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Measuring arrangements characterised by the use of optical means
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Industry
CPC
G01B11/00
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Current Industry
G01B11/00
Measuring arrangements characterised by the use of optical means
Sub Industries
G01B11/002
for measuring two or more coordinates
G01B11/005
coordinate measuring machines
G01B11/007
feeler heads therefor
G01B11/02
for measuring length, width or thickness
G01B11/022
by means of tv-camera scanning
G01B11/024
by means of diode-array scanning
G01B11/026
by measuring distance between sensor and object
G01B11/028
by measuring lateral position of a boundary of the object
G01B11/03
by measuring coordinates of points
G01B11/04
specially adapted for measuring length or width of objects while moving
G01B11/043
for measuring length
G01B11/046
for measuring width
G01B11/06
for measuring thickness
G01B11/0608
Height gauges
G01B11/0616
of coating
G01B11/0625
with measurement of absorption or reflection
G01B11/0633
using one or more discrete wavelengths
G01B11/0641
with measurement of polarization
G01B11/065
using one or more discrete wavelengths
G01B11/0658
with measurement of emissivity or reradiation
G01B11/0666
using an exciting beam and a detection beam including surface acoustic waves [SAW]
G01B11/0675
using interferometry
G01B11/0683
measurement during deposition or removal of the layer
G01B11/0691
of objects while moving
G01B11/08
for measuring diameters
G01B11/10
of objects while moving
G01B11/105
using photoelectric detection means
G01B11/12
internal diameters
G01B11/14
for measuring distance or clearance between spaced objects or spaced apertures
G01B11/16
for measuring the deformation in a solid
G01B11/161
by interferometric means
G01B11/162
by speckle- or shearing interferometry
G01B11/164
by holographic interferometry
G01B11/165
by means of a grating deformed by the object
G01B11/167
by projecting a pattern on the object
G01B11/168
by means of polarisation
G01B11/18
using photoelastic elements
G01B11/20
using brittle lacquer
G01B11/22
for measuring depth
G01B11/24
for measuring contours or curvatures
G01B11/2408
for measuring roundness
G01B11/2416
of gears
G01B11/2425
of screw-threads
G01B11/2433
for measuring outlines by shadow casting
G01B11/2441
using interferometry
G01B11/245
using a plurality of fixed, simultaneously operating transducers
G01B11/25
by projecting a pattern
G01B11/2504
Calibration devices
G01B11/2509
Color coding
G01B11/2513
with several lines being projected in more than one direction
G01B11/2518
Projection by scanning of the object
G01B11/2522
the position of the object changing and being recorded
G01B11/2527
with phase change by in-plane movement of the patern
G01B11/2531
using several gratings, projected with variable angle of incidence on the object, and one detection device
G01B11/2536
using several gratings with variable grating pitch, projected on the object with the same angle of incidence
G01B11/254
Projection of a pattern, viewing through a pattern
G01B11/2545
with one projection direction and several detection directions
G01B11/255
for measuring radius of curvature
G01B11/26
for measuring angles or tapers for testing the alignment of axes
G01B11/27
for testing the alignment of axes
G01B11/272
using photoelectric detection means
G01B11/275
for testing wheel alignment
G01B11/2755
using photoelectric detection means
G01B11/28
for measuring areas
G01B11/285
using photoelectric detection means
G01B11/30
for measuring roughness or irregularity of surfaces
G01B11/303
using photoelectric detection means
G01B11/306
for measuring evenness
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last 30 patents
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Issue date
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G01 - MEASURING TESTING
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Issue date
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Issue date
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G01 - MEASURING TESTING
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Method and device for determining a bending angle on a bending machine
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Issue date
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Issue date
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B60 - VEHICLES IN GENERAL
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Method and apparatus for cooperative usage of multiple distance meters
Patent number
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Issue date
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G01 - MEASURING TESTING
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Patent Grant
Semiconductor marks and forming methods thereof
Patent number
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
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Cleanroom compatible robotic end effector exchange system
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
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Height estimation method, height estimation apparatus, and program
Patent number
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Issue date
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Nippon Telegraph and Telephone Corporation
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G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Line-scanning three-dimensional sensing system
Patent number
12,215,967
Issue date
Feb 4, 2025
Hong Kong Applied Science and Technology Research Institute Company Limited
Jinbo Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems of optical inspection of electronic device manu...
Patent number
12,215,966
Issue date
Feb 4, 2025
Applied Materials, Inc.
Mohsin Waqar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Shape correction device and shape correction method based on amount...
Patent number
12,215,971
Issue date
Feb 4, 2025
Hitachi Astemo, Ltd.
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G01 - MEASURING TESTING
Information
Patent Grant
System for measuring thickness and physical properties of thin film...
Patent number
12,216,044
Issue date
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Seoul National University R&DB Foundation
Heui Jae Pahk
G01 - MEASURING TESTING
Information
Patent Grant
Aircraft engine installation alignment system
Patent number
12,208,924
Issue date
Jan 28, 2025
United States of America as represented by the Secretary of the Air Force
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B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Non-contact apparatus for measuring wafer thickness
Patent number
12,209,853
Issue date
Jan 28, 2025
Fujikoshi Machinery Corp.
Chihiro Miyagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for measurement of tilt and overlay of a structure
Patent number
12,209,854
Issue date
Jan 28, 2025
KLA Corporation
Stilian Ivanov Pandev
G01 - MEASURING TESTING
Information
Patent Grant
Rotatable inspection device for defect detection
Patent number
12,209,858
Issue date
Jan 28, 2025
SENSIMA INSPECTION Sâ„«RL
Marc Lany
G01 - MEASURING TESTING
Information
Patent Grant
Spatial pattern loading measurement with imaging metrology
Patent number
12,211,717
Issue date
Jan 28, 2025
Applied Materials, Inc.
Eric Chin Hong Ng
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Method, module and system for projecting onto a workpiece and image...
Patent number
12,212,898
Issue date
Jan 28, 2025
Dassault Systémes
Christophe Montandon
G06 - COMPUTING CALCULATING COUNTING
Information
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Fiber-optic based material property measurement system and related...
Patent number
12,209,961
Issue date
Jan 28, 2025
University of Virginia Patent Foundation
Brian M. Foley
G01 - MEASURING TESTING
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Patent Grant
Imaging parameter output method and imaging parameter output device
Patent number
12,209,934
Issue date
Jan 28, 2025
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Taro Imagawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Implementing specific hardware to follow an efficient measurement p...
Patent number
12,209,857
Issue date
Jan 28, 2025
Hexagon Metrology, Inc.
Paul Racine
G01 - MEASURING TESTING
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Patent Grant
Projection apparatus, collection apparatus, and three-dimensional s...
Patent number
12,209,855
Issue date
Jan 28, 2025
SHINING3D TECHNOLOGY CO., LTD.
Chao Ma
G01 - MEASURING TESTING
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Patent Grant
Measurement and positioning methods and arrangements for assembling...
Patent number
12,212,109
Issue date
Jan 28, 2025
Rosenberger Hochfrequenztechnik GmbH & Co. KG
Thomas Miedl
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
System for determining optical probe location relative to a photoni...
Patent number
12,203,739
Issue date
Jan 21, 2025
Keysight Technologies, Inc.
Christopher Coleman
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for inspection of a geometry, the device comprisi...
Patent number
12,203,743
Issue date
Jan 21, 2025
Winteria AB
Martin Engman
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGE MEASURING APPARATUS AND PROGRAM
Publication number
20250045931
Publication date
Feb 6, 2025
Mitutoyo Corporation
Hiroyuki Yoshida
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
GOLF LAUNCH MONITOR AND TARGET ALIGNMENT METHOD OF GOLF LAUNCH MONITOR
Publication number
20250044080
Publication date
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VIEWORKS CO., LTD.
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G01 - MEASURING TESTING
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TIRE TREAD DETECTION DEVICE AND TIRE TREAD DETECTION SYSTEM
Publication number
20250044078
Publication date
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G01 - MEASURING TESTING
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Publication number
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Publication date
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G06 - COMPUTING CALCULATING COUNTING
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INTRAORAL SCANNER
Publication number
20250044079
Publication date
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G01 - MEASURING TESTING
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FLATNESS MEASURING SYSTEM, METHOD AND APPARATUS
Publication number
20250044081
Publication date
Feb 6, 2025
Hamar Laser Instruments, Inc.
Carlos Araujo
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING THE THICKNESS OF A VARNISH LAYER
Publication number
20250044077
Publication date
Feb 6, 2025
ARCELORMITTAL
Nathalie LABBE
G01 - MEASURING TESTING
Information
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THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...
Publication number
20250044073
Publication date
Feb 6, 2025
ORBOTECH LTD.
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G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
Publication number
20250044076
Publication date
Feb 6, 2025
SONY CORPORATION
Shingo TSURUMI
G01 - MEASURING TESTING
Information
Patent Application
ENHANCING DEPTH REPRESENTATIONS BASED ON AMPLITUDES OF TIME-OF-FLIG...
Publication number
20250044451
Publication date
Feb 6, 2025
QUALCOMM Incorporated
Li Hong
G01 - MEASURING TESTING
Information
Patent Application
Manufacturing Method of Electrode Assembly
Publication number
20250046892
Publication date
Feb 6, 2025
LG ENERGY SOLUTION, LTD.
Tai Joon Seo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...
Publication number
20250033212
Publication date
Jan 30, 2025
Gecko Robotics, Inc.
Alberto Pinero
B60 - VEHICLES IN GENERAL
Information
Patent Application
DEFLECTOMETRY MEASUREMENT METHOD
Publication number
20250035432
Publication date
Jan 30, 2025
WYSE LIGHT
SURREL Yves
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
Publication number
20250035434
Publication date
Jan 30, 2025
Panasonic Intellectual Property Management Co., Ltd.
AKIRA HASHIYA
G01 - MEASURING TESTING
Information
Patent Application
Sealing Apparatus
Publication number
20250038244
Publication date
Jan 30, 2025
LG ENERGY SOLUTION, LTD.
Eung Hyun Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THREE-DIMENSIONAL SHAPE MEASURING DEVICE AND THREE-DIMENSIONAL SHAP...
Publication number
20250035426
Publication date
Jan 30, 2025
TOKYO SEIMITSU CO., LTD.
Takashi OGURA
G01 - MEASURING TESTING
Information
Patent Application
MEASURING UNIT AND METHOD FOR OPTICALLY MEASURING OBJECTS
Publication number
20250035433
Publication date
Jan 30, 2025
Carl Zeiss GOM Metrology GmbH
Michael Jörck
G01 - MEASURING TESTING
Information
Patent Application
BATTERY CELL INSPECTION DEVICE AND BATTERY CELL INSPECTION SYSTEM I...
Publication number
20250038281
Publication date
Jan 30, 2025
SK On Co., Ltd.
Sang Min KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONTACTLESS DETERMINING A PHYSICAL FEATURE OF A TARGET ITEM
Publication number
20250035428
Publication date
Jan 30, 2025
DAS-NANO TECH S.L.
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G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR MEASURING BENDING OF AN ELONGATE VERTICALLY ORIENTED CHA...
Publication number
20250035429
Publication date
Jan 30, 2025
JOINT STOCK COMPANY "ROSENERGOATOM"
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G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
MACHINE TOOL
Publication number
20250035435
Publication date
Jan 30, 2025
Mitsubishi Electric Corporation
Hiroki GOTO
G01 - MEASURING TESTING
Information
Patent Application
CHIP MEASUREMENT SYSTEM
Publication number
20250037543
Publication date
Jan 30, 2025
Yasushi SHIGETA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Optoelectronic sensor and method of detecting objects in a monitore...
Publication number
20250035785
Publication date
Jan 30, 2025
SICK AG
Gerold FEISE
G01 - MEASURING TESTING
Information
Patent Application
TARGET ASYMMETRY MEASUREMENT FOR SUBSTRATE ALIGNMENT IN LITHOGRAPHY...
Publication number
20250036031
Publication date
Jan 30, 2025
ASML NETHERLANDS B.V.
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G01 - MEASURING TESTING
Information
Patent Application
IMAGE MEASUREMENT APPARATUS
Publication number
20250035422
Publication date
Jan 30, 2025
KEYENCE CORPORATION
Takashi Naruse
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION JIG, CALIBRATION METHOD, AND MEASUREMENT SYSTEM
Publication number
20250035430
Publication date
Jan 30, 2025
MITUTOYO CORPORATION
Ryosuke TANAKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CALIBRATION JIG
Publication number
20250035431
Publication date
Jan 30, 2025
MITUTOYO CORPORATION
Ryosuke TANAKA
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION OF SCANNING 3-D PERCEPTION SYSTEMS
Publication number
20250027765
Publication date
Jan 23, 2025
Summer Robotics, Inc.
Brian Alexander Paden
G01 - MEASURING TESTING
Information
Patent Application
DETECTING OUTLIERS AND ANOMALIES FOR OCD METROLOGY MACHINE LEARNING
Publication number
20250027767
Publication date
Jan 23, 2025
NOVA LTD
EITAN A. ROTHSTEIN
G01 - MEASURING TESTING
Information
Patent Application
METHODS, SYSTEMS, AND APPARATUS FOR MEASURING A GAP BETWEEN A SUPPO...
Publication number
20250029862
Publication date
Jan 23, 2025
Trung H. DAO
G01 - MEASURING TESTING