by alteration of electrical resistance

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CPC
G01P15/12

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GPHYSICS G01Measuring instruments G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT G01P15/00Measuring acceleration Measuring deceleration Measuring shock

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G01P15/12by alteration of electrical resistance

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Acceleration sensor and method of making the same
- Patent number 12,366,587
- Issue date Jul 22, 2025
- Chongqing University
- Xiaoping Zhou
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Dual-operating accelerometer
- Patent number 12,345,732
- Issue date Jul 1, 2025
- STMicroelectronics S.r.l.
- Francesco Rizzini
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Capacitive microelectromechanical device and method for forming a c...
- Patent number 12,332,271
- Issue date Jun 17, 2025
- Infineon Technologies AG
- Thoralf Kautzsch
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Channel for decreasing damping asymmetry
- Patent number 12,312,235
- Issue date May 27, 2025
- Murata Manufacturing Co., Ltd.
- Akira Konno
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Ultra-low power readout circuit with high-voltage bias generation f...
- Patent number 12,287,352
- Issue date Apr 29, 2025
- The Regents of the University of Michigan
- Yimai Peng
- G01 - MEASURING TESTING
Information Patent Grant
Inertial sensor and inertial measurement unit
- Patent number 12,276,675
- Issue date Apr 15, 2025
- Seiko Epson Corporation
- Shota Kigure
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and electronic device
- Patent number 12,264,916
- Issue date Apr 1, 2025
- Kabushiki Kaisha Toshiba
- Ryunosuke Gando
- G01 - MEASURING TESTING
Information Patent Grant
Acceleration sensing device
- Patent number 12,259,402
- Issue date Mar 25, 2025
- SHENZHEN SHOKZ CO., LTD.
- Wenbing Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor and inertial measurement unit
- Patent number 12,216,137
- Issue date Feb 4, 2025
- Seiko Epson Corporation
- Satoru Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical component, in particular, inertial sensor, includin...
- Patent number 12,210,033
- Issue date Jan 28, 2025
- Robert Bosch GmbH
- Johannes Classen
- G01 - MEASURING TESTING
Information Patent Grant
Accelerometer including protective housing
- Patent number 12,210,034
- Issue date Jan 28, 2025
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing device, inertial sensor, signal processing method...
- Patent number 12,203,955
- Issue date Jan 21, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Keisuke Kuroda
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical component for a pressure and inertial sensor device
- Patent number 12,181,356
- Issue date Dec 31, 2024
- Robert Bosch GmbH
- Lars Tebje
- G01 - MEASURING TESTING
Information Patent Grant
MEMS sensor with compensation of residual voltage
- Patent number 12,174,215
- Issue date Dec 24, 2024
- Invensense, Inc.
- Giacomo Gafforelli
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Circuit for operating a capacitive sensor and associated sensor device
- Patent number 12,163,812
- Issue date Dec 10, 2024
- Robert Bosch GmbH
- Alice Lanniel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sensor module, measurement system, and vehicle
- Patent number 12,153,066
- Issue date Nov 26, 2024
- Seiko Epson Corporation
- Taketo Chino
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical inertial sensor
- Patent number 12,153,063
- Issue date Nov 26, 2024
- Robert Bosch GmbH
- Klaus Petzold
- G01 - MEASURING TESTING
Information Patent Grant
3-axis angular accelerometer
- Patent number 12,153,065
- Issue date Nov 26, 2024
- Analog Devices, Inc.
- Xin Zhang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Physical quantity sensor, physical quantity sensor device, and iner...
- Patent number 12,153,064
- Issue date Nov 26, 2024
- Seiko Epson Corporation
- Satoru Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Low-noise multi-axis accelerometers and related methods
- Patent number 12,146,893
- Issue date Nov 19, 2024
- Analog Devices, Inc.
- Xin Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical sensor device with improved stability to stress
- Patent number 12,139,396
- Issue date Nov 12, 2024
- STMicroelectronics S.r.l.
- Francesco Rizzini
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mems device, electronic apparatus, and vehicle
- Patent number 12,130,303
- Issue date Oct 29, 2024
- Seiko Epson Corporation
- Fumiya Ito
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mems inertial sensor with high resistance to stiction
- Patent number 12,117,464
- Issue date Oct 15, 2024
- STMicroelectronics S.r.l.
- Gabriele Gattere
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Sensor device
- Patent number 12,117,466
- Issue date Oct 15, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Hideki Ueda
- G01 - MEASURING TESTING
Information Patent Grant
MEMS-based rotation sensor for seismic applications and sensor unit...
- Patent number 12,111,434
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Maxime Projetti
- G01 - MEASURING TESTING
Information Patent Grant
Accelerometer having an over travel stop with a stop gap less than...
- Patent number 12,105,114
- Issue date Oct 1, 2024
- NXP USA, INC.
- Aaron A. Geisberger
- G01 - MEASURING TESTING
Information Patent Grant
Sensing an ICMFB output to detect functional state of a mems sensor
- Patent number 12,092,653
- Issue date Sep 17, 2024
- STMicroelectronics, Inc.
- Davy Choi
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical sensor device and corresponding production method
- Patent number 12,077,429
- Issue date Sep 3, 2024
- Robert Bosch GmbH
- Lars Tebje
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Suspension for a mems vibration sensor
- Patent number 12,072,350
- Issue date Aug 27, 2024
- Knowles Electronics, LLC
- Faisal Zaman
- G01 - MEASURING TESTING
Information Patent Grant
Method for lithography process
- Patent number 12,066,756
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chi-Hung Liao
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
ACCELERATION SENSOR
- Publication number 20250230034
- Publication date Jul 17, 2025
- AAC Kaitai Technologies (Wuhan) CO., LTD
- Shitao Yan
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ACCELERATION SENSOR
- Publication number 20250231214
- Publication date Jul 17, 2025
- AAC Kaitai Technologies (Wuhan) CO., LTD
- Shitao Yan
- G01 - MEASURING TESTING
Information Patent Application
Inertial Sensor, Electronic Component, And Method Of Manufacturing...
- Publication number 20250231215
- Publication date Jul 17, 2025
- SEIKO EPSON CORPORATION
- Teruo TAKIZAWA
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATION SENSOR
- Publication number 20250231217
- Publication date Jul 17, 2025
- AAC Kaitai Technologies (Wuhan) CO., LTD
- Lingcheng Kong
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER DEVICE AND METHOD FOR EXAMINING A CAPACITIVE SENSOR
- Publication number 20250224421
- Publication date Jul 10, 2025
- ROBERT BOSCH GmbH
- Juergen Mueller
- G01 - MEASURING TESTING
Information Patent Application
MEMS ACCELEROMETER HAVING A HIGH MECHANICAL ROBUSTNESS
- Publication number 20250223152
- Publication date Jul 10, 2025
- STMicroelectronics International N.V.
- Francesco RIZZINI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MULTISENSOR MEMS INERTIAL SENSOR GUIDANCE FOR AUTOMATIC VEHICLES
- Publication number 20250224729
- Publication date Jul 10, 2025
- MEI Micro, Inc.
- Robert Mark Boysel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INERTIAL MEMS DEVICE COMPRISING MEMS ACCELEROMETERS HAVING DIFFEREN...
- Publication number 20250224422
- Publication date Jul 10, 2025
- STMicroelectronics International N.V.
- Nicolo' MANCA
- G01 - MEASURING TESTING
Information Patent Application
MEDICAL IMAGING SYSTEM, AND VIBRATION DETECTION METHOD AND VIBRATIO...
- Publication number 20250216412
- Publication date Jul 3, 2025
- GE Precision Healthcare LLC
- Kehao Zhang
- G01 - MEASURING TESTING
Information Patent Application
ANTI-STICTION ELECTRODES
- Publication number 20250197193
- Publication date Jun 19, 2025
- InvenSense, Inc.
- Roberto Martini
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS INERTIAL SENSOR WITH HIGH RESISTANCE TO STICTION
- Publication number 20250180597
- Publication date Jun 5, 2025
- STMicroelectronics S.r.l.
- Gabriele GATTERE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Physical Quantity Sensor And Inertial Measurement Unit
- Publication number 20250180598
- Publication date Jun 5, 2025
- SEIKO EPSON CORPORATION
- Satoru TANAKA
- G01 - MEASURING TESTING
Information Patent Application
ACCELEROMETER INCLUDING SINGLE MAGNET
- Publication number 20250172584
- Publication date May 29, 2025
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Application
MEMS TRI-AXIAL ACCELEROMETER WITH ONE OR MORE DECOUPLING ELEMENTS
- Publication number 20250155469
- Publication date May 15, 2025
- STMicroelectronics S.r.l.
- Alessandro TOCCHIO
- G01 - MEASURING TESTING
Information Patent Application
COMB STRUCTURE FOR MEMS ACCELEROMETER
- Publication number 20250138044
- Publication date May 1, 2025
- Matti LIUKKU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SERVO-TYPE VIBRATION DETECTOR AND EVALUATION METHOD FOR SERVO-TYPE...
- Publication number 20250130098
- Publication date Apr 24, 2025
- TOKKYOKIKI CORPORATION
- Teruo MARUYAMA
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR OPERATING A CAPACITIVE SENSOR AND SENSOR APPARATUS
- Publication number 20250130260
- Publication date Apr 24, 2025
- ROBERT BOSCH GmbH
- Alice Lanniel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROELECTROMECHANICAL DEVICE WITH RECOVERY FROM STICTION CONDITIONS
- Publication number 20250042718
- Publication date Feb 6, 2025
- STMicroelectronics International N.V.
- Manuel RIANI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Physical Quantity Sensor, Inertial Measurement Unit, And Electronic...
- Publication number 20250035667
- Publication date Jan 30, 2025
- SEIKO EPSON CORPORATION
- Tomokazu UMENO
- G01 - MEASURING TESTING
Information Patent Application
MICROMECHANICAL INERTIAL SENSOR, AND METHOD FOR OPERATING A MICROME...
- Publication number 20250033952
- Publication date Jan 30, 2025
- ROBERT BOSCH GmbH
- Daniel Baumgaertner
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INERTIAL SENSOR AND METHOD FOR FORMING THE SAME
- Publication number 20250026630
- Publication date Jan 23, 2025
- AAC TECHNOLOGIES PTE. LTD
- Veronica Tan
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Physical Quantity Sensor, Physical Quantity Sensor Device, And Iner...
- Publication number 20250027971
- Publication date Jan 23, 2025
- SEIKO EPSON CORPORATION
- Satoru TANAKA
- G01 - MEASURING TESTING
Information Patent Application
Sensor Module, Measurement System, And Vehicle
- Publication number 20250020686
- Publication date Jan 16, 2025
- SEIKO EPSON CORPORATION
- Taketo CHINO
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE AND METHOD FOR PRODUCING MEMS DEVICE
- Publication number 20250019226
- Publication date Jan 16, 2025
- Rohm Co., Ltd.
- Toma FUJITA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS DEVICE
- Publication number 20250019225
- Publication date Jan 16, 2025
- Rohm Co., Ltd.
- Daisuke Nishinohara
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS Device, Electronic Apparatus, And Vehicle
- Publication number 20250012829
- Publication date Jan 9, 2025
- SEIKO EPSON CORPORATION
- Fumiya ITO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ACCELERATION SENSOR
- Publication number 20250011159
- Publication date Jan 9, 2025
- Rohm Co., Ltd.
- Martin Wilfried HELLER
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
COMPOSITE SENSOR
- Publication number 20250003750
- Publication date Jan 2, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Kazufumi NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
MEMS STRAIN SENSITIVITY CALIBRATION
- Publication number 20240426867
- Publication date Dec 26, 2024
- InvenSense, Inc.
- Matthew Julian Thompson
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL MEMS DEVICE INTEGRATING A WAKE-UP ELEMENT, INERTIAL MEMS S...
- Publication number 20240425352
- Publication date Dec 26, 2024
- STMicroelectronics International N.V.
- Luca SEGHIZZI
- B81 - MICRO-STRUCTURAL TECHNOLOGY

by alteration of electrical resistance

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Acceleration sensor and method of making the same

Dual-operating accelerometer

Capacitive microelectromechanical device and method for forming a c...

Channel for decreasing damping asymmetry

Ultra-low power readout circuit with high-voltage bias generation f...

Inertial sensor and inertial measurement unit

Sensor and electronic device

Acceleration sensing device

Physical quantity sensor and inertial measurement unit

Micromechanical component, in particular, inertial sensor, includin...

Accelerometer including protective housing

Signal processing device, inertial sensor, signal processing method...

Micromechanical component for a pressure and inertial sensor device

MEMS sensor with compensation of residual voltage

Circuit for operating a capacitive sensor and associated sensor device

Sensor module, measurement system, and vehicle

Micromechanical inertial sensor

3-axis angular accelerometer

Physical quantity sensor, physical quantity sensor device, and iner...

Low-noise multi-axis accelerometers and related methods

Microelectromechanical sensor device with improved stability to stress

Mems device, electronic apparatus, and vehicle

Mems inertial sensor with high resistance to stiction

Sensor device

MEMS-based rotation sensor for seismic applications and sensor unit...

Accelerometer having an over travel stop with a stop gap less than...

Sensing an ICMFB output to detect functional state of a mems sensor

Micromechanical sensor device and corresponding production method

Suspension for a mems vibration sensor

Method for lithography process

Patents Applicationslast 30 patents

ACCELERATION SENSOR

ACCELERATION SENSOR

Inertial Sensor, Electronic Component, And Method Of Manufacturing...

ACCELERATION SENSOR

COMPUTER DEVICE AND METHOD FOR EXAMINING A CAPACITIVE SENSOR

MEMS ACCELEROMETER HAVING A HIGH MECHANICAL ROBUSTNESS

MULTISENSOR MEMS INERTIAL SENSOR GUIDANCE FOR AUTOMATIC VEHICLES

INERTIAL MEMS DEVICE COMPRISING MEMS ACCELEROMETERS HAVING DIFFEREN...

MEDICAL IMAGING SYSTEM, AND VIBRATION DETECTION METHOD AND VIBRATIO...

ANTI-STICTION ELECTRODES

MEMS INERTIAL SENSOR WITH HIGH RESISTANCE TO STICTION

Physical Quantity Sensor And Inertial Measurement Unit

ACCELEROMETER INCLUDING SINGLE MAGNET

MEMS TRI-AXIAL ACCELEROMETER WITH ONE OR MORE DECOUPLING ELEMENTS

COMB STRUCTURE FOR MEMS ACCELEROMETER

SERVO-TYPE VIBRATION DETECTOR AND EVALUATION METHOD FOR SERVO-TYPE...

CIRCUIT FOR OPERATING A CAPACITIVE SENSOR AND SENSOR APPARATUS

MICROELECTROMECHANICAL DEVICE WITH RECOVERY FROM STICTION CONDITIONS

Physical Quantity Sensor, Inertial Measurement Unit, And Electronic...

MICROMECHANICAL INERTIAL SENSOR, AND METHOD FOR OPERATING A MICROME...

INERTIAL SENSOR AND METHOD FOR FORMING THE SAME

Physical Quantity Sensor, Physical Quantity Sensor Device, And Iner...

Sensor Module, Measurement System, And Vehicle

MEMS DEVICE AND METHOD FOR PRODUCING MEMS DEVICE

MEMS DEVICE

MEMS Device, Electronic Apparatus, And Vehicle

ACCELERATION SENSOR

COMPOSITE SENSOR

MEMS STRAIN SENSITIVITY CALIBRATION

INERTIAL MEMS DEVICE INTEGRATING A WAKE-UP ELEMENT, INERTIAL MEMS S...