by measuring absorption

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CPC
G01B15/045

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B15/00Measuring arrangements characterised by the use of wave or particle radiation

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G01B15/045by measuring absorption

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Patents Grantslast 30 patents

Information Patent Grant
System and method to adjust a kinetics model of surface reactions d...
- Patent number 11,966,203
- Issue date Apr 23, 2024
- KLA Corporation
- Ankur Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-energy x-ray system and method for golf ball inspection
- Patent number 11,874,106
- Issue date Jan 16, 2024
- Acushnet Company
- Paul Furze
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Methods and systems for inspecting integrated circuits based on X-rays
- Patent number 11,815,349
- Issue date Nov 14, 2023
- Bruker Nano, Inc.
- Brennan Lovelace Peterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-energy x-ray system and method for golf ball inspection
- Patent number 11,543,241
- Issue date Jan 3, 2023
- Acushnet Company
- Paul Furze
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Calibration method of x-ray measuring device
- Patent number 11,346,660
- Issue date May 31, 2022
- Mitutoyo Corporation
- Masato Kon
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented method for determining a local deviation of a...
- Patent number 11,113,834
- Issue date Sep 7, 2021
- VOLUME GRAPHICS GMBH
- Christoph Poliwoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for determining the geometry of structures by mea...
- Patent number 10,900,777
- Issue date Jan 26, 2021
- Werth Messtechnik GmbH
- Ralf Christoph
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, x-ray inspection device, measurement...
- Patent number 10,809,209
- Issue date Oct 20, 2020
- Nikon Corporation
- Hirotomo Yashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Increased spatial resolution for photon-counting edge-on x-ray dete...
- Patent number 10,575,800
- Issue date Mar 3, 2020
- PRISMATIC SENSORS AB
- Mats Danielsson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measurement processing device, X-ray inspection device, measurement...
- Patent number 10,481,106
- Issue date Nov 19, 2019
- Nikon Corporation
- Hirotomo Yashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement processing device, X-ray inspection device, measurement...
- Patent number 10,444,165
- Issue date Oct 15, 2019
- Nikon Corporation
- Hirotomo Yashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for making a numerical three-dimensional model of a structur...
- Patent number 10,240,919
- Issue date Mar 26, 2019
- Dirk Peter Leenheer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parametric control of object scanning
- Patent number 9,857,163
- Issue date Jan 2, 2018
- Hexagon Metrology, Inc.
- Jonathan J. O'Hare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement of industrial products manufactured by extrusion techni...
- Patent number 9,146,092
- Issue date Sep 29, 2015
- Proton Products International Limited
- John Kyriakis
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Component aperture location using computed tomography
- Patent number 8,861,673
- Issue date Oct 14, 2014
- United Technologies Corporation
- Derek J. Michaels
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for non destructive measurement of wall thic...
- Patent number 8,325,972
- Issue date Dec 4, 2012
- Röntgen Technische Dienst B.V.
- Uwe Ewert
- G01 - MEASURING TESTING
Information Patent Grant
Method for bone structure prognosis and simulated bone remodeling
- Patent number 8,290,564
- Issue date Oct 16, 2012
- ImaTx, Inc.
- Philipp Lang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for imaging obscured areas of a test object
- Patent number 5,594,770
- Issue date Jan 14, 1997
- ThermoSpectra Corporation
- Philip Bowles
- G01 - MEASURING TESTING
Information Patent Grant
Methods of correcting optically generated errors in an electro-opti...
- Patent number 5,517,575
- Issue date May 14, 1996
- Theodore B. Ladewski
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical system for gauging specular surface profile deviations
- Patent number 5,465,153
- Issue date Nov 7, 1995
- KMS Fusion, Inc.
- Theodore B. Ladewski
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical system for gauging surface profile deviations using...
- Patent number 5,463,464
- Issue date Oct 31, 1995
- KMS Fusion, Inc.
- Theodore B. Ladewski
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for calibrating an apparatus for measuring the th...
- Patent number 5,440,386
- Issue date Aug 8, 1995
- Sollac (Societe anonyme)
- Jean-Jacques Campas
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical system for gauging surface profile deviations
- Patent number 5,438,417
- Issue date Aug 1, 1995
- KMS Fusion, Inc.
- Garland F. Busch
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical system for gauging surface profile deviations
- Patent number 5,416,589
- Issue date May 16, 1995
- KMS Fusion, Inc.
- Charles D. Lysogorski
- G01 - MEASURING TESTING
Information Patent Grant
Online tomographic gauging of sheet metal
- Patent number 5,351,203
- Issue date Sep 27, 1994
- Bethlehem Steel Corporation
- Carvel D. Hoffman
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical system for gauging surface profile deviations
- Patent number 5,289,267
- Issue date Feb 22, 1994
- KMS Fusion, Inc.
- Garland E. Busch
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring transverse thickness profile of...
- Patent number 5,202,909
- Issue date Apr 13, 1993
- Institute de Recherches de la Siderurgie Francaise (IRSID)
- Pierre Gauje
- G01 - MEASURING TESTING
Information Patent Grant
X-ray threaded pipe joint analysis system
- Patent number 5,042,055
- Issue date Aug 20, 1991
- Art Wirt
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for dimensional analysis and flaw detection of...
- Patent number 4,725,963
- Issue date Feb 16, 1988
- Scientific Measurement Systems I, Ltd.
- Morris Taylor
- G01 - MEASURING TESTING
Information Patent Grant
Profile measurement apparatus using radiation
- Patent number 4,633,420
- Issue date Dec 30, 1986
- Tokyo Shibaura Denki Kabushiki Kaisha
- Kazunori Masanobu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR INSPECTING INTEGRATED CIRCUITS BASED ON X-RAYS
- Publication number 20220042795
- Publication date Feb 10, 2022
- SVXR, Inc.
- Brennan Lovelace Peterson
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-IMPLEMENTED METHOD FOR DETERMINING A LOCAL DEVIATION OF A...
- Publication number 20210118164
- Publication date Apr 22, 2021
- Volume Graphics GmbH
- Christoph Poliwoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION METHOD OF X-RAY MEASURING DEVICE
- Publication number 20210072022
- Publication date Mar 11, 2021
- MITUTOYO CORPORATION
- Masato KON
- G01 - MEASURING TESTING
Information Patent Application
System and Method to Adjust A Kinetics Model of Surface Reactions D...
- Publication number 20210055699
- Publication date Feb 25, 2021
- KLA Corporation
- Ankur A. Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT OF INDUSTRIAL PRODUCTS MANUFACTURED BY EXTRUSION TECHNI...
- Publication number 20140183365
- Publication date Jul 3, 2014
- Proton Products International Limited
- John Kyriakis
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR BONE STRUCTURE PROGNOSIS AND SIMULATED BONE REMODELING
- Publication number 20130195325
- Publication date Aug 1, 2013
- ImaTx, Inc.
- Philipp Lang
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT APERTURE LOCATION USING COMPUTED TOMOGRAPHY
- Publication number 20130136225
- Publication date May 30, 2013
- Derek J. Michaels
- G01 - MEASURING TESTING
Information Patent Application
Method for Making a Numerical Three-Dimensional Model of a Structur...
- Publication number 20120265497
- Publication date Oct 18, 2012
- Dirk Peter Leehneer
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT AND METHOD FOR NON DESTRUCTIVE MEASUREMENT OF WALL THIC...
- Publication number 20100119103
- Publication date May 13, 2010
- RONTGEN TECHNISCHE DIENST
- Uwe Ewert
- G01 - MEASURING TESTING
Information Patent Application
Method for Bone Structure Prognosis and Simulated Bone Remodeling
- Publication number 20080031412
- Publication date Feb 7, 2008
- IMAGING THERAPEUTICS, INC.
- Philipp Lang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

by measuring absorption

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method to adjust a kinetics model of surface reactions d...

Multi-energy x-ray system and method for golf ball inspection

Methods and systems for inspecting integrated circuits based on X-rays

Multi-energy x-ray system and method for golf ball inspection

Calibration method of x-ray measuring device

Computer-implemented method for determining a local deviation of a...

Method and device for determining the geometry of structures by mea...

Measurement processing device, x-ray inspection device, measurement...

Increased spatial resolution for photon-counting edge-on x-ray dete...

Measurement processing device, X-ray inspection device, measurement...

Measurement processing device, X-ray inspection device, measurement...

Method for making a numerical three-dimensional model of a structur...

Parametric control of object scanning

Measurement of industrial products manufactured by extrusion techni...

Component aperture location using computed tomography

Arrangement and method for non destructive measurement of wall thic...

Method for bone structure prognosis and simulated bone remodeling

Method and apparatus for imaging obscured areas of a test object

Methods of correcting optically generated errors in an electro-opti...

Electro-optical system for gauging specular surface profile deviations

Electro-optical system for gauging surface profile deviations using...

Method and device for calibrating an apparatus for measuring the th...

Electro-optical system for gauging surface profile deviations

Electro-optical system for gauging surface profile deviations

Online tomographic gauging of sheet metal

Electro-optical system for gauging surface profile deviations

Method and apparatus for measuring transverse thickness profile of...

X-ray threaded pipe joint analysis system

Method and apparatus for dimensional analysis and flaw detection of...

Profile measurement apparatus using radiation

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR INSPECTING INTEGRATED CIRCUITS BASED ON X-RAYS

COMPUTER-IMPLEMENTED METHOD FOR DETERMINING A LOCAL DEVIATION OF A...

CALIBRATION METHOD OF X-RAY MEASURING DEVICE

System and Method to Adjust A Kinetics Model of Surface Reactions D...

MEASUREMENT OF INDUSTRIAL PRODUCTS MANUFACTURED BY EXTRUSION TECHNI...

METHOD FOR BONE STRUCTURE PROGNOSIS AND SIMULATED BONE REMODELING

COMPONENT APERTURE LOCATION USING COMPUTED TOMOGRAPHY

Method for Making a Numerical Three-Dimensional Model of a Structur...

ARRANGEMENT AND METHOD FOR NON DESTRUCTIVE MEASUREMENT OF WALL THIC...

Method for Bone Structure Prognosis and Simulated Bone Remodeling