by delay means

Industry

CPC
G01R23/175

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R23/00Arrangements for measuring frequencies Arrangements for analysing frequency spectra

Current Industry

G01R23/175by delay means

Industries

Patents Grantslast 30 patents

Information Patent Grant
Adjusting DFT coefficients to compensate for frequency offset durin...
- Patent number 11,638,116
- Issue date Apr 25, 2023
- Silicon Laboratories Inc.
- Wentao Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for wideband spectral estimation using joint spac...
- Patent number 11,630,139
- Issue date Apr 18, 2023
- Raytheon Company
- James M. Bowden
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating a setup
- Patent number 11,428,770
- Issue date Aug 30, 2022
- Rohde & Schwarz GmbH & Co. KG
- Jan-Patrick Schultheis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal processing method and material testing machine
- Patent number 11,092,630
- Issue date Aug 17, 2021
- Shimadzu Corporation
- Tohru Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Multi-signal instantaneous frequency measurement system
- Patent number 10,848,191
- Issue date Nov 24, 2020
- Rohde & Schwarz GmbH & Co. KG
- Andres Espana Fresno
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for providing flexible reserve power for power grid
- Patent number 10,613,492
- Issue date Apr 7, 2020
- General Electric Company
- Chaitanya Ashok Baone
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for performing real-time spectral analysis of non...
- Patent number 10,371,732
- Issue date Aug 6, 2019
- Keysight Technologies, Inc.
- Adnan Al-Adnani
- G01 - MEASURING TESTING
Information Patent Grant
Group delay based averaging
- Patent number 10,345,339
- Issue date Jul 9, 2019
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Grant
Group delay measurement apparatus and method
- Patent number 9,933,467
- Issue date Apr 3, 2018
- Guzik Technical Enterprises
- Anatoli B. Stein
- G01 - MEASURING TESTING
Information Patent Grant
Frequency measuring broadband digital receiver
- Patent number 8,116,709
- Issue date Feb 14, 2012
- Thales
- Thierry Briand
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic delay line frequency discriminator
- Patent number 7,176,447
- Issue date Feb 13, 2007
- Agilent Technologies, Inc.
- Richard K Karlquist
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for signal analysis
- Patent number 6,745,155
- Issue date Jun 1, 2004
- Huq Speech Technologies B.V.
- Tjeerd Catharinus Andringa
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Multiple simultaneous optical frequency measurement
- Patent number 6,509,729
- Issue date Jan 21, 2003
- The United States of America as represented by the Secretary of the Navy
- Hal L. Levitt
- G01 - MEASURING TESTING
Information Patent Grant
Programmable delay path circuit and operating point frequency detec...
- Patent number 6,272,439
- Issue date Aug 7, 2001
- VLSI Technology, Inc.
- Mark L. Buer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Continuous up/down spectrum scaling of signals
- Patent number 5,825,172
- Issue date Oct 20, 1998
- Gopalkrishna G. Nadkarni
- G01 - MEASURING TESTING
Information Patent Grant
Up/down spectrum scaling of signals
- Patent number 5,481,182
- Issue date Jan 2, 1996
- Gopalkrishna G. Nadkarni
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous signals IFM receiver using plural delay line correlators
- Patent number 5,440,228
- Issue date Aug 8, 1995
- Ralph O. Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid instantaneous frequency measurement compressive receiver app...
- Patent number 5,424,631
- Issue date Jun 13, 1995
- ITT Corporation
- Charles R. Ward
- G01 - MEASURING TESTING
Information Patent Grant
Feedback circuitry for recreating CW components from chirp-Z pulses
- Patent number 5,383,222
- Issue date Jan 17, 1995
- The United States of America as represented by the Secretary of the Army
- William, J. Skudera
- G01 - MEASURING TESTING
Information Patent Grant
Digital spectral normalizer
- Patent number 4,973,898
- Issue date Nov 27, 1990
- The United States of America as represented by the Secretary of the Navy
- Gerald L. Assard
- G01 - MEASURING TESTING
Information Patent Grant
Instantaneous frequency measurement (IFM) receiver with only two de...
- Patent number 4,963,816
- Issue date Oct 16, 1990
- The United States of America as represented by the Secretary of the Air Force
- James B. Y. Tsui
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer
- Patent number 4,896,102
- Issue date Jan 23, 1990
- Scientific-Atlanta, Inc.
- Carl E. DuBois
- G01 - MEASURING TESTING
Information Patent Grant
Wide band, complex microwave waveform receiver and analyzer, using...
- Patent number 4,866,441
- Issue date Sep 12, 1989
- Her Majesty the Queen in right of Canada, as represented by the Minister of N...
- Larry J. Conway
- G01 - MEASURING TESTING
Information Patent Grant
Passive interferometric imaging receiver system
- Patent number 4,794,395
- Issue date Dec 27, 1988
- Environmental Research Institute of Mich.
- Ivan Cindrich
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for simultaneous instantaneous signal frequenc...
- Patent number 4,791,360
- Issue date Dec 13, 1988
- Telemus Electronic Systems, Inc.
- Andre Gagnon
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous-delay correlator apparatus
- Patent number 4,783,640
- Issue date Nov 8, 1988
- Hughes Aircraft Company
- Samuel C. Reynolds
- G01 - MEASURING TESTING
Information Patent Grant
Magnetostatic wave delay line discriminator with automatic quadratu...
- Patent number 4,780,667
- Issue date Oct 25, 1988
- Hewlett-Packard Company
- Elias Reese
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer
- Patent number 4,777,433
- Issue date Oct 11, 1988
- Robert J. Steele
- G01 - MEASURING TESTING
Information Patent Grant
Compressive receiver having pulse width expansion
- Patent number 4,704,737
- Issue date Nov 3, 1987
- Hughes Aircraft Company
- Vaughn H. Estrick
- G01 - MEASURING TESTING
Information Patent Grant
Frequency determining and lock-on system
- Patent number 4,542,470
- Issue date Sep 17, 1985
- Spartanics, Ltd.
- William L. Mohan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ADJUSTING DFT COEFFICIENTS TO COMPENSATE FOR FREQUENCY OFFSET DURIN...
- Publication number 20220174453
- Publication date Jun 2, 2022
- Silicon Laboratories Inc.
- Wentao Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD OF CALIBRATING A SETUP
- Publication number 20210302526
- Publication date Sep 30, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Jan-Patrick Schultheis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL PROCESSING METHOD AND MATERIAL TESTING MACHINE
- Publication number 20190187195
- Publication date Jun 20, 2019
- Shimadzu Corporation
- Tohru MATSUURA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PROVIDING FLEXIBLE RESERVE POWER FOR POWER GRID
- Publication number 20190033801
- Publication date Jan 31, 2019
- GENERAL ELECTRIC COMPANY
- Chaitanya Ashok Baone
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING USEFUL SIGNALS, WITH RESPECTIVE NON...
- Publication number 20180120366
- Publication date May 3, 2018
- AIRBUS DEFENCE AND SPACE SAS
- MATHIEU PICARD
- G01 - MEASURING TESTING
Information Patent Application
GROUP DELAY MEASUREMENT APPARATUS AND METHOD
- Publication number 20180080965
- Publication date Mar 22, 2018
- Guzik Technical Enterprises
- Anatoli B. Stein
- G01 - MEASURING TESTING
Information Patent Application
Group Delay Based Averaging
- Publication number 20170168092
- Publication date Jun 15, 2017
- Tektronix, Inc.
- Kan TAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PERFORMING REAL-TIME SPECTRAL ANALYSIS OF NON...
- Publication number 20140122025
- Publication date May 1, 2014
- AGILENT TECHNOLOGIES, INC.
- Adnan Al-Adnani
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY MEASURING BROADBAND DIGITAL RECEIVER
- Publication number 20100069030
- Publication date Mar 18, 2010
- Thierry Briand
- G01 - MEASURING TESTING
Information Patent Application
Electro-optic delay line frequency discriminator
- Publication number 20060202110
- Publication date Sep 14, 2006
- Richard K. Karlquist
- G01 - MEASURING TESTING
Information Patent Application
Multiple simultaneous optical frequency measurement
- Publication number 20020121890
- Publication date Sep 5, 2002
- Hal L. Levitt
- G01 - MEASURING TESTING

by delay means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Adjusting DFT coefficients to compensate for frequency offset durin...

System and method for wideband spectral estimation using joint spac...

Method of calibrating a setup

Signal processing method and material testing machine

Multi-signal instantaneous frequency measurement system

Method and system for providing flexible reserve power for power grid

Method and system for performing real-time spectral analysis of non...

Group delay based averaging

Group delay measurement apparatus and method

Frequency measuring broadband digital receiver

Electro-optic delay line frequency discriminator

Methods and apparatuses for signal analysis

Multiple simultaneous optical frequency measurement

Programmable delay path circuit and operating point frequency detec...

Continuous up/down spectrum scaling of signals

Up/down spectrum scaling of signals

Simultaneous signals IFM receiver using plural delay line correlators

Hybrid instantaneous frequency measurement compressive receiver app...

Feedback circuitry for recreating CW components from chirp-Z pulses

Digital spectral normalizer

Instantaneous frequency measurement (IFM) receiver with only two de...

Spectrum analyzer

Wide band, complex microwave waveform receiver and analyzer, using...

Passive interferometric imaging receiver system

Method and apparatus for simultaneous instantaneous signal frequenc...

Simultaneous-delay correlator apparatus

Magnetostatic wave delay line discriminator with automatic quadratu...

Spectrum analyzer

Compressive receiver having pulse width expansion

Frequency determining and lock-on system

Patents Applicationslast 30 patents

ADJUSTING DFT COEFFICIENTS TO COMPENSATE FOR FREQUENCY OFFSET DURIN...

METHOD OF CALIBRATING A SETUP

SIGNAL PROCESSING METHOD AND MATERIAL TESTING MACHINE

METHOD AND SYSTEM FOR PROVIDING FLEXIBLE RESERVE POWER FOR POWER GRID

METHOD AND SYSTEM FOR DETECTING USEFUL SIGNALS, WITH RESPECTIVE NON...

GROUP DELAY MEASUREMENT APPARATUS AND METHOD

Group Delay Based Averaging

METHOD AND SYSTEM FOR PERFORMING REAL-TIME SPECTRAL ANALYSIS OF NON...

FREQUENCY MEASURING BROADBAND DIGITAL RECEIVER

Electro-optic delay line frequency discriminator

Multiple simultaneous optical frequency measurement