by matching the wavefront with a particular object surface shape

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G01B9/02039

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02039by matching the wavefront with a particular object surface shape

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Pre-conditioning interferometer
- Patent number 12,092,456
- Issue date Sep 17, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Dae Wook Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,927,500
- Issue date Mar 12, 2024
- Carl Zeiss SMT GmbH
- Steffen Siegler
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus for interferometrically determining a surface s...
- Patent number 11,892,283
- Issue date Feb 6, 2024
- Carl Zeiss SMT GmbH
- Stefan Schulte
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement method and interferometric measurement...
- Patent number 11,879,721
- Issue date Jan 23, 2024
- Carl Zeiss SMT GmbH
- Alexander Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a measuring apparatus
- Patent number 11,774,237
- Issue date Oct 3, 2023
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,326,872
- Issue date May 10, 2022
- Carl Zeiss SMT GmbH
- Steffen Siegler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Compensation optical system for an interferometric measuring system
- Patent number 11,199,396
- Issue date Dec 14, 2021
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Single-shot, adaptive metrology of rotationally variant optical sur...
- Patent number 11,168,979
- Issue date Nov 9, 2021
- University of Rochester
- Romita Chaudhuri
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,118,900
- Issue date Sep 14, 2021
- Carl Zeiss SMT GmbH
- Frank Riepenhausen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 11,092,431
- Issue date Aug 17, 2021
- Carl Zeiss SMT GmbH
- Frank Riepenhausen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining the spatial position of an object...
- Patent number 10,753,723
- Issue date Aug 25, 2020
- Björn Habrich
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer using tilted object waves and comprising a Fizeau in...
- Patent number 10,612,905
- Issue date Apr 7, 2020
- Universitaet Stuttgart
- Goran Baer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for interferometric determination of a shape of an...
- Patent number 10,527,403
- Issue date Jan 7, 2020
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
Ocular metrology employing spectral wavefront analysis of reflected...
- Patent number 10,470,655
- Issue date Nov 12, 2019
- Steven James Frisken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Spherical shape measurement method and apparatus for rotating a sph...
- Patent number 10,444,008
- Issue date Oct 15, 2019
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measuring arrangement
- Patent number 10,337,850
- Issue date Jul 2, 2019
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical coherence tomography systems integrated with surgical micro...
- Patent number 9,924,863
- Issue date Mar 27, 2018
- Bioptigen, Inc.
- Eric L. Buckland
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Ocular metrology employing spectral wavefront analysis of reflected...
- Patent number 9,913,579
- Issue date Mar 13, 2018
- Steven James Frisken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Wavefront analyser
- Patent number 9,861,277
- Issue date Jan 9, 2018
- Trevor Bruce Anderson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Surgical microscopes using optical coherence tomography and related...
- Patent number 9,498,121
- Issue date Nov 22, 2016
- Bioptigen, Inc.
- Eric L. Buckland
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometer and method for measuring non-rotationally symmetric...
- Patent number 9,435,640
- Issue date Sep 6, 2016
- Zygo Corporation
- Thomas Dresel
- G01 - MEASURING TESTING
Information Patent Grant
Spherical shape measurement method and apparatus
- Patent number 9,347,771
- Issue date May 24, 2016
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric apparatus with computer-generated hologram for meas...
- Patent number 9,234,741
- Issue date Jan 12, 2016
- DMETRIX, INC.
- Chen Liang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus to calculate wavefront aberration of optical...
- Patent number 9,175,953
- Issue date Nov 3, 2015
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Near-null compensator and figure metrology apparatus for measuring...
- Patent number 9,115,977
- Issue date Aug 25, 2015
- National University of Defense Technology
- Shanyong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, measuring method, and method of manufacturing...
- Patent number 9,091,534
- Issue date Jul 28, 2015
- Canon Kabushiki Kaisha
- Hitoshi Iijima
- G01 - MEASURING TESTING
Information Patent Grant
Surgical microscopes using optical coherence tomography and related...
- Patent number 9,060,712
- Issue date Jun 23, 2015
- Bioptigen, Inc.
- Eric L. Buckland
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Wavelength scanning interferometer and method for aspheric surface...
- Patent number 9,062,959
- Issue date Jun 23, 2015
- Zhejiang University
- Kaiwei Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring freeform surfaces
- Patent number 8,913,236
- Issue date Dec 16, 2014
- Corning Incorporated
- Steven J Vankerkhove
- G01 - MEASURING TESTING
Information Patent Grant
Low coherence interferometry with scan error correction
- Patent number 8,902,431
- Issue date Dec 2, 2014
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SINGLE FRAME-TILTED WAVE INTERFEROMETER
- Publication number 20240003672
- Publication date Jan 4, 2024
- UNIVERSITAT STUTTGART
- Christof PRUß
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT
- Publication number 20220349700
- Publication date Nov 3, 2022
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC MEASUREMENT METHOD AND INTERFEROMETRIC MEASUREMENT...
- Publication number 20220307822
- Publication date Sep 29, 2022
- Carl Zeiss SMT GMBH
- Alexander Wolf
- G01 - MEASURING TESTING
Information Patent Application
PRE-CONDITIONING INTERFEROMETER
- Publication number 20220299310
- Publication date Sep 22, 2022
- Arizona Board of Regents on behalf of The University of Arizona
- Dae Wook Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
- Publication number 20220236139
- Publication date Jul 28, 2022
- Carl Zeiss SMT GMBH
- Steffen SIEGLER
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE S...
- Publication number 20220221269
- Publication date Jul 14, 2022
- Carl Zeiss SMT GMBH
- Stefan SCHULTE
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-SHOT, ADAPTIVE METROLOGY OF ROTATIONALLY VARIANT OPTICAL SUR...
- Publication number 20200326182
- Publication date Oct 15, 2020
- University of Rochester
- Romita Chaudhuri
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...
- Publication number 20200225029
- Publication date Jul 16, 2020
- Carl Zeiss SMT GMBH
- Frank RIEPENHAUSEN
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION OPTICAL SYSTEM FOR AN INTERFEROMETRIC MEASURING SYSTEM
- Publication number 20200225028
- Publication date Jul 16, 2020
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING THE SPATIAL POSITION OF AN OBJECT...
- Publication number 20190285398
- Publication date Sep 19, 2019
- Björn Habrich
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING A SPHERICAL-ASTIGMATIC OPTICAL SURFACE
- Publication number 20190271532
- Publication date Sep 5, 2019
- Carl Zeiss SMT GMBH
- Stefan SCHULTE
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR INTERFEROMETRIC DETERMINATION OF A SHAPE OF AN...
- Publication number 20190154427
- Publication date May 23, 2019
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER USING TILTED OBJECT WAVES AND COMPRISING A FIZEAU IN...
- Publication number 20180328711
- Publication date Nov 15, 2018
- UNIVERSITAET STUTTGART
- Goran Baer
- G01 - MEASURING TESTING
Information Patent Application
OCULAR METROLOGY EMPLOYING SPECTRAL WAVEFRONT ANALYSIS OF REFLECTED...
- Publication number 20180146851
- Publication date May 31, 2018
- Steven James Frisken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INTERFEROMETRIC MEASURING ARRANGEMENT
- Publication number 20180106591
- Publication date Apr 19, 2018
- Carl Zeiss SMT GMBH
- Jochen HETZLER
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
METHOD FOR MEASURING A SPHERICAL-ASTIGMATIC OPTICAL SURFACE
- Publication number 20160298951
- Publication date Oct 13, 2016
- Carl Zeiss SMT GMBH
- Stefan SCHULTE
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC APPARATUS WITH COMPUTER-GENERATED HOLOGRAM FOR MEAS...
- Publication number 20150276374
- Publication date Oct 1, 2015
- DMetrix, Inc.
- Chen Liang
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR PERFORMING WAVEFRONT-BASED AND PROFILE-BA...
- Publication number 20140313517
- Publication date Oct 23, 2014
- Corning Incorporated
- STEVEN JAMES VANKERKHOVE
- G01 - MEASURING TESTING
Information Patent Application
Surgical Microscopes Using Optical Coherenece Tomography and Relate...
- Publication number 20140293224
- Publication date Oct 2, 2014
- Eric L. Buckland
- G02 - OPTICS
Information Patent Application
SHAPE MEASUREMENT METHOD, SHAPE MEASUREMENT APPARATUS, PROGRAM, AND...
- Publication number 20140233038
- Publication date Aug 21, 2014
- Atsushi Maeda
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH SCANNING INTERFEROMETER AND METHOD FOR ASPHERIC SURFACE...
- Publication number 20140218750
- Publication date Aug 7, 2014
- Zhejiang University
- KAIWEI WANG
- G01 - MEASURING TESTING
Information Patent Application
Near-Null Compensator and Figure Metrology Apparatus for Measuring...
- Publication number 20140132960
- Publication date May 15, 2014
- Shanyong Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING A SHAPE OF AN OPTICAL SURFACE BASED ON COMPUTAT...
- Publication number 20140078513
- Publication date Mar 20, 2014
- Carl Zeiss SMT GMBH
- Rolf FREIMANN
- G02 - OPTICS
Information Patent Application
Surgical Microscopes Using Optical Coherence Tomography and Related...
- Publication number 20130265545
- Publication date Oct 10, 2013
- Bioptigen, Inc.
- Eric L. Buckland
- G02 - OPTICS
Information Patent Application
MEASURING APPARATUS, MEASURING METHOD, AND METHOD OF MANUFACTURING...
- Publication number 20130250099
- Publication date Sep 26, 2013
- Canon Kabushiki Kaisha
- Hitoshi Iijima
- G01 - MEASURING TESTING
Information Patent Application
LOW COHERENCE INTERFEROMETRY WITH SCAN ERROR CORRECTION
- Publication number 20130155413
- Publication date Jun 20, 2013
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING FREEFORM SURFACES
- Publication number 20130054192
- Publication date Feb 28, 2013
- Steven J Vankerkhove
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING A DEVIATION OF AN OPTICAL SURFACE FROM A TARGET...
- Publication number 20120330609
- Publication date Dec 27, 2012
- Carl Zeiss SMT GMBH
- Ralf ARNOLD
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A SHAPE OF AN OPTICAL TEST SUR...
- Publication number 20120236316
- Publication date Sep 20, 2012
- Carl Zeiss SMT GMBH
- Bernd DOERBAND
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING A SHAPE OF AN OPTICAL SURFACE AND INTERFEROMETR...
- Publication number 20120229814
- Publication date Sep 13, 2012
- Carl Zeiss SMT GMBH
- Rolf FREIMANN
- G02 - OPTICS

by matching the wavefront with a particular object surface shape

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Pre-conditioning interferometer

Method and device for characterizing the surface shape of an optica...

Measuring apparatus for interferometrically determining a surface s...

Interferometric measurement method and interferometric measurement...

Method for calibrating a measuring apparatus

Method and device for characterizing the surface shape of an optica...

Compensation optical system for an interferometric measuring system

Single-shot, adaptive metrology of rotationally variant optical sur...

Method and device for characterizing the surface shape of an optica...

Method and device for characterizing the surface shape of an optica...

Method and device for determining the spatial position of an object...

Interferometer using tilted object waves and comprising a Fizeau in...

Measuring device for interferometric determination of a shape of an...

Ocular metrology employing spectral wavefront analysis of reflected...

Spherical shape measurement method and apparatus for rotating a sph...

Interferometric measuring arrangement

Optical coherence tomography systems integrated with surgical micro...

Ocular metrology employing spectral wavefront analysis of reflected...

Wavefront analyser

Surgical microscopes using optical coherence tomography and related...

Interferometer and method for measuring non-rotationally symmetric...

Spherical shape measurement method and apparatus

Interferometric apparatus with computer-generated hologram for meas...

Measurement apparatus to calculate wavefront aberration of optical...

Near-null compensator and figure metrology apparatus for measuring...

Measuring apparatus, measuring method, and method of manufacturing...

Surgical microscopes using optical coherence tomography and related...

Wavelength scanning interferometer and method for aspheric surface...

Method and device for measuring freeform surfaces

Low coherence interferometry with scan error correction

Patents Applicationslast 30 patents

SINGLE FRAME-TILTED WAVE INTERFEROMETER

MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT

INTERFEROMETRIC MEASUREMENT METHOD AND INTERFEROMETRIC MEASUREMENT...

PRE-CONDITIONING INTERFEROMETER

METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...

MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE S...

SINGLE-SHOT, ADAPTIVE METROLOGY OF ROTATIONALLY VARIANT OPTICAL SUR...

METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE SHAPE OF AN OPTICA...

COMPENSATION OPTICAL SYSTEM FOR AN INTERFEROMETRIC MEASURING SYSTEM

METHOD AND DEVICE FOR DETERMINING THE SPATIAL POSITION OF AN OBJECT...

METHOD FOR MEASURING A SPHERICAL-ASTIGMATIC OPTICAL SURFACE

MEASURING DEVICE FOR INTERFEROMETRIC DETERMINATION OF A SHAPE OF AN...

INTERFEROMETER USING TILTED OBJECT WAVES AND COMPRISING A FIZEAU IN...

OCULAR METROLOGY EMPLOYING SPECTRAL WAVEFRONT ANALYSIS OF REFLECTED...

INTERFEROMETRIC MEASURING ARRANGEMENT

METHOD FOR MEASURING A SPHERICAL-ASTIGMATIC OPTICAL SURFACE

INTERFEROMETRIC APPARATUS WITH COMPUTER-GENERATED HOLOGRAM FOR MEAS...

APPARATUS AND METHODS FOR PERFORMING WAVEFRONT-BASED AND PROFILE-BA...

Surgical Microscopes Using Optical Coherenece Tomography and Relate...

SHAPE MEASUREMENT METHOD, SHAPE MEASUREMENT APPARATUS, PROGRAM, AND...

WAVELENGTH SCANNING INTERFEROMETER AND METHOD FOR ASPHERIC SURFACE...

Near-Null Compensator and Figure Metrology Apparatus for Measuring...

METHOD OF MEASURING A SHAPE OF AN OPTICAL SURFACE BASED ON COMPUTAT...

Surgical Microscopes Using Optical Coherence Tomography and Related...

MEASURING APPARATUS, MEASURING METHOD, AND METHOD OF MANUFACTURING...

LOW COHERENCE INTERFEROMETRY WITH SCAN ERROR CORRECTION

METHOD AND DEVICE FOR MEASURING FREEFORM SURFACES

METHOD OF MEASURING A DEVIATION OF AN OPTICAL SURFACE FROM A TARGET...

METHOD AND APPARATUS FOR DETERMINING A SHAPE OF AN OPTICAL TEST SUR...

METHOD OF MEASURING A SHAPE OF AN OPTICAL SURFACE AND INTERFEROMETR...