by holographic interferometry

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CPC
G01B11/164

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/164by holographic interferometry

Industries

Patents Grantslast 30 patents

Information Patent Grant
Holographic microscope
- Patent number 12,045,008
- Issue date Jul 23, 2024
- Seon Kyu Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Optical detection of vibrations
- Patent number 11,371,878
- Issue date Jun 28, 2022
- Elbit Systems Land and C4I Ltd.
- Ilya Leizerson
- G01 - MEASURING TESTING
Information Patent Grant
Methods for obtaining and analyzing digital interferometric data fo...
- Patent number 9,952,161
- Issue date Apr 24, 2018
- Attofemto, Inc.
- Paul L. Pfaff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple beam transmission interferometric testing methods for the...
- Patent number 9,250,064
- Issue date Feb 2, 2016
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Optically enhanced holographic interferometric testing methods for...
- Patent number 8,462,350
- Issue date Jun 11, 2013
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for using a two-wave mixing ultrasonic detecti...
- Patent number 7,667,851
- Issue date Feb 23, 2010
- Lockheed Martin Corporation
- Marc Dubois
- G01 - MEASURING TESTING
Information Patent Grant
Device for registration of optical holograms on the amorphous molec...
- Patent number 6,998,195
- Issue date Feb 14, 2006
- HoloTech as
- John Petter Fjeldstad
- G01 - MEASURING TESTING
Information Patent Grant
Device for registration of optical holograms on the amorphous molec...
- Patent number 6,998,197
- Issue date Feb 14, 2006
- HoloTech as
- John Petter Fjeldstad
- G01 - MEASURING TESTING
Information Patent Grant
Process and apparatus for recording the deformation of objects
- Patent number 6,924,888
- Issue date Aug 2, 2005
- Steinbichler Optotechnik GmbH
- Hans Steinbichler
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for non-destructive real-time measurements of res...
- Patent number 6,765,677
- Issue date Jul 20, 2004
- HoloTech as
- John Petter Fjeldstad
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for non-destructive inspection of objects by mean...
- Patent number 6,522,409
- Issue date Feb 18, 2003
- HoloTech as
- John Petter Fjeldstad
- G01 - MEASURING TESTING
Information Patent Grant
Remote measurement of near-surface physical properties using optica...
- Patent number 5,682,236
- Issue date Oct 28, 1997
- Metrolaser
- James Davis Trolinger
- G01 - MEASURING TESTING
Information Patent Grant
Holomoire strain analyzer
- Patent number 5,671,042
- Issue date Sep 23, 1997
- Illinois Institute of Technology
- Cesar A. Sciammarella
- G01 - MEASURING TESTING
Information Patent Grant
Method of creating holographic interferograms for structural examin...
- Patent number 5,519,486
- Issue date May 21, 1996
- Unisearch Limited
- John P. Baird
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for nondestructive testing of the mechanical b...
- Patent number 5,508,801
- Issue date Apr 16, 1996
- Kabushikigaisya Hutech
- Victor Y. Panin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the nondestructive testing of vessels made...
- Patent number 5,448,352
- Issue date Sep 5, 1995
- Societe Anonyme Aerospatiale Societe Nationale Industrielle
- Jacques Bouteyre
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Method and apparatus for nondestructive inspection utilizing phase...
- Patent number 5,410,406
- Issue date Apr 25, 1995
- Holographics Inc.
- John M. Webster
- G01 - MEASURING TESTING
Information Patent Grant
Shearing optical element for interferometric analysis system
- Patent number 5,341,204
- Issue date Aug 23, 1994
- Grant Engineering, Inc.
- Ralph M. Grant
- G01 - MEASURING TESTING
Information Patent Grant
Holographic inspection system with integral stress inducer
- Patent number 5,339,152
- Issue date Aug 16, 1994
- Grumman Aerospace Corporation
- Michael Horn
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining the stress and strain in pipes...
- Patent number 5,065,331
- Issue date Nov 12, 1991
- Reginald I. Vachon
- G01 - MEASURING TESTING
Information Patent Grant
Real-time halographic interferometry with a pulsed laser and flicke...
- Patent number 4,999,681
- Issue date Mar 12, 1991
- David L. Mader
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring the manufacture of a product
- Patent number 4,987,545
- Issue date Jan 22, 1991
- Ingegerd Dirtoft
- G01 - MEASURING TESTING
Information Patent Grant
Differential holography
- Patent number 4,725,142
- Issue date Feb 16, 1988
- University of Delaware
- Mark Sharnoff
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining stress and strain in pipes, pr...
- Patent number 4,591,996
- Issue date May 27, 1986
- Reginald I. Vachon
- G01 - MEASURING TESTING
Information Patent Grant
Differential holographic interferometry
- Patent number 4,464,052
- Issue date Aug 7, 1984
- Don B. Neumann
- G01 - MEASURING TESTING
Information Patent Grant
Optics module for borehole stress measuring instrument
- Patent number 3,992,095
- Issue date Nov 16, 1976
- TRW Systems & Energy
- Jerold L. Jacoby
- E21 - EARTH DRILLING MINING
Information Patent Grant
Holographic instrument for measuring stress in a borehole wall
- Patent number 3,960,448
- Issue date Jun 1, 1976
- TRW Inc.
- James L. Schmidt
- E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information Patent Grant
Method and apparatus for measuring linear thermal expansion of poly...
- Patent number 3,938,889
- Issue date Feb 17, 1976
- The United States of America as represented by the Secretary of the Air Force
- James A. McKinnis
- G01 - MEASURING TESTING
Information Patent Grant
3899921
- Patent number 3,899,921
- Issue date Aug 19, 1975
- G01 - MEASURING TESTING
Information Patent Grant
3816649
- Patent number 3,816,649
- Issue date Jun 11, 1974
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HOLOGRAPHIC MICROSCOPE
- Publication number 20240126206
- Publication date Apr 18, 2024
- KOREA PHOTONICS TECHNOLOGY INSTITUTE
- Seon Kyu YOON
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE
- Publication number 20190310085
- Publication date Oct 10, 2019
- Consiglio Nazionale delle Ricerche - CNR
- Massimiliano LOCATELLI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE
- Publication number 20180003499
- Publication date Jan 4, 2018
- Consiglio Nazionale delle Ricerche - CNR
- Massimiliano LOCATELLI
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE BEAM TRANSMISSION INTERFEROMETRIC TESTING METHODS FOR THE...
- Publication number 20160195479
- Publication date Jul 7, 2016
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE BEAM TRANSMISSION INTERFEROMETRIC TESTING METHODS FOR THE...
- Publication number 20150041657
- Publication date Feb 12, 2015
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE OPTICAL WAVELENGTH INTERFEROMETRIC TESTING METHODS FOR THE...
- Publication number 20130337585
- Publication date Dec 19, 2013
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY-BASED STRESS ANALYSIS
- Publication number 20130003152
- Publication date Jan 3, 2013
- United Technologies Corporation
- Igor V. Belousov
- G01 - MEASURING TESTING
Information Patent Application
OPTICALLY ENHANCED HOLOGRAPHIC INTERFEROMETRIC TESTING METHODS FOR...
- Publication number 20120127473
- Publication date May 24, 2012
- Attofemto, Inc.
- Paul L. Pfaff
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for using a two-wave mixing ultrasonic detecti...
- Publication number 20030020923
- Publication date Jan 30, 2003
- Lockheed Martin Corporation
- Marc Dubois
- G01 - MEASURING TESTING
Information Patent Application
Device for registration of optical holograms on the amorphous molec...
- Publication number 20020155355
- Publication date Oct 24, 2002
- HoloTech a.s
- John Petter Fjeldstad
- G01 - MEASURING TESTING
Information Patent Application
Process and apparatus for recording the deformation of objects
- Publication number 20020135751
- Publication date Sep 26, 2002
- Hans Steinbichler
- G01 - MEASURING TESTING

by holographic interferometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Holographic microscope

Optical detection of vibrations

Methods for obtaining and analyzing digital interferometric data fo...

Multiple beam transmission interferometric testing methods for the...

Optically enhanced holographic interferometric testing methods for...

Method and apparatus for using a two-wave mixing ultrasonic detecti...

Device for registration of optical holograms on the amorphous molec...

Device for registration of optical holograms on the amorphous molec...

Process and apparatus for recording the deformation of objects

Method and device for non-destructive real-time measurements of res...

Method and device for non-destructive inspection of objects by mean...

Remote measurement of near-surface physical properties using optica...

Holomoire strain analyzer

Method of creating holographic interferograms for structural examin...

Method and apparatus for nondestructive testing of the mechanical b...

Method and apparatus for the nondestructive testing of vessels made...

Method and apparatus for nondestructive inspection utilizing phase...

Shearing optical element for interferometric analysis system

Holographic inspection system with integral stress inducer

Apparatus and method for determining the stress and strain in pipes...

Real-time halographic interferometry with a pulsed laser and flicke...

Method for monitoring the manufacture of a product

Differential holography

Apparatus and method for determining stress and strain in pipes, pr...

Differential holographic interferometry

Optics module for borehole stress measuring instrument

Holographic instrument for measuring stress in a borehole wall

Method and apparatus for measuring linear thermal expansion of poly...

3899921

3816649

Patents Applicationslast 30 patents

HOLOGRAPHIC MICROSCOPE

METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE

METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE

MULTIPLE BEAM TRANSMISSION INTERFEROMETRIC TESTING METHODS FOR THE...

MULTIPLE BEAM TRANSMISSION INTERFEROMETRIC TESTING METHODS FOR THE...

MULTIPLE OPTICAL WAVELENGTH INTERFEROMETRIC TESTING METHODS FOR THE...

INTERFEROMETRY-BASED STRESS ANALYSIS

OPTICALLY ENHANCED HOLOGRAPHIC INTERFEROMETRIC TESTING METHODS FOR...

Method and apparatus for using a two-wave mixing ultrasonic detecti...

Device for registration of optical holograms on the amorphous molec...

Process and apparatus for recording the deformation of objects