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Measuring optical phase difference Determining degree of coherence Measuring optical wavelength
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PHYSICS
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Measuring instruments
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J9/00
Measuring optical phase difference Determining degree of coherence Measuring optical wavelength
Sub Industries
G01J9/02
by interferometric methods
G01J9/0215
by shearing interferometric methods
G01J9/0246
Measuring optical wavelength
G01J9/04
by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained
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last 30 patents
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Patent Grant
Biosensor device
Patent number
12,203,860
Issue date
Jan 21, 2025
Electronics and Telecommunications Research Institute
Jin Tae Kim
G01 - MEASURING TESTING
Information
Patent Grant
Phase difference distribution estimation method and phase differenc...
Patent number
12,206,450
Issue date
Jan 21, 2025
Nippon Telegraph and Telephone Corporation
Yohei Katayama
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Apparatus and method for estimating a phase retarder and method of...
Patent number
12,181,346
Issue date
Dec 31, 2024
Electronics and Telecommunications Research Institute
Ki Hong Choi
G01 - MEASURING TESTING
Information
Patent Grant
Wavefront sensors with irregular aperture masks, diffusers, and cam...
Patent number
12,181,347
Issue date
Dec 31, 2024
Quartus Engineering Incorporated
Peter Pilarz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Absolute gravimeter and measurement method based on vacuum optical...
Patent number
12,174,335
Issue date
Dec 24, 2024
Zhejiang University
Xingfan Chen
G01 - MEASURING TESTING
Information
Patent Grant
Wavefront curvature sensor involving temporal sampling of the image...
Patent number
12,146,796
Issue date
Nov 19, 2024
WOOPTIX S.L.
Sergio Bonaque González
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Phase-sensitive compressed ultrafast photography systems and methods
Patent number
12,143,557
Issue date
Nov 12, 2024
California Institute of Technology
Lihong Wang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
Optical-based fire detection systems and methods
Patent number
12,130,187
Issue date
Oct 29, 2024
The Boeing Company
Philipp A. Boettcher
G08 - SIGNALLING
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Patent Grant
Method and device for detecting absolute or relative temperature an...
Patent number
12,123,800
Issue date
Oct 22, 2024
Adtran Networks SE
Benjamin Wohlfeil
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Metrology target design for tilted device designs
Patent number
12,117,347
Issue date
Oct 15, 2024
KLA Corporation
Myungjun Lee
G01 - MEASURING TESTING
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Patent Grant
Optical measurement device with universal metasurface and optical m...
Patent number
12,104,948
Issue date
Oct 1, 2024
Korea Advanced Institute of Science and Technology
Jonghwa Shin
G01 - MEASURING TESTING
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Patent Grant
System and method for extracting information on the spatial distrib...
Patent number
12,108,150
Issue date
Oct 1, 2024
WOOPTIX S.L.
Ricardo Oliva Garcia
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Electronic device and infrared communication method based on interf...
Patent number
12,074,638
Issue date
Aug 27, 2024
Samsung Electronics Co., Ltd.
Kangho Byun
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
Measurement apparatus, measurement method, lithography apparatus an...
Patent number
12,072,175
Issue date
Aug 27, 2024
Canon Kabushiki Kaisha
Wataru Yamaguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
System and method for increasing coherence length in lidar systems
Patent number
12,044,806
Issue date
Jul 23, 2024
Aeva, Inc.
Richard L. Sebastian
G02 - OPTICS
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Patent Grant
Totagraphy: coherent diffractive/digital information reconstruction...
Patent number
12,031,868
Issue date
Jul 9, 2024
Wavefront Analysis Systems LLC
Okan Ersoy
G01 - MEASURING TESTING
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Patent Grant
Spectroscopic polarimeter and device for automatically adjusting op...
Patent number
12,025,502
Issue date
Jul 2, 2024
MGEN.CO., LTD
Min Young Park
G02 - OPTICS
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Patent Grant
Interferometer with at least one dispersive element
Patent number
11,988,562
Issue date
May 21, 2024
SYSTEMS & TECHNOLOGY RESEARCH, LLC
Scott Bloom
G01 - MEASURING TESTING
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Patent Grant
Optical compensation system and optical compensation method
Patent number
11,977,219
Issue date
May 7, 2024
Mitsubishi Heavy Industries, Ltd.
Masashi Iwashimizu
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring wavelength for laser device
Patent number
11,971,307
Issue date
Apr 30, 2024
Beijing RSLaserOpto-Electronics Technology Co. Ltd
Guangyi Liu
G01 - MEASURING TESTING
Information
Patent Grant
Blocking element of short wavelengths in LED-type light sources
Patent number
11,960,109
Issue date
Apr 16, 2024
Universidad Complutense de Madrid
Celia Sanchez Ramos
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
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Patent Grant
Wavefront sensors and wavefront shape determination using related i...
Patent number
11,953,381
Issue date
Apr 9, 2024
UNIVERSITE DE PARIS
Marc Guillon
G01 - MEASURING TESTING
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Patent Grant
Microscope for quantitative wavefront measurements, microscope modu...
Patent number
11,933,676
Issue date
Mar 19, 2024
Universitat de Valencia
Manuel Martínez Corral
G02 - OPTICS
Information
Patent Grant
Interferometer and optical instrument with integrated optical compo...
Patent number
11,933,609
Issue date
Mar 19, 2024
Yokogawa Electric Corporation
Nobuhide Yamada
G01 - MEASURING TESTING
Information
Patent Grant
System and method for increasing coherence length in lidar systems
Patent number
11,927,698
Issue date
Mar 12, 2024
Aeva, Inc.
Richard L. Sebastian
G01 - MEASURING TESTING
Information
Patent Grant
Liquid crystal phase modulation device
Patent number
11,927,863
Issue date
Mar 12, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Benoît Racine
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for and method of sensing alignment marks
Patent number
11,899,380
Issue date
Feb 13, 2024
ASML Holding N.V.
Krishanu Shome
G01 - MEASURING TESTING
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Patent Grant
Atmospheric characterization systems and methods
Patent number
11,879,981
Issue date
Jan 23, 2024
BLUEHALO, LLC
Levi Judah Smolin
G01 - MEASURING TESTING
Information
Patent Grant
Wavefront sensor and method of reconstructing distorted wavefronts
Patent number
11,874,178
Issue date
Jan 16, 2024
King Abdullah University of Science and Technology
Congli Wang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Decoherence processing method and system, and coherent light receiv...
Patent number
11,867,565
Issue date
Jan 9, 2024
Ningbo ABAX Sensing Electronic Technology Co., Ltd.
Shuyu Lei
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ASCERTAINMENT OF A WAVEFRONT GRADIENT OF A LIGHT ON THE BASIS OF AN...
Publication number
20250012636
Publication date
Jan 9, 2025
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
Andreas ZEPP
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT MEASUREMENT DEVICE AND WAVEFRONT MEASUREMENT METHOD
Publication number
20240418575
Publication date
Dec 19, 2024
Hamamatsu Photonics K.K.
Kazuki KAWAI
G01 - MEASURING TESTING
Information
Patent Application
PHOTONIC WAVEGUIDE POWER AND PHASE MONITOR
Publication number
20240385243
Publication date
Nov 21, 2024
IMEC vzw
Wim BOGAERTS
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, LITHOGRAPHY APPARATUS AN...
Publication number
20240369347
Publication date
Nov 7, 2024
Canon Kabushiki Kaisha
Wataru Yamaguchi
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DETECTION SYSTEM
Publication number
20240361185
Publication date
Oct 31, 2024
ULTRA DISPLAY TECHNOLOGY CORP.
Hsien-Te CHEN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING THE CARRIER-ENVELOPE PHASE OFFSET O...
Publication number
20240344892
Publication date
Oct 17, 2024
Sphere Ultrafast Photonics, SA
Chen Guo
G01 - MEASURING TESTING
Information
Patent Application
Integrated High-Extinction Ratio Unbalanced Mach Zehnder Interferom...
Publication number
20240344891
Publication date
Oct 17, 2024
The Regents of the University of California
Kaikai Liu
G02 - OPTICS
Information
Patent Application
PHASE MEASUREMENT DEVICE FOR LASER INTERFERENCE PHOTOLITHOGRAPHY SY...
Publication number
20240319619
Publication date
Sep 26, 2024
TSINGHUA UNIVERSITY
Yu ZHU
G01 - MEASURING TESTING
Information
Patent Application
METALENS ARRAY AND WAVEFRONT SENSOR SYSTEM
Publication number
20240319016
Publication date
Sep 26, 2024
SHENZHEN METALENX TECHNOLOGY CO.,LTD
Chenglong HAO
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL WAVELENGTH MEASURING DEVICE USING ABSORPTION-TYPE OPTICAL F...
Publication number
20240280412
Publication date
Aug 22, 2024
GIST (Gwangju Institue of Science and Technology)
Bok Hyeon KIM
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR PHOTONIC SAMPLING OF A TEST WAVE-FORM
Publication number
20240201017
Publication date
Jun 20, 2024
Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
Dmitry Zimin
G01 - MEASURING TESTING
Information
Patent Application
WAVE FRONT SENSOR BASED ON FOURIER FILTERING
Publication number
20240192060
Publication date
Jun 13, 2024
Arizona Board of Regents on behalf of The University of Arizona
Stanley Pau
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING A MODAL PROPERTY OF A QUANTUM STA...
Publication number
20240175760
Publication date
May 30, 2024
Xanadu Quantum Technologies Inc.
Jean-Etienne TREMBLAY
G01 - MEASURING TESTING
Information
Patent Application
ATMOSPHERIC CHARACTERIZATION SYSTEMS AND METHODS
Publication number
20240168170
Publication date
May 23, 2024
BlueHalo, LLC
Levi Judah Smolin
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT SENSORS WITH IRREGULAR APERTURE MASKS, DIFFUSERS, AND CAM...
Publication number
20240102865
Publication date
Mar 28, 2024
Quartus Engineering Incorporated
Peter Pilarz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Device for Detecting Absolute or Relative Temperature an...
Publication number
20240085267
Publication date
Mar 14, 2024
Adtran Networks SE
Benjamin Wohlfeil
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR EXTRACTING INFORMATION ON THE SPATIAL DISTRIB...
Publication number
20240040246
Publication date
Feb 1, 2024
Wooptix S.L.
Ricardo Oliva Garcia
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR EXPANDING THE DYNAMIC RANGE OF MACH-ZEHNDER S...
Publication number
20240019310
Publication date
Jan 18, 2024
Shanghai Haina Data Technology Company Ltd.
Rui YIN
G01 - MEASURING TESTING
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Patent Application
APPARATUSES AND METHODS FOR EXAMINING THE MOVEMENT OF CONSTITUENTS...
Publication number
20240011903
Publication date
Jan 11, 2024
PURDUE RESEARCH FOUNDATION
David D. NOLTE
G01 - MEASURING TESTING
Information
Patent Application
PHASE DETECTION TECHNIQUES FOR HALF-SHIELD PHASE-DETECT SENSORS
Publication number
20240003748
Publication date
Jan 4, 2024
ADVANCED MICRO DEVICES, INC.
Wei-Chih Hung
G02 - OPTICS
Information
Patent Application
QUANTITATIVE PHASE IMAGE GENERATING METHOD, QUANTITATIVE PHASE IMAG...
Publication number
20240004176
Publication date
Jan 4, 2024
Nikon Corporation
Shota TSUCHIDA
G02 - OPTICS
Information
Patent Application
OPTICAL-BASED FIRE DETECTION SYSTEMS AND METHODS
Publication number
20230400356
Publication date
Dec 14, 2023
The Boeing Company
Philipp A. Boettcher
G08 - SIGNALLING
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Patent Application
OPTICAL TRANSMITTER
Publication number
20230384514
Publication date
Nov 30, 2023
ROCKLEY PHOTONICS LIMITED
Yi Ho LEE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT DEVICE WITH UNIVERSAL METASURFACE AND OPTICAL M...
Publication number
20230384152
Publication date
Nov 30, 2023
Korea Advanced Institute of Science and Technology
Jonghwa SHIN
G01 - MEASURING TESTING
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Patent Application
REFRACTIVE SCANNING INTERFEROMETER
Publication number
20230375409
Publication date
Nov 23, 2023
Rapid Phenotyping Pty Limited
Selene Rodd-Routley
G01 - MEASURING TESTING
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Patent Application
MULTIBEAM 3-D FOCUS GENERATOR
Publication number
20230367134
Publication date
Nov 16, 2023
Carl Zeiss SMT GMBH
Markus Seesselberg
G01 - MEASURING TESTING
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Patent Application
PHASE SHIFT MEASURING DEVICE AND PHASE SHIFT MEASURING METHOD
Publication number
20230366741
Publication date
Nov 16, 2023
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Il Min LEE
G01 - MEASURING TESTING
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Patent Application
System and Method for Gradient Interferometrically Locked Laser Source
Publication number
20230352899
Publication date
Nov 2, 2023
Nutronics, Inc.
Jeffrey D. Barchers
G02 - OPTICS
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Patent Application
LASER SOURCE, LIDAR SYSTEM AND METHOD FOR CONTROLLING A LASER SOURCE
Publication number
20230327402
Publication date
Oct 12, 2023
ams-OSRAM International GmbH
Hubert HALBRITTER
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
Publication number
20230324164
Publication date
Oct 12, 2023
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY