Built-In-Current test [BIC]

Industry

CPC
G01R31/3012

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/3012Built-In-Current test [BIC]

Industries

Patents Grantslast 30 patents

Information Patent Grant
Sensor integrated circuit load current monitoring circuitry and ass...
- Patent number 11,428,731
- Issue date Aug 30, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Glenn A. Forrest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor integrated circuit load current monitoring circuitry and ass...
- Patent number 10,948,537
- Issue date Mar 16, 2021
- ALLEGRO MICROSYSTEMS, LLC
- Glenn A. Forrest
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method using programmable reliability aging timer
- Patent number 10,145,891
- Issue date Dec 4, 2018
- Samsung Electronics Co., Ltd.
- Yong-sang Cho
- G01 - MEASURING TESTING
Information Patent Grant
Scan circuitry with IDDQ verification
- Patent number 10,139,448
- Issue date Nov 27, 2018
- NXP USA, INC.
- John M. Pigott
- G01 - MEASURING TESTING
Information Patent Grant
Measuring power consumption in an integrated circuit
- Patent number 9,709,625
- Issue date Jul 18, 2017
- International Business Machines Corporation
- Martin Eckert
- G01 - MEASURING TESTING
Information Patent Grant
Fault detection device, electrical instrument and fault detection m...
- Patent number 9,389,262
- Issue date Jul 12, 2016
- Samsung Electronics Co., Ltd.
- Se Jin Jo
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of testing the same
- Patent number 8,513,970
- Issue date Aug 20, 2013
- NEC Corporation
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Grant
Leak current detection circuit, body bias control circuit, semicond...
- Patent number 8,174,282
- Issue date May 8, 2012
- Fujitsu Semiconductor Limited
- Kiyonaga Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method for inspecting the same
- Patent number 7,948,728
- Issue date May 24, 2011
- Panasonic Corporation
- Shinichiro Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
AC testing of leakage current in integrated circuits using RC time...
- Patent number 7,348,790
- Issue date Mar 25, 2008
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for IDDQ measurement in system on a chip (SOC) de...
- Patent number 7,282,905
- Issue date Oct 16, 2007
- Texas Instruments Incorporated
- Wei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Current mirror multi-channel leakage current monitor circuit and me...
- Patent number 7,250,783
- Issue date Jul 31, 2007
- Intel Corporation
- Steven K. Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device with test circuit disconnected from power supp...
- Patent number 7,248,067
- Issue date Jul 24, 2007
- Infineon Technologies AG
- Peter Poechmueller
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for adding parametric test capability to digital...
- Patent number 7,159,159
- Issue date Jan 2, 2007
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic register with IDDQ testing capability
- Patent number 7,129,697
- Issue date Oct 31, 2006
- Broadcom Corporation
- Mehdi Hatamian
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for locating IDDQ defects using multiple controlled collapse...
- Patent number 7,064,570
- Issue date Jun 20, 2006
- International Business Machines, Corporation
- Patrick H. Buffet
- G01 - MEASURING TESTING
Information Patent Grant
AC testing of leakage current in integrated circuits using RC time...
- Patent number 6,967,496
- Issue date Nov 22, 2005
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Grant
IDDQ testing of CMOS mixed-signal integrated circuits
- Patent number 6,930,500
- Issue date Aug 16, 2005
- Board of Supervisors of Louisiana State University and Agricultural and Mecha...
- Ashok Srivastava
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic register with IDDQ testing capability
- Patent number 6,927,565
- Issue date Aug 9, 2005
- Broadcom Corporation
- Mehdi Hatamian
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for detecting quiescent current in an integrated...
- Patent number 6,891,389
- Issue date May 10, 2005
- The Texas A&M University System
- Duncan M. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Measuring current on a die
- Patent number 6,879,178
- Issue date Apr 12, 2005
- Hewlett-Packard Development Company, L.P.
- Isaac Kantorovich
- G01 - MEASURING TESTING
Information Patent Grant
Method and program product for designing hierarchical circuit for q...
- Patent number 6,868,532
- Issue date Mar 15, 2005
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Grant
Current mirror based multi-channel leakage current monitor circuit...
- Patent number 6,844,750
- Issue date Jan 18, 2005
- Intel Corporation
- Steven K. Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
AC testing of leakage current in integrated circuits using RC time...
- Patent number 6,777,970
- Issue date Aug 17, 2004
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic register with IDDQ testing capability
- Patent number 6,737,859
- Issue date May 18, 2004
- Broadcom Corporation
- Mehdi Hatamian
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for locating IDDQ defects using multiple controlled collapse...
- Patent number 6,677,774
- Issue date Jan 13, 2004
- International Business Machines Corporation
- Patrick H. Buffet
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic register with IDDQ testing capability
- Patent number 6,563,333
- Issue date May 13, 2003
- Broadcom Corporation
- Mehdi Hatamian
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dynamic register with IDDQ testing capability
- Patent number 6,411,117
- Issue date Jun 25, 2002
- Broadcom Corporation
- Mehdi Hatamian
- G01 - MEASURING TESTING
Information Patent Grant
IDDQ test solution for large asics
- Patent number 6,212,655
- Issue date Apr 3, 2001
- LSI Logic Corporation
- Venkat C. Ghanta
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for use in IDDQ integrated circuit testing
- Patent number 6,144,214
- Issue date Nov 7, 2000
- University of South Florida
- Stephan P. Athan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR INTEGRATED CIRCUIT LOAD CURRENT MONITORING CIRCUITRY AND ASS...
- Publication number 20210165038
- Publication date Jun 3, 2021
- ALLEGRO MICROSYSTEMS, LLC
- Glenn A. Forrest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR INTEGRATED CIRCUIT LOAD CURRENT MONITORING CIRCUITRY AND ASS...
- Publication number 20200233028
- Publication date Jul 23, 2020
- ALLEGRO MICROSYSTEMS, LLC
- Glenn A. Forrest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAULT DETECTION DEVICE, ELECTRICAL INSTRUMENT AND FAULT DETECTION M...
- Publication number 20120223719
- Publication date Sep 6, 2012
- Samsung Electronics Co., Ltd.
- Se Jin JO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME
- Publication number 20110260747
- Publication date Oct 27, 2011
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Application
LEAK CURRENT DETECTION CIRCUIT, BODY BIAS CONTROL CIRCUIT, SEMICOND...
- Publication number 20100026335
- Publication date Feb 4, 2010
- Fujitsu Microelectronics Limited
- Kiyonaga Fujii
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Determining Variations in Voltages Applied...
- Publication number 20080249727
- Publication date Oct 9, 2008
- Satoru Takase
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR INSPECTING THE SAME
- Publication number 20080239605
- Publication date Oct 2, 2008
- Matsushita Electric Industrial Co., Ltd.
- Shinichiro KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
System and method for IDDQ measurement in system on a chip (SOC) de...
- Publication number 20060125470
- Publication date Jun 15, 2006
- Wei Chen
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device with test circuit disconnected from power supp...
- Publication number 20060061378
- Publication date Mar 23, 2006
- Peter Poechmueller
- G01 - MEASURING TESTING
Information Patent Application
AC testing of leakage current in integrated circuits using RC time...
- Publication number 20060033522
- Publication date Feb 16, 2006
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Application
Dynamic register with IDDQ testing capability
- Publication number 20060028199
- Publication date Feb 9, 2006
- Mehdi Hatamian
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Current mirror multi-channel leakage current monitor circuit and me...
- Publication number 20050104612
- Publication date May 19, 2005
- Intel Corporation
- Steven K. Hsu
- G01 - MEASURING TESTING
Information Patent Application
IDDQ testing of CMOS mixed-signal integrated circuits
- Publication number 20050024075
- Publication date Feb 3, 2005
- Ashok Srivastava
- G01 - MEASURING TESTING
Information Patent Application
Dynamic register with IDDQ testing capability
- Publication number 20050007097
- Publication date Jan 13, 2005
- Mehdi Hatamian
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
AC testing of leakage current in integrated circuits using RC time...
- Publication number 20040246017
- Publication date Dec 9, 2004
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Application
Current mirror based multi-channel leakage current monitor circuit...
- Publication number 20040189337
- Publication date Sep 30, 2004
- Steven K. Hsu
- G01 - MEASURING TESTING
Information Patent Application
Method for locating IDDQ defects using multiple controlled collapse...
- Publication number 20040061519
- Publication date Apr 1, 2004
- Patrick H. Buffet
- G01 - MEASURING TESTING
Information Patent Application
Dynamic register with IDDQ testing capability
- Publication number 20040008050
- Publication date Jan 15, 2004
- Mehdi Hatamian
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Circuit and method for adding parametric test capability to digital...
- Publication number 20030208708
- Publication date Nov 6, 2003
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Application
Method and program product for designing hierarchical circuit for q...
- Publication number 20030110457
- Publication date Jun 12, 2003
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for efficient self-test of voltage and current...
- Publication number 20030018937
- Publication date Jan 23, 2003
- Atul S. Athavale
- G01 - MEASURING TESTING
Information Patent Application
Method for locating IDDQ defects using multiple controlled collapse...
- Publication number 20020196042
- Publication date Dec 26, 2002
- Patrick H. Buffet
- G01 - MEASURING TESTING
Information Patent Application
Dynamic register with IDDQ testing capability
- Publication number 20020163353
- Publication date Nov 7, 2002
- Mehdi Hatamian
- G01 - MEASURING TESTING
Information Patent Application
AC testing of leakage current
- Publication number 20020153914
- Publication date Oct 24, 2002
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING

Built-In-Current test [BIC]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sensor integrated circuit load current monitoring circuitry and ass...

Sensor integrated circuit load current monitoring circuitry and ass...

Apparatus and method using programmable reliability aging timer

Scan circuitry with IDDQ verification

Measuring power consumption in an integrated circuit

Fault detection device, electrical instrument and fault detection m...

Semiconductor device and method of testing the same

Leak current detection circuit, body bias control circuit, semicond...

Semiconductor device and method for inspecting the same

AC testing of leakage current in integrated circuits using RC time...

System and method for IDDQ measurement in system on a chip (SOC) de...

Current mirror multi-channel leakage current monitor circuit and me...

Semiconductor device with test circuit disconnected from power supp...

Circuit and method for adding parametric test capability to digital...

Dynamic register with IDDQ testing capability

Method for locating IDDQ defects using multiple controlled collapse...

AC testing of leakage current in integrated circuits using RC time...

IDDQ testing of CMOS mixed-signal integrated circuits

Dynamic register with IDDQ testing capability

System and method for detecting quiescent current in an integrated...

Measuring current on a die

Method and program product for designing hierarchical circuit for q...

Current mirror based multi-channel leakage current monitor circuit...

AC testing of leakage current in integrated circuits using RC time...

Dynamic register with IDDQ testing capability

Method for locating IDDQ defects using multiple controlled collapse...

Dynamic register with IDDQ testing capability

Dynamic register with IDDQ testing capability

IDDQ test solution for large asics

Method and apparatus for use in IDDQ integrated circuit testing

Patents Applicationslast 30 patents

SENSOR INTEGRATED CIRCUIT LOAD CURRENT MONITORING CIRCUITRY AND ASS...

SENSOR INTEGRATED CIRCUIT LOAD CURRENT MONITORING CIRCUITRY AND ASS...

FAULT DETECTION DEVICE, ELECTRICAL INSTRUMENT AND FAULT DETECTION M...

SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME

LEAK CURRENT DETECTION CIRCUIT, BODY BIAS CONTROL CIRCUIT, SEMICOND...

Systems and Methods for Determining Variations in Voltages Applied...

SEMICONDUCTOR DEVICE AND METHOD FOR INSPECTING THE SAME

System and method for IDDQ measurement in system on a chip (SOC) de...

Semiconductor device with test circuit disconnected from power supp...

AC testing of leakage current in integrated circuits using RC time...

Dynamic register with IDDQ testing capability

Current mirror multi-channel leakage current monitor circuit and me...

IDDQ testing of CMOS mixed-signal integrated circuits

Dynamic register with IDDQ testing capability

AC testing of leakage current in integrated circuits using RC time...

Current mirror based multi-channel leakage current monitor circuit...

Method for locating IDDQ defects using multiple controlled collapse...

Dynamic register with IDDQ testing capability

Circuit and method for adding parametric test capability to digital...

Method and program product for designing hierarchical circuit for q...

Method and apparatus for efficient self-test of voltage and current...

Method for locating IDDQ defects using multiple controlled collapse...

Dynamic register with IDDQ testing capability

AC testing of leakage current