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Measuring arrangements characterised by the use of optical means
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CPC
G01B11/00
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Current Industry
G01B11/00
Measuring arrangements characterised by the use of optical means
Sub Industries
G01B11/002
for measuring two or more coordinates
G01B11/005
coordinate measuring machines
G01B11/007
feeler heads therefor
G01B11/02
for measuring length, width or thickness
G01B11/022
by means of tv-camera scanning
G01B11/024
by means of diode-array scanning
G01B11/026
by measuring distance between sensor and object
G01B11/028
by measuring lateral position of a boundary of the object
G01B11/03
by measuring coordinates of points
G01B11/04
specially adapted for measuring length or width of objects while moving
G01B11/043
for measuring length
G01B11/046
for measuring width
G01B11/06
for measuring thickness
G01B11/0608
Height gauges
G01B11/0616
of coating
G01B11/0625
with measurement of absorption or reflection
G01B11/0633
using one or more discrete wavelengths
G01B11/0641
with measurement of polarization
G01B11/065
using one or more discrete wavelengths
G01B11/0658
with measurement of emissivity or reradiation
G01B11/0666
using an exciting beam and a detection beam including surface acoustic waves [SAW]
G01B11/0675
using interferometry
G01B11/0683
measurement during deposition or removal of the layer
G01B11/0691
of objects while moving
G01B11/08
for measuring diameters
G01B11/10
of objects while moving
G01B11/105
using photoelectric detection means
G01B11/12
internal diameters
G01B11/14
for measuring distance or clearance between spaced objects or spaced apertures
G01B11/16
for measuring the deformation in a solid
G01B11/161
by interferometric means
G01B11/162
by speckle- or shearing interferometry
G01B11/164
by holographic interferometry
G01B11/165
by means of a grating deformed by the object
G01B11/167
by projecting a pattern on the object
G01B11/168
by means of polarisation
G01B11/18
using photoelastic elements
G01B11/20
using brittle lacquer
G01B11/22
for measuring depth
G01B11/24
for measuring contours or curvatures
G01B11/2408
for measuring roundness
G01B11/2416
of gears
G01B11/2425
of screw-threads
G01B11/2433
for measuring outlines by shadow casting
G01B11/2441
using interferometry
G01B11/245
using a plurality of fixed, simultaneously operating transducers
G01B11/25
by projecting a pattern
G01B11/2504
Calibration devices
G01B11/2509
Color coding
G01B11/2513
with several lines being projected in more than one direction
G01B11/2518
Projection by scanning of the object
G01B11/2522
the position of the object changing and being recorded
G01B11/2527
with phase change by in-plane movement of the patern
G01B11/2531
using several gratings, projected with variable angle of incidence on the object, and one detection device
G01B11/2536
using several gratings with variable grating pitch, projected on the object with the same angle of incidence
G01B11/254
Projection of a pattern, viewing through a pattern
G01B11/2545
with one projection direction and several detection directions
G01B11/255
for measuring radius of curvature
G01B11/26
for measuring angles or tapers for testing the alignment of axes
G01B11/27
for testing the alignment of axes
G01B11/272
using photoelectric detection means
G01B11/275
for testing wheel alignment
G01B11/2755
using photoelectric detection means
G01B11/28
for measuring areas
G01B11/285
using photoelectric detection means
G01B11/30
for measuring roughness or irregularity of surfaces
G01B11/303
using photoelectric detection means
G01B11/306
for measuring evenness
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Patents Grants
last 30 patents
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Issue date
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G01 - MEASURING TESTING
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Optical assembly for parallelism measurement, optical apparatus inc...
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Issue date
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Issue date
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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G01 - MEASURING TESTING
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Issue date
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G01 - MEASURING TESTING
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Patent number
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Issue date
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G06 - COMPUTING CALCULATING COUNTING
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Patent number
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Issue date
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G01 - MEASURING TESTING
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Patent number
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Issue date
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G01 - MEASURING TESTING
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Patent Grant
Method for inspecting welding quality of welded portion between ele...
Patent number
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Issue date
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Grant
System and method for automatic detection of dual wheels
Patent number
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Issue date
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A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
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External illumination with reduced detectability
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Issue date
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G02 - OPTICS
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Integration of an optical height sensor in mask inspection tools
Patent number
12,360,058
Issue date
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Zefram Marks
G01 - MEASURING TESTING
Information
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Device and method for measuring interfaces of an optical element
Patent number
12,359,910
Issue date
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FOGALE NANOTECH
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G01 - MEASURING TESTING
Information
Patent Grant
Systems, methods, and apparatus for providing interactive inspectio...
Patent number
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Issue date
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B60 - VEHICLES IN GENERAL
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Absolute phase unwrapping for fringe analysis in an eye tracking ap...
Patent number
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Issue date
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G06 - COMPUTING CALCULATING COUNTING
Information
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Calibration method for computer vision system and three-dimensional...
Patent number
12,359,912
Issue date
Jul 15, 2025
Omron Corporation
Yoshinori Konishi
G05 - CONTROLLING REGULATING
Information
Patent Grant
System and method for identifying lengths of harvested particles
Patent number
12,361,683
Issue date
Jul 15, 2025
CLAAS E-Systems GmbH
Christoffer Rasmussen
G06 - COMPUTING CALCULATING COUNTING
Information
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Patent number
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Issue date
Jul 15, 2025
HONOR DEVICE CO., LTD.
Ye Lv
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Grant
Three-dimensional measurement device
Patent number
12,359,906
Issue date
Jul 15, 2025
CKD Corporation
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G01 - MEASURING TESTING
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Patent Grant
Member distinguish apparatus, member distinguish method, and comput...
Patent number
12,359,908
Issue date
Jul 15, 2025
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Akira Tsuji
G01 - MEASURING TESTING
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Uniform machined parts inspection process
Patent number
12,359,909
Issue date
Jul 15, 2025
Rolls-Royce Corporation
Monica Sy Munoz
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Scan engine ranging failure handling
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12,361,241
Issue date
Jul 15, 2025
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G06 - COMPUTING CALCULATING COUNTING
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Method and system for automatically collecting multiple information...
Patent number
12,361,577
Issue date
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Siming Tian
G06 - COMPUTING CALCULATING COUNTING
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Operation of a coordinate measuring machine with a person-guided se...
Patent number
12,352,554
Issue date
Jul 8, 2025
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Benjamin Weber
G01 - MEASURING TESTING
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Three-dimensional optical measuring mobile apparatus for ropes with...
Patent number
12,352,555
Issue date
Jul 8, 2025
BRIDON INTERNATIONAL LTD.
Cristiano Bonetti
G01 - MEASURING TESTING
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Optical displacement sensor
Patent number
12,352,556
Issue date
Jul 8, 2025
Sensibel AS
Håkon Sagberg
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Intraoral scanning apparatus
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12,355,936
Issue date
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3Shape A/S
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Optical measuring machine and measuring method
Patent number
12,352,560
Issue date
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VICI & C. S.P.A.
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G01 - MEASURING TESTING
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last 30 patents
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Publication date
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G06 - COMPUTING CALCULATING COUNTING
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Publication date
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B60 - VEHICLES IN GENERAL
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H01 - BASIC ELECTRIC ELEMENTS
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B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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OPTICAL SPATIAL PROBE
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Publication date
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G01 - MEASURING TESTING
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SELF-MIXING INTERFERENCE BASED SENSORS FOR CHARACTERIZING TOUCH INPUT
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20250237492
Publication date
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G06 - COMPUTING CALCULATING COUNTING
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DEPTH SENSOR
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20250237495
Publication date
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SK HYNIX INC.
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G01 - MEASURING TESTING
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APPARATUS FOR RECOVERING TWIST IN CABLE SHAPE
Publication number
20250237499
Publication date
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The Government of the United States of America
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G01 - MEASURING TESTING
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Stringed Instrument Scanning System and Related Methods
Publication number
20250237493
Publication date
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MIDGEA, GmbH
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G10 - MUSICAL INSTRUMENTS ACOUSTICS
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METHOD FOR SEEDING CELLS ON A SENSOR SURFACE
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20250237645
Publication date
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HOFFMANN-LA ROCHE INC.
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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G01 - MEASURING TESTING
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20250231020
Publication date
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G01 - MEASURING TESTING
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Publication date
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H01 - BASIC ELECTRIC ELEMENTS
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GLASS SUBSTRATE, GLASS LAMINATE, MEMBER FOR DISPLAY DEVICE, DISPLAY...
Publication number
20250234468
Publication date
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B32 - LAYERED PRODUCTS
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WAFER BONDING OVERLAY MEASUREMENT SYSTEM
Publication number
20250233022
Publication date
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TOKYO ELECTRON LIMITED
Ilseok SON
H01 - BASIC ELECTRIC ELEMENTS
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METHOD FOR DETERMINING A HEIGHT MAP USING A WHITE LIGHT INTERFEROME...
Publication number
20250231019
Publication date
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G01 - MEASURING TESTING
Information
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System and Method/Process for In-Field Measurements of Plant Crops
Publication number
20250231299
Publication date
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G01 - MEASURING TESTING
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SURFACE SHAPE MEASUREMENT DEVICE
Publication number
20250231021
Publication date
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G01 - MEASURING TESTING
Information
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Publication number
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Publication date
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G06 - COMPUTING CALCULATING COUNTING
Information
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Publication number
20250224229
Publication date
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TAIYUAN UNIVERSITY OF TECHNOLOGY
XIAO DENG
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL IMAGER AND PROJECTION DEVICE
Publication number
20250226700
Publication date
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Austin Russell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD, SYSTEM AND SENSOR FOR ANALYSING A SAMPLE, AND PROCESS FOR M...
Publication number
20250224331
Publication date
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G01 - MEASURING TESTING
Information
Patent Application
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Publication number
20250224499
Publication date
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G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASURING DEVICE, ACQUISITION METHOD, AND RECORDING MEDIUM
Publication number
20250224225
Publication date
Jul 10, 2025
Mitsubishi Electric Corporation
Nobuki KOTAKE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR PERFORMING VEHICLE INSPECTIONS
Publication number
20250224310
Publication date
Jul 10, 2025
Clay Skelton
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT METHOD AND MEASUREMENT SYSTEM
Publication number
20250224227
Publication date
Jul 10, 2025
Kabushiki Kaisha Toshiba
Daisuke HIRATSUKA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD TO MAP THICKNESS VARIATIONS OF SUBSTRATES IN MANU...
Publication number
20250224228
Publication date
Jul 10, 2025
Applied Materials, Inc.
Mehdi Vaez-Iravani
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...