
- Alberto Troia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERACTIVE DRAM SIGNAL ANALYZER AND METHOD OF ANALYZING AND CALIBR...
- Publication number 20250157558
- Publication date May 15, 2025
- COSIGNON
- Sung Ho PARK
- G01 - MEASURING TESTING
Information Patent Application
STORAGE DEVICE AND OPERATING METHOD THEREOF
- Publication number 20250157559
- Publication date May 15, 2025
- SK HYNIX INC.
- Jung Sik Choi
- G11 - INFORMATION STORAGE
Information Patent Application
TEST MODE STATE MACHINE FOR A MEMORY DEVICE
- Publication number 20250138744
- Publication date May 1, 2025
- Micron Technology, Inc.
- Rucha Deepak Geedh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE HAVING CELL OVER PERIPHERY STRUCTURE AND SEMICONDUCTO...
- Publication number 20250140332
- Publication date May 1, 2025
- Samsung Electronics Co., Ltd.
- Changyoung Lee
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR SYSTEM FOR DETECTING FAIL LOCATION
- Publication number 20250140333
- Publication date May 1, 2025
- SK HYNIX INC.
- Dong Yoon KA
- G11 - INFORMATION STORAGE
Information Patent Application
SCHEME TO FETCH OPTIMAL READ PARAMETERS BY SKIPPING INVALID WORDLINES
- Publication number 20250140331
- Publication date May 1, 2025
- Western Digital Technologies, Inc.
- DARSHAN PAGARIYA
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR ISOLATING FAULTY NAND TEMPERATURE SENSOR
- Publication number 20250140330
- Publication date May 1, 2025
- Western Digital Technologies, Inc.
- VARUN SHARMA
- G01 - MEASURING TESTING
Information Patent Application
STORING MEMORY ARRAY OPERATIONAL INFORMATION IN NON-VOLATILE SUBARRAYS
- Publication number 20250130908
- Publication date Apr 24, 2025
- Micron Technology, Inc.
- Christopher John Kawamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY TESTING SYSTEM AND MEMORY TESTING METHOD
- Publication number 20250131974
- Publication date Apr 24, 2025
- NANYA TECHNOLOGY CORPORATION
- Chien Yu CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
EXTENDING FUNCTIONALITY OF MEMORY CONTROLLERS USING A LOOPBACK MODE...
- Publication number 20250131970
- Publication date Apr 24, 2025
- Ampere Computing LLC
- Massimo Sutera
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND TEST METHOD THEREOF
- Publication number 20250124996
- Publication date Apr 17, 2025
- WINBOND ELECTRONICS CORP.
- Chih-Chiang Lai
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE FOR CONTROLLING OPERATING POWER SUPPLIED TO WO...
- Publication number 20250124998
- Publication date Apr 17, 2025
- SK HYNIX INC.
- Byeong Cheol LEE
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY DEVICE INCLUDING WORDLINE LEAKAGE CURRENT DETECT...
- Publication number 20250124995
- Publication date Apr 17, 2025
- Samsung Electronics Co., Ltd.
- Buil Nam
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICES RELATED TO GENERATION OF INTERNAL COMMMANDS
- Publication number 20250124999
- Publication date Apr 17, 2025
- SK HYNIX INC.
- Hyun Seung KIM
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING CIRCUIT FOR A MEMORY DEVICE
- Publication number 20250118385
- Publication date Apr 10, 2025
- Micron Technology, Inc.
- Chunqiang Weng
- G11 - INFORMATION STORAGE

Built-in arrangements for testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electronic device for adjusting driving voltage of volatile memory...

Hybrid memory system with increased bandwidth

Scheme to fetch optimal read parameters by skipping invalid wordlines

Data integrity checks based on voltage distribution metrics

Controlling memory including managing a correction value table

Link evaluation for a memory device

Electronic devices related to compensation of monitoring signals

Electronic fuse device and operation method thereof

Digital verify failbit count (VFC) circuit

Memory device including sense amplifying circuit

Memory device and operating method of the memory device

Reconfigurable MBIST method based on adaptive march algorithm

System and method for testing memory device

In-situ detection of anomalies in integrated circuits using machine...

Volatile memory devices and methods of operating same to improve re...

Configurable testing and repair system for non-volatile memory

Interactive DRAM signal analyzer and method of analyzing and calibr...

Semiconductor memory devices that support enhanced data recovery op...

Configurable scan chain architecture for multi-port memory

Memory system including a sub-controller and operating method of th...

System and method for testing a non-volatile memory

Adjusting memory power consumption

Memory device, memory device test method, and test system

Memory interface and semiconductor memory device and semiconductor...

Non-volatile memory with layout adaptive problematic word line dete...

Built-in self-test burst patterns based on architecture of memory

Test circuit and receiving circuit having test function

Test circuit for detecting word line defect and semiconductor appar...

Bit retiring to mitigate bit errors

Component die validation built-in self-test (VBIST) engine

Patents Applicationslast 30 patents

MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE

DIE-LEVEL BLOCK FAMILY ERROR AVOIDANCE

SYSTEM AND METHOD FOR TESTING MEMORY DEVICE

MEMORY SYSTEM

SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF

MEMORY, MEMORY SYSTEM, PROGRAM METHOD OF MEMORY, AND ELECTRONIC APP...

METHOD, DEVICE, AND CIRCUIT FOR HIGH-SPEED MEMORIES

BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE INCLUDING BUILT-IN-SELF-TES...

SOLID STATE STORAGE DEVICE AND PATROL READ METHOD USING WORD LINE G...

STORAGE DEVICE

MEMORY

CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...

MEMORY REPAIR CIRCUIT, A MEMORY REPAIR METHOD, AND A MEMORY DEVICE

LASER DETECTING CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME

ACTIVATION FUNCTIONS FOR ARTIFICIAL INTELLIGENCE OPERATIONS

INTERACTIVE DRAM SIGNAL ANALYZER AND METHOD OF ANALYZING AND CALIBR...

STORAGE DEVICE AND OPERATING METHOD THEREOF

TEST MODE STATE MACHINE FOR A MEMORY DEVICE

MEMORY DEVICE HAVING CELL OVER PERIPHERY STRUCTURE AND SEMICONDUCTO...

SEMICONDUCTOR SYSTEM FOR DETECTING FAIL LOCATION

SCHEME TO FETCH OPTIMAL READ PARAMETERS BY SKIPPING INVALID WORDLINES

METHOD FOR ISOLATING FAULTY NAND TEMPERATURE SENSOR

STORING MEMORY ARRAY OPERATIONAL INFORMATION IN NON-VOLATILE SUBARRAYS

MEMORY TESTING SYSTEM AND MEMORY TESTING METHOD

EXTENDING FUNCTIONALITY OF MEMORY CONTROLLERS USING A LOOPBACK MODE...

SEMICONDUCTOR MEMORY DEVICE AND TEST METHOD THEREOF

SEMICONDUCTOR DEVICE FOR CONTROLLING OPERATING POWER SUPPLIED TO WO...

NONVOLATILE MEMORY DEVICE INCLUDING WORDLINE LEAKAGE CURRENT DETECT...

SEMICONDUCTOR DEVICES RELATED TO GENERATION OF INTERNAL COMMMANDS

TESTING CIRCUIT FOR A MEMORY DEVICE