by interferometric methods

Industry

CPC
G01J9/02

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J9/00Measuring optical phase difference Determining degree of coherence Measuring optical wavelength

Current Industry

G01J9/02by interferometric methods

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Optical sensor module including an interferometric sensor and exten...
- Patent number 12,209,890
- Issue date Jan 28, 2025
- Apple Inc.
- Tong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Biosensor device
- Patent number 12,203,860
- Issue date Jan 21, 2025
- Electronics and Telecommunications Research Institute
- Jin Tae Kim
- G01 - MEASURING TESTING
Information Patent Grant
Absolute gravimeter and measurement method based on vacuum optical...
- Patent number 12,174,335
- Issue date Dec 24, 2024
- Zhejiang University
- Xingfan Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting absolute or relative temperature an...
- Patent number 12,123,800
- Issue date Oct 22, 2024
- Adtran Networks SE
- Benjamin Wohlfeil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical measurement device with universal metasurface and optical m...
- Patent number 12,104,948
- Issue date Oct 1, 2024
- Korea Advanced Institute of Science and Technology
- Jonghwa Shin
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and infrared communication method based on interf...
- Patent number 12,074,638
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Kangho Byun
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for increasing coherence length in lidar systems
- Patent number 12,044,806
- Issue date Jul 23, 2024
- Aeva, Inc.
- Richard L. Sebastian
- G02 - OPTICS
Information Patent Grant
Totagraphy: coherent diffractive/digital information reconstruction...
- Patent number 12,031,868
- Issue date Jul 9, 2024
- Wavefront Analysis Systems LLC
- Okan Ersoy
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic polarimeter and device for automatically adjusting op...
- Patent number 12,025,502
- Issue date Jul 2, 2024
- MGEN.CO., LTD
- Min Young Park
- G02 - OPTICS
Information Patent Grant
Interferometer with at least one dispersive element
- Patent number 11,988,562
- Issue date May 21, 2024
- SYSTEMS & TECHNOLOGY RESEARCH, LLC
- Scott Bloom
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring wavelength for laser device
- Patent number 11,971,307
- Issue date Apr 30, 2024
- Beijing RSLaserOpto-Electronics Technology Co. Ltd
- Guangyi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
System and method for increasing coherence length in lidar systems
- Patent number 11,927,698
- Issue date Mar 12, 2024
- Aeva, Inc.
- Richard L. Sebastian
- G01 - MEASURING TESTING
Information Patent Grant
Liquid crystal phase modulation device
- Patent number 11,927,863
- Issue date Mar 12, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Benoît Racine
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of sensing alignment marks
- Patent number 11,899,380
- Issue date Feb 13, 2024
- ASML Holding N.V.
- Krishanu Shome
- G01 - MEASURING TESTING
Information Patent Grant
Wavefront sensor and method of reconstructing distorted wavefronts
- Patent number 11,874,178
- Issue date Jan 16, 2024
- King Abdullah University of Science and Technology
- Congli Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Determination of measurement error in an etalon
- Patent number 11,860,036
- Issue date Jan 2, 2024
- Cymer, LLC
- Russell Allen Burdt
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting absolute or relative temperature an...
- Patent number 11,846,559
- Issue date Dec 19, 2023
- Adtran Networks SE
- Benjamin Wohlfeil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative phase image generating method, quantitative phase imag...
- Patent number 11,808,929
- Issue date Nov 7, 2023
- Nikon Corporation
- Shota Tsuchida
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system, method of determining a mode hop of a laser...
- Patent number 11,719,529
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting wavefront error by modal-based opti...
- Patent number 11,709,111
- Issue date Jul 25, 2023
- Zhejiang University
- Jian Bai
- G01 - MEASURING TESTING
Information Patent Grant
High bandwidth quantum random number generator
- Patent number 11,709,657
- Issue date Jul 25, 2023
- Kabushiki Kaisha Toshiba
- Taofiq Paraiso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reducing speckle in an excimer light source
- Patent number 11,686,951
- Issue date Jun 27, 2023
- Cymer, LLC
- Wilhelmus Patrick Elisabeth Maria op 't Root
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Refractive scanning interferometer
- Patent number 11,668,603
- Issue date Jun 6, 2023
- Rapid Phenotyping Pty Limited
- Selene Rodd-Routley
- G01 - MEASURING TESTING
Information Patent Grant
High precision optical locker
- Patent number 11,662,508
- Issue date May 30, 2023
- Lumentum Operations LLC
- Adrian Perrin Janssen
- G01 - MEASURING TESTING
Information Patent Grant
Optical deflector parameter measurement device, method, and program
- Patent number 11,656,073
- Issue date May 23, 2023
- Nippon Telegraph and Telephone Corporation
- Masahiro Ueno
- G01 - MEASURING TESTING
Information Patent Grant
Calculation method, recording method, optical film, and phase modul...
- Patent number 11,573,527
- Issue date Feb 7, 2023
- Toppan Printing Co., Ltd.
- Akihito Kagotani
- B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information Patent Grant
Method and device for generating (quasi-) periodic interference pat...
- Patent number 11,555,745
- Issue date Jan 17, 2023
- Imec VZW
- Niels Verellen
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength tracking system, method to calibrate a wavelength tracki...
- Patent number 11,525,737
- Issue date Dec 13, 2022
- ASML Netherland B.V.
- Maarten Jozef Jansen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for measuring and locking ultra-fast laser pu...
- Patent number 11,522,334
- Issue date Dec 6, 2022
- Institute of Physics, Chinese Academy of Sciences
- Shaobo Fang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Increasing Coherence Length in Lidar Systems
- Publication number 20250035759
- Publication date Jan 30, 2025
- Aeva, Inc.
- Richard L. Sebastian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPERSION MEASUREMENT DEVICE AND METHOD BASED ON FRANSON SECOND-OR...
- Publication number 20250035490
- Publication date Jan 30, 2025
- NATIONAL TIME SERVICE CENTER, THE CHINESE ACADEMY OF SCIENCES
- Ruifang DONG
- G01 - MEASURING TESTING
Information Patent Application
ASCERTAINMENT OF A WAVEFRONT GRADIENT OF A LIGHT ON THE BASIS OF AN...
- Publication number 20250012636
- Publication date Jan 9, 2025
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Andreas ZEPP
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC WAVEGUIDE POWER AND PHASE MONITOR
- Publication number 20240385243
- Publication date Nov 21, 2024
- IMEC vzw
- Wim BOGAERTS
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DETECTION SYSTEM
- Publication number 20240361185
- Publication date Oct 31, 2024
- ULTRA DISPLAY TECHNOLOGY CORP.
- Hsien-Te CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING THE CARRIER-ENVELOPE PHASE OFFSET O...
- Publication number 20240344892
- Publication date Oct 17, 2024
- Sphere Ultrafast Photonics, SA
- Chen Guo
- G01 - MEASURING TESTING
Information Patent Application
Integrated High-Extinction Ratio Unbalanced Mach Zehnder Interferom...
- Publication number 20240344891
- Publication date Oct 17, 2024
- The Regents of the University of California
- Kaikai Liu
- G02 - OPTICS
Information Patent Application
PHASE MEASUREMENT DEVICE FOR LASER INTERFERENCE PHOTOLITHOGRAPHY SY...
- Publication number 20240319619
- Publication date Sep 26, 2024
- TSINGHUA UNIVERSITY
- Yu ZHU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVELENGTH MEASURING DEVICE USING ABSORPTION-TYPE OPTICAL F...
- Publication number 20240280412
- Publication date Aug 22, 2024
- GIST (Gwangju Institue of Science and Technology)
- Bok Hyeon KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING A MODAL PROPERTY OF A QUANTUM STA...
- Publication number 20240175760
- Publication date May 30, 2024
- Xanadu Quantum Technologies Inc.
- Jean-Etienne TREMBLAY
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Detecting Absolute or Relative Temperature an...
- Publication number 20240085267
- Publication date Mar 14, 2024
- Adtran Networks SE
- Benjamin Wohlfeil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR EXPANDING THE DYNAMIC RANGE OF MACH-ZEHNDER S...
- Publication number 20240019310
- Publication date Jan 18, 2024
- Shanghai Haina Data Technology Company Ltd.
- Rui YIN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR EXAMINING THE MOVEMENT OF CONSTITUENTS...
- Publication number 20240011903
- Publication date Jan 11, 2024
- PURDUE RESEARCH FOUNDATION
- David D. NOLTE
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE PHASE IMAGE GENERATING METHOD, QUANTITATIVE PHASE IMAG...
- Publication number 20240004176
- Publication date Jan 4, 2024
- Nikon Corporation
- Shota TSUCHIDA
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT DEVICE WITH UNIVERSAL METASURFACE AND OPTICAL M...
- Publication number 20230384152
- Publication date Nov 30, 2023
- Korea Advanced Institute of Science and Technology
- Jonghwa SHIN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TRANSMITTER
- Publication number 20230384514
- Publication date Nov 30, 2023
- ROCKLEY PHOTONICS LIMITED
- Yi Ho LEE
- G01 - MEASURING TESTING
Information Patent Application
REFRACTIVE SCANNING INTERFEROMETER
- Publication number 20230375409
- Publication date Nov 23, 2023
- Rapid Phenotyping Pty Limited
- Selene Rodd-Routley
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Gradient Interferometrically Locked Laser Source
- Publication number 20230352899
- Publication date Nov 2, 2023
- Nutronics, Inc.
- Jeffrey D. Barchers
- G02 - OPTICS
Information Patent Application
LASER SOURCE, LIDAR SYSTEM AND METHOD FOR CONTROLLING A LASER SOURCE
- Publication number 20230327402
- Publication date Oct 12, 2023
- ams-OSRAM International GmbH
- Hubert HALBRITTER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
- Publication number 20230324164
- Publication date Oct 12, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical Sensor Module Including an Interferometric Sensor and Exten...
- Publication number 20230314185
- Publication date Oct 5, 2023
- Apple Inc.
- Tong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RECONSTRUCTION OF A WAVEFRONT OF A LIGHT BEAM CONTAINING OPTICAL VO...
- Publication number 20230296444
- Publication date Sep 21, 2023
- UNIVERSITÉ PARIS CITÉ
- Marc GUILLON
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE HOLOGRAPHIC PHASE MASKS
- Publication number 20230236494
- Publication date Jul 27, 2023
- University of Central Florida Research Foundation, Inc.
- Ivan Divliansky
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR OPERATING OPTICAL WAVEMETER AND WAVEMETER...
- Publication number 20230204430
- Publication date Jun 29, 2023
- Huawei Technologies Canada Co., Ltd.
- Trevor James HALL
- G01 - MEASURING TESTING
Information Patent Application
LIQUID CRYSTAL PHASE MODULATION DEVICE
- Publication number 20230194944
- Publication date Jun 22, 2023
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Benoît RACINE
- G01 - MEASURING TESTING
Information Patent Application
Conformal imaging vibrometer using adaptive optics with scene-based...
- Publication number 20230175893
- Publication date Jun 8, 2023
- David Mort Pepper
- G01 - MEASURING TESTING
Information Patent Application
PHASE DIFFERENCE MEASURING DEVICE, BEAM OUTPUT APPARATUS AND PHASE...
- Publication number 20230152163
- Publication date May 18, 2023
- Mitsubishi Heavy Industries, Ltd.
- Koichi HAMAMOTO
- G02 - OPTICS
Information Patent Application
DETERMINATION OF MEASUREMENT ERROR IN AN ETALON
- Publication number 20230142333
- Publication date May 11, 2023
- CYMER, LLC
- Russell Allen Burdt
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING WAVELENGTH FOR LASER DEVICE
- Publication number 20230144290
- Publication date May 11, 2023
- Beijing Rslaser Opto-Electronics Technology Co., Ltd.
- Guangyi LIU
- G01 - MEASURING TESTING
Information Patent Application
Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...
- Publication number 20230056872
- Publication date Feb 23, 2023
- ASML NETHERLANDS B.V.
- Engelbertus Antonius Fransiscus VAN DER PASCH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

by interferometric methods

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical sensor module including an interferometric sensor and exten...

Biosensor device

Absolute gravimeter and measurement method based on vacuum optical...

Method and device for detecting absolute or relative temperature an...

Optical measurement device with universal metasurface and optical m...

Electronic device and infrared communication method based on interf...

System and method for increasing coherence length in lidar systems

Totagraphy: coherent diffractive/digital information reconstruction...

Spectroscopic polarimeter and device for automatically adjusting op...

Interferometer with at least one dispersive element

Device and method for measuring wavelength for laser device

Interferometer and optical instrument with integrated optical compo...

System and method for increasing coherence length in lidar systems

Liquid crystal phase modulation device

Apparatus for and method of sensing alignment marks

Wavefront sensor and method of reconstructing distorted wavefronts

Determination of measurement error in an etalon

Method and device for detecting absolute or relative temperature an...

Quantitative phase image generating method, quantitative phase imag...

Interferometer system, method of determining a mode hop of a laser...

Device and method for detecting wavefront error by modal-based opti...

High bandwidth quantum random number generator

Reducing speckle in an excimer light source

Refractive scanning interferometer

High precision optical locker

Optical deflector parameter measurement device, method, and program

Calculation method, recording method, optical film, and phase modul...

Method and device for generating (quasi-) periodic interference pat...

Wavelength tracking system, method to calibrate a wavelength tracki...

Methods and apparatus for measuring and locking ultra-fast laser pu...

Patents Applicationslast 30 patents

System and Method for Increasing Coherence Length in Lidar Systems

DISPERSION MEASUREMENT DEVICE AND METHOD BASED ON FRANSON SECOND-OR...

ASCERTAINMENT OF A WAVEFRONT GRADIENT OF A LIGHT ON THE BASIS OF AN...

PHOTONIC WAVEGUIDE POWER AND PHASE MONITOR

ELECTRONIC DETECTION SYSTEM

METHOD AND SYSTEM FOR MEASURING THE CARRIER-ENVELOPE PHASE OFFSET O...

Integrated High-Extinction Ratio Unbalanced Mach Zehnder Interferom...

PHASE MEASUREMENT DEVICE FOR LASER INTERFERENCE PHOTOLITHOGRAPHY SY...

OPTICAL WAVELENGTH MEASURING DEVICE USING ABSORPTION-TYPE OPTICAL F...

SYSTEM AND METHOD FOR DETERMINING A MODAL PROPERTY OF A QUANTUM STA...

Method and Device for Detecting Absolute or Relative Temperature an...

METHOD AND SYSTEM FOR EXPANDING THE DYNAMIC RANGE OF MACH-ZEHNDER S...

APPARATUSES AND METHODS FOR EXAMINING THE MOVEMENT OF CONSTITUENTS...

QUANTITATIVE PHASE IMAGE GENERATING METHOD, QUANTITATIVE PHASE IMAG...

OPTICAL MEASUREMENT DEVICE WITH UNIVERSAL METASURFACE AND OPTICAL M...

OPTICAL TRANSMITTER

REFRACTIVE SCANNING INTERFEROMETER

System and Method for Gradient Interferometrically Locked Laser Source

LASER SOURCE, LIDAR SYSTEM AND METHOD FOR CONTROLLING A LASER SOURCE

INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...

Optical Sensor Module Including an Interferometric Sensor and Exten...

RECONSTRUCTION OF A WAVEFRONT OF A LIGHT BEAM CONTAINING OPTICAL VO...

REFLECTIVE HOLOGRAPHIC PHASE MASKS

METHOD AND APPARATUS FOR OPERATING OPTICAL WAVEMETER AND WAVEMETER...

LIQUID CRYSTAL PHASE MODULATION DEVICE

Conformal imaging vibrometer using adaptive optics with scene-based...

PHASE DIFFERENCE MEASURING DEVICE, BEAM OUTPUT APPARATUS AND PHASE...

DETERMINATION OF MEASUREMENT ERROR IN AN ETALON

DEVICE AND METHOD FOR MEASURING WAVELENGTH FOR LASER DEVICE

Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...