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Instruments as specified in the subgroups and characterised by the use of optical measuring means
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G01B9/00
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Current Industry
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Sub Industries
G01B9/02
Interferometers for determining dimensional properties of, or relations between, measurement objects
G01B9/02001
characterised by manipulating or generating specific radiation properties
G01B9/02002
Frequency variation
G01B9/02003
by using beat frequencies generated by mixing of two or more frequencies
G01B9/02004
by using a continuous frequency sweep or scan
G01B9/02005
by using discrete frequency stepping or switching
G01B9/02007
Two or more frequencies or sources used for interferometric measurement
G01B9/02008
by using a frequency comb
G01B9/02009
by using two or more low coherence lengths using different or varying spectral width
G01B9/0201
using temporal phase variation
G01B9/02011
using temporal polarization variation
G01B9/02012
using temporal intensity variation
G01B9/02014
by using pulsed light
G01B9/02015
characterised by a particular beam path configuration
G01B9/02016
contacting two or more objects
G01B9/02017
contacting one object several times
G01B9/02018
Multiple-pass interferometer
G01B9/02019
contacting different points on same face of object
G01B9/02021
contacting different faces of object
G01B9/02022
contacting one object by grazing incidence
G01B9/02023
Indirect probing of object
G01B9/02024
Measuring in transmission
G01B9/02025
Interference between three or more discrete surfaces
G01B9/02027
Two or more interferometric channels or interferometers
G01B9/02028
Two or more reference or object arms in one interferometer
G01B9/02029
Combination with non-interferometric systems
G01B9/0203
With imaging systems
G01B9/02031
With non-optical systems
G01B9/02032
generating a spatial carrier frequency
G01B9/02034
characterised by particularly shaped beams or wavefronts
G01B9/02035
Shaping the focal point
G01B9/02036
by using chromatic effects
G01B9/02037
by generating a transverse line focus
G01B9/02038
Shaping the wavefront
G01B9/02039
by matching the wavefront with a particular object surface shape
G01B9/02041
characterised by particular imaging or detection techniques
G01B9/02042
Confocal imaging
G01B9/02043
Imaging of the Fourier or pupil or back focal plane
G01B9/02044
Imaging in the frequency domain
G01B9/02045
using the Doppler effect
G01B9/02047
using digital holographic imaging
G01B9/02048
Rough and fine measurement
G01B9/02049
characterised by particular mechanical design details
G01B9/0205
of probe head
G01B9/02051
Integrated design
G01B9/02052
Protecting
G01B9/02054
Hand held
G01B9/02055
characterised by error reduction techniques
G01B9/02056
Passive error reduction, i.e. not varying during measurement
G01B9/02057
by using common path configuration
G01B9/02058
by particular optical compensation or alignment elements
G01B9/02059
Reducing effect of parasitic reflections
G01B9/02061
Reducing or preventing effect of tilt or misalignment
G01B9/02062
Active error reduction
G01B9/02063
by particular alignment of focus position
G01B9/02064
by particular adjustment of coherence gate
G01B9/02065
using a second interferometer before or after measuring interferometer
G01B9/02067
by electronic control systems
G01B9/02068
Auto-alignment of optical elements
G01B9/02069
Synchronization of light source or manipulator and detector
G01B9/0207
Error reduction by correction of the measurement signal based on independently determined error sources
G01B9/02071
by measuring path difference independently from interferometer
G01B9/02072
by calibration or testing of interferometer
G01B9/02074
of the detector
G01B9/02075
of particular errors
G01B9/02076
Caused by motion
G01B9/02077
of the object
G01B9/02078
Caused by ambiguity
G01B9/02079
Quadrature detection
G01B9/02081
simultaneous quadrature detection
G01B9/02082
Caused by speckles
G01B9/02083
characterised by particular signal processing and presentation
G01B9/02084
Processing in the Fourier or frequency domain when not imaged in the frequency domain
G01B9/02085
Combining two or more images of different regions
G01B9/02087
Combining two or more images of the same region
G01B9/02088
Matching signals with a database
G01B9/02089
Displaying the signal
G01B9/0209
Non-tomographic low coherence interferometers
G01B9/02091
Tomographic low coherence interferometers
G01B9/02092
Self-mixing interferometers
G01B9/02094
Speckle interferometers
G01B9/02095
detecting deformation from original shape
G01B9/02096
detecting a contour or curvature
G01B9/02097
Self-interferometers
G01B9/02098
shearing interferometers
G01B9/021
using holographic techniques
G01B9/023
for contour producing
G01B9/025
Double exposure technique
G01B9/027
in real time
G01B9/029
by time averaging
G01B9/04
Measuring microscopes
G01B9/06
Measuring telescopes
G01B9/08
Optical projection comparators
G01B9/10
Goniometers for measuring angles between surfaces
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent number
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Issue date
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G01 - MEASURING TESTING
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Patent number
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Issue date
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G01 - MEASURING TESTING
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Patent number
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Issue date
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G01 - MEASURING TESTING
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Patent number
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
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Issue date
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A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent number
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Issue date
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G01 - MEASURING TESTING
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Patent number
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Issue date
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G01 - MEASURING TESTING
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Patent number
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Issue date
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A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent number
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Issue date
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G02 - OPTICS
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Issue date
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G02 - OPTICS
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Issue date
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G02 - OPTICS
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Issue date
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G01 - MEASURING TESTING
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Issue date
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G01 - MEASURING TESTING
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Issue date
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G06 - COMPUTING CALCULATING COUNTING
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Issue date
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H01 - BASIC ELECTRIC ELEMENTS
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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Publication date
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G01 - MEASURING TESTING
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Publication date
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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Publication date
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Publication date
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G01 - MEASURING TESTING
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Publication date
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G01 - MEASURING TESTING
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Publication date
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G01 - MEASURING TESTING
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G01 - MEASURING TESTING
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Publication date
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G01 - MEASURING TESTING
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Publication date
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Publication number
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G06 - COMPUTING CALCULATING COUNTING
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Publication number
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Publication date
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G06 - COMPUTING CALCULATING COUNTING
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Publication number
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Publication date
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G01 - MEASURING TESTING
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Publication number
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Publication date
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G01 - MEASURING TESTING
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Publication date
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G01 - MEASURING TESTING
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Publication date
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
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Publication number
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Publication date
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G01 - MEASURING TESTING
Information
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Publication number
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Publication date
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G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
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Publication number
20250123095
Publication date
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G01 - MEASURING TESTING